Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/1990
09/12/1990CN2062059U Leakage indicator for insulator
09/12/1990CN2062058U Portable program control short way grounding device
09/12/1990CN1045299A Triode current measuring device for cathode ray tube
09/11/1990US4956818 Memory incorporating logic LSI and method for testing the same LSI
09/11/1990US4956739 Device for locating internal faults in a high-voltage capacitor battery
09/11/1990US4956605 Tab mounted chip burn-in apparatus
09/11/1990US4956603 Method and apparatus for measuring the lifetime on P-N semiconductor junctions by photovoltaic effect
09/11/1990US4956602 Wafer scale testing of redundant integrated circuit dies
09/11/1990US4955726 Perfluoropolyethers used as fluids for testing in electronic field
09/11/1990US4955131 Method of building a variety of complex high performance IC devices
09/11/1990CA1273999A1 Apparatus and method for testing contact interruptions of circuit interconnection devices
09/07/1990WO1990010242A2 Aircraft battery status monitor
09/07/1990WO1990010241A1 Method and apparatus for automatically calculating the integrity of an electrical coil
09/07/1990WO1990010240A1 A method for testing the operational efficiency of a component of an electronic circuit
09/07/1990WO1990008328A3 Method and apparatus for controlling an equipped printed circuit card, particularly for controlling the welding seams of the card
09/07/1990WO1990006520A3 Electrographic process for generating an electrical image signal
09/06/1990DE4006298A1 Einspritzventil-diagnosesystem Injector diagnostic system
09/05/1990EP0385702A2 Method for electrically detecting positional deviation of contact hole in semiconductor device
09/05/1990EP0385591A2 Serial testing technique for embedded memories
09/05/1990EP0385474A2 Method of and apparatus for inspecting printed circuit boards
09/05/1990EP0250620B1 Method and device for electrically testing printed circuits
09/05/1990CN2061698U Accumulator voltage monitoring alarm
09/05/1990CN2061697U Miniature universaltest
09/05/1990CN2061696U Electrical leakage tester
09/05/1990CN2061695U Test pencil for check and inspection of automotive vehicle
09/04/1990US4954774 Automatic control system of integrated circuits
09/04/1990US4954773 Voltage measurement with an electron probe without external trigger signal
09/04/1990US4954772 Test method of an electrostatic breakdown of a semiconductor device and an apparatus therefor
09/04/1990US4954713 Device for characterizing semiconductor samples by photoluminescence with high spatial resolution and at low temperature
09/04/1990US4954705 Method for examining a specimen in a particle beam instrument
09/04/1990US4953983 Non-destructively measuring local carrier concentration and gap energy in a semiconductor
09/04/1990US4953283 Method of handling electronic component chips
09/04/1990US4953277 Manufacturing process for an electronic device
09/04/1990CA1273706A1 Method and apparatus for isolating faults in a digital logic circuit
09/04/1990CA1273688A1 Diagnosis switch
09/04/1990CA1273678A1 Calibrated automatic test system
08/1990
08/30/1990DE3905798A1 Method for measuring damage in at least one area of a semiconductor wafer during the treatment of the semiconductor wafer
08/29/1990EP0384599A1 Integrated circuit test structure and test process
08/29/1990CN2061295U Acousto-optic test pencil
08/29/1990CN2061294U Multifunctional test pencil
08/28/1990US4953096 Test method and apparatus for distributed system
08/28/1990US4952915 Failed electrical component detector for multiphase electric machines
08/28/1990US4952881 Electrical test device
08/28/1990US4952880 Apparatus for testing and counting flaws in the insulation of an electrical conductor passing through an electrode
08/28/1990US4952872 Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid
08/28/1990US4952871 Method and apparatus of testing printed circuit boards and assembly employable therewith
08/28/1990US4952862 Apparatus and method for adaptively predicting battery discharge reserve time
08/28/1990US4952272 Etching a protecting conductive layer on an electrode pad
08/28/1990US4952063 Method and apparatus for evaluating surface and subsurface features in a semiconductor
08/28/1990US4951385 Electrical harness assembly apparatus
08/23/1990WO1990009601A1 Conductor tracing system
08/23/1990WO1990009598A1 A device for monitoring and indicating a given minimum battery power reserve
08/23/1990DE4004427A1 Diagnostic fault test system and circuit
08/23/1990DE4004413A1 Fehlerfeststellsystem fuer elektrische schaltungen Error detection system for electrical circuits
08/22/1990EP0383653A1 System for testing pieces of cables
08/22/1990EP0383182A2 Probe unit
08/22/1990EP0383158A2 Lightwave component analyzer
08/22/1990EP0383140A2 Process and appliance for testing windings for short circuits
08/22/1990EP0383139A2 Process and appliance for testing windings for short circuits
08/22/1990CN2060898U Arrangement for indicating electrical condition
08/22/1990CN2060897U Intelligent on-line multi-test electric meter
08/22/1990CN2060896U Arrange for monitoring high-voltage circuit
08/22/1990CN2060895U Test arrangement used in signal railcar of shift frequency locomotive
08/22/1990CN2060893U Test pencil for automobiles
08/22/1990CN1009312B Method of measuring the hysteresis loop of a ferroelectric by computer
08/21/1990US4951254 Static memory unit having a plurality of test modes, and computer equipped with such units
08/21/1990US4951220 Method and apparatus for manufacturing a test-compatible, largely defect-tolerant configuration of redundantly implemented, systolic VLSI systems
08/21/1990US4950997 Diagnostic testing device for seed tube sensors
08/21/1990US4950982 Electric probing test machine
08/21/1990US4950977 Method of measuring mobile ion concentration in semiconductor devices
08/21/1990US4950957 Extended ion sources and method for using them in an insulation defect detector
08/21/1990US4950921 Semiconductor integrated circuit having a built-in voltage generator for testing at different power supply voltages
08/21/1990US4950913 Programmable timer power switch unit
08/21/1990CA1273098A1 Dynamic air gap measuring device for use with rotating electrical machinery
08/21/1990CA1273063A1 Adjustable impedance driver network
08/21/1990CA1273062A1 Programmable logic array
08/21/1990CA1273061A1 Active load network
08/21/1990CA1273060A1 Device for the emi testing of electronic systems
08/21/1990CA1272944A1 Perfluoropolyethers used as fluid for testing in electronic field
08/16/1990EP0382428A2 Test fixture for microstrip assemblies
08/16/1990EP0382360A2 Event qualified testing architecture for integrated circuits
08/16/1990EP0382264A2 IC test equipment
08/16/1990EP0382184A2 Circuit for testability
08/16/1990EP0381890A1 Current monitoring
08/16/1990EP0381679A1 Electronic assembly with self-test circuit
08/15/1990CN2060554U Multifunction electronic remote sensing domestic electrical appliances safety combination tools
08/14/1990US4949362 System for detecting and limiting electrical ground faults within electrical devices
08/14/1990US4949341 Built-in self test method for application specific integrated circuit libraries
08/14/1990US4949290 Method and apparatus for defining test sequences for a signal measurement system
08/14/1990US4949274 Test meters
08/14/1990US4949046 Battery state of charge indicator
08/14/1990US4949035 Connector alignment verification and monitoring system
08/14/1990US4949034 Method for contactless evaluation of characteristics of semiconductor wafers and devices
08/14/1990US4949033 LSI system including a plurality of LSI circuit chips mounted on a board
08/14/1990US4949001 Partial discharge detection method and apparatus
08/14/1990US4947546 Method of making a cable assembly
08/14/1990US4947545 Automated burn-in system
08/13/1990CA2009871A1 Cale element testing equipment
08/09/1990WO1990009024A1 Integrated semiconductor store
08/09/1990WO1990008964A1 Process for producing test patterns for a component