Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1991
01/30/1991CN1048926A Multifunctional active measuring device for locamotive signal
01/29/1991US4989209 Method and apparatus for testing high pin count integrated circuits
01/29/1991US4989175 High speed on-chip clock phase generating system
01/29/1991US4989146 Automotive trouble diagnosing system
01/29/1991US4988949 Apparatus for detecting excessive chafing of a cable arrangement against an electrically grounded structure
01/29/1991CA1279704C Apparatus and method for automatic lead fail detection in electrocardiography
01/29/1991CA1279697C Tester for terminal post resistance for an energy storage element connected in an electrical circuit
01/28/1991CA2016003A1 Apparatus and method for testing printed circuit boards
01/24/1991DE3923961A1 Manipulator esp. for use with conventional microscope - has two thrust unit arrangement with small dimensions perpendicular to thrust unit directions of motion
01/23/1991EP0409398A2 Test cell for non-contact testing of electrical circuits for open/short circuiting
01/23/1991EP0408970A2 Circuit for input and output of test signals for testing a circuit with analog and digital circuits
01/23/1991EP0408867A2 Device for testing electrical loads of a car which are connected with a direct current source
01/23/1991EP0408863A2 Tab mounted chip burn-in structure
01/23/1991EP0408813A1 Partial discharge detection method and apparatus
01/23/1991CN2070006U Electronic tester of regulator
01/23/1991CN2070004U Portable tester
01/22/1991US4987366 Oscillator damped test and evaluation circuit for a proximity switch
01/22/1991US4987365 Method and apparatus for testing integrated circuits
01/22/1991US4987316 Passenger restraint firing circuit
01/22/1991US4986778 Carrier for use in testing circuit boards
01/22/1991US4986760 Socket for tab burn-in and test
01/17/1991DE3922900A1 Monitoring of electromagnetic actuator - using circuit coupled to microprocessor to provide input that can be compared with reference to identify fault
01/17/1991DE3922548A1 Arrangement for testing cables, esp. looms, with plug connectors - with coupling element with clamping device contg. elastically-deformable elements
01/17/1991DE3922479A1 Parameter adjusting in voltage model actual values - determining amount of magnetising and torque generating components for rated operation
01/16/1991EP0408425A1 Component net test appliance especially for an electronic circuit
01/16/1991EP0408353A2 Semiconductor integrated circuit
01/16/1991EP0408299A2 Semiconductor integrated circuit device and test method therefor
01/16/1991EP0408094A2 General purpose avionics display monitor
01/16/1991EP0408018A2 A method and apparatus for performing automatic test pattern generation
01/16/1991EP0407835A2 Atomic force microscope
01/16/1991EP0407787A1 Test device for printed circuit cards and its application for testing printed circuit boards, forming a multiplexer-demultiplexer arrangement for numerical signals
01/16/1991EP0407522A1 State-of-charge indications
01/16/1991CN2069569U Numeral speedy wire checking instrumest
01/16/1991CN2069568U Special-purpose test pencil for car
01/15/1991US4985917 Personal artificial loop (p.a.l.)
01/15/1991US4985843 Digital locator
01/15/1991US4985681 Particle beam measuring method for non-contact testing of interconnect networks
01/15/1991US4985676 Method and apparatus of performing probing test for electrically and sequentially testing semiconductor device patterns
01/15/1991US4985675 Multi-layer tolerance checker
01/15/1991US4985674 Real time, hostile environment, memory tester interface
01/15/1991US4985673 Method and system for inspecting plural semiconductor devices
01/15/1991US4985672 Test equipment for a low current IC
01/15/1991US4985628 Inspection apparatus incorporating digital electron detection
01/15/1991CA1279108C Look ahead terminal counter
01/15/1991CA1279107C Multi-mode counter network
01/10/1991WO1991000527A2 Method and apparatus for locating faults in electronic units
01/10/1991WO1991000526A1 Cable fault tracing systems
01/10/1991DE3921628A1 Assembler and disassembler process for microprocessors - has modules for conversion of inputs into code for use by processor
01/10/1991DE3921594A1 Pulse echo measurement appts. with automatic threshold matching - measures time between sent and received pulse to register fault type in two=wire and coaxial leads
01/10/1991DE3920629A1 Ascertaining capacity and charge of nickel-cadmium accumulator - using charging and discharging circuits, voltage measurer, control and input and display units
01/09/1991EP0407186A2 Work station monitor
01/09/1991EP0407131A2 Contact
01/09/1991EP0407127A2 Mode programmable VLSI data registers
01/09/1991EP0407036A2 Connection test system
01/09/1991EP0407029A2 Method for a below a minute burn-in
01/09/1991EP0406919A2 Arrangement for electronically testing printed circuits with extremely fine contact-point screen
01/09/1991EP0406809A2 Method and apparatus for determining the loop impedance at the operation
01/09/1991EP0406312A1 Electronic battery testing device
01/09/1991CN2069121U Arrangments for testing pull switches
01/09/1991CN2069119U Multi-purpose determination apparatus in electron and electric appliance
01/08/1991US4984250 DC termination circuit for subscriber cables
01/08/1991US4984185 Portable computer having a battery voltage detecting circuit
01/08/1991US4983924 Trigger circuit
01/08/1991US4983911 Voltage imaging system using electro-optics
01/08/1991US4983908 Probing card for wafer testing and method of manufacturing the same
01/08/1991US4983830 Focused ion beam apparatus having charged particle energy filter
01/08/1991US4983827 Linescan apparatus for detecting salient pattern of a product
01/08/1991CA1278880C Apparatus for measuring characteristics of electronic devices
01/05/1991CA2020152A1 Contact
01/03/1991CA2017854A1 Automated fault insertion in electronic circuit board
01/02/1991EP0405802A2 Electrooptic apparatus for the measurement of ultrashort electrical signals
01/02/1991EP0405737A2 Method and apparatus for non-contact opens/shorts testing of electrical circuits
01/02/1991EP0405726A2 Context switching system
01/02/1991EP0405672A1 Method of measuring a voltage distribution across a conductor pattern
01/02/1991EP0405586A1 Semiconductor device and method of burning in the same
01/02/1991EP0404995A1 Integrated-circuit array
01/02/1991EP0404970A1 Method and system for contactless testing of electronic activity in an integrated circuit chip-to-test after passivation thereof
01/02/1991EP0211087B1 Test pattern generator
01/02/1991CN1048265A Apparatus for impact testing for electric generator stator wedge tightness
01/02/1991CN1011085B Circuit arrangement for testing integrated circuit components
01/02/1991CN1011084B Testing-measuring system and method for variant electronic device
01/02/1991CN1011083B Apparatus for detecting position of internal fault of gas insulated bus
01/02/1991CN1011081B Method for measuring arc-breaking parameter of welding ac arc and its equipment
01/02/1991CA1278609C Multi-channel modulated numerical frequency synthesizer
01/01/1991US4982403 Electrical circuit testing device and circuit comprising the said device
01/01/1991US4982361 Multiple loop parallel pipelined logic simulation system
01/01/1991US4982163 Method and a device for the determination of the condition of the insulation of an object coated with an electric insulation
01/01/1991US4982153 Method and apparatus for cooling an integrated circuit chip during testing
01/01/1991US4982152 Voltage detecting device
01/01/1991US4981817 Tab method for implementing dynamic chip burn-in
01/01/1991US4981764 Method of providing a indication signal to indicate a level of electrolyte in a wet cell
12/1990
12/31/1990WO1991000523A1 Portable low power computer
12/27/1990WO1990015999A1 Test pattern generator
12/27/1990WO1990015998A1 Object detection and analysis with transmission lines
12/27/1990EP0404482A2 Simulation of selected logic circuit designs
12/27/1990EP0404444A1 Apparatus and method for performing spike analysis in a logic simulator
12/27/1990EP0404143A1 Load monitoring circuit with alternating current working in railway systems
12/27/1990EP0403835A2 Apparatus for impact testing for electric generator stator wedge tightness
12/27/1990EP0403821A2 Semiconductor integrated circuit device incorporating a test circuit
12/27/1990EP0403547A1 Method of and apparatus for testing multi-wire cable