| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/18/2009 | CN101368983A Digital multimeter having sealed input jack detection arrangement |
| 02/18/2009 | CN101368981A Radio frequency module testing platform |
| 02/18/2009 | CN101368980A Adjustable probe platform |
| 02/18/2009 | CN101368891A Fraction analysis apparatus |
| 02/18/2009 | CN101368872A LED luminous flux measurement apparatus and method |
| 02/18/2009 | CN100463288C Battery device |
| 02/18/2009 | CN100463133C System, equipment and method for automatic testing IC complete device |
| 02/18/2009 | CN100462732C Method for circuit inspection |
| 02/18/2009 | CN100462731C Pattern generator and test apparatus |
| 02/18/2009 | CN100462730C Integrated module with delayed components and method for setting signal, time and position therein |
| 02/18/2009 | CN100462729C On-line monitoring method for winding turn-to-turn short-circuit of distribution generator stator based on multi-criterion mixing |
| 02/18/2009 | CN100462728C Circuit device and method for testing relay switching contacts of a digital output circuit |
| 02/18/2009 | CN100462727C Simulator of AC electronic load suitable to any waveform of AC signal |
| 02/18/2009 | CN100462695C Radiometric level gauge |
| 02/17/2009 | US7493545 Reception system that inhibits transmission of acknowledgment or negative acknowledgment signal for a data channel when control information of a control channel exceeds a reception capability of a receiver |
| 02/17/2009 | US7493543 Determining timing associated with an input or output of an embedded circuit in an integrated circuit for testing |
| 02/17/2009 | US7493542 Arrangement for testing integrated circuits |
| 02/17/2009 | US7493541 Method and system for performing built-in-self-test routines using an accumulator to store fault information |
| 02/17/2009 | US7493540 Continuous application and decompression of test patterns to a circuit-under-test |
| 02/17/2009 | US7493539 Separately controlled scan paths of functional registers providing stimulus/response data |
| 02/17/2009 | US7493538 Low power scan process with connected stimulus and scan paths |
| 02/17/2009 | US7493537 Propagation test strobe circuitry with boundary scan circuitry |
| 02/17/2009 | US7493536 IC input memory with dual data and dual control inputs |
| 02/17/2009 | US7493535 JTAG circuit transferring data between devices on TCK terminals |
| 02/17/2009 | US7493532 Methods and structure for optimizing SAS domain link quality and performance |
| 02/17/2009 | US7493530 Method and apparatus for detecting an error in a bit sequence |
| 02/17/2009 | US7493434 Determining the value of internal signals in a malfunctioning integrated circuit |
| 02/17/2009 | US7493426 Data communication method and apparatus utilizing programmable channels for allocation of buffer space and transaction control |
| 02/17/2009 | US7493419 Input/output workload fingerprinting for input/output schedulers |
| 02/17/2009 | US7493408 USB host protocol |
| 02/17/2009 | US7493226 Method and construct for enabling programmable, integrated system margin testing |
| 02/17/2009 | US7492791 Ranging and round trip delay timing adjustment in a multi-point to point bidirectional communication system |
| 02/17/2009 | US7492724 Method for data transmission |
| 02/17/2009 | US7492717 Method and apparatus for multi-path load balancing using multiple metrics |
| 02/17/2009 | US7492714 Method and apparatus for packet grooming and aggregation |
| 02/17/2009 | US7492711 Link sizing based on both user behavior and traffic characteristics |
| 02/17/2009 | US7492707 Transmitting device for assigning data for receiving device selected from plurality of receiving devices to shared channel |
| 02/17/2009 | US7492705 Changing line cards associated with a communications network |
| 02/17/2009 | US7492181 Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range |
| 02/17/2009 | US7492180 Apparatus and methods for performing a test |
| 02/17/2009 | US7492179 Systems and methods for reducing testing times on integrated circuit dies |
| 02/17/2009 | US7492178 Method and apparatus for testing a hall magnetic field sensor on a wafer |
| 02/17/2009 | US7492177 Bendable conductive connector |
| 02/17/2009 | US7492176 Prober and probe contact method |
| 02/17/2009 | US7492175 Membrane probing system |
| 02/17/2009 | US7492174 Testing apparatus for surface mounted connectors |
| 02/17/2009 | US7492173 Probe accessories, and methods for probing test points using same |
| 02/17/2009 | US7492172 Chuck for holding a device under test |
| 02/17/2009 | US7492170 Probe based information storage for probes used for opens detection in in-circuit testing |
| 02/17/2009 | US7492163 Systems, devices, and methods for arc fault detection |
| 02/17/2009 | US7492162 Inverter system |
| 02/17/2009 | US7492160 Device and method for measuring individual cell voltages in a cell stack of an energy accumulator |
| 02/17/2009 | US7492147 Wafer probe station having a skirting component |
| 02/17/2009 | US7492146 Impedance controlled via structure |
| 02/17/2009 | US7492143 Method and structure for variable pitch microwave probe assembly |
| 02/17/2009 | US7492126 Secondary cell residual capacity calculation method and battery pack |
| 02/17/2009 | US7492124 Method and system for battery protection |
| 02/17/2009 | US7492105 Method of detecting an arc in a glow-discharge device and apparatus for controlling a high-frequency arc discharge |
| 02/17/2009 | US7491986 Semiconductor integrated circuit device |
| 02/17/2009 | US7491970 IC with comparator receiving expected and mask data from pads |
| 02/17/2009 | US7491620 Method and structures for indexing dice |
| 02/17/2009 | US7491556 Efficient method of forming and assembling a microelectronic chip including solder bumps |
| 02/17/2009 | US7490478 Dynamic spray system |
| 02/13/2009 | CA2636675A1 Polarity tester for an electronic communication port |
| 02/12/2009 | WO2009021210A1 A rack system and a method for processing manufactured products |
| 02/12/2009 | WO2009020372A1 Apparatus and method for sensing leakage current of battery |
| 02/12/2009 | WO2009020367A1 Apparatus and method for sensing battery cell voltage using isolation capacitor |
| 02/12/2009 | WO2009019944A1 Socket for testing semiconductor device |
| 02/12/2009 | WO2009018928A1 Contactless measuring system |
| 02/12/2009 | WO2009018850A1 Method for determining the magnetic leakage flux coupling of a transformer |
| 02/12/2009 | WO2009018822A1 Method for the detection of flaws characterizable by interruptions in conductive track networks |
| 02/12/2009 | WO2009002696A3 Adding virtual features via real world accessories |
| 02/12/2009 | WO2008152238A3 Method of diagnosing defective elements in a standalone system, powered by an intermittent power source |
| 02/12/2009 | WO2008042455A3 System and method for presenting multiple transaction options in a portable device |
| 02/12/2009 | WO2007081522A3 A probe array structure and a method of making a probe array structure |
| 02/12/2009 | WO2007065012A3 Apparatus and method for adjusting an orientation of probes |
| 02/12/2009 | US20090044070 System and method for trellis decoding in a multi-pair transceiver system |
| 02/12/2009 | US20090044064 Scan path circuit and semiconductor integrated circuit |
| 02/12/2009 | US20090044063 Semiconductor memory device and test system of a semiconductor memory device |
| 02/12/2009 | US20090044062 Method of testing a memory module and hub of the memory module |
| 02/12/2009 | US20090044054 Dynamic critical path detector for digital logic circuit paths |
| 02/12/2009 | US20090042445 Joint connector |
| 02/12/2009 | US20090042322 Method for inspecting semiconductor device |
| 02/12/2009 | US20090041060 Cross Link Multiplexer Bus |
| 02/12/2009 | US20090040922 Efficient protection mechanisms in a ring topology network utilizing label switching protocols |
| 02/12/2009 | US20090040920 Byzantine-Fault Tolerant Self-Stabilizing Protocol for Distributed Clock Synchronization Systems |
| 02/12/2009 | US20090040514 Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool |
| 02/12/2009 | US20090040059 Apparatus to Monitor Process-Based Parameters of an Integrated Circuit (IC) Substrate |
| 02/12/2009 | US20090039912 Method of Acceptance for Semiconductor Devices |
| 02/12/2009 | US20090039911 Method to monitor substrate viability |
| 02/12/2009 | US20090039909 Semiconductor device having contact failure detector |
| 02/12/2009 | US20090039908 Microstructure inspecting apparatus and microstructure inspecting method |
| 02/12/2009 | US20090039907 Probe card for semiconductor test |
| 02/12/2009 | US20090039905 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
| 02/12/2009 | US20090039903 Contact load measuring apparatus and inspecting apparatus |
| 02/12/2009 | US20090039898 Alternator and starter tester with alternator cable check |
| 02/12/2009 | US20090039897 Systems and Methods for Scan Chain Testing Using Analog Signals |
| 02/12/2009 | US20090039896 Extrusion failure monitor structures |
| 02/12/2009 | US20090039895 Method of detecting faulty via holes in printed circuit boards |
| 02/12/2009 | US20090039894 Stage-Fused Transformer Loop System and Method of Rapid Diagnosis of Fault Cable or Transformer Failure Within The System |