Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
---|
03/10/1987 | US4649338 Fine line circuitry probes and method of manufacture |
03/03/1987 | US4647851 Fine line circuitry probes and method of manufacture |
02/25/1987 | CN86200112U Misoperation indicating device for universal meter |
02/24/1987 | US4646007 Tachometer indicator with uncompensated magnetic return to zero |
02/24/1987 | US4646005 Signal probe |
02/18/1987 | CN85102189A Systems engineering of electric power measurement |
02/17/1987 | US4644269 Test fixture having full surface contact hinged lid |
02/17/1987 | US4643501 Electronic board fixture |
02/04/1987 | CN85204505U Small-signal linear wave detector for oscillograph |
01/29/1987 | DE3526137A1 Device for decoupling a test probe |
01/27/1987 | US4639058 Low profile test clip and handle therefor |
01/22/1987 | DE3525325A1 Automatic contact terminal |
01/20/1987 | US4638239 Reference voltage generating circuit |
01/15/1987 | DE3524420A1 Device for storing test prods or probe tips |
01/14/1987 | EP0208590A1 Hall effect current-measuring probe |
01/13/1987 | US4636723 Testing device for printed circuit boards |
01/13/1987 | US4636722 High density probe-head with isolated and shielded transmission lines |
01/13/1987 | US4636026 Electrical test probe |
01/07/1987 | EP0207129A1 Test fixture for facilitating the connection of leads of an integrated circuit packeage to test apparatus |
12/30/1986 | US4633176 Test fixture including deflectable probes |
12/30/1986 | US4632485 Electrical circuit testing apparatus |
12/30/1986 | EP0206488A1 Method and apparatus for measuring electric current |
12/30/1986 | EP0205768A2 Measuring instrument housing |
12/24/1986 | CN85202641U Tong-type leakage current meter detection system |
12/23/1986 | CA1215790A1 Component verifier |
12/18/1986 | WO1986007493A1 Calibration apparatus for integrated circuits |
12/17/1986 | EP0201181A1 Probe assembly for use with electronic instrument |
12/16/1986 | US4629981 Meter overdrive protection circuit |
12/16/1986 | US4629975 Coaxial probe for measuring the current density profile of intense electron beams |
12/16/1986 | US4629262 Position sensor for magnetic suspension and pointing system |
12/10/1986 | CN86200707U Isolating tester |
12/03/1986 | EP0203369A1 Arrangement for or in moving iron or moving coil instruments |
12/03/1986 | CN85104346A Alternating millivoltmeter having single composited tube amplifier |
12/02/1986 | US4626780 Tri-axis automated test system for printed circuit boards |
12/02/1986 | US4626779 Spring-stops for a bi-level test fixture |
12/02/1986 | US4626778 Active current sensor with primary reducing winding |
12/02/1986 | US4626776 Circuit board testing apparatus |
12/02/1986 | US4626775 Radio frequency probing apparatus for surface acoustic wave devices |
11/25/1986 | US4625262 Pointer illuminating structure in measuring instrument |
11/25/1986 | US4625164 Vacuum actuated bi-level test fixture |
11/20/1986 | WO1986006841A1 Pc board test fixture |
11/20/1986 | EP0118147B1 Measuring and damping resistance arrangement for a high-voltage apparatus |
11/18/1986 | US4623839 Probe device for testing an integrated circuit |
11/11/1986 | US4622514 Multiple mode buckling beam probe assembly |
11/06/1986 | WO1986006495A1 A coplanar waveguide probe |
11/04/1986 | US4621232 Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
11/04/1986 | US4620765 Eight conductor modular test adapter |
10/28/1986 | US4620151 Electric current measuring tongs with magnetic circuit and pivoting arm |
10/21/1986 | US4618821 Test probe assembly for microelectronic circuits |
10/21/1986 | US4618820 Probe support for test fixture of printed circuit artworks |
10/21/1986 | US4618819 Measurement of electrical signals with subpicosecond resolution |
10/21/1986 | US4618208 Circuit test clip |
10/21/1986 | US4618199 Low insertion force socket |
10/15/1986 | EP0197637A1 Electrical circuit test probe and connector |
10/15/1986 | EP0197636A1 Electrical connector for electrical circuit test probe and connector |
10/14/1986 | US4617548 Current sensing resistance apparatus |
10/08/1986 | EP0196495A1 Pliers |
10/08/1986 | CN85204716U Multipurpose multimeter pen |
10/07/1986 | US4616178 Pulsed linear integrated circuit tester |
10/01/1986 | EP0196158A1 Apparatus and methods for resistivity testing |
10/01/1986 | EP0196149A1 Electrical interface arrangements |
09/30/1986 | US4614386 Adaptor for changing the pitch of a contact array used with a printed circuit board testing apparatus |
09/24/1986 | EP0195556A1 Test clip for PLCC |
09/24/1986 | EP0195467A1 Induction probe arrangement with several probes |
09/23/1986 | US4613813 Electrostatic system analyzer |
09/17/1986 | EP0194805A1 Test clip for PLCC |
09/17/1986 | EP0194695A1 Process and testing adapter for contacting elements for testing |
09/09/1986 | US4611166 Radiation hazard detector |
09/02/1986 | US4609243 Adaptor for automatic testing equipment |
08/27/1986 | EP0192345A1 Apparatus for automated testing of surface mounted components |
08/27/1986 | EP0192057A2 Device for making an electrically conductive contact on an insolated cable core |
08/26/1986 | CA1210454A1 Vision obstructing shield for electric meters |
08/14/1986 | WO1986004685A1 Arrangement for the measurement of electronic units |
08/13/1986 | EP0190164A1 Pass-through test socket for semiconductor devices |
08/12/1986 | US4605894 High density test head |
08/12/1986 | CA1209725A1 Integrated circuit mounting apparatus |
08/06/1986 | CN85203305U Plier-type power factor meter |
08/05/1986 | US4604572 Device for testing semiconductor devices at a high temperature |
08/05/1986 | CA1209277A1 Adaptor for automatic testing equipment and method |
07/30/1986 | EP0189179A1 Test adapter |
07/29/1986 | US4603293 Measurement of electrical signals with subpicosecond resolution |
07/29/1986 | US4603023 Method of making a hybrid dielectric probe interposer |
07/22/1986 | CA1208293A1 Sensing switch for a detachable communications probe |
07/15/1986 | US4600878 Apparatus for testing electrical microprinted circuits utilizing ionizing gas for providing electrical connections |
07/08/1986 | US4599559 Test probe assembly for IC chips |
07/08/1986 | US4599557 Logic probe |
07/02/1986 | EP0185714A1 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine. |
07/01/1986 | US4598246 Printed circuit board tester having a flex and wiping action free vacuum actuated edge connector |
07/01/1986 | US4597622 Electrical connector for electrical circuit test probe and connector |
06/19/1986 | WO1986003591A1 Contact set for test apparatus for testing integrated circuit package |
06/18/1986 | EP0184619A2 Printed circuit testing device |
06/18/1986 | EP0184609A1 Device for measuring a current with a resistor |
06/10/1986 | US4593804 Apparatus for guiding a circuit board onto a testing location on a test fixture |
06/04/1986 | CN85203169U Multiple purpose millivolt, temperature and heat flow tester |
06/03/1986 | US4593243 Coplanar and stripline probe card apparatus |
05/21/1986 | EP0181806A1 Integrated circuit test clip |
05/21/1986 | EP0181729A1 Apparatus for use in testing circuit boards |
05/21/1986 | EP0181429A1 Contact probe |
05/20/1986 | US4590422 Automatic wafer prober having a probe scrub routine |
05/20/1986 | US4590335 Test shoe for telephone connector blocks having module retraction means |