Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/1991
07/11/1991WO1991010258A1 Process for determining the position of a pn transition
07/11/1991WO1991010205A1 Method and device for storing intermittent functional faults of a physical system and of context variables of these faults
07/11/1991WO1991010170A1 Programmable masking apparatus
07/11/1991WO1991010147A1 Device for automatically ascertaining capacitor breakdown voltage
07/11/1991DE4041897A1 Scanning path system with integrated circuit - enables simple evaluation with efficient layout and series shift resistor handling control and observation point data
07/11/1991DE4029703A1 Fault tracing arrangement for vehicle airbag system - contains wheatstone bridge circuit with resistor forming one arm and decision circuit
07/11/1991DE3924763A1 Test device for multi-wire electric cable - compares voltages in corresp. resistors of resistance networks, one supplied directly and one via cable under test
07/11/1991CA2007630A1 Voltage and electrical continuity monitoring device
07/10/1991EP0436375A2 Motor diagnostics and electronic control for a clothes dryer
07/10/1991EP0436358A2 Integrated circuit having power supply connection integrity monitor
07/10/1991EP0436247A2 Circuit for encoding identification information on circuit dice
07/10/1991CN2080713U Safety plug with leakage display for power supply
07/10/1991CN2080679U Multifunction test pencil for electronic apparatus
07/10/1991CN2080678U Simple digital ic tester
07/10/1991CN1013152B Core monitor that uses rotor shaft voltage
07/09/1991US5031152 Test circuit for non-volatile storage cell
07/09/1991US5031128 Logic analyzer with double triggering action
07/09/1991US5031073 Fault-isolating apparatus and method for connecting circuitry
07/09/1991US5030917 Transient rotor fault detection in induction and synchronous motors
07/09/1991US5030916 Auto electric tester
07/09/1991US5030909 Method and system for contactless testing of electronic activity in an integrated circuit chip-to-test after passivation thereof
07/09/1991US5030908 Method of testing semiconductor elements and apparatus for testing the same
07/09/1991US5030905 Below a minute burn-in
07/09/1991US5030904 Diagnostic system for integrated circuits using existing pads
07/09/1991US5030869 Device testing system with cable pivot
07/09/1991US5030829 Method and apparatus for investigating latch-up propagation in complementary-metal-oxide-semiconductor (CMOS) circuits
07/09/1991US5030008 Method and apparatus for the automated analysis of three-dimensional objects
07/04/1991DE4002155A1 Capacitive measurement head for thickness of thermoplastic foil - has bar-shaped inner electrode enclosed by flattened ring outer electrode, both with low coefficient of thermal expansion
07/03/1991EP0435636A1 Testing of integrated circuits using clock bursts
07/03/1991EP0435371A2 Power supply device with non-symmetric monitoring
07/03/1991EP0435271A2 An apparatus and a method for checking a semiconductor
07/03/1991EP0434893A2 Abnormality detecting device
07/03/1991EP0205258B1 Semiconductor integrated circuit having a function for switching the operational modes of an internal circuit
07/03/1991EP0160789B1 Test pattern generator
07/03/1991CN2080181U Anti-false operation device of ac/dc test transformer
07/03/1991CA2032846A1 Motor diagnostics and electronic control for clothes dryer
07/02/1991US5029274 Apparatus and method for testing the integrity of wiring ensembles
07/02/1991US5029181 Automatic calibration device for direct spectrum spread receiver
07/02/1991US5029171 Test vector generation system
07/02/1991US5029166 Method and apparatus for testing circuit boards
07/02/1991US5029133 VLSI chip having improved test access
07/02/1991US5029040 Output circuit having a fail-safe function
07/02/1991US5029039 Current adaptive fault indicator
07/02/1991US5028878 Dual memory timing system for VLSI test systems
07/02/1991US5028873 Tester for a reed relay printed circuit board
07/02/1991US5028867 Printed-wiring board
07/02/1991US5028866 Method and apparatus for mapping printed circuit fields
07/02/1991CA1285655C Graphical system for modelling a process and associated method
07/02/1991CA1285616C Test adapter for integrated circuit carrier
06/1991
06/27/1991WO1991009319A2 Process and device for verifying the cut-off torque of an actuator
06/27/1991WO1991009318A1 Automotive testing device and method of use
06/26/1991EP0434137A2 System for partitioning and testing submodule circuits of an integrated circuit
06/26/1991EP0433995A2 Remote instrument testing system
06/26/1991EP0433850A2 Method of organizing programmable logic array devices for board testability
06/26/1991EP0433680A2 Method for measuring the potential of the conductor lines of a program-controlled integrated circuit
06/26/1991EP0433604A2 Electrical probe incorporating scanning proximity microscope
06/26/1991EP0433573A2 Device for monitoring the state of function of an accumulator
06/26/1991EP0433514A1 Testable input-output arrangement for transformer-decoupled load
06/26/1991EP0433361A1 An instrument for checking the operational state of an ic-circuit
06/26/1991CN2079758U Lamplight display for testing circuit
06/25/1991US5027355 Logic circuit and design method for improved testability
06/25/1991US5027353 Method for testing interconnections
06/25/1991US5027294 Method and apparatus for battery-power management using load-compensation monitoring of battery discharge
06/25/1991US5027268 System for administering life of plant
06/25/1991US5027108 Buried power line contact alert
06/25/1991US5027074 Portable
06/25/1991US5027064 Method and means for measuring operating temperature of semiconductor devices by monitoring RF characteristics
06/25/1991US5027063 Vacuum-actuated test fixture for testing electronic components
06/25/1991US5027044 Load state decision apparatus for servomotor
06/20/1991DE3941178A1 Quantitative potential measurement using corpuscular probe - by measuring related sec. particle energy distribution displacement with simple drift and instability compensation
06/19/1991EP0433020A2 Method of detecting and characterizing anomalies in a propagative medium
06/19/1991EP0432963A2 Method and apparatus for evaluating ion implant dosage levels in semiconductors
06/19/1991EP0432747A2 Over-loading monitoring system for electric motor in automotive engine simulating apparatus
06/19/1991EP0432689A2 Remaining-amount-of-battery detecting device
06/19/1991EP0432640A2 Monitoring device for accumulators
06/19/1991EP0432639A2 Monitoring device for accumulators
06/19/1991EP0432292A1 Logic IC tester
06/19/1991EP0432291A1 IC test equipment
06/19/1991CN2079301U Digital megohmmeter
06/19/1991CN2079299U Multi-function micro electric field detector
06/18/1991US5025344 Built-in current testing of integrated circuits
06/18/1991US5025210 Evaluation facilitating circuit device
06/18/1991US5025205 Reconfigurable architecture for logic test system
06/18/1991US5025195 Current monitoring
06/18/1991US5025145 Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements
06/13/1991WO1991008604A1 Fast battery charging system and method
06/13/1991WO1991008585A1 Method and device for semiconductor fabrication fault analasys
06/13/1991WO1991008494A1 Battery monitoring system
06/13/1991DE4001377C1 Measuring arrangement testing protective layers - applying test rod and earth cable to detect fault spots and pores w.r.t. conductive substrate
06/12/1991EP0431560A2 AC evaluation equipment for an IC tester
06/12/1991EP0431034A1 Circuit testing.
06/12/1991CN2078886U Range-adjustable induction electric properties tester
06/12/1991CN2078885U Digital measuring instrument of insulator resistance and bleeder current
06/12/1991CN1052195A Method for predicting intermittent discharge capacity of dry battery
06/11/1991US5023916 Method for inspecting the leads of electrical components on surface mount printed circuit boards
06/11/1991US5023875 Interlaced scan fault detection system
06/11/1991US5023693 Transistor with current sensing function
06/11/1991US5023684 Composite semiconductor device having function for overcurrent detection
06/11/1991US5023561 Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer
06/11/1991US5023545 Circuit probing system