| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 06/04/2008 | CN100392798C Device and method for separating thin crystalline grains |
| 06/04/2008 | CN100392797C Stripping method |
| 06/04/2008 | CN100392796C High pressure processing chamber for semiconductor substrate including flow enhancing features |
| 06/04/2008 | CN100392792C Linear drive system for use in plasma processing system |
| 06/04/2008 | CN100392791C Techniques for improving etch rate uniformity |
| 06/04/2008 | CN100392763C Boosting circuit with boosted voltage limited |
| 06/04/2008 | CN100392691C Light emitting device and its producing method |
| 06/04/2008 | CN100392662C Method and system for manufacturing layout and mask, and manufacture of semiconductor device |
| 06/04/2008 | CN100392556C Interface circuit for full-custom and semi-custom timing domains |
| 06/04/2008 | CN100392507C Film transistor display assembly capable of reducing light leakage current and manufacturing method thereof |
| 06/04/2008 | CN100392506C Film transistor array panel and its manufacturing method |
| 06/04/2008 | CN100392504C Liquid crystal display |
| 06/04/2008 | CN100392420C Multi-channel analyzer of non-contact applied chip |
| 06/04/2008 | CN100392409C Probe, probe assembly method |
| 06/04/2008 | CN100392408C 接触探头 Contact probe |
| 06/04/2008 | CN100392278C Multi-position stop mechanism |
| 06/04/2008 | CN100392148C Methods for silicon oxide and oxynitride deposition using single wafer low pressure CVD |
| 06/04/2008 | CN100391714C Compression moulding machines |
| 06/04/2008 | CN100391693C Grinder and method for grinding workpiece |
| 06/03/2008 | USRE40356 Large-capacity semiconductor memory with improved layout for sub-amplifiers to increase operational speed |
| 06/03/2008 | USRE40352 Switch mode power supply with reduced switching losses |
| 06/03/2008 | US7383521 Characterization and reduction of variation for integrated circuits |
| 06/03/2008 | US7383156 Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface |
| 06/03/2008 | US7383093 Substrate processing apparatus and substrate processing method |
| 06/03/2008 | US7382914 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 06/03/2008 | US7382816 Two-stage laser pulse energy control device and two-stage laser system |
| 06/03/2008 | US7382815 Laser spectral engineering for lithographic process |
| 06/03/2008 | US7382671 Method for detecting column fail by controlling sense amplifier of memory device |
| 06/03/2008 | US7382662 Twin insulator charge storage device operation and its fabrication method |
| 06/03/2008 | US7382649 Nonvolatile semiconductor memory |
| 06/03/2008 | US7382646 Memory architecture containing a high density memory array of semi-volatile or non-volatile memory elements |
| 06/03/2008 | US7382536 Objective with fluoride crystal lenses |
| 06/03/2008 | US7382527 EUV multilayer mirror with phase shifting layer |
| 06/03/2008 | US7382519 Method and device for fabricating a release structure to facilitate bonding of mirror devices onto a substrate |
| 06/03/2008 | US7382515 Silicon-rich silicon nitrides as etch stops in MEMS manufacture |
| 06/03/2008 | US7382451 Method of defect inspection |
| 06/03/2008 | US7382446 Aberration measuring method |
| 06/03/2008 | US7382440 Lithographic apparatus and device manufacturing method |
| 06/03/2008 | US7382437 Projection optical system, exposure apparatus and device fabricating method |
| 06/03/2008 | US7382436 Mirror, lithographic apparatus, device manufacturing method, and device manufactured thereby |
| 06/03/2008 | US7382434 Exposure apparatus and device manufacturing method |
| 06/03/2008 | US7382389 Methods and systems for thermal-based laser processing a multi-material device |
| 06/03/2008 | US7382363 Microencapsulated electrophoretic display with integrated driver |
| 06/03/2008 | US7382098 Plasma producing apparatus and doping apparatus |
| 06/03/2008 | US7382060 Semiconductor component having thinned die, polymer layers, contacts on opposing sides, and conductive vias connecting the contacts |
| 06/03/2008 | US7382058 Top layers of metal for high performance IC's |
| 06/03/2008 | US7382056 Integrated passive devices |
| 06/03/2008 | US7382052 Post passivation interconnection schemes on top of IC chip |
| 06/03/2008 | US7382051 Semiconductor device with reduced contact resistance |
| 06/03/2008 | US7382046 Semiconductor device protection cover, and semiconductor device unit including the cover |
| 06/03/2008 | US7382042 COF flexible printed wiring board and method of producing the wiring board |
| 06/03/2008 | US7382040 Organic field effect transistor and display using same |
| 06/03/2008 | US7382039 Edge seal for improving integrated circuit noise isolation |
| 06/03/2008 | US7382031 Component including a fixed element that is in a silicon layer and is mechanically connected to a substrate via an anchoring element and method for its manufacture |
| 06/03/2008 | US7382029 Method and apparatus for improving integrated circuit device performance using hybrid crystal orientations |
| 06/03/2008 | US7382027 MOSFET device with low gate contact resistance |
| 06/03/2008 | US7382026 Semiconductor memory device and method of manufacturing the same |
| 06/03/2008 | US7382024 Low threshold voltage PMOS apparatus and method of fabricating the same |
| 06/03/2008 | US7382023 Fully depleted SOI multiple threshold voltage application |
| 06/03/2008 | US7382021 Insulated gate field-effect transistor having III-VI source/drain layer(s) |
| 06/03/2008 | US7382020 Semiconductor integrated circuit |
| 06/03/2008 | US7382017 Nano-enabled memory devices and anisotropic charge carrying arrays |
| 06/03/2008 | US7382016 Semiconductor device and method of manufacturing the same |
| 06/03/2008 | US7382015 Semiconductor device including an element isolation portion having a recess |
| 06/03/2008 | US7382012 Reducing parasitic capacitance of MIM capacitor in integrated circuits by reducing effective dielectric constant of dielectric layer |
| 06/03/2008 | US7382005 Circuit component with bump formed over chip |
| 06/03/2008 | US7382004 Semiconductor sensing device |
| 06/03/2008 | US7382003 Solid-state image pick-up unit and method of manufacturing the same |
| 06/03/2008 | US7382001 Enhancement mode III-nitride FET |
| 06/03/2008 | US7382000 Semiconductor device |
| 06/03/2008 | US7381998 Semiconductor integrated circuit device |
| 06/03/2008 | US7381997 Lateral silicided diodes |
| 06/03/2008 | US7381993 High-breakdown-voltage insulated gate semiconductor device |
| 06/03/2008 | US7381992 Silicon carbide power devices with self-aligned source and well regions |
| 06/03/2008 | US7381991 Semiconductor device and method of fabricating the same |
| 06/03/2008 | US7381990 Thin film transistor with multiple gates fabricated using super grain silicon crystallization |
| 06/03/2008 | US7381988 Array substrate for liquid crystal display device and the fabrication method of the same |
| 06/03/2008 | US7381984 Thin film transistor and flat panel display including the same |
| 06/03/2008 | US7381978 Contact opening metrology |
| 06/03/2008 | US7381949 Method and apparatus for simultaneously depositing and observing materials on a target |
| 06/03/2008 | US7381928 Thermal processing apparatus and thermal processing method |
| 06/03/2008 | US7381694 Semiconductor substrate or chip; using mixture of carbon dioxide gas with ethylene, propylene, butylene carbonate with propylene glycol monomethyl ether acetate; pulsation fluids |
| 06/03/2008 | US7381673 SiC, SiO2, and Al and/or Si, with He leak rate of 1.3x10-10 Pa*m3/sec or below; high vacuum air-tightness, excellent thermal conductivity, adjustable coefficient of thermal expansion, small variation in strength and high reliability |
| 06/03/2008 | US7381662 Methods for improving the cracking resistance of low-k dielectric materials |
| 06/03/2008 | US7381661 Method for the production of a substrate with a magnetron sputter coating and unit for the same |
| 06/03/2008 | US7381660 Dielectric barrier layer for a copper metallization layer having a varying silicon concentration along its thickness |
| 06/03/2008 | US7381659 Method for reducing film stress for SiCOH low-k dielectric materials |
| 06/03/2008 | US7381658 Encapsulation of nano-dimensional structures by oxidation |
| 06/03/2008 | US7381657 Biased pulse DC reactive sputtering of oxide films |
| 06/03/2008 | US7381656 Method of manufacturing a semiconductor device and semiconductor device obtained by means of said method |
| 06/03/2008 | US7381655 Mandrel/trim alignment in SIT processing |
| 06/03/2008 | US7381654 Method for fabricating right-angle holes in a substrate |
| 06/03/2008 | US7381653 Plasma processing method |
| 06/03/2008 | US7381652 Method of manufacturing flash memory device |
| 06/03/2008 | US7381651 Processes for monitoring the levels of oxygen and/or nitrogen species in a substantially oxygen and nitrogen-free plasma ashing process |
| 06/03/2008 | US7381650 Method and apparatus for process control in time division multiplexed (TDM) etch processes |
| 06/03/2008 | US7381649 Structure for a multiple-gate FET device and a method for its fabrication |
| 06/03/2008 | US7381648 Chemical mechanical polishing slurry useful for copper substrates |
| 06/03/2008 | US7381647 Methods and systems for planarizing microelectronic devices with Ge-Se-Ag layers |
| 06/03/2008 | US7381646 Method for using a Cu BEOL process to fabricate an integrated circuit (IC) originally having an al design |