Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2008
08/28/2008US20080203545 Semiconductor device and method of fabrication thereof
08/28/2008US20080203544 Semiconductor wafer structure with balanced reflectance and absorption characteristics for rapid thermal anneal uniformity
08/28/2008US20080203542 Ion-assisted oxidation methods and the resulting structures
08/28/2008US20080203541 Semiconductor device and manufacturing method of the same
08/28/2008US20080203540 Structure and method for device-specific fill for improved anneal uniformity
08/28/2008US20080203538 Semiconductor wafer with division guide pattern
08/28/2008US20080203537 Differential Junction Varactor
08/28/2008US20080203536 Bipolar transistor using selective dielectric deposition and methods for fabrication thereof
08/28/2008US20080203534 Complementary zener triggered bipolar esd protection
08/28/2008US20080203532 Semiconductor device and method of manufacturing the same
08/28/2008US20080203531 Semiconductor device and manufacturing method thereof
08/28/2008US20080203530 Semiconductor device and method of producing the same
08/28/2008US20080203529 Semiconductor device comprising multilayer dielectric film and related method
08/28/2008US20080203528 Metal-insulator-metal capacitor and method for fabricating the same
08/28/2008US20080203525 Capacitance trimming circuit of semiconductor device having vertically stacked capacitor layers and operation method thereof
08/28/2008US20080203524 Localized temperature control during rapid thermal anneal
08/28/2008US20080203523 Localized temperature control during rapid thermal anneal
08/28/2008US20080203519 Microelectronic assembly with improved isolation voltage performance and a method for forming the same
08/28/2008US20080203517 Semiconductor component having rectifying junctions and method for producing the same
08/28/2008US20080203515 Photoelectric conversion device and electronic device, and method for manufacturing photoelectric conversion device
08/28/2008US20080203513 Semiconductor Integrated Device Having Solid-State Image Sensor Packaged Within and Production Method for Same
08/28/2008US20080203511 Sensor-type semiconductor package and method for fabricating the same
08/28/2008US20080203508 Image sensing device having protection pattern on the microlens, camera module, and method of forming the same
08/28/2008US20080203507 Image sensors for zoom lenses and fabricating methods thereof
08/28/2008US20080203502 Self-addressable self-assembling microelectronic systems and devices for molecular biological analysis and diagnostics
08/28/2008US20080203500 Semiconductor device and production method therefor
08/28/2008US20080203499 Semiconductor device having gate insulator including high-dielectric-constant materials and manufacture method of the same
08/28/2008US20080203497 Semiconductor Devices Including Assymetric Source and Drain Regions Having a Same Width and Related Methods
08/28/2008US20080203493 Semiconductor memory device and fabrication process thereof
08/28/2008US20080203491 Radiation hardened finfet
08/28/2008US20080203490 Bipolar transistor with raised extrinsic self-aligned base using selective epitaxial growth for bicmos integration
08/28/2008US20080203489 Ensuring Migratability of Circuits by Masking Portions of the Circuits While Improving Performance of Other Portions of the Circuits
08/28/2008US20080203488 CMOS semiconductor device and method of fabricating the same
08/28/2008US20080203487 Field effect transistor having an interlayer dielectric material having increased intrinsic stress
08/28/2008US20080203486 Method for differential spacer removal by wet chemical etch process and device with differential spacer structure
08/28/2008US20080203485 Strained metal gate structure for cmos devices with improved channel mobility and methods of forming the same
08/28/2008US20080203484 Field effect transistor arrangement and method of producing a field effect transistor arrangement
08/28/2008US20080203483 Semiconductor device including a recessed-channel-array misfet
08/28/2008US20080203481 Nonvolatile semiconductor memory and method of manufacturing the same
08/28/2008US20080203480 Integrated circuit using a superjunction semiconductor device
08/28/2008US20080203478 High Frequency Switch With Low Loss, Low Harmonics, And Improved Linearity Performance
08/28/2008US20080203476 Semiconductor Device Having Strip-Shaped Channel And Method For Manufacturing Such A Device
08/28/2008US20080203475 Semiconductor device and method of fabricating the same
08/28/2008US20080203474 Semiconductor device having offset spacer and method of forming the same
08/28/2008US20080203472 Lateral mosfet and manufacturing method thereof
08/28/2008US20080203471 Nitride semiconductor device and method for producing nitride semiconductor device
08/28/2008US20080203470 Lateral compensation component
08/28/2008US20080203469 Integrated circuit including an array of memory cells having dual gate transistors
08/28/2008US20080203468 FinFET with Reduced Gate to Fin Overlay Sensitivity
08/28/2008US20080203467 Nrom flash memory devices on ultrathin silicon
08/28/2008US20080203465 Semiconductor device and method for manufacturing the same
08/28/2008US20080203464 Electrically alterable non-volatile memory and array
08/28/2008US20080203463 Non-Volatile Memory with Erase Gate on Isolation Zones
08/28/2008US20080203462 Finfet-Based Non-Volatile Memory Device
08/28/2008US20080203461 Gate structure of nand flash memory having insulators each filled with between gate electrodes of adjacent memory cells and manufacturing method thereof
08/28/2008US20080203460 Manufacturing method for a nanocrystal based device covered with a layer of nitride deposited by cvd
08/28/2008US20080203459 Method of manufacturing a semiconductor device and semiconductor device
08/28/2008US20080203458 Semiconductor Memory Device and Method of Fabricating the Same
08/28/2008US20080203456 Dynamic random access memory devices and methods of forming the same
08/28/2008US20080203455 Semiconductor device employing transistor having recessed channel region and method of fabricating the same
08/28/2008US20080203454 Semiconductor device and method of manufacturing the same
08/28/2008US20080203453 Semiconductor structures and memory device constructions
08/28/2008US20080203449 Source/drain stressor and method therefor
08/28/2008US20080203448 Stressed dielectric devices and methods of fabricating same
08/28/2008US20080203447 Low-temperature electrically activated gate electrode and method of fabricating same
08/28/2008US20080203444 Multi-finger transistor and method of manufacturing the same
08/28/2008US20080203441 SiC semiconductor device and method for manufacturing the same
08/28/2008US20080203440 Semiconductor device fabrication method and semiconductor device fabricated thereby
08/28/2008US20080203439 Semiconductor integrated circuit having plural transistors
08/28/2008US20080203438 Demultiplexers using transistors for accessing memory cell arrays
08/28/2008US20080203437 Semiconductor integrated circuit device with reduced leakage current
08/28/2008US20080203436 Semiconductor device and layout method of decoupling capacitor thereof
08/28/2008US20080203434 Semiconductor Device with a Bipolar Transistor and Method of Manufacturing Such a Device
08/28/2008US20080203433 High electron mobility transistor and method of forming the same
08/28/2008US20080203432 Semiconductor device and method for fabricating the same
08/28/2008US20080203431 GaN-BASED NITRIC OXIDE SENSORS AND METHODS OF MAKING AND USING THE SAME
08/28/2008US20080203429 Semiconductor Device and a Method of Manufacturing the Same
08/28/2008US20080203428 Mos transistors having recessed channel regions and methods of fabricating the same
08/28/2008US20080203427 Semiconductor device having a strained semiconductor alloy concentration profile
08/28/2008US20080203426 Heterojunction semiconductor device and method of manufacturing
08/28/2008US20080203417 Surface mounting type light emitting diode and method for manufacturing the same
08/28/2008US20080203416 Surface mounting type light emitting diode and method for manufacturing the same
08/28/2008US20080203415 Led devices having lenses and methods of making same
08/28/2008US20080203409 PROCESS FOR PRODUCING (Al, Ga)N CRYSTALS
08/28/2008US20080203408 PROCESS FOR PRODUCING (Al, Ga)lnN CRYSTALS
08/28/2008US20080203407 Method for producing an optoelectronic semiconductor chip, and optoelectronic semiconductor chip
08/28/2008US20080203405 Method for Preparing an Electric Circuit Comprising Multiple Leds
08/28/2008US20080203403 Semiconductor integrated circuit
08/28/2008US20080203402 SiC semiconductor device and method for manufacturing the same
08/28/2008US20080203401 Method for manufacturing semiconductor device and semiconductor device manufactured therefrom
08/28/2008US20080203398 Silicon carbide self-aligned epitaxial MOSFET and method of manufacturing thereof
08/28/2008US20080203395 Semiconductor device and manufacturing method thereof
08/28/2008US20080203394 Method for fabrication of active-matrix display panels
08/28/2008US20080203392 Display substrate, method of manufacturing the same and display device having the same
08/28/2008US20080203390 Method for manufacturing a signal line, thin film transistor panel, and method for manufacturing the thin film transistor panel
08/28/2008US20080203389 Semiconductor apparatus having temperature sensing diode
08/28/2008US20080203388 Apparatus and method for detection of edge damages
08/28/2008US20080203387 Thin film transistor and method of manufacturing the same
08/28/2008US20080203386 Photoresists; vapor deposition; atomic layer deposition; sputtering; lithography; etching
08/28/2008US20080203382 Semiconductor wafer, devices made therefrom, and method of fabrication
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