| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/11/1991 | EP0204697B1 Amenable logic gate and method of testing |
| 09/11/1991 | CN2084623U Monitor for electric network circuit insulation |
| 09/11/1991 | CN2084622U Digit display multifunctional pair line device |
| 09/10/1991 | WO1991014313A1 Method and apparatus for autoranging, quadrature signal generation, digital phase reference, and calibration in a high speed rf measurement receiver |
| 09/10/1991 | US5048094 Method and apparatus for checking pattern |
| 09/10/1991 | US5048021 Method and apparatus for generating control signals |
| 09/10/1991 | US5047961 Automatic battery monitoring system |
| 09/10/1991 | US5047725 Verification and correction method for an error model for a measurement network |
| 09/10/1991 | US5047724 Power cable arcing fault detection system |
| 09/10/1991 | US5047722 Apparatus for measuring internal resistance of wet cell storage batteries having non-removable cell caps |
| 09/10/1991 | US5047721 Faulty lamp tester |
| 09/10/1991 | US5047714 Printed circuit board and a method of recognizing the position of surface mounted parts |
| 09/10/1991 | US5047713 Method and apparatus for measuring a deep impurity level of a semiconductor crystal |
| 09/10/1991 | US5047712 Circuit for inverting the latter half of pattern output from device under test |
| 09/10/1991 | US5047711 Wafer-level burn-in testing of integrated circuits |
| 09/10/1991 | US5047710 System for scan testing of logic circuit networks |
| 09/10/1991 | US5047708 Apparatus for testing circuit boards |
| 09/10/1991 | US5046239 Method of making a flexible membrane circuit tester |
| 09/10/1991 | CA2077657A1 Method and apparatus for autoranging, quadrature signal generation, digital phase reference, and calibration in a high speed rf measurement receiver |
| 09/10/1991 | CA1288817C Automatic circuit tester control system |
| 09/10/1991 | CA1288816C System for diagnosing defects in electronic assemblies |
| 09/05/1991 | WO1991013365A1 Process and device for monitoring the functioning of an electrical consumer |
| 09/05/1991 | DE4104400A1 Car battery with discharge prevention - has some positive plates of end cell connected to voltage drop detector and device preventing further discharge |
| 09/05/1991 | DE4006505A1 Drive arrangement for DC motor with series current sensor - generates detect signal if sensor signal fails to maintain capacitor charge |
| 09/04/1991 | EP0444845A1 Semiconductor apparatus including semiconductor integrated circuit and operating method thereof |
| 09/04/1991 | EP0444825A2 Register circuit for scan pass |
| 09/04/1991 | EP0444816A2 Circuit element measuring method and apparatus |
| 09/04/1991 | EP0444806A2 Pseudo-exhaustive self-test technique |
| 09/04/1991 | EP0444023A1 System and method for depassivating a passivated lithium battery in a battery powered microprocessor control device. |
| 09/04/1991 | CN2084202U Digital electric line tester |
| 09/04/1991 | CN2084201U Current-time tester for thermistor |
| 09/03/1991 | US5046048 Semiconductor integrated circuit including output buffer |
| 09/03/1991 | US5046034 Array structure for use in an adaptive inference testing device |
| 09/03/1991 | US5046033 System for transferring test program information |
| 09/03/1991 | US5045840 Device for sensing continuity in a circuit having an open circuited apparatus |
| 09/03/1991 | US5045835 Apparatus and method for determining the existence of an abnormality in a vehicle operator protection system |
| 09/03/1991 | US5045787 Apparatus and method for measuring insulated track joint resistances |
| 09/03/1991 | US5045783 Method for testing a printed circuit board with a particle probe |
| 09/03/1991 | US5045782 Negative feedback high current driver for in-circuit tester |
| 09/03/1991 | US5045779 Method and apparatus for testing dynamoelectric machine rotors |
| 09/03/1991 | US5044750 Method for checking lithography critical dimensions |
| 09/03/1991 | CA1288526C Test circuit for measuring specific contact resistivity of self-aligned contacts in integrated circuits |
| 09/03/1991 | CA1288515C Automated test apparatus for use with multiple equipment |
| 09/03/1991 | CA1288478C Scan data path coupling |
| 08/31/1991 | CA2011208A1 System to identify conductors in a multi conductor cable |
| 08/29/1991 | DE4105320A1 Motor winding defect detector - applies AC voltage between 800 and 1,100 volts across windings and iron core and checks for steep rise in partial discharge tester signal |
| 08/29/1991 | DE4005609A1 Verfahren und vorrichtung zur funktionsueberwachung eines elektrischen verbrauchers Method and device for an electrical consumer who FUNCTION MONITORING |
| 08/28/1991 | EP0443546A2 Semiconductor device storage jig |
| 08/28/1991 | EP0443289A2 Apparatus for inspecting printed circuit boards |
| 08/28/1991 | EP0443275A1 Electrical edge contact member and a method of manufacturing same |
| 08/28/1991 | EP0443072A1 Shielded case for the thermical treatment of rotors |
| 08/28/1991 | EP0443034A1 System for detecting melt-adhesion of relay |
| 08/28/1991 | CN2083757U Electricity leakage alarm device |
| 08/28/1991 | CA2037112A1 Measuring device used to verify the contact established between two electric conductors |
| 08/28/1991 | CA2036263A1 Circuit element measuring apparatus and method |
| 08/27/1991 | US5043988 Method and apparatus for high precision weighted random pattern generation |
| 08/27/1991 | US5043987 Electronic device |
| 08/27/1991 | US5043986 Method and integrated circuit adapted for partial scan testability |
| 08/27/1991 | US5043985 Integrated circuit testing arrangement |
| 08/27/1991 | US5043984 Method and system for inspecting microprocessor-based unit and/or component thereof |
| 08/27/1991 | US5043931 Wrap test system and method |
| 08/27/1991 | US5043910 Printed circuit board function testing system |
| 08/27/1991 | US5043670 Block heater tester |
| 08/27/1991 | US5043651 Apparatus for displaying the remaining charge of rechargeable battery |
| 08/27/1991 | US5043589 Semiconductor device inspection apparatus using a plurality of reflective elements |
| 08/27/1991 | US5042952 Method and apparatus for evaluating surface and subsurface and subsurface features in a semiconductor |
| 08/27/1991 | US5042668 Method and apparatus for random electronic component testing |
| 08/27/1991 | US5042148 Method of manufacturing a probing card for wafer testing |
| 08/27/1991 | CA2037148A1 Detection device of an internal arc in a metalclad electrical installation |
| 08/22/1991 | WO1991012706A1 Making and testing an integrated circuit using high density probe points |
| 08/22/1991 | WO1991012536A1 Voltage imaging system using electro-optics |
| 08/22/1991 | WO1991012534A1 Voltage imaging system using electro-optics |
| 08/22/1991 | WO1991012532A2 Process and device for loading an adapter for a printed circuit tester |
| 08/22/1991 | WO1991012094A2 Process and device for recuperating used batteries |
| 08/22/1991 | DE4004542A1 Electrical signal contg. encoded IC structure information evaluation - comparing original signal with threshold and determining time between line and comparison signals |
| 08/22/1991 | DE4004445A1 DC machine armature resistance measurement - evaluating current resulting from voltage pulse applied to winding |
| 08/21/1991 | EP0442666A2 Diagnostic system for integrated circuits using existing pads |
| 08/21/1991 | EP0442151A2 Combination light unit and battery monitor device |
| 08/21/1991 | EP0442149A1 Device and method for charging an adapter for a printed circuit board testing device |
| 08/21/1991 | EP0204130B1 Apparatus for reducing test data storage requirements for high speed vlsi circuit testing |
| 08/21/1991 | CN2083298U Instant retaining-capacity tester for accumutators |
| 08/21/1991 | CN2083297U Ultrasonic photoelectric sensor for local discharge of electrical equipment |
| 08/21/1991 | CN1013618B Earth fault detacting system and device for power equipment |
| 08/21/1991 | CA2036004A1 Semiconductor device storage jig |
| 08/20/1991 | US5042034 By-pass boundary scan design |
| 08/20/1991 | US5041997 Lightwave component analyzer |
| 08/20/1991 | US5041976 Diagnostic system using pattern recognition for electronic automotive control systems |
| 08/20/1991 | US5041817 Arrangement for the inductive querying of and supplying of power to an isolated circuit having an electrical consuming device |
| 08/20/1991 | US5041783 Probe unit for an atomic probe microscope |
| 08/20/1991 | US5041017 Perfect coupling confirming mechanism for an electric connector |
| 08/20/1991 | CA1287886C Method and apparatus for testing digital systems |
| 08/20/1991 | CA1287885C Testing device for voltage testing of cables and cable sets |
| 08/20/1991 | CA1287884C High impedance fault analyzer in electric power |
| 08/20/1991 | CA1287869C Circuit for supervising contact for passenger protective device |
| 08/14/1991 | EP0441714A1 Device for monitoring the operation of a microprocessor system or the like |
| 08/14/1991 | EP0441518A2 Built-in self-test technique for read-only memories |
| 08/14/1991 | EP0441291A1 Withstand-voltage testing method and apparatus |
| 08/14/1991 | EP0440901A2 Ion beam apparatus as well as a process to perform potential measurements by means of an ion beam |
| 08/14/1991 | EP0290589A4 Fully programmable linear feedback shift register |
| 08/14/1991 | DE4003670A1 Tomographic measuring device - measures three=dimensional micro-magnetic or microelectronic fields with rotating device |