Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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02/28/1991 | DE3928003A1 Guiding corpuscular probe in region of sample - following signal of interest along conductor path of integrated circuit whose layout is not fully known |
02/27/1991 | EP0414657A2 Electronic device for detection and storage of short circuit currents switched off by a power circuit breaker |
02/27/1991 | EP0414378A2 An adapter for integrated circuit elements and a method using the adapter for testing assembled elements |
02/27/1991 | EP0414142A2 Monitoring and controlling system and method of acquisition of random errors |
02/27/1991 | EP0414052A1 Device for measuring the temperature of the winding of electrical machinery |
02/27/1991 | EP0413817A1 Substrate examining apparatus |
02/27/1991 | CN2072231U Mini oil tester |
02/27/1991 | CN2072230U Portable tester for protective relay |
02/27/1991 | CN1011824B Method of test vector generation for testing ic |
02/27/1991 | CN1011823B Dynamic life tester and quality analysis for semiconductor rectifying devices |
02/26/1991 | WO1991003014A2 Method and apparatus for high precision weighted random pattern generation |
02/26/1991 | US4996691 Integrated circuit testing method and apparatus and integrated circuit devices for use therewith |
02/26/1991 | US4996689 Method of generating tests for a combinational logic circuit |
02/26/1991 | US4996688 In a digital electronic |
02/26/1991 | US4996659 Method of diagnosing integrated logic circuit |
02/26/1991 | US4996654 Method of displaying acquired data |
02/26/1991 | US4996643 Diagnosis system for a motor vehicle |
02/26/1991 | US4996580 Bipolar semiconductor device |
02/26/1991 | US4996519 Method and apparatus for monitoring an amplifier |
02/26/1991 | US4996486 Method and apparatus for inspecting laminated iron core stacks for interlamination shorts |
02/26/1991 | US4996478 Coaxial probe mounting system |
02/26/1991 | US4996477 Fault unit |
02/26/1991 | CA1280805C Memory for storing response patterns in an automatic testing instrument |
02/24/1991 | CA2023880A1 Electronic control for an appliance |
02/23/1991 | CA2023651A1 Apparatus for measuring a winding temperature of electric machines |
02/21/1991 | WO1991002396A1 Adaptive trip fault current indicator |
02/21/1991 | WO1991002258A1 Method and package for integrated circuit identification and testing |
02/21/1991 | WO1991002257A1 Device for monitoring the functions of a plurality of control units in a motor vehicle |
02/21/1991 | WO1991002256A1 Process and device for polling control unit data |
02/21/1991 | WO1991002147A1 Process and device for controlling and/or regulating the output of an internal combustion engine in a motor vehicle |
02/21/1991 | WO1991000527A3 Method and apparatus for locating faults in electronic units |
02/21/1991 | DE3942219C1 Crimped connection quality measurement method - measuring distance positionally fixed tool or press base and active tool or press head |
02/21/1991 | DE3927414A1 Monitoring mining machinery, installations and power supply - measuring and evaluating current and voltage with measuring appts. integrated in existing compact stations |
02/21/1991 | DE3926994A1 Flux vector indicator for self-commutated asynchronous machine - uses integration of voltage vector and current vector components |
02/20/1991 | EP0413542A2 Direct mount semiconductor package |
02/20/1991 | EP0148403B1 Linear feedback shift register |
02/20/1991 | CN2071791U Electric cable and wire tester |
02/19/1991 | US4995039 Circuit for transparent scan path testing of integrated circuit devices |
02/19/1991 | US4995038 Finding faults in circuit boards |
02/19/1991 | US4995006 Apparatus and method for low-pass equivalent processing |
02/19/1991 | US4994737 System for facilitating planar probe measurements of high-speed interconnect structures |
02/19/1991 | US4994736 Method and structure for extracting lateral PNP transistor basewidth data at wafer probe |
02/19/1991 | US4994735 Flexible tester surface for testing integrated circuits |
02/19/1991 | US4994732 Automatic test system having a "true tester-per-pin" architecture |
02/19/1991 | US4994728 Apparatus for diagnosing vehicle-mounted battery |
02/19/1991 | US4993955 Top-load socket for integrated circuit device |
02/14/1991 | DE4024594A1 Integrated circuit comprising separate function modules - each with own test circuit having pick=up path to collect test data from lead conducting output-input signals |
02/14/1991 | DE3934974A1 Vorrichtung zur funktionskontrolle mehrerer steuergeraete in einem kraftfahrzeug Apparatus for functional control of multiple ECUs in a motor vehicle |
02/14/1991 | DE3926097A1 Verfahren und vorrichtung zum abfragen von steuergeraete-daten Method and device for query of tax-makers-data |
02/13/1991 | EP0412422A2 Self-test system for external programming device |
02/13/1991 | EP0412119A1 Static-free interrogating connector for electric components. |
02/13/1991 | CN2071344U Measuring electrode of insulation oil and temp. controlling system of heating basin |
02/13/1991 | CN2071342U Multifunctional current measurer |
02/13/1991 | CN1049229A Apparatus for monitoring degradation of insulation of electrical installation |
02/12/1991 | US4992985 Method for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capability |
02/12/1991 | US4992970 System for reading or setting printed circuit boards voltage of computer by support processor |
02/12/1991 | US4992937 Microcomputer having a program mode setting circuit |
02/12/1991 | US4992739 Continuity tester |
02/12/1991 | US4992729 Low profile inker |
02/12/1991 | US4992728 Electrical probe incorporating scanning proximity microscope |
02/12/1991 | US4992727 Integrated circuits |
02/12/1991 | US4992679 Programming logic device with multiple independent feedbacks per input/output terminal |
02/12/1991 | US4991429 Torque angle and peak current detector for synchronous motors |
02/12/1991 | CA1280219C Diagnosis of faults on circuit board |
02/12/1991 | CA1280168C Fault indicator having delayed trip circuit |
02/12/1991 | CA1280166C Power supply magnetic shunt for transmission line sensor module |
02/12/1991 | CA1280164C Electronic battery testing device |
02/12/1991 | CA1280162C Digital-to-analog calibration system |
02/08/1991 | WO1991002395A1 Current adaptive fault indicator |
02/08/1991 | CA2064834A1 Current adaptive fault indicator |
02/07/1991 | WO1991001528A1 Method and apparatus for data collection of testing and inspection of products made on a production assembly line |
02/07/1991 | DE4023387A1 Generation of logic image for testing microelectronic components - using raster electron microscopic with unmodified deflection unit |
02/07/1991 | DE3925911A1 Opto-electronic test system for PCB - has circuit detecting bores in conductor path pattern ascertained by image converter |
02/06/1991 | EP0411904A2 Processor condition sensing circuits, systems and methods |
02/06/1991 | EP0411863A2 Apparatus for monitoring degradation of insulation of electrical installation |
02/06/1991 | EP0411792A2 Apparatus for testing hall effect device |
02/06/1991 | EP0411069A1 Redundancy and testing techniques for ic wafers |
02/06/1991 | CN2070913U Tester for electric line leakage of motor driven vehicle |
02/06/1991 | CN1049058A On-line overvoltage monitor for electric power system |
02/06/1991 | CN1049057A Method for rapid measurement of phase resistance of delta winding |
02/05/1991 | US4991185 Method of testing n-bit programmable counters |
02/05/1991 | US4991176 Optimal test generation for finite state machine models |
02/05/1991 | US4991106 Method and apparatus for aligning and analyzing sample and control signals |
02/05/1991 | US4990895 Method and apparatus for testing photoelectric circuits |
02/05/1991 | US4990857 Insulation testing apparatus of a refrigerating machine |
02/05/1991 | US4990854 Process and device for automatically detecting the response voltage of an electromagnetic component, in particular an electrovalve |
02/05/1991 | US4990776 Electron microscope |
02/05/1991 | US4990218 Immediately after lamination; nondeforming |
02/05/1991 | US4989989 Hydraulic sensor for quench detection and location in superconductors |
02/05/1991 | CA1279936C Multiple lead probe for integrated circuits in wafer form |
02/05/1991 | CA1279934C Method and measuring instrument for identifying the diffusion length ofthe minority charge carriers for non-destructive detection of flaws and impurities in semiconductor crystal bodies |
02/05/1991 | CA1279910C Differential input selector |
02/01/1991 | CA2022413A1 Apparatus for monitoring degradation of insulation of electrical installation |
02/01/1991 | CA2022239A1 Programmable fault insertion arrangement and method |
01/30/1991 | EP0410436A2 Apparatus and method for testing printed circuit boards |
01/30/1991 | EP0410108A1 Control arrangement for a restraining system in motor cars |
01/30/1991 | CN2070453U Gas discharge light tester |
01/30/1991 | CN2070452U Leakage current testing alarming device for high-voltage insulator |
01/30/1991 | CN2070451U Tester for arrester discharge counter |
01/30/1991 | CN1048927A Method and apparatus for locating abnormality in gas-insulated electric device |