Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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02/19/1992 | CN2096768U Load simulated apparatus for electronic light adjusting equipment |
02/19/1992 | CN2096765U Domestic flash signal screw-driver with voltage tester |
02/19/1992 | CN1058843A Method and device for measuring beam diameter of cathode-ray tube (crt) |
02/18/1992 | US5090035 Linear feedback shift register |
02/18/1992 | US5090015 Programmable array logic self-checking system |
02/18/1992 | US5089974 Building technical management controller with a two-wire data and power transmission line |
02/18/1992 | US5089874 Semiconductor device with infrared mapping markers |
02/18/1992 | US5089774 Apparatus and a method for checking a semiconductor |
02/18/1992 | US5089772 Device for testing semiconductor integrated circuits and method of testing the same |
02/18/1992 | US5088190 Method of forming an apparatus for burn in testing of integrated circuit chip |
02/18/1992 | CA1296110C Reconfigurable register bit-slice for self-test |
02/18/1992 | CA1296109C Bus executed scan testing method and apparatus |
02/18/1992 | CA1296062C Electronic circuit tester |
02/18/1992 | CA1296059C Device for detecting openings and shorts in at least one leg of an electrical circuit |
02/18/1992 | CA1296051C Torque determination for control of an induction motor apparatus |
02/13/1992 | DE4025171A1 Monitoring covered current paths in IC, thyristor, etc. - placing thin magneto=optic, anisotropic layer over body and detecting hysteresis effect of magnetic shield |
02/12/1992 | WO1992003852A1 Battery with charge indicator |
02/12/1992 | EP0470821A2 Scannable register with delay test capability |
02/12/1992 | EP0470803A2 Event qualified test architecture |
02/12/1992 | EP0470802A2 Event qualified test methods and circuitry |
02/12/1992 | EP0470770A2 Test driver for connecting an integrated circuit chip to a controlling computer |
02/12/1992 | EP0470692A2 Method and apparatus for measuring a deep inpurity level of a semiconductor crystal |
02/12/1992 | EP0470545A2 Power source circuit having charge function and recording apparatus |
02/12/1992 | EP0470521A2 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe |
02/12/1992 | EP0470303A1 Test chambers |
02/12/1992 | EP0470141A1 Method and apparatus for localizing from above the ground or water the position of or cable fault in a cable buried underground or underwater |
02/12/1992 | CN2096074U Fault detector for rubber-plastic cable outer sheath damage |
02/12/1992 | CN2096073U Circuit tester for motor vehicle |
02/12/1992 | CA2088765A1 Batteries |
02/11/1992 | US5087909 Method and apparatus for radio frequency signal detection |
02/11/1992 | US5087885 Lighting arrester tester |
02/11/1992 | US5087884 Open head detection circuit and method |
02/11/1992 | US5087876 Apparatus and method for making surface photovoltage measurements of a semiconductor |
02/11/1992 | US5087874 Apparatus and method for locating a short |
02/11/1992 | CA1295680C Electronic battery testing device with automatic voltage scaling |
02/11/1992 | CA1295679C Electrochemical test cell structure |
02/11/1992 | CA1295655C Nondestructive readout of a latent electrostatic image formed on an insulating material |
02/06/1992 | WO1992002039A1 Improved interconnection structure and test method |
02/06/1992 | WO1992001947A1 Reusable test unit for simulating electromechemical sensor signals for quality assurance of portable blood analyzer instruments |
02/06/1992 | WO1992001943A1 Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same |
02/06/1992 | DE4041029C1 Component cooler for vacuum chamber - has stamper-like heat sink inserted in sealed opening and directly contacting base of component |
02/05/1992 | EP0469809A2 Integrated circuit arrangement suitable for testing cells arranged in rows and columns |
02/05/1992 | EP0469721A2 Mode switching for a memory system with diagnostic scan |
02/05/1992 | EP0469705A2 High speed testing for programmable logic devices |
02/05/1992 | EP0469507A1 Integrated circuit comprising a standard cell, an application cell and a test cell |
02/05/1992 | EP0469381A2 Method for dynamic testing of digital logical circuits |
02/05/1992 | EP0469238A2 Reduced delay circuits for shift register latch scan strings |
02/05/1992 | EP0469103A1 Process and device for recuperating used batteries. |
02/05/1992 | CN1058473A Optical fiber laying structure for electric power cable line trouble occurrence location detecting system |
02/05/1992 | CN1058472A Line discontinuity monitor for low-voltage power transmission line |
02/04/1992 | US5086504 Method for performing computer system functions defined by a hierarchial programming language having default nodes |
02/04/1992 | US5086397 Method and apparatus for data collection of testing and inspection of products made on a production assembly line |
02/04/1992 | US5086364 Circuitry for detecting a short circuit of a load in series with an fet |
02/04/1992 | US5086280 Continuously variable pulsewidth waveform formation device employing two memories |
02/04/1992 | US5086278 Circuit element measuring method and apparatus |
02/04/1992 | US5086277 Apparatus and method for performing diagnostic tests on the electrical systems of recreational vehicles and the like |
02/04/1992 | US5086276 Method of determining condensate location in an HID lamp |
02/04/1992 | US5086271 Driver system and distributed transmission line network for driving devices under test |
02/04/1992 | US5086269 Burn-in process and apparatus |
02/04/1992 | US5086268 Measuring mount for microwave components |
02/04/1992 | US5085517 Automatic high speed optical inspection system |
02/04/1992 | CA1295368C Short-wire bed-of-nails test fixture |
01/29/1992 | EP0468906A2 Device testing system with cable pivot |
01/29/1992 | EP0468863A1 Burn-in kiln for electronic modules |
01/29/1992 | EP0468805A2 A diagnostic system for a material handling vehicle |
01/29/1992 | EP0468553A2 Instrumentation system and instrumentation devices adapted for use in such a system |
01/29/1992 | EP0468509A2 Matching network |
01/29/1992 | EP0468153A1 Device for contacting elements for testing |
01/29/1992 | CN1058275A Trap charge relaxation spectra method and its measuring system |
01/29/1992 | CN1058269A Full automatic monitoring method and apparatus for inflated cable leakage inspection |
01/28/1992 | US5084876 Method and apparatus for testing digital circuits |
01/28/1992 | US5084874 Enhanced test circuit |
01/28/1992 | US5084671 Electric probing-test machine having a cooling system |
01/28/1992 | US5084633 Bidirectional current sensing for power MOSFETS |
01/28/1992 | US5083863 System for checking the connection of conductor elements in a connector, and an automatic connection installation equipped with said system |
01/28/1992 | CA2047946A1 Diagnostic system for a material handling vehicle |
01/28/1992 | CA1295011C Battery monitoring and condition indicator system for multi-battery pack |
01/23/1992 | WO1992001233A1 Method and apparatus for resistance measurements on a semiconductor element |
01/23/1992 | DE4107031C1 Load current pulse duration determn. circuit for rectifier thyristor - provides measurement of thyristor control potentials independently of load |
01/23/1992 | DE4104403A1 Rotor asymmetry detection and monitoring equipment - detects modulation of fields affecting terminals using voltage test points |
01/23/1992 | DE4023294A1 Short circuit testing of multilayer circuit board - has test probe pressed against insulated conductor track |
01/23/1992 | DE4022028A1 Electrical plate capacitor resin test - is carried out by applying supply and checking for pulse generation |
01/22/1992 | EP0467620A2 Optical magnetic-field sensor |
01/22/1992 | EP0467448A2 Processing device and method of programming such a processing device |
01/22/1992 | EP0467149A2 Method of and device for inspecting pattern of printed circuit board |
01/22/1992 | EP0466939A1 Ic testing device |
01/22/1992 | CN2094066U Watch-type electric shock warner |
01/21/1992 | US5083299 Tester for measuring signal propagation delay through electronic components |
01/21/1992 | US5083284 Apparatus for predicting the lifetime of cable for movable portion of industrial robot |
01/21/1992 | US5083117 Apparatus for monitoring and controlling electrostatic discharge |
01/21/1992 | US5083114 Ground fault indicating device |
01/21/1992 | US5083087 Broken wire detector for wire scribing machines |
01/21/1992 | US5083086 Differential arc reflectometry |
01/21/1992 | US5083083 Testability architecture and techniques for programmable interconnect architecture |
01/21/1992 | US5083082 Dipping into liquid polymer to evidence bubbles from cavities in sample; thermal, shock test; endcapped perfluoro propylene glycol polyether |
01/21/1992 | US5083049 Asynchronous circuit with edge-triggered inputs |
01/21/1992 | US5082792 Forming a physical structure on an integrated circuit device and determining its size by measurement of resistance |
01/18/1992 | CA2042071A1 Broken wire detector for wire scribing machines |
01/15/1992 | EP0466594A1 Device for monitoring a polyphase rectifier |
01/15/1992 | EP0466487A2 Enablement of a test mode in an electronic module with limited pin-outs |