Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/1992
02/19/1992CN2096768U Load simulated apparatus for electronic light adjusting equipment
02/19/1992CN2096765U Domestic flash signal screw-driver with voltage tester
02/19/1992CN1058843A Method and device for measuring beam diameter of cathode-ray tube (crt)
02/18/1992US5090035 Linear feedback shift register
02/18/1992US5090015 Programmable array logic self-checking system
02/18/1992US5089974 Building technical management controller with a two-wire data and power transmission line
02/18/1992US5089874 Semiconductor device with infrared mapping markers
02/18/1992US5089774 Apparatus and a method for checking a semiconductor
02/18/1992US5089772 Device for testing semiconductor integrated circuits and method of testing the same
02/18/1992US5088190 Method of forming an apparatus for burn in testing of integrated circuit chip
02/18/1992CA1296110C Reconfigurable register bit-slice for self-test
02/18/1992CA1296109C Bus executed scan testing method and apparatus
02/18/1992CA1296062C Electronic circuit tester
02/18/1992CA1296059C Device for detecting openings and shorts in at least one leg of an electrical circuit
02/18/1992CA1296051C Torque determination for control of an induction motor apparatus
02/13/1992DE4025171A1 Monitoring covered current paths in IC, thyristor, etc. - placing thin magneto=optic, anisotropic layer over body and detecting hysteresis effect of magnetic shield
02/12/1992WO1992003852A1 Battery with charge indicator
02/12/1992EP0470821A2 Scannable register with delay test capability
02/12/1992EP0470803A2 Event qualified test architecture
02/12/1992EP0470802A2 Event qualified test methods and circuitry
02/12/1992EP0470770A2 Test driver for connecting an integrated circuit chip to a controlling computer
02/12/1992EP0470692A2 Method and apparatus for measuring a deep inpurity level of a semiconductor crystal
02/12/1992EP0470545A2 Power source circuit having charge function and recording apparatus
02/12/1992EP0470521A2 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe
02/12/1992EP0470303A1 Test chambers
02/12/1992EP0470141A1 Method and apparatus for localizing from above the ground or water the position of or cable fault in a cable buried underground or underwater
02/12/1992CN2096074U Fault detector for rubber-plastic cable outer sheath damage
02/12/1992CN2096073U Circuit tester for motor vehicle
02/12/1992CA2088765A1 Batteries
02/11/1992US5087909 Method and apparatus for radio frequency signal detection
02/11/1992US5087885 Lighting arrester tester
02/11/1992US5087884 Open head detection circuit and method
02/11/1992US5087876 Apparatus and method for making surface photovoltage measurements of a semiconductor
02/11/1992US5087874 Apparatus and method for locating a short
02/11/1992CA1295680C Electronic battery testing device with automatic voltage scaling
02/11/1992CA1295679C Electrochemical test cell structure
02/11/1992CA1295655C Nondestructive readout of a latent electrostatic image formed on an insulating material
02/06/1992WO1992002039A1 Improved interconnection structure and test method
02/06/1992WO1992001947A1 Reusable test unit for simulating electromechemical sensor signals for quality assurance of portable blood analyzer instruments
02/06/1992WO1992001943A1 Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same
02/06/1992DE4041029C1 Component cooler for vacuum chamber - has stamper-like heat sink inserted in sealed opening and directly contacting base of component
02/05/1992EP0469809A2 Integrated circuit arrangement suitable for testing cells arranged in rows and columns
02/05/1992EP0469721A2 Mode switching for a memory system with diagnostic scan
02/05/1992EP0469705A2 High speed testing for programmable logic devices
02/05/1992EP0469507A1 Integrated circuit comprising a standard cell, an application cell and a test cell
02/05/1992EP0469381A2 Method for dynamic testing of digital logical circuits
02/05/1992EP0469238A2 Reduced delay circuits for shift register latch scan strings
02/05/1992EP0469103A1 Process and device for recuperating used batteries.
02/05/1992CN1058473A Optical fiber laying structure for electric power cable line trouble occurrence location detecting system
02/05/1992CN1058472A Line discontinuity monitor for low-voltage power transmission line
02/04/1992US5086504 Method for performing computer system functions defined by a hierarchial programming language having default nodes
02/04/1992US5086397 Method and apparatus for data collection of testing and inspection of products made on a production assembly line
02/04/1992US5086364 Circuitry for detecting a short circuit of a load in series with an fet
02/04/1992US5086280 Continuously variable pulsewidth waveform formation device employing two memories
02/04/1992US5086278 Circuit element measuring method and apparatus
02/04/1992US5086277 Apparatus and method for performing diagnostic tests on the electrical systems of recreational vehicles and the like
02/04/1992US5086276 Method of determining condensate location in an HID lamp
02/04/1992US5086271 Driver system and distributed transmission line network for driving devices under test
02/04/1992US5086269 Burn-in process and apparatus
02/04/1992US5086268 Measuring mount for microwave components
02/04/1992US5085517 Automatic high speed optical inspection system
02/04/1992CA1295368C Short-wire bed-of-nails test fixture
01/1992
01/29/1992EP0468906A2 Device testing system with cable pivot
01/29/1992EP0468863A1 Burn-in kiln for electronic modules
01/29/1992EP0468805A2 A diagnostic system for a material handling vehicle
01/29/1992EP0468553A2 Instrumentation system and instrumentation devices adapted for use in such a system
01/29/1992EP0468509A2 Matching network
01/29/1992EP0468153A1 Device for contacting elements for testing
01/29/1992CN1058275A Trap charge relaxation spectra method and its measuring system
01/29/1992CN1058269A Full automatic monitoring method and apparatus for inflated cable leakage inspection
01/28/1992US5084876 Method and apparatus for testing digital circuits
01/28/1992US5084874 Enhanced test circuit
01/28/1992US5084671 Electric probing-test machine having a cooling system
01/28/1992US5084633 Bidirectional current sensing for power MOSFETS
01/28/1992US5083863 System for checking the connection of conductor elements in a connector, and an automatic connection installation equipped with said system
01/28/1992CA2047946A1 Diagnostic system for a material handling vehicle
01/28/1992CA1295011C Battery monitoring and condition indicator system for multi-battery pack
01/23/1992WO1992001233A1 Method and apparatus for resistance measurements on a semiconductor element
01/23/1992DE4107031C1 Load current pulse duration determn. circuit for rectifier thyristor - provides measurement of thyristor control potentials independently of load
01/23/1992DE4104403A1 Rotor asymmetry detection and monitoring equipment - detects modulation of fields affecting terminals using voltage test points
01/23/1992DE4023294A1 Short circuit testing of multilayer circuit board - has test probe pressed against insulated conductor track
01/23/1992DE4022028A1 Electrical plate capacitor resin test - is carried out by applying supply and checking for pulse generation
01/22/1992EP0467620A2 Optical magnetic-field sensor
01/22/1992EP0467448A2 Processing device and method of programming such a processing device
01/22/1992EP0467149A2 Method of and device for inspecting pattern of printed circuit board
01/22/1992EP0466939A1 Ic testing device
01/22/1992CN2094066U Watch-type electric shock warner
01/21/1992US5083299 Tester for measuring signal propagation delay through electronic components
01/21/1992US5083284 Apparatus for predicting the lifetime of cable for movable portion of industrial robot
01/21/1992US5083117 Apparatus for monitoring and controlling electrostatic discharge
01/21/1992US5083114 Ground fault indicating device
01/21/1992US5083087 Broken wire detector for wire scribing machines
01/21/1992US5083086 Differential arc reflectometry
01/21/1992US5083083 Testability architecture and techniques for programmable interconnect architecture
01/21/1992US5083082 Dipping into liquid polymer to evidence bubbles from cavities in sample; thermal, shock test; endcapped perfluoro propylene glycol polyether
01/21/1992US5083049 Asynchronous circuit with edge-triggered inputs
01/21/1992US5082792 Forming a physical structure on an integrated circuit device and determining its size by measurement of resistance
01/18/1992CA2042071A1 Broken wire detector for wire scribing machines
01/15/1992EP0466594A1 Device for monitoring a polyphase rectifier
01/15/1992EP0466487A2 Enablement of a test mode in an electronic module with limited pin-outs