| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/19/1988 | US4758780 Circuit board test apparatus and method |
| 07/19/1988 | US4758777 Surface resistivity meter |
| 07/13/1988 | EP0274257A1 Gauge driving system |
| 07/12/1988 | US4757256 High density probe card |
| 07/12/1988 | US4757255 Environmental box for automated wafer probing |
| 07/12/1988 | US4757254 High-speed side access edge connector testing assembly |
| 07/12/1988 | CA1239203A1 Test clip for plcc |
| 07/07/1988 | DE3643873A1 Method and device for testing electrical circuits cast in synthetic resin |
| 07/06/1988 | EP0273825A1 Device for measuring the characteristics of a very high frequency component |
| 07/06/1988 | EP0273194A1 Adapter for testing printed circuit boards |
| 07/06/1988 | EP0273103A2 Sensor circuit arrangement |
| 07/05/1988 | US4755747 Wafer prober and a probe card to be used therewith |
| 07/05/1988 | US4754555 Apparatus for inspecting the coplanarity of leaded surface mounted electronic components |
| 06/30/1988 | WO1988004782A1 Electrical device contactor |
| 06/30/1988 | DE3643305A1 Contact element for test adapters |
| 06/30/1988 | DE3643142A1 Test adapter |
| 06/29/1988 | EP0272450A1 Device for testing printed circuit boards |
| 06/23/1988 | DE3643253A1 Device for the automatic measuring check of assembled circuit boards |
| 06/16/1988 | DE3641144A1 Peak voltage measuring instrument |
| 06/15/1988 | EP0271397A1 Indicating device with a coil, and pivoting equipment of the galvanometer or logometer type |
| 06/15/1988 | EP0270821A1 Arrangement for compensation the frequency response of a shunt |
| 06/14/1988 | US4751458 Test pads for integrated circuit chips |
| 06/14/1988 | US4751457 Integrated circuit probe parallelism establishing method and apparatus |
| 06/14/1988 | US4751456 Arrangement for or in moving iron or moving coil instruments |
| 06/14/1988 | US4750890 Test socket for an integrated circuit package |
| 06/14/1988 | CA1238113A1 Cart and basket arrangement for testing printed circuit boards |
| 06/14/1988 | CA1238098A1 Modular test plug adapter |
| 06/08/1988 | EP0270422A1 Circuit for measuring the dynamic characteristics of a housing for a high-speed integrated circuit, and method of measuring these dynamic characteristics |
| 06/08/1988 | EP0270276A1 Circuit testing device |
| 06/07/1988 | US4749947 Grid-based, "cross-check" test structure for testing integrated circuits |
| 06/07/1988 | US4749945 Test equipment for printed circuit boards |
| 06/07/1988 | US4749943 Automatic test system |
| 06/07/1988 | US4749942 Wafer probe head |
| 06/07/1988 | US4749362 Short-circuit-proof connector clip for a multiterminal circuit |
| 06/07/1988 | US4749356 Probe for in-circuit emulator |
| 06/01/1988 | EP0268969A1 Adapter for a device for testing printed circuit boards |
| 06/01/1988 | DE3738331A1 Device for damping the pointer movement in moving-iron measuring instruments |
| 06/01/1988 | CN87210424U Magnetoelectric type multi-needle measurement meter |
| 06/01/1988 | CN87208643U Protection and anti-electricity-stealing relay for watt-hour meter |
| 05/31/1988 | US4748405 Current sensor arrangement |
| 05/31/1988 | US4747784 For establishing an electrical connection |
| 05/24/1988 | US4746861 Test fixture for printed circuit board assembly |
| 05/24/1988 | US4746857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer |
| 05/24/1988 | US4745813 Extended spindle electric gage mechanism |
| 05/19/1988 | WO1988003651A1 Testing device for electric printed circuit boards |
| 05/18/1988 | EP0267502A1 System for the compensation of the effect of the return current asymmetry on the response of a current measuring shunt |
| 05/18/1988 | CN87201667U 负载传感器 Load Sensors |
| 05/10/1988 | US4743875 Circuit breaker having a direct current measuring shunt |
| 05/10/1988 | US4743846 Rectangular shunt with measurement compensation system |
| 05/10/1988 | US4743839 Wide bandwidth probe using pole-zero cancellation |
| 05/05/1988 | WO1988003319A1 Electric resistor equipped with thin film conductor and power detector |
| 05/05/1988 | DE3637406C1 Test device for circuit boards |
| 05/04/1988 | EP0265767A1 Probe card |
| 05/04/1988 | EP0265423A1 Presentation panel. |
| 04/27/1988 | EP0265076A1 Electrical measuring shunts |
| 04/26/1988 | US4740923 Memory circuit and method of controlling the same |
| 04/26/1988 | US4740746 Controlled impedance microcircuit probe |
| 04/26/1988 | US4740745 Polarity and continuity tester for primary and secondary automotive circuits |
| 04/26/1988 | CA1235748A1 Replica circuit |
| 04/21/1988 | DE3734647A1 Pin board |
| 04/19/1988 | US4739259 Telescoping pin probe |
| 04/19/1988 | US4739257 Testsite system |
| 04/19/1988 | US4739249 Method and apparatus for the measurement of the properties of sheet- or foil-like materials of low electrical conductivity |
| 04/19/1988 | US4739184 Portable transducer simulator |
| 04/19/1988 | US4738875 Method of screening plastics member from electromagnetic interference |
| 04/19/1988 | US4738633 Device for making an electrically conductive contact to an insulated cable lead |
| 04/14/1988 | DE3636361C1 Adapter for testing the performance of electrical components intended for surface mounting |
| 04/13/1988 | EP0263307A2 Board fixturing system |
| 04/13/1988 | EP0263244A1 Apparatus for the electronic testing of printed circuits with contact points in an extremely fine raster (1/20th to 1/10th inch) |
| 04/13/1988 | EP0263154A1 Multimeter. |
| 04/12/1988 | US4736522 Process for loading test pins |
| 04/12/1988 | US4736480 Cable wire testing pliers |
| 04/07/1988 | WO1988002549A1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer |
| 04/06/1988 | EP0262371A2 Contacting device in the form of a so-called pin-card for testing micro-electronic multipole components |
| 04/06/1988 | EP0262367A1 Mechanical probe for the measurement of time-dependent electrical signals |
| 04/06/1988 | CN87202540U Phase-sequence pen of universol avometer |
| 04/06/1988 | CN87106593A Electronic appliance |
| 04/05/1988 | US4735580 Test adapter for integrated circuit carrier |
| 03/30/1988 | EP0261951A2 Electronic appliance comprising a load call |
| 03/30/1988 | EP0261829A1 Electrical interface arrangement |
| 03/30/1988 | CN87212115U Intelligent watt-hour meter |
| 03/29/1988 | US4734046 Coaxial converter with resilient terminal |
| 03/23/1988 | EP0260782A1 Low impedance switched attenuator |
| 03/23/1988 | CN87207622U Magnetic induced elements for electric control device of electro-mechanical equipment |
| 03/22/1988 | US4733172 Apparatus for testing I.C. chip |
| 03/16/1988 | EP0260096A1 Integrated circuit probe station |
| 03/16/1988 | EP0260024A2 Integrated circuit probe parallelism establishing method and apparatus |
| 03/16/1988 | EP0259942A2 Piezoelectric pressure sensing apparatus for integrated circuit testing stations |
| 03/16/1988 | EP0259667A2 Testing station for integrated circuits |
| 03/15/1988 | US4731577 Coaxial probe card |
| 03/15/1988 | CA1234188A1 Reference voltage generating circuit |
| 03/09/1988 | EP0259163A2 Semiconductor wafer probe |
| 03/09/1988 | EP0259162A2 Integrated circuit probe system |
| 03/09/1988 | EP0259161A2 Multiple lead probe for integrated circuits in wafer form |
| 03/09/1988 | EP0258494A2 Modified BNC connector for active probe |
| 03/09/1988 | CN87207483U Universal meters probe |
| 03/09/1988 | CN87207304U Universal electric meter |
| 03/08/1988 | US4730159 Programmable bed-of-nails test access jigs |
| 03/03/1988 | DE3727241A1 Contact-making device |
| 03/03/1988 | DE3629407A1 Contacting device in the form of a so-called needle card for microelectronic components to be tested and having a large number of pins |