Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/12/1990 | CN2062059U Leakage indicator for insulator |
09/12/1990 | CN2062058U Portable program control short way grounding device |
09/12/1990 | CN1045299A Triode current measuring device for cathode ray tube |
09/11/1990 | US4956818 Memory incorporating logic LSI and method for testing the same LSI |
09/11/1990 | US4956739 Device for locating internal faults in a high-voltage capacitor battery |
09/11/1990 | US4956605 Tab mounted chip burn-in apparatus |
09/11/1990 | US4956603 Method and apparatus for measuring the lifetime on P-N semiconductor junctions by photovoltaic effect |
09/11/1990 | US4956602 Wafer scale testing of redundant integrated circuit dies |
09/11/1990 | US4955726 Perfluoropolyethers used as fluids for testing in electronic field |
09/11/1990 | US4955131 Method of building a variety of complex high performance IC devices |
09/11/1990 | CA1273999A1 Apparatus and method for testing contact interruptions of circuit interconnection devices |
09/07/1990 | WO1990010242A2 Aircraft battery status monitor |
09/07/1990 | WO1990010241A1 Method and apparatus for automatically calculating the integrity of an electrical coil |
09/07/1990 | WO1990010240A1 A method for testing the operational efficiency of a component of an electronic circuit |
09/07/1990 | WO1990008328A3 Method and apparatus for controlling an equipped printed circuit card, particularly for controlling the welding seams of the card |
09/07/1990 | WO1990006520A3 Electrographic process for generating an electrical image signal |
09/06/1990 | DE4006298A1 Einspritzventil-diagnosesystem Injector diagnostic system |
09/05/1990 | EP0385702A2 Method for electrically detecting positional deviation of contact hole in semiconductor device |
09/05/1990 | EP0385591A2 Serial testing technique for embedded memories |
09/05/1990 | EP0385474A2 Method of and apparatus for inspecting printed circuit boards |
09/05/1990 | EP0250620B1 Method and device for electrically testing printed circuits |
09/05/1990 | CN2061698U Accumulator voltage monitoring alarm |
09/05/1990 | CN2061697U Miniature universaltest |
09/05/1990 | CN2061696U Electrical leakage tester |
09/05/1990 | CN2061695U Test pencil for check and inspection of automotive vehicle |
09/04/1990 | US4954774 Automatic control system of integrated circuits |
09/04/1990 | US4954773 Voltage measurement with an electron probe without external trigger signal |
09/04/1990 | US4954772 Test method of an electrostatic breakdown of a semiconductor device and an apparatus therefor |
09/04/1990 | US4954713 Device for characterizing semiconductor samples by photoluminescence with high spatial resolution and at low temperature |
09/04/1990 | US4954705 Method for examining a specimen in a particle beam instrument |
09/04/1990 | US4953983 Non-destructively measuring local carrier concentration and gap energy in a semiconductor |
09/04/1990 | US4953283 Method of handling electronic component chips |
09/04/1990 | US4953277 Manufacturing process for an electronic device |
09/04/1990 | CA1273706A1 Method and apparatus for isolating faults in a digital logic circuit |
09/04/1990 | CA1273688A1 Diagnosis switch |
09/04/1990 | CA1273678A1 Calibrated automatic test system |
08/30/1990 | DE3905798A1 Method for measuring damage in at least one area of a semiconductor wafer during the treatment of the semiconductor wafer |
08/29/1990 | EP0384599A1 Integrated circuit test structure and test process |
08/29/1990 | CN2061295U Acousto-optic test pencil |
08/29/1990 | CN2061294U Multifunctional test pencil |
08/28/1990 | US4953096 Test method and apparatus for distributed system |
08/28/1990 | US4952915 Failed electrical component detector for multiphase electric machines |
08/28/1990 | US4952881 Electrical test device |
08/28/1990 | US4952880 Apparatus for testing and counting flaws in the insulation of an electrical conductor passing through an electrode |
08/28/1990 | US4952872 Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid |
08/28/1990 | US4952871 Method and apparatus of testing printed circuit boards and assembly employable therewith |
08/28/1990 | US4952862 Apparatus and method for adaptively predicting battery discharge reserve time |
08/28/1990 | US4952272 Etching a protecting conductive layer on an electrode pad |
08/28/1990 | US4952063 Method and apparatus for evaluating surface and subsurface features in a semiconductor |
08/28/1990 | US4951385 Electrical harness assembly apparatus |
08/23/1990 | WO1990009601A1 Conductor tracing system |
08/23/1990 | WO1990009598A1 A device for monitoring and indicating a given minimum battery power reserve |
08/23/1990 | DE4004427A1 Diagnostic fault test system and circuit |
08/23/1990 | DE4004413A1 Fehlerfeststellsystem fuer elektrische schaltungen Error detection system for electrical circuits |
08/22/1990 | EP0383653A1 System for testing pieces of cables |
08/22/1990 | EP0383182A2 Probe unit |
08/22/1990 | EP0383158A2 Lightwave component analyzer |
08/22/1990 | EP0383140A2 Process and appliance for testing windings for short circuits |
08/22/1990 | EP0383139A2 Process and appliance for testing windings for short circuits |
08/22/1990 | CN2060898U Arrangement for indicating electrical condition |
08/22/1990 | CN2060897U Intelligent on-line multi-test electric meter |
08/22/1990 | CN2060896U Arrange for monitoring high-voltage circuit |
08/22/1990 | CN2060895U Test arrangement used in signal railcar of shift frequency locomotive |
08/22/1990 | CN2060893U Test pencil for automobiles |
08/22/1990 | CN1009312B Method of measuring the hysteresis loop of a ferroelectric by computer |
08/21/1990 | US4951254 Static memory unit having a plurality of test modes, and computer equipped with such units |
08/21/1990 | US4951220 Method and apparatus for manufacturing a test-compatible, largely defect-tolerant configuration of redundantly implemented, systolic VLSI systems |
08/21/1990 | US4950997 Diagnostic testing device for seed tube sensors |
08/21/1990 | US4950982 Electric probing test machine |
08/21/1990 | US4950977 Method of measuring mobile ion concentration in semiconductor devices |
08/21/1990 | US4950957 Extended ion sources and method for using them in an insulation defect detector |
08/21/1990 | US4950921 Semiconductor integrated circuit having a built-in voltage generator for testing at different power supply voltages |
08/21/1990 | US4950913 Programmable timer power switch unit |
08/21/1990 | CA1273098A1 Dynamic air gap measuring device for use with rotating electrical machinery |
08/21/1990 | CA1273063A1 Adjustable impedance driver network |
08/21/1990 | CA1273062A1 Programmable logic array |
08/21/1990 | CA1273061A1 Active load network |
08/21/1990 | CA1273060A1 Device for the emi testing of electronic systems |
08/21/1990 | CA1272944A1 Perfluoropolyethers used as fluid for testing in electronic field |
08/16/1990 | EP0382428A2 Test fixture for microstrip assemblies |
08/16/1990 | EP0382360A2 Event qualified testing architecture for integrated circuits |
08/16/1990 | EP0382264A2 IC test equipment |
08/16/1990 | EP0382184A2 Circuit for testability |
08/16/1990 | EP0381890A1 Current monitoring |
08/16/1990 | EP0381679A1 Electronic assembly with self-test circuit |
08/15/1990 | CN2060554U Multifunction electronic remote sensing domestic electrical appliances safety combination tools |
08/14/1990 | US4949362 System for detecting and limiting electrical ground faults within electrical devices |
08/14/1990 | US4949341 Built-in self test method for application specific integrated circuit libraries |
08/14/1990 | US4949290 Method and apparatus for defining test sequences for a signal measurement system |
08/14/1990 | US4949274 Test meters |
08/14/1990 | US4949046 Battery state of charge indicator |
08/14/1990 | US4949035 Connector alignment verification and monitoring system |
08/14/1990 | US4949034 Method for contactless evaluation of characteristics of semiconductor wafers and devices |
08/14/1990 | US4949033 LSI system including a plurality of LSI circuit chips mounted on a board |
08/14/1990 | US4949001 Partial discharge detection method and apparatus |
08/14/1990 | US4947546 Method of making a cable assembly |
08/14/1990 | US4947545 Automated burn-in system |
08/13/1990 | CA2009871A1 Cale element testing equipment |
08/09/1990 | WO1990009024A1 Integrated semiconductor store |
08/09/1990 | WO1990008964A1 Process for producing test patterns for a component |