| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/24/1992 | US5099196 On-chip integrated circuit speed selection |
| 03/24/1992 | US5098204 Load balanced planar bearing assembly especially for a cryogenic probe station |
| 03/24/1992 | US5098187 Apparatus and method for signal generation and for processing |
| 03/24/1992 | CA1297998C Interconnection system for integrated circuit chips |
| 03/24/1992 | CA1297944C Vehicle battery discharging indicator |
| 03/22/1992 | CA2051882A1 Device for processing the output signal of a derivative type response sensor |
| 03/19/1992 | WO1992004717A1 Circuit arrangement for testing a semiconductor store by means of parallel tests with different test bit patterns |
| 03/19/1992 | WO1992004627A1 Apparatus and method for indicating state of charge of a battery |
| 03/19/1992 | WO1992004620A2 Method and apparatus for high resolution inspection of electronic items |
| 03/18/1992 | WO1992005488A1 Fault insertion |
| 03/18/1992 | EP0475631A2 A general purpose, reconfigurable system for processing serial bit streams |
| 03/18/1992 | EP0475614A2 Probe contact with small amplitude vibration for bed of nails testing |
| 03/18/1992 | EP0475050A2 Flexible tape probe |
| 03/18/1992 | EP0474907A1 A diagnostic apparatus for a vehicle network system and a method of diagnosing a vehicle network system |
| 03/18/1992 | CN2099404U Language-intellect type synthetical protective-device for motor |
| 03/18/1992 | CN2099320U Transistor dc parameter test meter with digital display |
| 03/18/1992 | CN2099319U Leak current detector for metallic oxide lightning arrester |
| 03/18/1992 | CN1059602A Chopper test table for underground railways |
| 03/17/1992 | US5097492 Solder connection |
| 03/17/1992 | US5097468 Testing asynchronous processes |
| 03/17/1992 | US5097214 Method and apparatus for determining the properties of an insulation layer by maintaining an output current ratio generated by directing ions at the insulation layer |
| 03/17/1992 | US5097213 Apparatus for automatic testing of electrical and electronic connectors |
| 03/17/1992 | US5097207 Temperature stable cryogenic probe station |
| 03/17/1992 | US5097206 Built-in test circuit for static CMOS circuits |
| 03/17/1992 | US5097205 Ic chip test circuit for high frequency integrated circuits |
| 03/17/1992 | US5097204 Method and apparatus for evaluating the capacitance of an integrated electronic device using an e beam |
| 03/17/1992 | US5097201 Voltage imaging system using electro-optics |
| 03/17/1992 | US5097144 Driver circuit for testing bi-directional transceiver semiconductor products |
| 03/17/1992 | CA1297526C Solenoid response detector |
| 03/12/1992 | WO1992004637A1 Functional at speed test system for integrated circuits on undiced wafers |
| 03/12/1992 | DE4028819A1 Schaltungsanordnung zum testen eines halbleiterspeichers mittels paralleltests mit verschiedenen testbitmustern Circuitry for testing a semiconductor memory using parallel tests with different testbitmustern |
| 03/12/1992 | DE4028721A1 Determining remaining life of switching devices - by integrating contact current during period between switching path threshold values and comparing with device special charge limit value |
| 03/12/1992 | CA2091442A1 Functional at speed test system for integrated circuits on undiced wafers |
| 03/11/1992 | WO1992004626A1 Electronic tester for assessing battery/cell capacity |
| 03/11/1992 | EP0474439A2 Circuit test method |
| 03/11/1992 | EP0474380A1 Method and apparatus for monitoring a network |
| 03/11/1992 | EP0474275A2 Automatic test equipment system using pin slice architecture |
| 03/11/1992 | EP0474274A2 Event sequencer for automatic test equipment |
| 03/11/1992 | EP0222084B1 Hierarchical test system architecture |
| 03/11/1992 | CN2098693U Automatic detecting alarm for voltage and liquid level of accumulator |
| 03/11/1992 | CN2098692U Economic running tester for motor |
| 03/11/1992 | CN2098691U Frequency-changing c-v meter for semiconductor interfacial state |
| 03/10/1992 | US5095537 Automatic monitoring system in an explosive environment of a direct current source by storage batteries |
| 03/10/1992 | US5095454 Method and apparatus for verifying timing during simulation of digital circuits |
| 03/10/1992 | US5095447 Color overlay of scanned and reference images for display |
| 03/10/1992 | US5095277 System to test wiring parts |
| 03/10/1992 | US5095276 Tractor trailer light system test circuit |
| 03/10/1992 | US5095274 Temperature-compensated apparatus for monitoring current having controlled sensitivity to supply voltage |
| 03/10/1992 | US5095268 Tool for tuning microwave circuit within a closed housing |
| 03/10/1992 | US5095267 Method of screening A.C. performance characteristics during D.C. parametric test operation |
| 03/10/1992 | US5095262 Electro-optic sampling system clock and stimulus pattern generator |
| 03/10/1992 | US5094584 Method and apparatus for automatically changing printed circuit board test fixtures |
| 03/10/1992 | US5093982 Automated burn-in system |
| 03/10/1992 | CA1297155C Automatic field ground detector and locator |
| 03/10/1992 | CA1297154C Strand-to strand short circuit tester |
| 03/05/1992 | DE4127216A1 Integrated semiconductor chip with set functional test circuit - having chip-edge connections for test mode selection, clock input, test data input and output |
| 03/05/1992 | DE4027902A1 Visual testing of PCB with mounted components - using cross-stable, video camera and monitor reduces operator fatigue by showing sections of board contg. whole components |
| 03/04/1992 | EP0473429A2 Optical magnetic-field sensor and method of producing the same |
| 03/04/1992 | EP0473193A2 Semiconductor device having a temperature detection circuit |
| 03/04/1992 | EP0473187A2 A battery alarm system |
| 03/04/1992 | EP0472938A2 Device for testing and repairing an integrated circuit |
| 03/04/1992 | EP0472902A2 Silicon controlled rectifier gate conduction detector |
| 03/04/1992 | EP0472818A2 Built-in self test for integrated circuits |
| 03/04/1992 | EP0286660B1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer |
| 03/04/1992 | EP0197051B1 Automated circuit tester |
| 03/04/1992 | CN2098041U Thick-film hybrid integrated circuit test instrument |
| 03/04/1992 | CN2098040U High-tension line ground fault remote-detector |
| 03/04/1992 | CN2098039U High-voltage test safety control chest |
| 03/04/1992 | CN2098038U Power system oscillation detecting device composed by multipliers |
| 03/04/1992 | CN1059245A Apparatus and method for controlling positions of crt measuring camera |
| 03/03/1992 | US5093797 Apparatus for inspecting packaged electronic device |
| 03/03/1992 | US5093624 Battery monitoring |
| 03/03/1992 | US5093616 Voltage measurement method using electron beam |
| 03/03/1992 | US5092774 Mechanically compliant high frequency electrical connector |
| 02/27/1992 | DE4026799A1 Selective detection of faults in conductors in high voltage network - by comparing conductor voltages and currents with earth current and star earth voltage |
| 02/26/1992 | EP0472160A2 High-rate pulse pattern generator |
| 02/26/1992 | EP0471698A1 Process for determining physical variables of rechargeable electric accumulators. |
| 02/25/1992 | US5091908 Built-in self-test technique for read-only memories |
| 02/25/1992 | US5091872 Apparatus and method for performing spike analysis in a logic simulator |
| 02/25/1992 | US5091769 Configuration for testing and burn-in of integrated circuit chips |
| 02/25/1992 | US5091693 Dual-sided test head having floating contact surfaces |
| 02/25/1992 | US5091692 Probing test device |
| 02/25/1992 | US5091691 Apparatus for making surface photovoltage measurements of a semiconductor |
| 02/25/1992 | US5090244 System for detecting free particles in a component housing and detection method |
| 02/25/1992 | US5090118 High performance test head and method of making |
| 02/20/1992 | WO1992002934A1 Integrated memory having improved testing means |
| 02/20/1992 | WO1992002825A1 Automotive diagnostic tool |
| 02/20/1992 | DE4025549A1 Sacrificial anode and steel reinforcement short-circuit monitoring - using artificial short circuiter and detector for phase potential change with circuiter switched-on and switched=off |
| 02/20/1992 | DE4025548A1 Monitoring potential between sacrificial anode and steel reinforcement - monitoring change in potential between reference electrode and either anode or steel when pulsed current is applied, avoiding short circuit |
| 02/19/1992 | EP0471544A2 Semiconductor memory with a sequence of clocked access codes for test mode entry |
| 02/19/1992 | EP0471543A2 A semiconductor memory with a clocked access code for test mode entry |
| 02/19/1992 | EP0471542A2 An improved power-on reset circuit for controlling test mode entry |
| 02/19/1992 | EP0471541A2 A semiconductor memory with multiple clocking for test mode entry |
| 02/19/1992 | EP0471540A2 A semiconductor memory with a flag for indicating test mode |
| 02/19/1992 | EP0471399A1 Device for monitoring the supply voltage on integrated circuits |
| 02/19/1992 | EP0471196A2 Image analysis method |
| 02/19/1992 | EP0242700B1 Ac level calibration method and apparatus |
| 02/19/1992 | CN2096833U Sealed cd, ni storage battery charge test device |
| 02/19/1992 | CN2096817U Quick screening instrument for three-terminal regulated block |
| 02/19/1992 | CN2096769U Domestic protector of electrical equipment |