| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/29/2011 | CN201886233U Probe frame |
| 06/29/2011 | CN201886140U Magnetic induction density measuring device based on colossal magnetoresistance effect |
| 06/29/2011 | CN201886118U Light-emitting diode (LED) test jig |
| 06/29/2011 | CN201886115U Special flexible ultra-high-frequency detection sensor for stop valve |
| 06/29/2011 | CN201886040U Adjustable and controllable electric-arc generating device |
| 06/29/2011 | CN201886039U Locating device used for installing electrified line detection equipment |
| 06/29/2011 | CN201886038U Test fixture for power module reliability |
| 06/29/2011 | CN201886037U Detection electrical structure of surface mounted device (SMD) LED high-speed spectrophotometry machine |
| 06/29/2011 | CN1954227B Contactless interface of test signals with a device under test |
| 06/29/2011 | CN102112885A Electric contact member and contact probe |
| 06/29/2011 | CN102112884A Contactless loop probe |
| 06/29/2011 | CN102109569A Method for dielectric breakdown test on gate oxide adopting probe card |
| 06/29/2011 | CN102109544A Voltage sampling device and using method thereof |
| 06/29/2011 | CN102109538A Large-current fixture |
| 06/29/2011 | CN102109537A Radio shielding test socket and testing machine using radio shielding test sockets |
| 06/29/2011 | CN102109536A Fixture for testing high-voltage switch |
| 06/29/2011 | CN101533038B Novel test socket |
| 06/29/2011 | CN101438174B Input by-pass circuit for a current probe |
| 06/29/2011 | CN101275985B Probing method, probe apparatus |
| 06/29/2011 | CN101055298B Temperature detection function-incorporating current sensor |
| 06/28/2011 | US7969173 Chuck for holding a device under test |
| 06/28/2011 | US7969170 Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit |
| 06/28/2011 | US7967621 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 06/23/2011 | WO2011074837A2 Probe apparatus for a wafer solder bump |
| 06/23/2011 | US20110148451 Wiring board for testing loaded printed circuit board |
| 06/23/2011 | US20110148448 Loaded printed circuit board test fixture and method for manufacturing the same |
| 06/23/2011 | US20110148447 Multilayer ceramic substrate and probe board using pillar-type conductor and fabricating methods of the same |
| 06/22/2011 | EP2335084A1 Test adapter configuration |
| 06/22/2011 | EP1350096B1 Electro-optic system controller |
| 06/22/2011 | CN201876524U Adapting-type testing equipment for electronic part |
| 06/22/2011 | CN201876478U Control type liquid resistance load device with movable overflow pipe |
| 06/22/2011 | CN201876477U Aging test socket of 100-wire 0.5-pitch ceramic quad flat pack (CQFP) device |
| 06/22/2011 | CN201876476U Flexible test wire |
| 06/22/2011 | CN201876475U Chuck and strip testing machine with chuck |
| 06/22/2011 | CN201876474U Ultrahigh frequency electromagnetic wave signal detection sensor box |
| 06/22/2011 | CN201876473U Integral all-metal single-phase intelligent instrument subrack |
| 06/22/2011 | CN201876472U Millimeter wave transmitter-receiver (TR) component parameter test clamp device |
| 06/22/2011 | CN201876471U Bi-electrode magnetic battery clamp |
| 06/22/2011 | CN201876470U Four-electrode magnetic battery clamp |
| 06/22/2011 | CN201876469U Extra-high voltage and extra-large diameter voltage-sharing cover |
| 06/22/2011 | CN201876468U Digitiform contact and integrated circuit wafer testing machine with same |
| 06/22/2011 | CN201876436U Double wire anti-scale and anti-wax probe for capacitance method online test of water ratio in crude oil |
| 06/22/2011 | CN102103153A Array type probe card |
| 06/22/2011 | CN102103152A Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment |
| 06/22/2011 | CN102103151A Film type probe unit and manufacturing method of the same, manufacturing method and inspection method using the same of work |
| 06/22/2011 | CN102103150A Support needle and probe provided with support needle |
| 06/22/2011 | CN102103149A Test circuit board |
| 06/22/2011 | CN101545927B Method for manufacturing probe card and device of probe card |
| 06/22/2011 | CN101446595B Sample rack for measuring critical current properties of high-temperature superconducting tape |
| 06/22/2011 | CN101344551B Semi-conductor test structure |
| 06/16/2011 | WO2011072076A2 Transformer within wafer test probe |
| 06/16/2011 | WO2011071082A1 Contact probe |
| 06/16/2011 | WO2011046290A3 Slidable pogo pin |
| 06/16/2011 | US20110140687 Digital multimeter having case panel structure |
| 06/15/2011 | CN201867476U Wide-load analog controller |
| 06/15/2011 | CN201867472U 模拟断路器 Analog Circuit Breakers |
| 06/15/2011 | CN201867461U Clamping, energizing and testing device for product |
| 06/15/2011 | CN201867434U Storage type signal generator |
| 06/15/2011 | CN201867433U Battery test fixture with scales |
| 06/15/2011 | CN201867432U Connecting handle of current transformer calibrator |
| 06/15/2011 | CN201867431U High-voltage transmission conductor positioning bracket for electric cabinet |
| 06/15/2011 | CN201867430U Positioning structure of test bench |
| 06/15/2011 | CN201867429U Clamp |
| 06/15/2011 | CN201867428U Test head structure and test head |
| 06/15/2011 | CN201867427U Testing, printing and braiding integrated machine and separate type rotating disk |
| 06/15/2011 | CN201867426U Electrical testing device |
| 06/15/2011 | CN201867425U Automatic conveyor of semiconductor substrate electrical conductivity testing instrument |
| 06/15/2011 | CN201866475U Device for stabilizing and supporting extra-high voltage resonance reactor tower |
| 06/15/2011 | CN1898572B Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 06/15/2011 | CN102099699A Substrate-inspecting device having cleaning mechanism for tips of pins |
| 06/15/2011 | CN102099694A A multi-point probe for testing electrical properties and a method of producing a multi-point probe |
| 06/15/2011 | CN102099693A Measurement probe |
| 06/15/2011 | CN102099692A Probe |
| 06/15/2011 | CN102096047A Detecting tool for performance of battery group |
| 06/15/2011 | CN102096032A Experimental facility and method for electric heating combined stress aging with oil-paper insulation of transformer |
| 06/15/2011 | CN102095905A Signal acquisition system having probe cable termination in a signal processing instrument |
| 06/15/2011 | CN102095904A Signal acquisition system having a compensation digital filter |
| 06/15/2011 | CN102095903A Two abutting sections of an align fixture together floatingly engaging an electronic component |
| 06/15/2011 | CN102095902A Surface leakage current testing and shielding tool for electric equipment |
| 06/15/2011 | CN102095901A Substrate for use in measuring electric characteristics |
| 06/15/2011 | CN102095900A Detecting system |
| 06/15/2011 | CN102095899A Wiring device and current mutual inductance testing system |
| 06/15/2011 | CN101639489B Material separating device |
| 06/15/2011 | CN101566667B MOS component testing method |
| 06/15/2011 | CN101557683B Probe card used for IC wafer electrical property testing |
| 06/15/2011 | CN101453825B Low loss multilayered circuit board |
| 06/15/2011 | CN101413977B High pressure measuring apparatus |
| 06/15/2011 | CN101398457B Wafer, test system thereof, test method thereof, and test fixture thereof |
| 06/15/2011 | CN101393250B Test socket and test board for wafer level semiconductor testing |
| 06/15/2011 | CN101201362B Tester table |
| 06/15/2011 | CN101178427B Relay connector |
| 06/15/2011 | CN101153878B Coordinate transforming apparatus for electrical signal connection |
| 06/15/2011 | CN101131398B Integrated circuit tester |
| 06/14/2011 | US7961846 Interface device for testing a telecommunication circuit |
| 06/14/2011 | US7960991 Test apparatus and probe card |
| 06/14/2011 | US7960990 Closed-grid bus architecture for wafer interconnect structure |
| 06/14/2011 | US7960988 Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| 06/09/2011 | WO2011068506A1 Signal sensing devices and circuit boards |
| 06/09/2011 | WO2011066640A1 Re-enterable end cap |
| 06/09/2011 | WO2011022301A3 Wafer level contactor |