Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1991
11/10/1991WO1991017448A1 Automatic harness testing apparatus
11/10/1991CA2063436A1 Automatic harness testing apparatus
11/07/1991DE4110412A1 Identification appts. for electrical leads and safety devices - comprises received tuned to transmitter connectable to socket in section of power supply installation to be tested
11/07/1991DE4109458A1 Automatic characteristic recorder for photosensitivity and linearity - couples signal path from integrated photosensors to second path in measurement value calculator via offset correction control unit
11/07/1991DE4040410C1 Tooling for crimping electrical connectors - comprises crank press with spring-loaded plunger, connected torsionally to transducer providing displacement measurement
11/07/1991DE4014387A1 Ascertaining actual value of internal voltage of async. machine - deriving ohmic or inductive voltage drop in each winding from measured external machine voltage
11/07/1991DE4014100A1 Electric strength tester for metal encapsulated switchgear - uses small transportable voltage generator connectable to test electrode inbuilt in gas-insulated casing
11/06/1991EP0455562A1 Internal spark detection device for an electrically shielded installation
11/06/1991EP0455537A1 Simulation device for step motor
11/06/1991EP0455406A1 Method of testing control matrices for flat-panel displays
11/06/1991EP0455352A1 Battery state of charge indicator system
11/06/1991EP0455084A2 Accumulator test device for emergency lighting systems
11/06/1991EP0454962A1 Method and device for testing printed circuit cards
11/06/1991EP0454926A2 Drop testing in fiber to the home systems
11/06/1991EP0225364B1 Monitoring state of battery charge
11/06/1991CN1056003A Scan test circuit for use with multiple frequency circuits
11/06/1991CN1055907A Conveyor system and conveying method thereof
11/05/1991US5063516 Smart power driver system for a motor vehicle
11/05/1991US5062204 Method of making a flexible membrane circuit tester
11/05/1991US5062203 Method of making a flexible membrane circuit tester
11/04/1991WO1991017450A1 Buffer integrated circuit providing testing interface
11/04/1991CA2063384A1 Buffer integrated circuit providing testing interface
11/03/1991CA2041697A1 Stepper motor simulator device
10/1991
10/31/1991WO1991016809A1 Process for the assembly and insulation-testing of electronic power components fitted to cooling elements
10/31/1991WO1991016637A1 Device for monitoring the operation of an electrical consumer, its control and the associated connectors
10/31/1991DE4113583A1 Measuring control for capacitor testing and sorting - using standard reference component to provide mean measurement value and standard deviation
10/31/1991DE4013393A1 Electromagnetic valve function monitoring method - measuring coil voltage and/or current fluctuations after applying actuating current
10/31/1991CA2015724A1 Control circuit for a cable tester
10/30/1991EP0454578A1 Process of testing the efficiency of the electromagnetic screening of a conductor, and appliance therefor
10/30/1991EP0454347A2 Vacuum-actuated test fixture for testing electronic components
10/30/1991EP0454320A1 Scan test circuit for use with multiple frequency circuits
10/30/1991EP0454128A2 Electrical apparatus particularly useful as an electromagnetic pulse simulator
10/30/1991EP0454052A2 Data processing device with test circuit
10/30/1991EP0453758A1 Test system comprising integrated circuits for a printed circuit and application of this system for testing said printed circuit
10/30/1991EP0453737A1 Probe for a credit card with moulded semiconductor chip
10/30/1991EP0453716A2 Connector assembly for chip testing
10/30/1991CN2087787U New type position indicator of electric transmission line fault point
10/30/1991CN2087786U Current-leakage voltage-withstand combined tester
10/29/1991US5062110 Logic circuit testing apparatus
10/29/1991US5062109 Memory tester
10/29/1991US5061898 Battery evaluation test system
10/29/1991US5061895 System for detecting and correcting misalignment of semiconductor package leads
10/29/1991US5060844 Interconnection structure and test method
10/25/1991CA2041155A1 Sequence connector assembly
10/25/1991CA2040311A1 Vacuum-actuated test fixture for testing electronic components
10/24/1991DE4012445A1 Partial discharge measuring and/or fault location in HV insulation - using pulse-echo method by charging capacitor, triggering, decoupling, processing and displaying before point of application
10/24/1991DE4012386A1 Controlling safety equipment for driver and/or passengers - measuring voltage of oscillating circuit and rectifying for comparison with stipulated voltage value
10/23/1991EP0453394A2 Dynamic process for the generation of biased pseudo-random test patterns for the functional verification of hardware designs
10/23/1991EP0453236A1 Apparatus for detecting the existence of an abnormality in a vehicle operator protection system
10/23/1991EP0453147A1 Testing electronic components
10/23/1991EP0453106A1 Electrical assemblies
10/23/1991CN2087346U Low-voltage direct-current test pencil
10/22/1991US5060198 Device for the structural testing of an integrated circuit
10/22/1991US5060091 Apparatus and method for hard disk testing
10/22/1991US5060065 Apparatus and method for illuminating a printed circuit board for inspection
10/22/1991US5059913 Apparatus and method for electrical testing of insulating arm sleeves using a conductive liquid and inflatable sealing member
10/22/1991US5059912 Method and apparatus for the interturn and interlayer fault testing of coils
10/22/1991US5059911 Cable fault location detector
10/22/1991US5059899 Semiconductor dies and wafers and methods for making
10/22/1991US5059897 Method and apparatus for testing passive substrates for integrated circuit mounting
10/22/1991US5059895 Battery voltmeter
10/22/1991US5059893 Ac evaluation equipment for an ic tester
10/22/1991US5059889 Parametric measurement unit/device power supply for semiconductor test system
10/22/1991US5059819 Integrated logic circuit
10/22/1991US5058797 Detection method for wire bonding failures
10/22/1991CA1291269C Efficient address test for large memories
10/22/1991CA1291262C Transformer life consumption indicator
10/22/1991CA1291215C Fault detection
10/22/1991CA1291214C Clock monitor for use with vlsi chips
10/22/1991CA1291213C Circuit condition monitoring system
10/22/1991CA1291212C Tester system for electrical power circuits
10/17/1991WO1991015890A1 Arcing fault detector
10/17/1991WO1991015853A1 Very high density wafer scale device architecture
10/17/1991WO1991015777A1 Process for monitoring faults in inductive loads
10/17/1991WO1991015757A1 Apparatus and method for calorimetrically determining battery charge state
10/17/1991DE4111865A1 Test system for electronic control unit for motor vehicle - feeds interrogation signal into control unit which contains type information signal generator
10/17/1991DE4012109A1 Vorrichtung zur funktionsueberwachung eines elektrischen verbrauchers, seiner ansteuerung und der dazugehoerigen verbindungen Apparatus for FUNCTION MONITORING an electric consumer's, its control and travel give them the connections
10/17/1991DE4011231A1 Semiconductor diode testing circuit - measures data in changeover period from conductor to blocking state
10/16/1991EP0452218A2 An apparatus for detecting failure in power system
10/16/1991EP0452114A2 Socket
10/16/1991EP0451584A2 Charge detecting apparatus
10/16/1991EP0451481A2 Test device for earth fault circuit breaker
10/16/1991CN2086908U High-valtage current measurer
10/16/1991CN1014359B Test method for lcd elements
10/15/1991US5058087 Process for determining the electrical duration of signal paths
10/15/1991US5057965 Work station monitor
10/15/1991US5057904 Socket unit for package having pins and pads
10/15/1991US5057780 Method and apparatus for measuring trigger and latchback voltage of a semiconductor device
10/15/1991US5057775 Method of testing control matrices for flat-panel displays
10/15/1991US5057774 Apparatus for measuring the quiescent current of an integrated monolithic digital circuit
10/15/1991US5057773 Method for opens/shorts testing of capacitively coupled networks in substrates using electron beams
10/15/1991US5057772 Method and system for concurrent electronic component testing and lead verification
10/15/1991US5057771 Phase-locked timebase for electro-optic sampling
10/15/1991US5057441 Method for reliability testing integrated circuit metal films
10/15/1991US5057383 Battery system
10/15/1991US5057031 Zero insertion force pin grid array test socket
10/15/1991US5056765 Immobilizing device particularly useful during processing or testing flat workpieces
10/09/1991EP0450938A2 Battery having a label comprising a voltmeter
10/09/1991EP0450808A2 Fault detection and isolation in automotive wiring harness
10/09/1991EP0450807A2 Fault detection and isolation in automotive wiring harness
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