Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
06/2011
06/22/2011EP1466333B1 Microstructures
06/14/2011US7959779 Macroscopically manipulable nanoscale devices made from nanotube assemblies
06/09/2011US20110138507 Whispering gallery mode ultrasonically coupled scanning probe microscope
05/2011
05/31/2011US7954166 Independently-addressable, self-correcting inking for cantilever arrays
05/26/2011US20110126329 Device comprising a cantilever and scanning system
05/25/2011CN1871378B Deposition method for nanostructure materials
05/24/2011US7946020 Manufacturing of micro-objects such as miniature diamond tool tips
05/19/2011US20110114476 Method and apparatus for specimen fabrication
05/17/2011US7945966 Nanometric emitter/receiver guides
05/17/2011US7945963 Information memory apparatus using probe
05/17/2011US7945962 Information memory apparatus using probe
05/12/2011US20110113517 Wear-less operation of a material surface with a scanning probe microscope
05/10/2011US7940477 Solid immersion lens and related method for making same
05/10/2011US7939136 Method for forming composites of sub-arrays of fullerene nanotubes
05/05/2011WO2011052902A4 Two-dimensional virtual array probe for three-dimensional ultrasonic imaging
05/05/2011WO2011052902A2 Two-dimensional virtual array probe for three-dimensional ultrasonic imaging
05/05/2011US20110107473 Diamond-like carbon coated nanoprobes
05/05/2011US20110107472 Sensor for quantitative measurement of electromechanical properties and microstructure of nano-materials and method for making the same
05/04/2011CN101438355B Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
05/03/2011US7934323 Method and a device for the positioning of a displaceable component in an examining system
04/2011
04/28/2011US20110099673 Stage for scanning probe microscopy and sample observation method
04/26/2011US7933482 Optical fiber probe tips and methods for fabricating same
04/21/2011WO2011045208A1 Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package
04/21/2011US20110093991 Probe Storage Container, Prober Apparatus, Probe Arranging Method and Manufacturing Method of Probe Storage Container
04/21/2011US20110093989 Scanner device for scanning probe microscope
04/21/2011US20110093987 Mems actuator device with integrated temperature sensors
04/20/2011EP2312326A1 Mount for a scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package.
04/20/2011CN1795376B Sensor, method for producing sensor, and detection method
04/20/2011CN102022980A Micro-longhole measuring method based on fiber grating
04/19/2011US7930766 Fluid delivery for scanning probe microscopy
04/14/2011US20110086781 Method for forming composites of sub-arrays of fullerene nanotubes
04/07/2011WO2011038470A1 Sensors for scanning probe microscopy, method for three-dimensional measurement and method for manufacturing such sensors
03/2011
03/31/2011US20110078835 Seek-scan probe (ssp) memory with sharp probe tips formed at cmos-compatible temperatures
03/29/2011US7917966 Aligned nanostructures on a tip
03/29/2011US7913544 Scanning probe devices and methods for fabricating same
03/17/2011US20110067151 Contact probe pin for semiconductor test apparatus
03/16/2011CN101313206B Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography
03/10/2011WO2010138904A3 Metrology probe and method of configuring a metrology probe
03/09/2011EP1543152B1 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading
03/03/2011WO2010012423A8 A probe arrangement for exchanging in a controllable way liquids with micro-sized samples of material like biological cells
03/03/2011US20110055987 Method to reduce wedge effects in molded trigonal tips
03/01/2011US7897936 Method and apparatus for specimen fabrication
02/2011
02/24/2011US20110047662 Apparatus and method for investigating surface properties of different materials
02/24/2011US20110047661 Microprobe, measurement system and method
02/23/2011EP2287624A2 Scanning Probe System
02/23/2011EP2287614A1 Semiconductor nanocrystal probes for biological applications
02/23/2011CN101165816B Semiconductor probe having embossed resistive tip and method of fabricating the same
02/17/2011US20110039100 Method for Making a 3D Nanostructure Having a Nanosubstructure, and an Insulating Pyramid Having a Metallic Tip, a Pyramid Having Nano-Apertures and Horizontal and/or Vertical Nanowires Obtainable by this Method
02/15/2011US7887885 Nanolithography methods and products therefor and produced thereby
02/15/2011US7887689 Method and apparatus for attaching nanostructure-containing material onto a sharp tip of an object and related articles
02/10/2011WO2011016256A1 Cantilever excitation device and scanning probe microscope
02/10/2011WO2011015378A1 Metal tip for scanning probe applications and method of producing the same
02/10/2011US20110035849 SPM Imaging Apparatus, Probe and Method
02/10/2011DE19816914B4 Abtastmikroskop Scanning tunneling microscope
02/09/2011EP2282218A1 Microprobe with spring hanger array
02/09/2011EP2282217A1 Metal tip for scanning probe applications and method of producing the same
01/2011
01/26/2011CN101960286A Carbon nanotube support and process for producing the carbon nanotube support
01/20/2011US20110014378 Leveling devices and methods
01/13/2011US20110010808 Protected metallic tip or metallized scanning probe microscopy tip for optical applications
01/06/2011WO2011002071A1 Probe, method for manufacturing probe, probe microscope, magnetic head, method for manufacturing magnetic head, and magnetic recording/reproducing device
01/06/2011US20110000703 Carbon nanotube supporting body and process for producing the carbon nanotube supporting body
01/04/2011US7865966 Method and apparatus of automatic scanning probe imaging
12/2010
12/30/2010US20100330345 Methods utilizing scanning probe microscope tips and products thereof or produced thereby
12/30/2010DE202010013458U1 Sonde für aperturlose Nahfeldmikroskopie und/oder für Ramanspektroskopie Apertureless near-field probe and / or Raman spectroscopy for
12/29/2010EP2267428A1 Scanning probe microscope and method of observing sample using the same
12/28/2010US7861316 Microscope probe having an ultra-tall tip
12/28/2010US7857956 Manipulating a polarizable object using dielectrophoresis; self-fabrication; electronic circuits
12/23/2010WO2010146773A1 Microcontact prober
12/21/2010US7855946 Recording and reproducing apparatus provided with probe memory
12/15/2010CN1871666B A lightweight and thermally stable metrology instrument for a coordinate position apparatus and method of manufacture of said instrument
12/14/2010US7854016 Process for manufacturing probes intended to interact with a storage medium and probe obtained thereby
12/09/2010DE102009023796A1 Device for metalizing scanning probe tips of magnetic force microscopy, has light source directing large-area light to probe tips covered with salt solution, where deposition of metal particles is spatially limited to end region of tip
12/08/2010EP2259043A1 Carbon nanotube support and process for producing the carbon nanotube support
12/02/2010WO2010138904A2 Metrology probe and method of configuring a metrology probe
12/02/2010CA2761957A1 Metrology probe and method of configuring a metrology probe
11/2010
11/30/2010US7842344 Using direct-write lithographic printing to generate protein microarrays; nanoscopic high throughput assy
11/25/2010DE102007038280B4 Aktuator und Verfahren zu seiner Herstellung Actuator and process for its preparation
11/23/2010US7841016 Local injector of spin-polarized electrons with semiconductor tip under light excitation
11/18/2010US20100293675 Probe and cantilever
11/17/2010EP1157407B1 Methods utilizing scanning probe microscope tips
11/09/2010US7828981 Semiconductor probe with high resolution resistive tip and method of fabricating the same
11/04/2010US20100281587 Optical electric field enhancement element and probe using the same
11/04/2010US20100280601 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof
11/02/2010US7823470 Cantilever and cantilever manufacturing method
10/2010
10/28/2010WO2010123120A1 Immersion measurement probe, cantilever, and immersion measurement method
10/28/2010US20100275335 Scanning probe and method for attaching conductive particle to the apex of the probe tip of the scanning probe
10/26/2010US7823216 Probe device for a metrology instrument and method of fabricating the same
10/14/2010US20100263096 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
10/14/2010US20100258525 Method for the Collective Fabrication of Carbon Nanofibers on the Surface of Micropatterns Constructed on the Surface of a Substrate and Structure Comprising Nanofibers on the Surface of Micropatterns
10/12/2010US7814566 Tip array structure and fabricating method of tip structure
10/07/2010WO2010112438A1 Liquid-tight container for storing and transporting afm probes
10/06/2010EP2237051A1 Liquid-tight container for storing and transporting AFM probes
10/06/2010EP2235723A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby
10/06/2010EP1141753B1 Method for producing optical fibers with subwavelength apertures
10/06/2010CN101855534A Method and apparatus of automatic scanning probe imaging
09/2010
09/30/2010US20100251439 Large area, homogeneous array fabrication including leveling with use of bright spots
09/29/2010EP2231507A1 A method for making a 3d nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method
09/21/2010US7797991 Rocking Y-shaped probe for critical dimension atomic force microscopy
09/16/2010US20100235955 Vibration compensation in probe microscopy
09/16/2010US20100235954 Dual-tip cantilever
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