Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1991
12/12/1991WO1991019205A1 Fault detection apparatus
12/11/1991EP0461041A2 Flip-flop circuit
12/11/1991EP0460911A2 Electrical probe with contact force protection
12/11/1991EP0460603A2 Delay data setting circuit and method
12/11/1991EP0460407A2 Sensor circuit
12/11/1991EP0460352A2 System for test data storage reduction
12/11/1991EP0460117A1 Aircraft battery status monitor
12/11/1991EP0460050A1 A method for testing the operational efficiency of a component of an electronic circuit.
12/11/1991CN2090537U Digital monitor for electric equipment of car
12/11/1991CN1056934A Disturbing simulator for alternating electric source
12/10/1991US5072418 Series maxium/minimum function computing devices, systems and methods
12/10/1991US5072417 Methods and apparatus for synchronizing the time scales of e-beam test equipment
12/10/1991US5072403 Equipment for and methods of locating the position of a fault on a power transmission line
12/10/1991US5072391 Diagnostic system for a motor vehicle
12/10/1991US5072186 Method and apparatus for interturn and/or interlayer fault testing of coils
12/10/1991US5072185 Wire harness modular interface adapter system and testing apparatus
12/10/1991US5072178 Method and apparatus for testing logic circuitry by applying a logical test pattern
12/10/1991US5072176 Flexible membrane circuit tester
12/10/1991US5072175 Integrated circuit having improved continuity testability and a system incorporating the same
12/10/1991US5072138 Semiconductor memory with sequential clocked access codes for test mode entry
12/10/1991US5072137 Semiconductor memory with a clocked access code for test mode entry
12/08/1991CA2018639A1 Method and apparatus for comparing fuel cell voltage
12/05/1991DE4110535A1 Detecting lateral temp. distribution in semiconductor element - using laser-raster microscope with OBIC stage and laser with wavelength near absorption edge of semiconductor material
12/05/1991DE4017559A1 Electrical signal measurement appts. - has electro-optical crystal next to conductor exposed to constant laser light, polarisation analyser, streak camera or sampling oscilloscope
12/04/1991EP0459863A1 Integrated circuit with mode detection pin
12/04/1991EP0459489A2 Method of reading optical image of inspected surface and image reading system employable therein
12/04/1991EP0459001A1 Integrated semiconductor memory
12/04/1991CN2090066U Socket line checking instrument
12/04/1991CN1056784A Line breakdown detecting instrument
12/04/1991CN1056770A Semiconductor integrated circuit chip having identification circuit therein
12/04/1991CN1015024B Measuring equipment for time constant of electric motors
12/04/1991CN1015023B Method of measuring impedance, especially low-voltage capacity impedance
12/03/1991US5070537 System for detecting defective point on power transmission line by utilizing satellite
12/03/1991US5070297 Full wafer integrated circuit testing device
12/03/1991US5070296 Integrated circuit interconnections testing
12/03/1991US5070258 Integrated circuit having metal substrate used to provide electrical indication of operation mode of circuits
12/03/1991US5069629 Electrical interconnect contact system
12/03/1991CA1292766C Monitoring device for overhead power transmission system
12/02/1991WO1991019190A1 Battery status indicator
12/02/1991CA2084311A1 Battery status indicator
11/1991
11/30/1991WO1991019202A1 Method and system for concurrent electronic component testing and lead verification
11/30/1991CA2083701A1 Method and system for concurrent electronic component testing and lead verification
11/28/1991DE4026326A1 Integrated circuit chip having identification circuit - has voltage limiter and option unit determining identification by existence of current path, between power and input terminals
11/28/1991DE4020218A1 Load measurement for electrical drives - by deriving abstract parameter from phase angle between current and voltage of motor and its revolution rate
11/28/1991DE4016639A1 Covered current path testing in integrated circuit - by measuring surface magnetic field distribution using sensor moving in raster pattern
11/27/1991EP0458678A1 Automatic device for noise measurement of electronic components
11/27/1991EP0458515A2 Method and apparatus for testing delta-sigma modulators
11/27/1991EP0458448A2 An adapter and test fixture for an integrated circuit device package
11/27/1991EP0458429A2 Optical measurement device
11/27/1991EP0458300A2 Function test for computer controlled electrically actuating components in a motor vehicle
11/27/1991EP0458280A2 Printed circuit board inspection apparatus
11/27/1991EP0458053A2 Rolling device for testing vehicles
11/27/1991EP0457809A1 Conductor tracing system.
11/27/1991CN2089660U Power socket for leakage alarm
11/27/1991CN1056598A Automatic tester for pinhole and withstanding voltage of enamelled wire
11/27/1991CN1056583A Mehtod and apparatus for testing ground of small current
11/26/1991US5068881 Scannable register with delay test capability
11/26/1991US5068814 Interactive adaptive inference system
11/26/1991US5068657 Method and apparatus for testing delta-sigma modulators
11/26/1991US5068620 Circuit for securing output distortion, in particular of final stages of audio devices
11/26/1991US5068614 Swept frequency domain relectometry enhancement
11/26/1991US5068605 Semiconductor integrated circuit device and method of testing the same
11/26/1991US5068604 Method of and device for testing multiple power supply connections of an integrated circuit on a printed circuit board
11/26/1991US5068603 Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays
11/26/1991US5068602 DUT board for a semiconductor device tester having a reconfigurable coaxial interconnect grid and method of using same
11/26/1991US5068601 Dual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler docking
11/26/1991US5068599 Integrated circuit having an enabling circuit for controlling primary and secondary subcircuits
11/26/1991US5068547 Process monitor circuit
11/26/1991US5067798 Laser beam scanning system
11/23/1991WO1991018441A1 A power supply
11/21/1991EP0457569A2 Indicator unit
11/21/1991EP0457472A1 Socket
11/21/1991EP0457426A1 Method and system for optimizing termination in systems of programmable devices
11/20/1991CN1056372A Checkout device for fault current protective switch
11/19/1991US5067132 One out of n checking apparatus and method
11/19/1991US5067130 Method for acquiring data in a logic analyzer
11/19/1991US5067091 Circuit design conversion apparatus
11/19/1991US5066919 Fault detection and isolation in automotive wiring harness by network analysis method
11/19/1991US5066909 Apparatus for testing an electronic circuit having an arbitrary output waveform
11/19/1991US5066908 Method for electrically detecting positional deviation of contact hole in semiconductor device
11/19/1991CA1292279C Arrangement for measuring the slip of electric induction motors
11/14/1991WO1991017545A1 Integrated semiconductor store with parallel test facility and redundancy process
11/14/1991WO1991017451A1 Battery testing
11/14/1991WO1991017449A1 Driver circuit for testing bi-directional transceiver semiconductor products
11/14/1991DE4114195A1 Potential distribution image formation esp. microelectronic component - by measuring change in light polarisation with surface covered by electro=optical medium
11/14/1991DE4014165A1 Electromotor test device load machine connection - using load machine coupling arrangement with centring and docking elements
11/13/1991EP0456255A2 Dynamic memory device and method for screening the same
11/13/1991EP0455653A1 Integrated semiconductor store.
11/13/1991CN2088699U Multi-function electricity test pen
11/13/1991CN2088696U Electricity detector for automobile and motorcycle
11/13/1991CN2088694U Multi-purpose antishock digital microammeter
11/12/1991US5065118 Electronically tuned VHF/UHF matching network
11/12/1991US5065104 Fault sensing with an artificial reference potential provided by an isolated capacitance effect
11/12/1991US5065101 Mini-relay or reed relay tester
11/12/1991US5065091 Semiconductor integrated circuit device testing
11/12/1991US5065090 Method for testing integrated circuits having a grid-based, "cross-check" te
11/12/1991US5065084 Electronic equipment having display device for displaying lifetime of power source
11/12/1991US5065083 Microprocessor controlled electronic stimulating device having a battery management system and method therefor
11/12/1991US5064498 Oxide removal with water and choline solution
11/12/1991CA1292080C Status driven menu system
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