Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1991
10/09/1991EP0450806A2 Fault detection and isolation in automotive wiring harness
10/09/1991EP0450453A1 BICMOS input circuit for detecting signals out of ECL range
10/09/1991EP0450211A1 Contact shutter device in ic socket
10/09/1991EP0449967A1 Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors.
10/09/1991EP0449807A1 Process for monitoring short-circuits in a voltage circuit inverter.
10/09/1991EP0276305B1 Apparatus and method for measuring battery condition
10/09/1991CN2086419U Anti-jointing switch with ground wire checking unit
10/09/1991CN2086418U No-contact test unit
10/09/1991CN1055242A Automatic dc break down voltage tester for semiconductor devices
10/08/1991US5056094 Delay fault testing method and apparatus
10/08/1991US5056093 System scan path architecture
10/08/1991US5056061 Circuit for encoding identification information on circuit dice using fet capacitors
10/08/1991US5056023 Diagnosis system for motor vehicle
10/08/1991US5055780 Probe plate used for testing a semiconductor device, and a test apparatus therefor
10/08/1991US5055776 Flexible membrane circuit tester
10/08/1991US5055774 Integrated circuit integrity testing apparatus
10/08/1991US5055715 Semiconductor integrated circuit provided with monitor-elements for checking affection of process deviation on other elements
10/08/1991US5055710 Integrated logic circuit having plural input cells and flip-flop and output cells arranged in a cell block
10/08/1991US5055667 Non-linear photosite response in CCD imagers
10/08/1991CA1290464C Architecture and device for testable mixed analog and digital vlsi circuits
10/08/1991CA1290461C Test pin assembly for circuit board tester
10/08/1991CA1290398C Method and apparatus for isolating faults in an antenna system
10/04/1991CA2079338A1 Apparatus and method for calorimetrically determining battery charge state
10/03/1991WO1991015036A1 Measurement device and method for sorting used batteries and accumulators
10/03/1991WO1991014945A1 Directional sampling bridge
10/03/1991WO1991014600A1 Means for measuring the charging status of a storage battery
10/03/1991WO1991012094A3 Process and device for recuperating used batteries
10/03/1991CA2079219A1 Measurement device and method for sorting used batteries and accumulators
10/02/1991EP0449744A1 Directional sampling bridge
10/02/1991EP0449417A2 Testing random access memories
10/02/1991EP0449066A1 Clock digital multiplier
10/02/1991EP0448958A2 Semiconductor integrated circuit having non-volatile memory cells for controlling a predetermined function
10/02/1991EP0448767A1 Battery system
10/02/1991EP0448755A1 Intelligent battery system
10/02/1991EP0448619A1 Method and apparatus for protecting electrical systems.
10/02/1991EP0448610A1 Process and installation for the control of electro-mechanical converters.
10/02/1991DE4010198A1 Verfahren zum ueberwachen von induktiven lasten auf fehler A method for inductive loads to supervise error
10/02/1991CN2085971U Tester for hanging isolator of high-tension line
10/02/1991CN2085970U Measurer for flat cable
10/02/1991CN1055066A Power apparatus and method of location of fault in power apparatus
10/01/1991US5054097 Methods and apparatus for alignment of images
10/01/1991US5054050 Drop testing in fiber to the home systems
10/01/1991US5054024 System scan path architecture with remote bus controller
10/01/1991US5053981 Method of measuring electrical characteristics of electronic circuit
10/01/1991US5053712 Method for comparing the quality of rf absorbers
10/01/1991US5053700 Method for wafer scale testing of redundant integrated circuit dies
10/01/1991US5053699 Scanning electron microscope based parametric testing method and apparatus
10/01/1991US5053698 Test device and method for testing electronic device and semiconductor device having the test device
10/01/1991CA1290056C Circuit for testing the bus structure of a printed wiring card
10/01/1991CA1290018C Magnetic print hammer actuator protection circuit
10/01/1991CA1290017C Flexible imbedded test system for vlsi circuits
09/1991
09/26/1991DE4009262A1 Testing switching function of EM relay - suddenly changing direction of set part of excitation voltage as soon as switch=over occurs
09/26/1991DE4009184A1 Suppressing current peaks during commutation of brushless DC motor
09/25/1991EP0448419A1 Device for measuring the quality of the contact between two electrical conductors
09/25/1991EP0448358A2 Lamp Failure detection system
09/25/1991EP0448293A1 Method of locating a fault
09/25/1991EP0448273A1 Integrated circuit electromigration monitor
09/25/1991EP0448263A2 Semiconductor integrated circuit device having a test circuit
09/25/1991EP0448235A2 Battery charging apparatus
09/25/1991EP0447995A2 Analyzing device for saving semiconductor memory failures
09/25/1991EP0447928A1 Method and measurement device for indicating the state of a lead battery
09/25/1991EP0212997B1 Semiconductor integrated circuit adapted to carry out a test operation
09/25/1991EP0212208B1 Circuit arrangement for testing integrated-circuit units
09/24/1991US5051997 Semiconductor integrated circuit with self-test function
09/24/1991US5051938 Simulation of selected logic circuit designs
09/24/1991US5051876 Compound hand tool with a screwdriver
09/24/1991US5051810 Semiconductor device operating in high frequency range
09/24/1991US5051732 Power outlet ground integrity and wriststrap monitor circuit
09/24/1991US5051691 Zero power dissipation laser fuse signature circuit for redundancy in vlsi design
09/24/1991US5051690 Apparatus and method for detecting vertically propagated defects in integrated circuits
09/24/1991CA1289678C Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grip
09/24/1991CA1289652C Method and apparatus for establishing a servicing mode of an electronic apparatus
09/18/1991EP0447117A2 Built-in self test for analog to digital converters
09/18/1991EP0446951A2 Four-pole circuit breaker
09/18/1991EP0446945A2 Electronic equipment incorporating an integrated BTL circuit
09/18/1991EP0446933A2 Circuit breaker
09/18/1991EP0446838A2 Method of and apparatus for inspection of bonding wire
09/18/1991EP0446550A2 Per-pin integrated circuit test system having for each pin an N-bit interface
09/18/1991CN2085064U Apparatus for pasting wax chip to indicating temp.
09/17/1991USRE33692 Fault diagnosis system for electronic device on automobiles
09/17/1991US5050170 Apparatus for combining signals from first and second information processing elements
09/17/1991US5050093 Method and apparatus for inspecting electrical wire
09/17/1991US5050080 Diagnostic system for a motor vehicle
09/17/1991US5049816 Semiconductor substrate minority carrier lifetime measurements
09/17/1991US5049815 Spectral analysis of induction motor current to detect rotor faults with reduced false alarms
09/17/1991US5049814 Testing of integrated circuits using clock bursts
09/17/1991US5049813 Testing of integrated circuit devices on loaded printed circuit boards
09/17/1991US5049811 Measuring integrity of semiconductor multi-layer metal structures
09/17/1991US5049803 Method and apparatus for charging and testing batteries
09/17/1991CA2038295A1 High speed fail processor
09/17/1991CA1289193C Programmable level shifting interface device
09/17/1991CA1289191C Detection of transposition group short circuits in machine windings
09/12/1991DE4007011A1 Space-saving test head positioner - has hollow shaft clamping to stand with reduced counterweight via pulley system
09/11/1991EP0446014A2 Top-load socket for integrated circuit device
09/11/1991EP0445990A2 Power apparatus and method of location of a fault in a power apparatus
09/11/1991EP0445928A2 System for facilitating planar probe measurements of high-speed interconnect structures
09/11/1991EP0445831A1 Sorting method for variable capacitance diodes
09/11/1991EP0445826A2 Sequential logic circuit device
09/11/1991EP0445454A1 Hardware simulator
09/11/1991EP0365649A4 Apparatus and method for mapping the connectivity of communications systems with multiple communications paths
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