Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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05/02/1991 | EP0425070A2 One out of N checking apparatus and method |
05/02/1991 | EP0425044A1 Device for charging a battery |
05/02/1991 | EP0424825A2 Method for measuring DC current/voltage characteristic of semi-conductor device |
05/02/1991 | EP0424696A2 Structure for testing the operability of a completed printed circuit board, process for fabricating same and process for testing same. |
05/02/1991 | EP0424612A2 Apparatus and method for real time data error capture and compression for redundancy analysis of a memory |
05/02/1991 | EP0424598A2 Method for detecting partial discharge in an insulation of an electric power cable |
05/02/1991 | DE3935520A1 Cascade transformer tester with visual good-bad display - gives rapid indication of correct or incorrect functioning and readily locates HV connection base point |
05/01/1991 | CN2076287U Wireless intelligence street lamp monitor |
05/01/1991 | CN2076241U Explosion-proof earthing controller |
05/01/1991 | CN1051088A Automatic testing meter for electrical absorptance |
05/01/1991 | CA2028765A1 Block heater tester |
04/30/1991 | US5012471 Value-strength based test pattern generator and process |
04/30/1991 | US5012194 Method testing electron discharge tubes |
04/30/1991 | US5012186 Electrical probe with contact force protection |
04/30/1991 | US5012185 Semiconductor integrated circuit having I/O terminals allowing independent connection test |
04/30/1991 | US5012180 System for testing internal nodes |
04/30/1991 | US5012176 Apparatus and method for calorimetrically determining battery charge state |
04/30/1991 | US5012115 Device for optically detecting hold position of electronic component with dual emitters |
04/30/1991 | US5012100 Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits |
04/30/1991 | US5011960 Wiring pattern detection method and apparatus |
04/30/1991 | CA1283721C Device for use in an apparatus for detecting and locating information about an event |
04/30/1991 | CA1283704C Resistive fault location method and device for use on electrical cables |
04/30/1991 | CA1283701C Motor test apparatus, system and method |
04/27/1991 | CA2027473A1 Test device for a bus with two pairs of conductors |
04/27/1991 | CA2025952A1 Embedded testing circuit and method for fabricating same |
04/25/1991 | DE3935585A1 Model-supported test system for electrical machines or drives - has electronic RPM counter without mechanical coupling matching output waveform of VCO to input waveform of PLL |
04/24/1991 | EP0424270A2 Electro-emissive laser stimulated test |
04/24/1991 | EP0424105A2 Method of fabricating a contact device |
04/24/1991 | EP0423918A2 Battery voltage discriminator circuit |
04/24/1991 | EP0423483A2 Procedure for determining the state of charge of an accumulator |
04/24/1991 | CN2075787U Digital display tramegger for absorptance |
04/24/1991 | CN2075786U Digital display connection made for electric transformer and group configuration measuring instrument |
04/24/1991 | CN2075775U Monitor for insulation oveheat of generater |
04/24/1991 | CN1050931A Multi-functional indicator lamp of one-phase and three-phase alternating current motor |
04/23/1991 | US5010552 Device and method for the generation of test vectors and testing method for integrated circuits |
04/23/1991 | US5010447 Divided capacitor mounting pads |
04/23/1991 | US5010446 Multi-edge extender board |
04/23/1991 | US5010297 Automatic test equipment with active load having high-speed inhibit mode switching |
04/23/1991 | US5010296 Wafer prober |
04/23/1991 | US5010294 Method for topically-resolved determination of the diffusion length of minority charge carriers in a semiconductor crystal body with the assistance of an electrolytic cell |
04/23/1991 | US5010019 Method of making a semiconductor device operating in high frequency range |
04/23/1991 | US5009609 Contact shutter device in IC socket |
04/23/1991 | US5009075 Fault determination test method for systems including an electronic expansion valve and electronic controller |
04/23/1991 | CA1283489C Method and circuit for testing the reliability of integrated circuit chips |
04/23/1991 | CA1283450C Test system for electronic devices with radio frequency signatureextraction means |
04/23/1991 | CA1283448C Device for measuring the characteristics of a microwave component |
04/23/1991 | CA1283446C Circuit breaker test kit |
04/21/1991 | CA2027190A1 Electro-emissive laser stimulated test |
04/18/1991 | DE4030790A1 Abtastregister und testschaltkreis, der dieses benutzt Scan register and test circuitry that uses this |
04/18/1991 | CA2017769A1 Combined motor tester and pulse train monitor for stepper motors |
04/17/1991 | EP0422930A2 Semiconductor integrated circuit devices |
04/17/1991 | EP0422912A2 Semiconductor integrated circuit device having test circuit |
04/17/1991 | CN2075401U Voltage regulator for silicon rectifying generator having failur display |
04/17/1991 | CN1012406B Optical receptor |
04/16/1991 | US5008626 Direct current miniature lamp tester |
04/16/1991 | US5008618 Scan test apparatus for asynchronous circuitry |
04/16/1991 | US5008617 Functional testing of ultra large area, ultra large scale integrated circuits |
04/16/1991 | US5008614 TAB frame and process of testing same |
04/16/1991 | US5008613 Voltage tester for graduated optical display of a voltage and method for its manufacture |
04/16/1991 | US5007846 Specialized frame for retaining an edge connector on a printed circuit board |
04/16/1991 | US5007735 Method of characterizing bistable semiconductor lasers |
04/16/1991 | US5007163 Non-destructure method of performing electrical burn-in testing of semiconductor chips |
04/11/1991 | DE4029293A1 Detecting defects in electrical components - has internal protection for high voltage capacitor battery in h circuit using current converter measurement devices |
04/10/1991 | EP0421693A2 Memory self-test |
04/10/1991 | EP0421574A2 Firing circuit |
04/10/1991 | EP0421573A2 Firing circuit with three crash sensors |
04/10/1991 | CN2074942U High-voltage switch cabinet |
04/10/1991 | CN2074917U Simple charge diplaying device |
04/09/1991 | US5006812 Power amplifier with built-in test circuit |
04/09/1991 | US5006808 Testing electrical circuits |
04/09/1991 | US5006807 Method for determining undershoot resistance of an electronic device |
04/09/1991 | US5006796 Temperature control instrument for electronic components under test |
04/09/1991 | US5006795 Charged beam radiation apparatus |
04/09/1991 | US5006794 Module for preventing instability in integrated circuit testers |
04/09/1991 | US5006792 Flip-chip test socket adaptor and method |
04/09/1991 | US5006788 Method and apparatus for monitoring electromagnetic emission levels |
04/09/1991 | US5006787 Self-testing circuitry for VLSI units |
04/09/1991 | US5006778 Motor diagnostics and electronic control for a clothers dryer |
04/09/1991 | US5006769 Arrangement for detecting winding shorts in the rotor winding of electrical machines |
04/09/1991 | US5006717 Method of evaluating a semiconductor device and an apparatus for performing the same |
04/09/1991 | US5006295 Method for making a plurality of like printed circuit board test pieces and arranging them relative to one another cutting along a hole row center plane |
04/09/1991 | CA1282883C Remote disconnection and short-circuiting apparatus and method |
04/09/1991 | CA1282830C Apparatus and method for testing auto electronics systems |
04/04/1991 | WO1991004498A1 Test circuit |
04/04/1991 | WO1991004497A1 Method and apparatus for the localization of a power conductor, preferably a short-circuit |
04/04/1991 | WO1991004495A1 Temperature-compensated apparatus for monitoring current having reduced sensitivity to supply voltage |
04/04/1991 | WO1991003014A3 Method and apparatus for high precision weighted random pattern generation |
04/04/1991 | CA2020324A1 Firing circuit |
04/03/1991 | EP0420767A1 Vector analyser for millimeter and/or submillimeter network |
04/03/1991 | EP0420690A2 Electric inspection unit using anisotropically electroconductive sheet and process for producing the anisotropically electroconductive sheet |
04/03/1991 | EP0420530A1 Apparatus and method for adaptively predicting battery discharge reserve time |
04/03/1991 | EP0420398A2 Method for acquiring data in a logic analyzer |
04/03/1991 | EP0420388A2 Test latch circuit |
04/03/1991 | EP0420210A2 Lamp inoperable-state detecting circuit and large display apparatus equipped with the same |
04/03/1991 | EP0420082A2 Digitally synchronized sweep signal source |
04/03/1991 | EP0419734A1 Method for testing a hierarchically organised integrated circuit device, and integrated circuit device suitable for being so tested |
04/03/1991 | EP0185714B1 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine |
04/03/1991 | CN2074460U Non-grounded dc system earth tester |
04/03/1991 | CN1050465A Synthetic equivalent test circuit of circuit breaker |
04/03/1991 | CN1050444A Multifunctional phase-sequence meter |