| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/20/1986 | US4589815 Electronic test head positioner for test systems |
| 05/13/1986 | US4588346 Positioner for maintaining an object in a substantially weightless condition |
| 05/07/1986 | EP0180013A1 Test probe system |
| 05/07/1986 | CN85203393U Electrode device for measuring dielectric capacity and electrical resistivity at low-and-high temperature |
| 05/06/1986 | US4587484 Mercury probe and method |
| 05/06/1986 | US4587481 Arrangement for testing micro interconnections and a method for operating the same |
| 04/30/1986 | EP0179298A1 A method of eliminating the influence on one or more persons or animals from a magnetic field generating source and a device for eliminating such influence |
| 04/29/1986 | US4585991 Solid state multiprobe testing apparatus |
| 04/29/1986 | US4585727 Fixed point method and apparatus for probing semiconductor devices |
| 04/29/1986 | US4585290 Modular test plug adapter |
| 04/22/1986 | US4584526 Combination continuity and live circuit path tester |
| 04/22/1986 | US4584525 Current-shunt system for known conductors |
| 04/16/1986 | EP0177809A1 Coaxial connector arrangement |
| 04/15/1986 | US4583042 Capacitive circuit board testing system and method using a conductive pliant elastomeric reference plane |
| 04/15/1986 | US4582383 Terminal apparatus and a batch inserting type test plug for a drawer type relay |
| 04/15/1986 | US4582379 Test shoe for telephone connector blocks |
| 04/09/1986 | EP0177210A1 Electric circuit testing equipment |
| 04/09/1986 | EP0176644A1 Shock-resistant container, particularly for a portable measurement apparatus |
| 04/02/1986 | EP0176488A1 Instrument for measuring electrical quantities, having adjustable threshold detectors |
| 04/02/1986 | EP0175995A1 Arrangement for testing integrated circuits |
| 04/01/1986 | US4580095 Current divider for a measuring transducer |
| 03/25/1986 | CA1202392A1 Holder for connecting electrical conductors to contact surfaces on electronic components |
| 03/19/1986 | EP0174511A1 Fiber-optical current sensor |
| 03/18/1986 | US4576174 Micro electrode |
| 03/04/1986 | US4574236 High frequency test fixture |
| 03/04/1986 | US4574235 Transmission line connector and contact set assembly for test site |
| 02/27/1986 | WO1986001133A1 Pass-through test socket for semiconductor devices |
| 02/25/1986 | US4573009 Printed circuit board test fixture with flexion means for providing registration between the test probes and the circuit board |
| 02/25/1986 | US4573007 Digital test probe having memory for logic levels at different test locations |
| 02/19/1986 | EP0172132A1 Test adapter |
| 02/19/1986 | EP0171885A1 Programmable bed-of-nailstest access jigs |
| 02/18/1986 | US4571542 Method and unit for inspecting printed wiring boards |
| 02/18/1986 | US4571540 Electrical contact probe |
| 02/11/1986 | US4570117 Modular field strength instrument |
| 02/04/1986 | US4568879 Marking apparatus |
| 01/28/1986 | US4567433 Complex probe card for testing a semiconductor wafer |
| 01/28/1986 | US4567432 On a semiconductor wafer |
| 01/28/1986 | US4566594 Component verifier |
| 01/28/1986 | US4566184 Process for making a probe for high speed integrated circuits |
| 01/21/1986 | CA1199696A1 Voltage divider |
| 01/15/1986 | EP0167884A2 DC supply unit with overcurrent protection |
| 01/14/1986 | US4564806 Taut band instrument having accurate taut band positioning means |
| 01/07/1986 | US4563640 Fixed probe board |
| 01/07/1986 | CA1199069A1 Active voltage probe |
| 01/03/1986 | WO1986000173A1 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine |
| 12/31/1985 | US4561711 Connector saver assembly |
| 12/27/1985 | EP0165331A1 Buckling beam test probe assembly |
| 12/24/1985 | US4560926 Contact device for use in the testing of printed circuits and a removable contact head for use in such a device |
| 12/24/1985 | US4560223 Self-cleaning tri-cusp signal contact |
| 12/24/1985 | CA1198478A1 Convertible multirate dial register for energy consumption meters |
| 12/18/1985 | EP0164722A1 Automatic test system |
| 12/18/1985 | EP0164672A2 A multiple mode buckling beam probe assembly |
| 12/11/1985 | EP0093727B1 Current transformer |
| 12/10/1985 | US4557383 Shock proof case |
| 12/04/1985 | EP0163462A1 Electrostatic system analyzer |
| 12/04/1985 | EP0163414A1 Integrated circuit test socket |
| 12/04/1985 | EP0163211A2 High density probe-head with isolated and shielded transmission lines |
| 12/03/1985 | US4556844 Apparatus for mounting an electrical sensing device or encoder on a data output indicator or meter |
| 12/03/1985 | US4556269 Holder for electronic components |
| 12/03/1985 | CA1197557A1 Viscous dampening arrangement for taut-band suspension |
| 11/27/1985 | EP0162148A1 Method for detecting the relationship of the needle coordinates of a needle contact field to the addresses of the contact needles of a wiring test automatic machine |
| 11/19/1985 | US4554513 Replica circuit |
| 11/19/1985 | US4554506 Modular test probe |
| 11/19/1985 | US4554505 Test socket for a leadless chip carrier |
| 11/19/1985 | CA1196960A1 Miniature electrical probe |
| 11/12/1985 | US4552018 Interchangeable scale meter case |
| 11/06/1985 | EP0160209A1 Measurement of electrical signals with subpicosecond resolution |
| 11/05/1985 | USRE32024 Mercury probe |
| 11/05/1985 | US4551675 Apparatus for testing printed circuit boards |
| 11/05/1985 | US4551673 Testing arrangement for printed circuit boards |
| 10/16/1985 | EP0158432A1 Chip carrier test adapter |
| 10/15/1985 | US4547028 For an electrical device |
| 10/15/1985 | CA1195386A1 Testing device |
| 10/01/1985 | US4544888 Miniature circuit processing devices and matrix test heads for use therein |
| 10/01/1985 | US4544886 Circuit board test fixture |
| 09/24/1985 | CA1194122A1 Self-powered ammeter |
| 09/17/1985 | US4541676 Chip carrier test adapter |
| 09/10/1985 | US4540940 Circuit tester for automotive electrical systems |
| 09/10/1985 | US4540227 Test equipment interconnection system |
| 09/10/1985 | CA1193321A1 Test instrument with flexibly connected head |
| 08/28/1985 | EP0153010A1 Circuit board testing |
| 08/27/1985 | US4538104 In-circuit test apparatus for printed circuit board |
| 08/27/1985 | CA1192640A1 Variable high-current electrical load bank with rapid adjustment over a wide range of currents |
| 08/20/1985 | US4536051 Electrical interface arrangements |
| 08/20/1985 | US4535536 Method of assembling adaptor for automatic testing equipment |
| 08/13/1985 | US4535307 Microwave circuit device package |
| 08/13/1985 | US4534605 Symmetrical, single point drive for contacts of an integrated circuit tester |
| 08/07/1985 | EP0150327A1 Contact device |
| 08/06/1985 | US4533864 Test instrument with flexibly connected head |
| 08/06/1985 | US4533192 Integrated circuit test socket |
| 07/31/1985 | EP0149776A1 Adapter for printed circuit testing device |
| 07/30/1985 | US4532423 IC Tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested |
| 07/30/1985 | US4531799 Electrical connector |
| 07/24/1985 | EP0149420A1 Contact-making socket for the control of electrical circuits, especially printed circuits, and method of making this socket |
| 07/09/1985 | US4528504 Pulsed linear integrated circuit tester |
| 07/09/1985 | US4528500 Apparatus and method for testing circuit boards |
| 07/09/1985 | US4527942 Electronic test head positioner for test systems |
| 07/09/1985 | CA1190285A1 Measurement shunt with compensation for induced error voltages |
| 07/02/1985 | US4527119 High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber |
| 06/26/1985 | EP0146037A2 Method for manufacturing a coaxial line rigid probe interposer |