Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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08/14/1991 | CN2082869U High voltage multifunctional testing instrument |
08/14/1991 | CN2082868U Double-channel differential voltage monitoring instrument |
08/13/1991 | US5040150 Semiconductor integrated circuit device |
08/13/1991 | US5039941 Voltage threshold measuring circuit |
08/13/1991 | US5039940 Connector for verifying sequence of transit car controls |
08/13/1991 | US5039939 Calculating AC chip performance using the LSSD scan path |
08/13/1991 | US5039938 Phosphor glow testing of hybrid substrates |
08/13/1991 | US5039929 Automatic charger capable of charging several batteries |
08/13/1991 | US5039878 Temperature sensing circuit |
08/13/1991 | US5039872 Digitally synthesized audio frequency voltage source |
08/13/1991 | US5039850 IC card |
08/13/1991 | US5039602 Method of screening A.C. performance characteristics during D.C. parametric test operation |
08/08/1991 | WO1991011757A1 Control system |
08/08/1991 | WO1991011728A1 Ic testing device |
08/08/1991 | WO1991009319A3 Process and device for verifying the cut-off torque of an actuator |
08/07/1991 | EP0439948A1 Method and apparatus for testing electronic circuit components |
08/07/1991 | EP0439922A2 Integrated circuit transfer test device system utilizing lateral transistors |
08/07/1991 | EP0439921A2 Apparatus and method of testing arbitrary waveforms |
08/07/1991 | EP0225925B1 Cuvette belt faulty seal detector |
08/07/1991 | CN2082422U Connection state testing device of single-phase three-pole socket |
08/06/1991 | US5038349 Method for reducing masking of errors when using a grid-based, "cross-check" test structure |
08/06/1991 | US5038134 Releasing circuit for actuating vehicular safety device |
08/06/1991 | US5038091 Electronic control for an appliance |
08/06/1991 | CA1287409C Test system for random access memory |
08/06/1991 | CA1287372C Partial discharge detection method and apparatus |
08/01/1991 | DE4002531A1 Rapid spectral analysis of recurring signal - by detecting, modulation and mixing of sec. signal caused by exposing integrated circuit to prim. beam |
07/31/1991 | EP0439261A2 Negative feedback high current driver for in-circuit tester |
07/31/1991 | EP0439199A1 Programmable logic device with means for preloading storage cells therein |
07/31/1991 | EP0438957A2 Dry interface thermal chuck system for semiconductor wafer testing |
07/31/1991 | EP0438879A1 Sense wire signal enhancements for insulation defect detection |
07/31/1991 | EP0438705A2 Integrated circuit driver inhibit control method for test |
07/31/1991 | EP0438537A1 A device for monitoring and indicating a given minimum battery power reserve. |
07/31/1991 | EP0438491A1 Testing electrical circuits. |
07/31/1991 | EP0438477A1 Automotive battery status monitor. |
07/31/1991 | EP0207087B1 Re-regulation circuit for automobile tachometer detection circuit |
07/31/1991 | CN2081983U Microcomputerized monitor for electric quantity of motor |
07/31/1991 | CN1013411B Programmable tester with bubble memory |
07/30/1991 | WO1991011727A1 Method and detector for identifying insulator flashover |
07/30/1991 | US5036473 Method of using electronically reconfigurable logic circuits |
07/30/1991 | US5036380 Burn-in pads for tab interconnects |
07/30/1991 | US5036285 Resonant probe and radio frequency coupler |
07/30/1991 | US5036284 Monitor circuits for battery charging and other applications |
07/30/1991 | US5036273 System of measuring a state density in a semi-conductor element and a method using this system |
07/30/1991 | US5036272 Plural test mode selection circuit |
07/30/1991 | US5036230 CMOS clock-phase synthesizer |
07/30/1991 | US5036196 Surface microscope |
07/30/1991 | US5035644 Proper coupling confirming mechanism for an electric connector |
07/30/1991 | US5035629 Electrical connector |
07/30/1991 | CA1287184C Printed circuit board testing employing mechanical isolation |
07/30/1991 | CA1287113C Laser temperature modulation and detection method |
07/30/1991 | CA1287111C Leakage resistance detector and alarm circuit |
07/25/1991 | WO1991011094A2 Probe and inverting apparatus |
07/24/1991 | EP0438363A1 Current measurement circuit in a MOS power transistor |
07/24/1991 | EP0438322A2 Linear feedback shift register |
07/24/1991 | EP0438172A1 Semiconductor memory device having monitoring function |
07/24/1991 | EP0438141A2 A device for detecting residual capacity of a battery |
07/24/1991 | EP0438127A2 Semiconductor wafer |
07/24/1991 | EP0437940A1 Defect position locator for cable insulation monitoring |
07/24/1991 | EP0437559A1 Process and device for controlling and/or regulating the output of an internal combustion engine in a motor vehicle. |
07/24/1991 | EP0437491A1 Method of using electronically reconfigurable gate array logic and apparatus formed thereby. |
07/24/1991 | EP0437423A1 Dc/dc converter. |
07/24/1991 | CN2081591U One-phase triple-pole safety socket |
07/24/1991 | CN2081538U Non-contact gold-measuring pen |
07/24/1991 | CN1013308B Coil winding-direction tester |
07/23/1991 | US5034903 Apparatus and method for measuring the time evolution of carriers propogating within submicron and micron electronic devices |
07/23/1991 | US5034889 Diagnosis system for a motor vehicle |
07/23/1991 | US5034749 Sliding contact test apparatus |
07/23/1991 | US5034727 Monitor system for a connection of a connector in an electric system of a motor vehicle |
07/23/1991 | US5034688 Temperature conditioning support for small objects such as semi-conductor components and thermal regulation process using said support |
07/23/1991 | US5034686 Weapon interface system evaluation apparatus and method |
07/23/1991 | US5034685 Test device for testing integrated circuits |
07/23/1991 | US5034684 Probe device and method of controlling the same |
07/23/1991 | US5034683 Voltage detecting device |
07/23/1991 | US5034678 Method of and apparatus for measuring the frequency response of an electrooptic device using an optical white noise generator |
07/23/1991 | CA1286803C Serial testing technique for embedded memories |
07/23/1991 | CA1286785C Universal programmable counter/timer and address register module |
07/23/1991 | CA1286724C Method and apparatus for monitoring electromagnetic emission levels |
07/18/1991 | DE4100899A1 Control system for test sequences in information processing device - uses graphic interface for test sequence definition in form of data structure and graphical display of test sequence |
07/17/1991 | EP0437386A1 Security latch for i.c. |
07/17/1991 | EP0437218A2 Semiconductor memory tester |
07/17/1991 | EP0437217A2 Memory tester |
07/17/1991 | EP0437214A2 Method for diagnosing an insulation deterioration of an electric apparatus |
07/17/1991 | EP0437034A2 I.F. calibration method |
07/17/1991 | EP0436777A2 Method and apparatus for analog testing of thin film transistor arrays |
07/17/1991 | CN1053155A Pulsating current testing method and circuit thereof for pulsating current motor |
07/17/1991 | CN1053129A Grounding current detection method and device thereof |
07/16/1991 | US5032991 Method for routing conductive paths |
07/16/1991 | US5032826 Core monitor that uses rotor shaft voltages |
07/16/1991 | US5032825 Battery capacity indicator |
07/16/1991 | US5032795 Defect position locator for cable insulation monitoring |
07/16/1991 | US5032791 Apparatus for testing Hall effect device |
07/16/1991 | US5032789 Modular/concurrent board tester |
07/16/1991 | US5032788 Test cell for non-contact opens/shorts testing of electrical circuits |
07/16/1991 | US5032786 Method of a measuring physical properties of buried channel |
07/16/1991 | US5032783 Test circuit and scan tested logic device with isolated data lines during testing |
07/16/1991 | US5032735 Method of and apparatus for inspecting printed circuit boards |
07/16/1991 | CA1286371C Input register for test operand generation |
07/16/1991 | CA1286365C High speed hybrid digital driver |
07/16/1991 | CA1286364C In-place diagnosable electronic circuit board |
07/16/1991 | CA1286363C Technique for determining the values of circuit elements in a threeterminal equivalent circuit |