Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2011
01/13/2011US20110006397 Group III nitride semiconductor free-standing substrate and method of manufacturing the same, group III nitride semiconductor device and method of manufacturing the same
01/13/2011US20110006395 Hybrid bump capacitor
01/13/2011US20110006390 Sti structure and method of forming bottom void in same
01/13/2011US20110006389 Suppressing fractures in diced integrated circuits
01/13/2011US20110006383 Three-dimensional structure and its manufacturing method
01/13/2011US20110006381 Mems package and method for the production thereof
01/13/2011US20110006379 Semiconductor device and manufacturing method thereof
01/13/2011US20110006378 Semiconductor Manufacturing Method Using Maskless Capping Layer Removal
01/13/2011US20110006377 Patterning Embedded Control Lines for Vertically Stacked Semiconductor Elements
01/13/2011US20110006376 Semiconductor device, semiconductor device manufacturing method, and display device
01/13/2011US20110006375 Method of forming a high-k gate dielectric layer
01/13/2011US20110006372 Formation of standard voltage threshold and low voltage threshold mosfet devices
01/13/2011US20110006371 Inducing stress in cmos device
01/13/2011US20110006370 Effecting selectivity of silicon or silicon-germanium deposition on a silicon or silicon-germanium substrate by doping
01/13/2011US20110006369 Finfet transistor with high-voltage capability and cmos-compatible method for fabricating the same
01/13/2011US20110006368 Semiconductor wafer, method of manufacturing a semiconductor wafer, and electronic device
01/13/2011US20110006363 Trench MOSFET structures using three masks process
01/13/2011US20110006362 Trench MOSFET with on-resistance reduction
01/13/2011US20110006359 Semiconductor structures and methods of manufacture
01/13/2011US20110006357 Non-volatile memory device and method of manufacturing same
01/13/2011US20110006356 Non-volatile memory and method for fabricating the same
01/13/2011US20110006354 Metal gate structure of a semiconductor device
01/13/2011US20110006352 Reverse engineering resistant read only memory
01/13/2011US20110006349 Field effect transistor having channel silicon germanium
01/13/2011US20110006348 Rounded three-dimensional germanium active channel for transistors and sensors
01/13/2011US20110006345 Field effect transistor and method of manufacturing the same
01/13/2011US20110006344 Method for improving transistor performance through reducing the salicide interface resistance
01/13/2011US20110006343 Semiconductor wafer, method of manufacturing a semiconductor wafer, and electronic device
01/13/2011US20110006342 Electrostatic discharge (esd) protection circuits, integrated circuits, systems, and methods for forming the esd protection circuits
01/13/2011US20110006339 Semiconductor device and method of manufacturing the same
01/13/2011US20110006338 Igbt and method of producing the same
01/13/2011US20110006336 Organic light emitting diode display and method for manufacturing the same
01/13/2011US20110006335 Organic light emitting diode display and method for manufacturing the same
01/13/2011US20110006330 Semiconductor light emitting devices including an optically transmissive element and methods for packaging the same
01/13/2011US20110006322 Wafer-level package structure of light emitting diode and manufacturing method thereof
01/13/2011US20110006316 Lighting device, display, and method for manufacturing the same
01/13/2011US20110006314 Semiconductor device and method for manufacturing the same
01/13/2011US20110006310 Semiconductor device and semiconductor device manufacturing method
01/13/2011US20110006309 EPITAXIAL SiC SINGLE CRYSTAL SUBSTRATE AND METHOD OF MANUFACTURE OF EXPITAXIAL SiC SINGLE CRYSTAL SUBSTRATE
01/13/2011US20110006307 Group III-Nitride Semiconductor Schottky Diode and Its Fabrication Method
01/13/2011US20110006306 Light emitting device
01/13/2011US20110006304 Semiconductor device with alternately arranged p-type and n-type thin semiconductor layers and method for manufacturing the same
01/13/2011US20110006303 Semiconductor apparatus manufacturing method and semiconductor apparatus
01/13/2011US20110006302 Semiconductor device and method for manufacturing the same
01/13/2011US20110006301 Semiconductor device and manufacturing method the same
01/13/2011US20110006300 Electronic device, method of manufacturing the same, display and sensor
01/13/2011US20110006299 Field-effect transistor and method for fabricating field-effect transistor
01/13/2011US20110006298 Electronic device and method for producing the same
01/13/2011US20110006297 Patterned crystalline semiconductor thin film, method for producing thin film transistor and field effect transistor
01/13/2011US20110006286 Transverse Force, Pressure and Vibration Sensors using Piezoelectric Nanostructures
01/13/2011US20110006285 Core-alloyed shell semiconductor nanocrystals
01/13/2011US20110006284 Photonic structure
01/13/2011US20110006280 Quantum-dot device and position-controlled quantum-dot-fabrication method
01/13/2011US20110006278 Variable resistance non-volatile memory device and method for manufacturing the same
01/13/2011US20110006276 Schottky diode switch and memory units containing the same
01/13/2011US20110006275 Non-volatile resistive sense memory
01/13/2011US20110006251 Cerium salt, producing method thereof, cerium oxide and cerium based polishing slurry
01/13/2011US20110006183 Device and method for aligning and holding a plurality of singulated semiconductor components in receiving pockets of a terminal carrier
01/13/2011US20110005967 Methods and apparatuses for large diameter wafer handling
01/13/2011US20110005966 Foup and robotic flange thereof
01/13/2011US20110005942 Iii-v nitride semiconductor device comprising a diamond layer
01/13/2011US20110005680 Tunable gas flow equalizer
01/13/2011US20110005679 Plasma uniformity control through vhf cathode ground return with feedback stabilization of vhf cathode impedance
01/13/2011US20110005571 Method and apparatus for manufacturing solar cell, and solar cell
01/13/2011US20110005564 Method and Apparatus Pertaining to Nanoensembles Having Integral Variable Potential Junctions
01/13/2011US20110005459 Resist coating apparatus
01/13/2011US20110005319 Capacitive mems gyroscope and method of making the same
01/13/2011US20110005143 Polishing oil slurry for polishing hard crystal substrate
01/13/2011US20110005070 Dual-damascene bit line structures for microelectronic devices and methods of fabricating microelectronic devices
01/13/2011DE202010014632U1 Schutzhaube zum Transport und zur Lagerung von elektronischen Bauteilen, insbesondere Bauteile mit integrierten Schaltkreisen Protective cover for transport and storage of electronic components, particularly components with integrated circuits
01/13/2011DE202010008396U1 Konstruktion eines Verbindungselements mit direkter Siliziumbohrung Construction of a connecting member with direct silicon hole
01/13/2011DE19953784B4 Variable Lastschaltung, variable Signalübertragungsschaltung und Signalübertragungssteuerverfahren für integrierte Schaltkreise Variable load circuit, variable signal transmission circuit and signal transmission control method for integrated circuits
01/13/2011DE112009000403T5 CMP-Schlamm und Polierverfahren unter Verwendung desselben The same CMP slurry and polishing method using
01/13/2011DE112006003049B4 Integriertes Schaltungspackage und Package-Substrat unter Verwendung eines Array-Kondensatorkerns und Verfahren zur Herstellung An integrated circuit package and the package substrate using an array capacitor core and process for preparing
01/13/2011DE112004001259B4 Verfahren und System zum Ausführen einer Messverteilung auf der Grundlage einer Fehlererkennung und computerlesbares Speichermedium A method and system for performing distribution measurement on the basis of an error detection and computer readable storage medium
01/13/2011DE10343876B4 Vorrichtung zur Messung von Strukturbreiten auf Masken für die Halbleiterindustrie Apparatus for measuring structure widths on masks for the semiconductor industry,
01/13/2011DE102010024119A1 Halbleitervorrichtung, Herstellungsverfahren einer Halbleitervorrichtung und elektronisches Gerät A semiconductor device manufacturing method of a semiconductor device and electronic device
01/13/2011DE102010000208A1 Monolithische Halbleiterschalter und Verfahren zu ihrer Herstellung Monolithic semiconductor switches and method for their preparation
01/13/2011DE102010000199A1 Halbleiterbauelement, Systemträger und Einkapselungsverfahren Semiconductor device, system unit and encapsulation
01/13/2011DE102009032217A1 Verfahren und Vorrichtung zur Behandlung von Substraten Method and apparatus for treating substrates
01/13/2011DE102009031110A1 Verbesserte Deckschichtintegrität in einem Metallgatestapel mit großem ε durch Verwenden einer Hartmaske für die Abstandshalterstrukturierung Improved top layer integrity in a metal gate stack with large ε by using a hard mask for the spacer structure
01/13/2011DE102009017692A1 Method for production of low-temperature contacting for microelectronic superstructures, involves applying photo-structured material on connection contacts having surface of microelectronic element
01/13/2011DE102007040826B9 Integrierter Schaltkreis mit einer Zelle mit einer Schicht veränderbarer Resistivität und Verfahren zur Herstellung An integrated circuit comprising a cell having a variable resistivity layer and processes for preparing
01/13/2011DE102006019935B4 SOI-Transistor mit reduziertem Körperpotential und ein Verfahren zur Herstellung SOI transistor with reduced body potential and a process for preparing
01/13/2011DE102005059231B4 Verfahren zum Herstellen eines Verbindungshalbleiter-Feldeffekttransistors mit einer Fin-Struktur und Verbindungshalbleiter-Feldeffekttransistor mit einer Fin-Struktur A method of manufacturing a compound semiconductor field effect transistor having a fin structure, and compound semiconductor field-effect transistor having a fin structure
01/13/2011DE102004002223B4 Verfahren zur Herstellung einer Halbleitervorrichtung A process for producing a semiconductor device
01/13/2011DE10164189B4 Halbton-Phasenverschiebungsmaske und -maskenrohling Halftone phase shift mask and -maskenrohling
01/13/2011DE10021385B4 Verfahren zur Herstellung eines Kondensators mit Erzeugung einer unteren Kondensatorelektrode unter Verwendung einer CMP-Stoppschicht A method for manufacturing a capacitor with generation of a lower capacitor electrode using a CMP stop layer
01/13/2011CA2767482A1 System for converting energy with an enhanced electric field
01/13/2011CA2766141A1 High speed low power magnetic devices based on current induced spin-momentum transfer
01/13/2011CA2765288A1 Method and device for treating substrates
01/12/2011EP2273573A1 Nitride semiconductor element and method for manufacturing same
01/12/2011EP2273556A2 Device comprising an arrangement of narrow solar cells
01/12/2011EP2273554A1 Vertical metal oxide semiconductor field-effect diode
01/12/2011EP2273553A2 A method for fabricating AlGaN/GaN HEMT devices
01/12/2011EP2273552A2 Methods of fabricating nanstructures and nanowires and devices fabricated therefrom
01/12/2011EP2273548A2 Handle wafer with viewing windows
01/12/2011EP2273547A2 Gate-induced strain for performance improvement of a cmos semiconductor apparatus
01/12/2011EP2273546A1 Method for releasing a component from a thermal release tape
01/12/2011EP2273545A1 Method for insertion bonding and device thus obtained