Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/1990
05/23/1990EP0369554A2 Apparatus for automatically scrubbing a surface
05/23/1990EP0369530A2 Temperature sensing circuit
05/23/1990EP0369273A1 Method for comparing the quality of HF absorbers
05/23/1990EP0369112A1 Adapter for electronic test devices for printed-circuit boards and the like
05/23/1990DE3900756C1 Method and device for monitoring electrical contact terminals
05/23/1990DE3839289C1 Circuit for the operation of an integrated circuit of which it is a component, optionally in a test operation mode or a functional operation mode
05/23/1990DE3839211A1 IO interface for digitial function tests
05/23/1990CN2057514U Apparatus for calibrating cables
05/22/1990US4928278 IC test system
05/22/1990US4928066 Continuity coupling in a harness making machine
05/22/1990US4928061 Multi-layer printed circuit board
05/22/1990US4928058 Electro-optic signal measurement
05/22/1990US4928002 Method of recording test results of die on a wafer
05/22/1990US4927692 Antistatic mask for use with electronic test apparatus
05/17/1990WO1990005311A1 Method and means for testing insulation integrity on low-voltage, unshielded electrical cables
05/17/1990DE3903115C1 Arrangement for simulating the consequences of an electrostatic discharge
05/17/1990DE3838657A1 Device for detecting the inadvertent loosening of the two plug parts of an electrical connector
05/16/1990EP0368557A2 Compressor system comprising a surge detection system
05/16/1990EP0368030A1 Measuring method and circuitry for the determination of the trip current of residual current breakers
05/16/1990EP0368029A1 Measuring method and circuitry for testing protective measures in AC networks
05/15/1990US4926452 Automated laminography system for inspection of electronics
05/15/1990US4926425 System for testing digital circuits
05/15/1990US4926424 Test auxiliary circuit for testing semiconductor device
05/15/1990US4926363 Modular test structure for single chip digital exchange controller
05/15/1990US4926352 Diagnostic system for control apparatus of a motor vehicle
05/15/1990US4926330 Diagnosis system for a motor vehicle
05/15/1990US4926285 Electrostatic discharge simulator with highly reproducible wave-front
05/15/1990US4926234 Semiconductor device operating in high frequency range
05/15/1990US4926118 Test station
05/15/1990US4926117 For performing multiple tests on semiconductor devices
05/15/1990US4925089 Environmental response control apparatus and method
05/15/1990US4924589 Method of making and testing an integrated circuit
05/11/1990CA2002324A1 Method for comparing the quality of rf absorbers
05/10/1990DE3937120A1 Test adaptor with bushings for electronic circuit board - has plated through holes in bushing plate for short-circuit plugs connecting tracks of underlying conductor plate
05/10/1990DE3929735A1 Finely controlling point of scanning tunnelling microscope - exerting electrostatic forces on metallised oxide diaphragm deflected vertically by tensions in two directions
05/10/1990DE3922204C1 Non-contact voltage measurement method - has optically transparent plate in contact with liquid crystal coated IC with optical alignment and constant potential measurement
05/10/1990DE3905856C1 Method and device for testing cable access connections
05/10/1990DE3837821A1 High-precision CMOS Schmitt trigger
05/09/1990EP0367728A1 A system for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles
05/09/1990EP0367710A2 Diagnostics of a board containing a plurality of hybrid electronic components
05/09/1990EP0367688A1 Process and appliance for detecting an open circuit in a transmission line
05/09/1990EP0367379A1 Extended ion source apparatus and method for detecting insulation defects
05/09/1990EP0367345A1 Logic analyser with double triggering
05/09/1990EP0367115A1 Integrated circuit device having signal discrimination circuit and method of testing the same
05/09/1990EP0366702A1 Integrated circuits.
05/09/1990CN1042012A Power source device (system) for asynchronous motor experiment
05/09/1990CN1007950B Torque determination for control of an induction motor apparatus
05/08/1990US4924468 Logic analyzer
05/08/1990US4924398 Fault diagnosis system for automotive electronic devices
05/08/1990US4924391 Trouble-diagnosable multifunction testing apparatus
05/08/1990US4924212 Temperature threshold detection circuit
05/08/1990US4924177 Tester for solid state electronic components
05/08/1990US4924175 Apparatus for displaying analog signatures of an electronic component
05/08/1990US4924096 Non-contact testing of photovoltaic detector arrays
05/08/1990CA1268820A1 Circuit testing
05/08/1990CA1268818A1 Test system with shared test instruments
05/08/1990CA1268813A1 Insulation testing device for gas insulated apparatus
05/03/1990WO1990004792A1 Testing electrical circuits
05/02/1990EP0366553A2 Test device and method for testing electronic device and semiconductor device having the test device
05/02/1990EP0366453A2 Variable gain current-to-voltage amplifier with gain independent test mode operation
05/02/1990EP0366220A1 Positive retention chip carrier
05/02/1990EP0365874A1 Optical inspection system for solder joints and inspection method
05/02/1990EP0365697A1 Circuit for detecting an open circuit composed by a load in series with an electronic switch
05/02/1990EP0365649A1 Apparatus and method for mapping the connectivity of communications systems with multiple communications paths
05/01/1990US4922492 Architecture and device for testable mixed analog and digital VLSI circuits
05/01/1990US4922196 Beam-blanking apparatus for stroboscopic electron beam instruments
05/01/1990US4922195 Extraneous frequency detector
05/01/1990US4922190 Adaptor device for an arrangement for testing printed-circuit boards
05/01/1990US4922185 Diagnostic meter base
05/01/1990US4922184 Apparatus and process for the simultaneous continuity sensing of multiple circuits
05/01/1990US4922183 Methods, systems and apparatus for detecting changes in variables
05/01/1990US4922172 Motor test apparatus, system and method
05/01/1990US4922097 Potential measurement device
05/01/1990US4921810 Method for testing semiconductor devices
05/01/1990CA1268550A1 Apparatus providing improved diagnosability
04/1990
04/25/1990EP0364925A1 Semiconductor integrated circuit having i/o terminals allowing independent connection test
04/25/1990EP0364577A1 Disconnection detection apparatus for lamps
04/25/1990EP0364536A1 Burn-in pads for tab interconnect structures
04/25/1990EP0218791B1 Weighted random pattern testing apparatus and method
04/25/1990CN2056545U Single phase power supply plug with electric leakage alarming
04/25/1990CN2056517U Inspector for electric circuit on/off
04/25/1990CN2056514U Safty electricity test pen
04/24/1990US4920515 Programmable logic array having an improved testing arrangement
04/24/1990US4920496 Apparatus and method for calculating signal level in decibels
04/24/1990US4920310 Voltage detector
04/24/1990US4919623 Burn-in socket for integrated circuit device
04/24/1990US4918928 Apparatus for testing IC devices at low temperature and cooling bag for use in testing IC devices at low temperature
04/24/1990CA1268214A1 Method and apparatus for analyzing errors in integrated circuits
04/24/1990CA1268213A1 Fault detector for detecting faults in a dc capacitor circuit
04/19/1990WO1990004233A1 Method of using electronically reconfigurable gate array logic and apparatus formed thereby
04/19/1990WO1990004228A1 Pattern generator
04/19/1990WO1990004188A1 Automotive battery status monitor
04/19/1990WO1990004187A1 Dc/dc converter
04/18/1990EP0363465A1 Test programme generation assisting apparatus for digital circuits.
04/18/1990EP0198861B1 Control installation for batteries
04/18/1990EP0067556B1 Digital data processing system
04/17/1990US4918691 Testing of integrated circuit modules
04/17/1990US4918390 Method and system for monitoring the condition of a plurality of electrical devices
04/17/1990US4918385 Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same
04/17/1990US4918380 System for measuring misregistration