Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1992
11/25/1992CN1066506A Electronic measuring device of same time-base sampling pulse and testing signal
11/24/1992US5166970 Multi-conductor identifier with voice communication capability
11/24/1992US5166937 Arrangement for testing digital circuit devices having tri-state outputs
11/24/1992US5166880 Fault detection device for an automotive passenger protection device
11/24/1992US5166753 Method for inspecting electronic devices mounted on a circuit board
11/24/1992US5166625 Automatic device for measuring the noise level of electronic components
11/24/1992US5166624 Method for testing assembly susceptibility to electrostatic discharge events
11/24/1992US5166623 Method for indicating battery capacity
11/24/1992US5166609 Adapter and test fixture for an integrated circuit device package
11/24/1992US5166608 Arrangement for high speed testing of field-effect transistors and memory cells employing the same
11/24/1992US5166607 Method and apparatus to heat the surface of a semiconductor die in a device during burn-in while withdrawing heat from device leads
11/24/1992US5166606 High efficiency cryogenic test station
11/24/1992US5166604 Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
11/24/1992US5166600 Measuring device having an auxiliary electrode for a gas-insulated encased high-voltage conductor
11/24/1992US5166592 Method of detecting an unusual loading of an AC motor
11/24/1992US5165161 Cable making and testing apparatus
11/24/1992CA1310695C Logic performance verification and transition fault detection
11/24/1992CA1310694C Method and apparatus for testing photoelectric circuits
11/24/1992CA1310693C Electrical connecting apparatus for an electrical or electronic testing unit
11/22/1992CA2068952A1 Isolation monitoring and measuring device for an electrical power system with isolated neutral
11/21/1992WO1992020250A1 Multilayer female component for refastenable fastening device and method of making the same
11/19/1992EP0514265A2 Device for displaying remaining electric energy of battery
11/19/1992EP0514250A1 Device for in situ ultra high frequency broadband testing
11/19/1992EP0513994A2 An actuator and a valve actuator system
11/19/1992EP0513826A2 Method for measuring AC specifications of microprocessor
11/19/1992EP0513776A2 Instrument and method for 3-dimensional atomic arrangement observation
11/19/1992EP0513158A1 Control system
11/19/1992DE4215487A1 Semiconductor device heating unit esp. for high temp. testing - has heater surrounding holder channels rotated by motor about set angle and sensor registering entry and withdrawal of semiconductor arrangement
11/19/1992DE4110791C1 Test arrangement for cyclically charged and discharged batteries - allows defective battery to be switched out without disturbing testing process of other batteries
11/18/1992CN2122395U Multifunctional electronic circuit tester
11/18/1992CN2122394U Checker for line fault
11/18/1992CN2122392U 电子验电器 Electronic electroscope
11/17/1992US5164901 Method and apparatus for testing a vehicle occupant restraint system
11/17/1992US5164888 Method and structure for implementing dynamic chip burn-in
11/17/1992US5164761 Battery system for camera
11/17/1992US5164666 Method and apparatus for analyzing errors in integrated circuits
11/17/1992US5164665 IC tester
11/17/1992US5164664 Method for the optical measurement of electrical potentials
11/17/1992US5164663 Active distributed programmable line termination for in-circuit automatic test receivers
11/17/1992US5164662 Detection of radio frequency emissions
11/17/1992US5164661 Thermal control system for a semi-conductor burn-in
11/12/1992WO1992020042A1 Method for blocking smart card
11/12/1992DE4115307A1 Diagnostic circuit for idling control switch of IC engine - has two-position switch and additional resistors for proving correct switch function or identifying fault
11/12/1992DE4115088A1 HV resistance tester for protective clothing - has free-flowing electrically conducting electrode material to ensure efficient contact with all surfaces of sample
11/12/1992DE4113759C1 Testing circuit components of processor-controlled modules of communication system - applying single sufficient test program from memory zones of SRAM and DRAM arrangement including start information
11/12/1992DE4110752C1 Electrostatic tester producing test pulse for electronic components - comprises charged capacitor, discharge resistors and switching elements in matrix form releasing pulse
11/11/1992EP0512920A2 Detection circuit for detecting a state of a control system with improved accuracy
11/11/1992EP0512711A2 Device for measuring the quantity of electricity stored in a battery
11/11/1992EP0512340A1 Overcharge preventing device and overdischarge preventing device for a secondary battery
11/11/1992CN2121696U Power feedback device for test of asynchronous motor
11/11/1992CN1066127A Multi-function test pencil
11/10/1992US5162866 Apparatus and method for inspecting IC leads
11/10/1992US5162744 Method of determining settling time of a device under test
11/10/1992US5162743 Method and apparatus for optimizing the electrical length of a signal flow path
11/10/1992US5162742 Method for locating electrical shorts in electronic substrates
11/10/1992US5162741 Temperature compensated lithium battery energy monitor
11/10/1992US5162729 Embedded testing circuit and method for fabricating same
11/10/1992US5162728 Functional at speed test system for integrated circuits on undiced wafers
11/10/1992US5162727 Method and apparatus of determining the stator flux estimate of an electric machine
11/10/1992US5162721 Electronic system to discriminate a plurality of power sources
11/10/1992CA1310062C Arrangement for controlling switchgear
11/09/1992WO1992020194A1 Signal quality monitoring system
11/09/1992CA2102404A1 Signal quality monitoring system
11/04/1992EP0511752A1 High-speed integrated circuit testing with jtag
11/04/1992EP0511315A1 Probe and inverting apparatus
11/04/1992CN2121034U Automatic intelligence (compare) test instrument for standard cell
11/04/1992CN2121033U Stabilization value test instrument for discharge tube
11/04/1992CN2121032U Insulator twinkle displayer
11/04/1992CN2121031U Automobile detecting apparatus
11/04/1992CN1018953B Trap charge relaxation spectra method and its measuring system
11/03/1992US5161202 Method of and device for inspecting pattern of printed circuit board
11/03/1992US5161161 Minimum pulsewidth test module on clocked logic integrated circuit
11/03/1992US5161160 Circuit for testability
11/03/1992US5161159 Semiconductor memory with multiple clocking for test mode entry
11/03/1992US5161120 Data output buffer for a semiconductor memory
11/03/1992US5161112 Device for sensing and discriminating operational faults in an electrical power supply
11/03/1992US5160926 Display transducer apparatus
11/03/1992US5160884 Charged particle beam device
11/03/1992US5160883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support
11/03/1992US5160880 Method and apparatus for charging and testing batteries
11/03/1992US5160779 Testing semiconductors
11/03/1992US5159752 Scanning electron microscope based parametric testing method and apparatus
10/1992
10/29/1992WO1992019052A1 Mappable test structure for gate array circuit and method for testing the same
10/29/1992WO1992018872A1 Process for detecting a branch circuit subject to earth leaks in an electric power supply or distribution system
10/29/1992WO1992018871A1 Digital battery capacity warning device
10/29/1992WO1992018860A1 Method and apparatus for determining thermal resistance and structural integrity of coatings on conducting materials by monitoring electrical conductance of the underlying material upon localized heating of the overlying coating
10/29/1992WO1992018351A1 Method and apparatus for testing an airbag restraint system with parallel sensors
10/29/1992DE4213606A1 Transistor with current detection property - has main transistor region on substrate also carrying separately arranged measurement regions with common base and collector connections and separate emitter regions
10/28/1992EP0511145A2 Method for determining the thickness of an interfacial polysilicon/silicon oxide film
10/28/1992EP0511137A1 Procedure and apparatus for measuring and monitoring the electrical isolation of an active system
10/28/1992EP0510993A2 Characterization of sequential circuits
10/28/1992EP0510928A1 An apparatus for inspecting a semiconductor device
10/28/1992EP0510910A2 Apparatus for testing printed circuits
10/28/1992EP0510887A2 Method and apparatus for detecting and analyzing defective semiconductor element
10/28/1992EP0510862A1 Built-in self-test circuit
10/28/1992EP0510795A2 Timing window arc detection
10/28/1992EP0510708A1 Oscillating apparatus
10/28/1992EP0510430A2 Method and device for measuring the electrical potential of a sample with a radiation probe
10/28/1992EP0510389A1 Ordering shift register latches in a scan ring to facilitate diagnosis, testing and isolation
10/28/1992EP0510015A1 Method of charging a battery means with a load