Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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07/27/2011 | CN102135550A Probe card |
07/27/2011 | CN102135549A ICT testing auxiliary jig and testing method thereof |
07/27/2011 | CN101710659B Test jack for reactive controllable chip |
07/27/2011 | CN101571552B High-low temperature incubator for electric hysteresis loop measuring system |
07/27/2011 | CN101556293B Intelligent high-pressure range switching device |
07/27/2011 | CN101441227B Self-adapting contact probe set of multiple-set measurement |
07/27/2011 | CN101354428B Trolley for probe card and operation method of probe card using the same |
07/27/2011 | CN101178428B Relay connector |
07/26/2011 | US7987063 Fast, low power formatter for automatic test system |
07/21/2011 | WO2011088325A1 Methods and systems for measuring state of charge |
07/21/2011 | WO2011088310A1 Contact pin holder |
07/21/2011 | US20110175636 Terminal for flat test probe |
07/21/2011 | US20110175635 Probe for electrical test and method for manufacturing the same, and electrical connecting apparatus and method for manufacturing the same |
07/21/2011 | US20110175634 Fabrication method of semiconductor integrated circuit device |
07/21/2011 | US20110175597 Signal testing apparatus for load control system |
07/21/2011 | US20110175595 Sensor and measurement method |
07/21/2011 | CA2786560A1 Methods and systems for measuring state of charge |
07/20/2011 | EP2345901A2 Impedance corrected conductive-contact holder and conductive-contact unit |
07/20/2011 | EP2345900A2 Conductive-contact holder and conductive-contact unit |
07/20/2011 | CN201904224U Bottom electrode for aging test clamp of capacitor inner core |
07/20/2011 | CN201903632U Resistance balance detecting instrument |
07/20/2011 | CN201903617U High-voltage-resistant test device |
07/20/2011 | CN201903590U Insulation detecting instrument for mesh reinforcement |
07/20/2011 | CN201903586U Automatic test device for voltage and internal resistance of battery |
07/20/2011 | CN201903559U Probe group pedestal |
07/20/2011 | CN201903558U Test probe |
07/20/2011 | CN201903557U Female seat installation device |
07/20/2011 | CN201903556U Fixture used for scanning barcode of circular battery and measuring voltage and internal resistance of circular battery |
07/20/2011 | CN201903555U Auxiliary device for testing of transformer bushing tap |
07/20/2011 | CN1973208B A method for providing alignment of a probe |
07/20/2011 | CN102130390A Contact type electronic check module |
07/20/2011 | CN102129044A Power supply test system |
07/20/2011 | CN102129003A Inspection apparatus of circuit substrate |
07/20/2011 | CN102128992A Test system for no-load and locked-rotor characteristics of handheld electric tool |
07/20/2011 | CN102128965A Universal meter |
07/20/2011 | CN102128960A Assembling table frame of test device for durability of automobile rotary connector |
07/20/2011 | CN102128959A Portable nuclear phase auxiliary vehicle for mid switch cabinet |
07/20/2011 | CN102128958A Insulating support for supporting high-pressure testing leads and use method thereof |
07/20/2011 | CN102128957A Mechanical type full-automatic transformation ratio electrical bridge |
07/20/2011 | CN102128956A Connecting plate for test socket |
07/20/2011 | CN102128955A Auxiliary safety measure device for high-voltage test |
07/20/2011 | CN102128954A Blanking primitives masking circuit |
07/20/2011 | CN101706516B Frequency offset method based on beat method |
07/20/2011 | CN101650374B Semiconductor component test base provided with temperature-changing device and test machine platform |
07/20/2011 | CN101581757B Test system and test method |
07/20/2011 | CN101526403B Measurement device for temperature and current of high voltage line |
07/20/2011 | CN101294984B Probe apparatus and detection apparatus |
07/20/2011 | CN101285865B Method and apparatus for detecting tip position of probe, alignment method, and probe apparatus |
07/20/2011 | CN101261287B Probe assembling |
07/19/2011 | US7982480 Calibrated wideband high frequency passive impedance probe |
07/14/2011 | WO2011085227A2 Automatic probe configuration station and method therefor |
07/14/2011 | US20110171838 Segmented contactor |
07/14/2011 | US20110169516 Probe element having a substantially zero stiffness and applications thereof |
07/14/2011 | US20110169481 Test and measurement device with a pistol-grip handle |
07/14/2011 | DE19861283B4 Prüfstation mit innerer und äußerer Abschirmung Test station with inner and outer shield |
07/13/2011 | CN201897628U Tester for intermediate joints for cables with extruded insulation |
07/13/2011 | CN201897607U High-voltage linear amplifier used for high-voltage insulation dielectric spectrum analysis |
07/13/2011 | CN201897606U ICT (information communication technology) test tool with limiting column |
07/13/2011 | CN201897605U Compression leg assembly for power amplifier product test toolings |
07/13/2011 | CN201897604U High-voltage lead insulation bracket for high-voltage test |
07/13/2011 | CN201897603U Gravity type test loading tilting device for QFN (quad flat non-leaded package) chip |
07/13/2011 | CN201897602U Special arranging tool for GIS (global information system) local discharge ultrasonic testing sensor |
07/13/2011 | CN1704437B Sterically hindered reagents for use in single component siloxane cure systems |
07/13/2011 | CN102124353A Clamp with a non-linear biasing member |
07/13/2011 | CN102121971A Integral detection cabinet with battery cabin |
07/13/2011 | CN102121965A Overtravel testing device |
07/13/2011 | CN102121948A System for measuring transient shell voltage of gas insulated switchgear |
07/13/2011 | CN102121944A Microprobe structure and manufacturing method thereof |
07/13/2011 | CN101487874B High-speed test device |
07/12/2011 | US7977959 Method and apparatus for testing devices using serially controlled intelligent switches |
07/12/2011 | CA2354312C Methods and apparatus for secure programming of an electricity meter |
07/07/2011 | WO2011081129A1 Method for manufacturing printed circuit substrate and method for manufacturing probe substrate using the same |
07/07/2011 | US20110163774 Probe card |
07/07/2011 | US20110163772 Micro contact probe coated with nanostructure and method for manufacturing the same |
07/06/2011 | CN201892721U High voltage resistant testing device |
07/06/2011 | CN201892720U High-interference-resistant on-line monitoring device for partial discharge signal of transformer |
07/06/2011 | CN201892700U Secondary side electricity-testing and nuclear-phase handcart of central switch cabinet |
07/06/2011 | CN201892696U Heavy-current protection exiting device for synthesis test of direct current converter valve |
07/06/2011 | CN201892695U Multifunctional signal generator |
07/06/2011 | CN201892694U High-voltage large-capacity impact voltage generator |
07/06/2011 | CN201892693U RC equivalent load device for multiple valve type tests of direct current converter valve |
07/06/2011 | CN201892692U RLC equivalent load device for multiple valve type tests of direct current converter valve |
07/06/2011 | CN201892691U Improved probe detection structure |
07/06/2011 | CN201892690U Watch pen chunk and watch pen with same |
07/06/2011 | CN201892689U Semiconductor raw material detection working platform |
07/06/2011 | CN201892688U Impulse voltage generator shell structure for outdoor use |
07/06/2011 | CN201892687U Universal test clamp of mobile phone battery |
07/06/2011 | CN201892686U Polymer lithium battery fixture suitable for four-wire method |
07/06/2011 | CN1902499B Electronic component/interface interposer |
07/06/2011 | CN102117589A Array test device |
07/06/2011 | CN102116831A Integrated circuit (IC) detection device |
07/06/2011 | CN102116779A Intelligent probe card architecture |
07/06/2011 | CN101101314B Display panel test fixture and test method |
06/30/2011 | WO2011075875A1 Control and protection system for operational test device of converter valves |
06/30/2011 | US20110156740 Probe card |
06/30/2011 | US20110156739 Test kit for testing a chip subassembly and a testing method by using the same |
06/30/2011 | US20110156738 Semiconductor integrated circuit |
06/30/2011 | US20110156737 Contactor |
06/30/2011 | US20110156736 Semiconductor apparatus and probe test method thereof |
06/29/2011 | EP2338063A1 Measuring system for determining scatter parameters |