Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1992
01/15/1992EP0466380A2 Integrated circuit structure analysis
01/15/1992EP0466274A1 Method and apparatus for resistance measurements on a semiconductor element
01/15/1992EP0466155A2 Optical fiber laying structure for electric power cable line trouble occurence location detecting system
01/15/1992EP0466013A2 Method of and device for inspecting pattern of printed circuit board
01/15/1992EP0465793A2 Multiprocessor system for control and diagnostic device in a motor vehicle
01/15/1992EP0414795A4 Voltage controlling and indicating device
01/15/1992EP0216276B1 Semiconductor logic tester with fast-recovery power supply
01/15/1992CN2093402U Broken circuit tester for flashlight with charger
01/15/1992CN2093401U Electrician's detecting tool
01/14/1992US5081687 Method and apparatus for testing LCD panel array prior to shorting bar removal
01/14/1992US5081656 Automated laminography system for inspection of electronics
01/14/1992US5081592 Test system for acquiring, calculating and displaying representations of data sequences
01/14/1992US5081444 Automotive vehicle test equipment with anti-tamper device
01/14/1992US5081442 Fault detector for an air bag system
01/14/1992US5081414 Method for measuring lifetime of semiconductor material and apparatus therefor
01/14/1992US5081297 Software reconfigurable instrument with programmable counter modules reconfigurable as a counter/timer, function generator and digitizer
01/14/1992CA1294373C Printed circuit board testing using non-touching plasma contacting
01/14/1992CA1294372C System for printed circuit board testing
01/14/1992CA1294355C Apparatus for rapid recognition of short-circuits
01/14/1992CA1294329C Method of and apparatus for assessing insulation conditions
01/13/1992WO1992001234A1 Process and apparatus for determining concentration in semiconductors
01/13/1992CA2087189A1 Process and apparatus for determining concentration in semiconductors
01/09/1992WO1992000504A1 Device for reliably detecting faults and suppressing noise peaks in potentiometer assessment
01/09/1992WO1991011094A3 Probe and inverting apparatus
01/09/1992DE4024082C1 Contact holder for plug and socket connection - has pressure plunger and spring ensuring contact for testing electrical circuits of motor vehicle
01/09/1992DE4021359A1 Detecting covered current paths in highly integrated circuits - using magneto=optical film and device to produce contrast image
01/09/1992DE4019851A1 Determining diffusion length of minority charge carriers - generating blocking space charge zone at semiconductor crystal wafer by applying voltage
01/08/1992EP0465017A1 Integrated circuit test fixture and method
01/08/1992EP0464911A2 Radio receiver with acoustic signal
01/08/1992EP0464748A2 Battery condition detecting apparatus and charge control apparatus for automobile
01/08/1992EP0464746A2 Easily and quickly testable master-slave flipflop circuit
01/08/1992EP0464662A1 Method and means for fault location in a multi-terminal network
01/08/1992EP0464514A2 Method of inspecting jointed portion
01/08/1992EP0464074A1 Plug contact arrangement
01/08/1992EP0464021A1 Measuring device with auxiliary electrode for a gas-insulated, encased high-voltage installation.
01/08/1992CN1057720A Method for multi-bit parallel test in semiconductor memory device
01/07/1992US5079759 Multiplex transmission system for vehicles having a failure diagnosis function
01/07/1992US5079725 Chip identification method for use with scan design systems and scan testing techniques
01/07/1992US5079506 Checking circuit for checking the normal operation of a sensor
01/07/1992US5079501 Flexible membrane circuit tester
01/07/1992US5079442 Apparatus adaptable for use as a replacement output driver in a signal generating circuit
01/07/1992CA1293863C Time measurement in automatic test equipment
01/06/1992WO1992001255A1 Circuit arrangement for distributing on-chip generated test patterns with at least one scan path
01/06/1992CA2086612A1 Circuit arrangement for distributing on-chip generated test patterns with at least one scan path
01/04/1992CA2046078A1 Mode switching for a memory system with diagnostic scan
01/02/1992EP0463860A2 Faulted circuit detector having isolated indicator
01/02/1992EP0463599A1 Apparatus to detect intrusion on a cable link
01/02/1992EP0463301A2 Methodology for deriving executable low-level structural descriptions and valid physical implementations of circuits and systems from high-level semantic specifications and descriptions thereof
01/02/1992EP0238598B1 An oven for the burn-in of integrated circuits
01/02/1992DE4020106A1 Einrichtung zur sicheren ausfallerkennung und rauschspitzenunterdrueckung bei einer potentiometerauswertung Means for safe failure detection and rauschspitzenunterdrueckung at a potentiometer measurement
01/01/1992CN2092119U Multifunctional automatic monitor for single-phase mains
01/01/1992CN2092106U Portable integrated tester for motor
01/01/1992CN2092105U Manual measurer of neutral point
01/01/1992CN2092104U Single-phase grounding detector of low-current grounding system
01/01/1992CN2092103U Multi-core test pencil
12/1991
12/31/1991US5077740 Logic circuit having normal input/output data paths disabled when test data is transferred during macrocell testing
12/31/1991US5077689 Method for multi-bit parallel test in semiconductor memory device
12/31/1991US5077596 Semiconductor device
12/31/1991US5077526 Cable failure detection system
12/31/1991US5077523 Cryogenic probe station having movable chuck accomodating variable thickness probe cards
12/31/1991US5077521 Supply connection integrity monitor
12/31/1991US5076906 Covering with electolyte solution, applying potential, detecti ng gas bubbles
12/31/1991US5076697 Apparatus and method for inspecting defect of mounted component with slit light
12/27/1991EP0462944A1 Universal multicontact connection between an EWS probe card and a test card of a "test-on-wafer" station
12/27/1991EP0462328A1 Test device for an electronic chip
12/27/1991EP0340282A4 Two-mode driver circuit
12/27/1991EP0140205B1 Method and apparatus for fault testing a clock distribution network of a processor
12/26/1991WO1992000580A1 Faulted circuit detector having isolated indicator
12/26/1991WO1991020156A1 Electrographic process utilizing fluorescent toner and filtered detector for generating an electrical image signal
12/26/1991WO1991019991A1 Insulator aging assessment method
12/26/1991CA2041861A1 Faulted circuit detector having isolated indicator
12/25/1991CN1015207B Improvement of circuit for cable core wires identifier
12/24/1991US5075892 Parallel read circuit for testing high density memories
12/24/1991US5075629 Partial discharge detecting device for electrical equipments
12/24/1991US5075628 Insulation monitoring system of a direct current power supply system
12/24/1991US5075621 Capacitor power probe
12/24/1991US5075614 Device ascertaining the time required to charge a battery and timing the charge
12/24/1991US5075548 Tunnel current probe moving mechanism having parallel cantilevers
12/24/1991US5075544 Optical color change device for detecting electrical abnormality
12/24/1991US5075537 Controlling and monitoring circuit for electrical seat heating means, especially of automotive vehicles
12/24/1991US5074669 Method and apparatus for evaluating ion implant dosage levels in semiconductors
12/24/1991US5074037 Process for producing electrical connections on a universal substrate
12/18/1991EP0462050A1 Method and circuit for detecting the drop from synchronism of a stepper or synchronous motor
12/18/1991EP0461714A1 Method of controlling a self-test in a data processing system and data processing system suitable for this method
12/18/1991EP0461395A2 Illuminating device for circuit cards in a circuit card test device
12/18/1991EP0461327A2 Electric motor rotor tester
12/18/1991EP0271508B1 Electron-beam probing of photodiodes
12/18/1991EP0214229B1 Logic circuit having improved testability for defective via contacts
12/18/1991CN2090993U Multifunctional tester for wire connecting state
12/18/1991CN2090992U Portable line tester for vehicle
12/18/1991CN2090991U Vehicle electrometer
12/18/1991CN1057111A Monitoring instrument for dynamic contact failure of contactors
12/18/1991CN1015134B Arrangement in data processing system for system initialization and reset
12/17/1991US5073754 Method and apparatus for testing LCD panel array using a magnetic field sensor
12/17/1991US5073079 Modular loading-unloading system for integrated circuits or the like
12/17/1991CA1293336C Test fixture for tab circuits and devices
12/12/1991WO1991019392A1 Test fixture alignment system
12/12/1991WO1991019342A1 Process for testing devices
12/12/1991WO1991019318A1 Semiconductor device provided with logical circuit for measuring delay
12/12/1991WO1991019206A1 Electronic circuitry for detecting leakage of chemical substance