Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1990
08/08/1990EP0381448A2 Apparatus and method for changing frequencies
08/08/1990EP0380979A2 Phased locked loop to provide precise frequency and phase tracking of two signals
08/08/1990CN1044538A Method of testing connecting and/or switching devices and/or lines
08/07/1990US4947469 Resistive fault location method and device for use on electrical cables
08/07/1990US4947395 Bus executed scan testing method and apparatus
08/07/1990US4947392 Malfunction diagnostic apparatus for vehicle control system
08/07/1990US4947357 Scan testing a digital system using scan chains in integrated circuits
08/07/1990US4947124 Method for charging a nickel-cadmium accumulator and simultaneously testing its condition
08/07/1990US4947123 Battery state monitoring apparatus
08/07/1990US4947113 Driver circuit for providing pulses having clean edges
08/07/1990US4947112 Apparatus and method for testing printed circuit boards
08/07/1990US4947110 Test apparatus to check conditions and characteristics of power and communication networks
08/07/1990US4947106 Programmatically generated in-circuit test of analog to digital converters
08/07/1990US4947105 Method and circuit for testing integrated circuit modules
08/07/1990US4945760 Combined motor tester and pulse train monitor for stepper motors
08/07/1990CA1272528A1 Pressure control apparatus for use in an integrated circuit testing station
08/07/1990CA1272509A1 Diagnostic system for a digital processor
08/02/1990DE3902860A1 Method for rationalising the production and testing sequence of electrical cables
08/02/1990DE3902835A1 Verfahren zur erzeugung von pruefmustern fuer einen baustein Method for test pattern generation for a block
08/01/1990EP0380161A1 Method of testing a circuit, and circuit suitable for such a method
08/01/1990EP0379865A2 Specimen examination method for a corpuscular-beam apparatus
08/01/1990EP0379695A1 Method of testing transmission and/or switching equipment and/or lines
08/01/1990EP0185685B1 Electrical continuity testing
08/01/1990CN2059993U Dual comparison type conductor monitor
08/01/1990CN2059992U Car test pencil
08/01/1990CN1009032B Dielectric detecting apparatus for gas dielectric equipment
07/1990
07/31/1990US4945536 Method and apparatus for testing digital systems
07/31/1990US4945302 Process and a circuit board for performing tests during burn-in of integrated semi-conductor circuits
07/31/1990US4944447 Bonding verification process incorporating test patterns
07/26/1990WO1990008328A2 Method and apparatus for controlling an equipped printed circuit card, particularly for controlling the welding seams of the card
07/26/1990DE3901277A1 Circuit arrangement for measuring earth leakage faults in an electronic control for mining machines
07/25/1990EP0379155A2 Large scale integration circuit device
07/25/1990EP0378631A1 System for detecting free particles in a component housing and detection process.
07/25/1990EP0189777B1 Particle beam measuring method for the contactless testing of circuit networks
07/25/1990CN1044167A Arrangement and method for testing ground wire of electrical apparatus
07/25/1990CN1008946B Method and apparatus for on-line measuring transistor
07/24/1990US4943888 Electronic circuit breaker using digital circuitry having instantaneous trip capability
07/24/1990US4943769 Apparatus and method for opens/shorts testing of capacitively coupled networks in substrates using electron beams
07/24/1990US4943020 For manually positioning an object in space/maintaining position
07/24/1990CA1271997A1 Electron beam test probe for integrated circuit testing
07/19/1990CA2003916A1 Electrical outlet monitor
07/18/1990EP0378325A2 Circuit test method and apparatus
07/18/1990EP0377854A1 Test and measurement stand for an electromechanical converter
07/18/1990CN2059506U Indicator for short-circuit failure
07/18/1990CN1043993A Potential testing device for single-end connect insulator
07/18/1990CN1008848B Measuring melthod for effective address of mass storage
07/17/1990US4942609 Electronic flying integrity tester for disk drives
07/17/1990US4942577 Logic circuit system with latch circuits for reliable scan-path testing
07/17/1990US4942576 Badbit counter for memory testing
07/17/1990US4942357 Method of testing CCD's to detect the size of barriers and pockets
07/17/1990CA1271849A1 Electron beam testing of semiconductor wafers
07/17/1990CA1271841A1 Resonant loop current perturbing probe
07/17/1990CA1271833A1 Acoustic monitor for rotary electrical machinery
07/17/1990CA1271820A1 Method and apparatus for testing the operability of a probe
07/12/1990WO1990007813A1 Process for monitoring short-circuits in a voltage circuit inverter
07/11/1990EP0377455A2 Test mode switching system for LSI
07/11/1990EP0377277A1 Method and apparatus for detection and location of insulation defects
07/11/1990EP0377094A1 Apparatus and method for testing the condition of a car battery
07/11/1990EP0376967A1 Battery state of charge indicator.
07/11/1990CN1043789A Extraneous frequency detector
07/10/1990US4941115 Hand-held tester for communications ports of a data processor
07/10/1990US4940934 Method of electrically testing active matrix substrate
07/10/1990US4940933 Fiber optic arc monitor
07/10/1990US4940932 Method and apparatus for testing dynamoelectric machine rotors
07/10/1990US4940909 Configuration control circuit for programmable logic devices
07/10/1990US4940391 Compressor surge detection system
07/10/1990US4939928 Method of determining the continuity of solenoids in an electronic automatic transmission system
07/10/1990CA1271565A1 Adaptor in apparatus for electronically testing printed circuit boards
07/05/1990DE3900040A1 Method for electrically testing conductor tracks for short circuits
07/05/1990DE3900035A1 Device for electrically testing conductor tracks for short circuits
07/04/1990EP0376782A1 Apparatus for measuring an electrical variable of chip-type electronic components
07/04/1990EP0376781A1 Automatic testing station for chip-type electronic components
07/04/1990EP0376515A1 A method of displaying acquired data
07/04/1990EP0376165A2 Method for manufacturing a liquid crystal display device
07/04/1990EP0375984A1 Capacitor power probe
07/04/1990EP0375919A2 Calculating AC chip performance using the LSSD scan path
07/04/1990EP0375908A2 Method and structure for implementing dynamic chip burn-in
07/04/1990CN2058995U Low-frequency testing device for dc system grand connecting position
07/04/1990CN2058994U Multi-function testing pen for circuit discontinuities
07/04/1990CN1043571A Current sensing
07/03/1990US4939677 Timing-signal delay equipment
07/03/1990US4939621 Devices for regulating the temperature of an element by blowing a gas at appropriate temperature
07/03/1990US4939505 Monitoring and warning system for series-fed runway visual aids
07/03/1990US4939502 Device and method of fail-safe control for electronically controlled automatic transmission
07/03/1990US4939469 Non-destructive method for evaluation of printed wiring boards
07/03/1990US4939458 Method and apparatus for quantifying superconductivity
07/03/1990US4939453 Probe for use with circuitry for monitoring signals emanating from heated tip of soldering iron or solder extractor or the like
07/03/1990US4939452 Arrangement for testing printed-circuit boards
07/03/1990US4939446 Voltage transmission link for testing EMI susceptibility of a device or circuits
07/03/1990US4939396 Detector circuit
07/03/1990US4939391 Programmable logic device with observability and preload circuitry for buried state registers
07/03/1990US4939389 VLSI performance compensation for off-chip drivers and clock generation
07/03/1990CA1271265A1 Lead sense system for component insertion machine
07/03/1990CA1271263A1 Mounting bracket for test probes
06/1990
06/28/1990WO1990007229A1 Process and installation for the control of electro-mechanical converters
06/28/1990WO1990007214A1 Method and apparatus for protecting electrical systems
06/28/1990WO1990007153A1 Redundancy and testing techniques for ic wafers
06/28/1990WO1990007127A1 Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors
06/28/1990DE3843507A1 Method for measuring a pulsed current in an inductive load and device for carrying out the method
06/27/1990EP0375285A2 Extraneous frequency detector