G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
06/2011
06/09/2011	WO2011019160A3 Method for manufacturing a probe to be used in a semiconductor test or a flat panel display device test
06/09/2011	US20110137967 Display configuration for multimode electronic calipers having a ratiometric measurement mode
06/09/2011	US20110136272 Fabrication method of semiconductor integrated circuit device
06/09/2011	US20110133767 Silver alloy having excellent contact resistance and antifouling property and suitable for use in prove pin
06/09/2011	US20110133766 Transformer within wafer test probe
06/09/2011	CA2773815A1 Re-enterable end cap
06/08/2011	EP2330428A1 Test fixture for printed circuit board
06/08/2011	EP2329502A1 Probe cards including nanotube probes and methods of fabricating
06/08/2011	CN201859341U Remote control device for probe station
06/08/2011	CN201859210U Single-iron-core fluxgate and fluxgate single-axis sensor
06/08/2011	CN201859209U Single iron core fluxgate and double-shaft sensor for fluxgate
06/08/2011	CN201859208U Power battery insulation performance testing device
06/08/2011	CN201859198U Wafer level CIS (contact image sensor) testing device adopting probe card level pupil lens
06/08/2011	CN201859185U Load lead probing detection forceps
06/08/2011	CN201859172U Test pencil with insulating tape
06/08/2011	CN201859161U Asymmetric current source
06/08/2011	CN201859160U Aged load booster circuit
06/08/2011	CN201859159U Electric leading device for testing high-temperature resistance of charcoal/charcoal heating elements of high-temperature furnaces
06/08/2011	CN201859158U Fixed mount of printer for over the air (OTA) test
06/08/2011	CN201859157U Universal connector device for power battery tests
06/08/2011	CN201859156U Four-wire-method polymer lithium battery clamp
06/08/2011	CN201859155U Connected plug type electric energy meter crimping seat
06/08/2011	CN201859154U Air baffle
06/08/2011	CN201859153U Pre-centered positioning system of semiconductor chip test system
06/08/2011	CN102089668A Test of electronic devices with boards without sockets based on magnetic locking
06/08/2011	CN102087333A Apparatus, device, and method for cleaning tester interface contact elements and support hardware
06/08/2011	CN102087302A Signal generator
06/08/2011	CN102087301A Three-phase power supply device for partial discharge test
06/08/2011	CN101421630B Method for manufacturing probe sheet
06/08/2011	CN101251577B Test equipment capable of carrying composite test
06/07/2011	US7956629 Probe tile for probing semiconductor wafer
06/02/2011	US20110128026 Helical sensor for testing a composite medium
06/01/2011	EP2326963A1 Apparatus for testing integrated circuitry
06/01/2011	DE10297044B4 Testsockel Test Sockets
06/01/2011	CN201853921U Transition cable clamp of power primary equipment
06/01/2011	CN201853025U Probe block and board for detecting liquid crystal display panel
06/01/2011	CN201852913U Four-channel testing device for RFID high-frequency chips
06/01/2011	CN201852912U Electronic element testing mechanism
06/01/2011	CN201852909U Detection mechanism for solar cell plate
06/01/2011	CN201852906U Conductive electrode for insulating clothing
06/01/2011	CN201852902U ITO (information technology outsourcing) film conduction tester
06/01/2011	CN201852892U Single board test tooling
06/01/2011	CN201852860U Probe for testing high-voltage large-current product
06/01/2011	CN201852859U Test bed bracket for high-voltage bushing of transformer
06/01/2011	CN201852858U Semiconductor performance testing frame
06/01/2011	CN201852857U Touch type single phase intelligent instrument head
06/01/2011	CN201852856U Bead chain frame structure of spark testing machine
06/01/2011	CN201852855U Testing tooling for hard-wired power amplifier module
06/01/2011	CN201852854U Transformer detection wiring converter
06/01/2011	CN201852853U Load used for system aging
06/01/2011	CN102082553A Integrator of differential input
06/01/2011	CN102081111A Probe card
06/01/2011	CN102081110A Probe device
06/01/2011	CN102081109A Probe card and test apparatus including the same
06/01/2011	CN102081108A Signal acquisition system having reduced probe loading of a device under test
06/01/2011	CN102081107A Signal acquisition system having reduced probe loading of a device under test
06/01/2011	CN102081106A Direct-current ultra high voltage discharge device
06/01/2011	CN101659025B Probe polishing method and probe apparatus
06/01/2011	CN101458296B Multi-product silicon wafer test method
06/01/2011	CN101452009B Probe card for implementing silicon wafer grade test of HALL chip and test method
06/01/2011	CN101315402B Multi-test seat test station having in-turn arranged feeding section, test section and discharging section
06/01/2011	CN101052886B Replaceable probe apparatus for probing semiconductor wafer
05/2011
05/31/2011	US7952372 Contacting component, method of producing the same, and test tool having the contacting component
05/26/2011	US20110121849 Probe with printed tip
05/26/2011	US20110121848 Probe wafer, probe device, and testing system
05/26/2011	US20110121846 Contact structure for inspection
05/26/2011	US20110121820 High voltage sensing capacitor and indicator device
05/26/2011	US20110121816 Surge current detection device
05/26/2011	US20110120746 Precision shunt for high speed measurements
05/25/2011	EP2324535A1 Battery measuring terminal
05/25/2011	EP2115480B1 Test of electronic devices at package level using test boards without sockets
05/25/2011	CN201845905U Slot fixing device and electronic device applying same
05/25/2011	CN201845628U High-voltage load resistor bracket
05/25/2011	CN201845071U Electric test bench for testing crystalline silicon solar battery
05/25/2011	CN201845059U Process checking multimeter
05/25/2011	CN201845056U Electrical signal detector
05/25/2011	CN201845029U Test probe
05/25/2011	CN201845028U Probe card
05/25/2011	CN201845027U Rotary testing structure of circuit board tester
05/25/2011	CN201845026U Integral structure of high-voltage load box
05/25/2011	CN201845025U Power module test fixture with optimal design
05/25/2011	CN201845024U Test wiring tooling for locomotive traction converter
05/25/2011	CN102076173A Clamp for printed circuit board
05/25/2011	CN102075720A Device and method for detecting plug wire at video output port, device and method for detecting pull wire at video output port, and video play device
05/25/2011	CN102073277A Computer control system for power frequency insulating test
05/25/2011	CN102072994A Electrostatic test method for simulating practical service environment of product and neighboring equipment simulator
05/25/2011	CN102072991A Array tester provided with probe rod replacing unit
05/25/2011	CN102072982A Device and system for acquiring very fast transient overvoltage sensing signal
05/25/2011	CN102072975A Electrical property test fixture of super capacitor
05/25/2011	CN102072974A Clamp for power module reliability experiment
05/25/2011	CN102072973A Jig positioning pin for circuit board tester
05/25/2011	CN101587850B Bearing structure and testing device
05/25/2011	CN101346633B Probe card
05/25/2011	CN101334424B Pressure welding device possessing multiple pressing head
05/24/2011	US7948252 Multilayered probe card
05/19/2011	WO2011058646A1 Probe pin
05/19/2011	WO2011058375A1 Current measuring apparatus
05/19/2011	US20110115515 Probe for electrical test, electrical connecting apparatus using the same, and method for manufacturing probe
05/19/2011	US20110115514 Probe
05/19/2011	US20110115513 Wafer prober and failure analysis method using the same

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