| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 12/03/2013 | US8601610 Optical electric field enhancement element and probe using the same |
| 12/03/2013 | US8601608 Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
| 11/26/2013 | US8595860 Method of fabricating a probe device for a metrology instrument and a probe device produced thereby |
| 11/12/2013 | US8584261 Method of determining a spring constant of a cantilever and scanning probe microscope using the method |
| 10/31/2013 | WO2013163538A1 Scanning probe |
| 10/31/2013 | US20130291236 Characterization structure for an atomic force microscope tip |
| 10/17/2013 | WO2013154524A1 Inelastic electron tunneling air monitor |
| 10/09/2013 | EP1520292B1 Software synchronization of multiple scanning probes |
| 10/01/2013 | US8549660 Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid |
| 09/19/2013 | WO2013138178A1 Electrically isolated, high melting point, metal wire arrays and method of making same |
| 08/22/2013 | WO2013120153A1 Sensor device for scanning probe microscopy |
| 08/22/2013 | DE10110933B4 Mikrosonde und Abtastsondenvorrichtung mit der Mikrosonde Microprobe and Abtastsondenvorrichtung with the microprobe |
| 08/20/2013 | US8516611 Atomic force microscope probe |
| 08/06/2013 | US8505111 Cantilever excitation device and scanning probe microscope |
| 08/06/2013 | US8505110 Apparatus and process for controlled nanomanufacturing using catalyst retaining structures |
| 08/06/2013 | US8499621 Scanning probe microscopy inspection and modification system |
| 07/23/2013 | US8495760 Atomic force microscope manipulation of living cells |
| 07/18/2013 | WO2013106480A1 Measurement of rheological properties using microprobes |
| 07/11/2013 | US20130180019 Probe shape evaluation method for a scanning probe microscope |
| 07/09/2013 | US8484761 Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof |
| 07/09/2013 | US8484758 Apparatus and method for the functionalisation of AFM tips |
| 07/09/2013 | US8484755 Microprobe, measurement system and method |
| 06/27/2013 | WO2013059670A3 Octahedral and pyramid-on-post tips for microscopy and lithography |
| 06/27/2013 | DE102010026703B4 Vorrichtung zum Scannen von verschiedenartigen Oberflächen und Verwendung der Vorrichtung Apparatus for scanning different types of surfaces and use of the apparatus |
| 06/20/2013 | WO2013090887A1 Motion sensor integrated nano-probe n/mems apparatus, method and applications |
| 06/06/2013 | US20130145507 Scanning probe microscope and sample observing method using the same |
| 06/04/2013 | US8458810 Scanning thermal twisting atomic force microscopy |
| 05/30/2013 | US20130139285 Chemical sensor with oscillating cantilevered probe |
| 05/02/2013 | WO2013062275A1 Nano electrode and manufacturing method thereof |
| 05/02/2013 | US20130111636 Non-linear interaction imaging and spectroscopy |
| 05/02/2013 | US20130111635 Probe head scanning probe microscope including the same |
| 04/30/2013 | US8434161 Cantilevered probe detector with piezoelectric element |
| 04/30/2013 | US8434160 Cantilevered probe detector with piezoelectric element |
| 04/18/2013 | US20130097739 Cantilever of Scanning Probe Microscope and Method for Manufacturing the Same, Method for Inspecting Thermal Assist Type Magnetic Head Device and its Apparatus |
| 04/18/2013 | DE102011084434A1 Method for measuring force gradient at e.g. scanning force microscopy, involves attaching spacer at end of magnetic material filled nanotube |
| 04/17/2013 | CN101880024B Preparation method of novel probe based on gold-silver nano-wire optical waveguide |
| 04/17/2013 | CN101159171B Semiconductor probe having wedge shape resistive tip and method of fabricating the same |
| 04/16/2013 | US8423294 High resolution linear analysis of polymers |
| 04/11/2013 | US20130091607 Methods of preparing nanoprobes and endoscope-like devices |
| 04/09/2013 | US8418261 Stage for scanning probe microscopy and sample observation method |
| 04/04/2013 | WO2013044352A1 Method of fabricating nano-tips with controlled profile |
| 04/04/2013 | CA2849938A1 Method of fabricating nano-tips with controlled profile |
| 03/19/2013 | US8397555 Scanning probe devices |
| 03/15/2013 | DE202013002076U1 Sensoreinrichtung zum Erkennen von polarisierbaren Partikeln Sensor means for detecting particles polarizable |
| 03/07/2013 | US20130061357 Method of determining a spring constant of a cantilever and scanning probe microscope using the method |
| 03/05/2013 | US8393011 Piezoresistor height sensing cantilever |
| 03/05/2013 | US8393009 Sensor for noncontact profiling of a surface |
| 02/28/2013 | DE102012001685A1 Tip for generating high, strong localized electromagnetic field strength, used in scanning near-field optical microscope, has Bragg reflectors that are arranged at predetermined distance from apex portion and shaft |
| 02/21/2013 | US20130047303 Magnetic Actuation and Thermal Cantilevers for Temperature and Frequency Dependent Atomic Force Microscopy |
| 02/12/2013 | US8371184 Flow velocity and pressure measurement using a vibrating cantilever device |
| 02/07/2013 | US20130036521 High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source |
| 02/05/2013 | US8367426 Chemical sensor with oscillating cantilevered probe |
| 01/31/2013 | WO2012116168A3 Integrated microscope and related methods and devices |
| 01/30/2013 | CN102901846A Device and method for preparing metal needle point |
| 01/29/2013 | US8365311 Quantitative analysis of MRNA and protein expression |
| 01/24/2013 | WO2013011879A1 Analytical device and analytical system |
| 01/17/2013 | DE102011107649A1 Micromechanical sensor for, e.g. analyzing topographies in grid force microscopy, has unilateral bendable cantilever in which gate electrode of FET is inserted, and is spaced at free space from semiconductor substrate |
| 01/17/2013 | DE102011051808A1 Anschlussvorrichtung für einen einen Sensor umfassenden Sensorkopf Connection device for a comprehensive one sensor sensor head |
| 01/10/2013 | WO2012149453A3 Scanning probe microscope with compact scanner |
| 01/02/2013 | EP2540877A1 Single crystal diamond movable structure and manufacturing method thereof |
| 12/20/2012 | US20120324608 Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package |
| 12/19/2012 | EP2535725A1 A probe for scanning probe microscopy |
| 11/22/2012 | US20120297509 Massively parallel lithography with two-dimensional pen arrays |
| 11/22/2012 | US20120295029 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 11/22/2012 | DE102011050493A1 Vorrichtung und Verfahren zur Detektion der Auslenkung elastischer Elemente Apparatus and method for detecting the deflection of elastic members |
| 11/15/2012 | US20120291161 Cantilever for magnetic force microscope and method of manufacturing the same |
| 11/14/2012 | CN101379383B Miniaturized spring element and method for producing the spring element |
| 11/13/2012 | US8312560 Multifunctional scanning probe microscope |
| 11/13/2012 | US8308968 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 11/06/2012 | US8307461 Fabrication of a microcantilever microwave probe |
| 11/01/2012 | WO2012149453A2 Scanning probe microscope with compact scanner |
| 10/18/2012 | DE112010002768T5 Sonde, Methode zur Herstellung einer Sonde, Sonden-Mikroskop, Magnetkopf, Methode zurHerstellung eines Magnetkopfs und einer magnetischen Aufnahme- und Wiedergabevorrichtung Probe, method for manufacturing a probe, probe microscope, magnetic head, a magnetic head zurHerstellung method and a magnetic recording and reproducing apparatus |
| 10/16/2012 | US8288154 Motion sensor for monitoring migration, vibrational movement, oscillations and fluctuation in semen, ear cilia, bacteria and kinesins |
| 10/16/2012 | US8288153 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 10/16/2012 | US8288152 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 10/16/2012 | US8287745 Method for fabricating probe tip |
| 10/04/2012 | WO2012133961A1 Combined probe capable of electrochemical and raman spectroscopic monitoring, scanning, and feedback stimulation |
| 10/04/2012 | US20120255073 Scanning probe lithography apparatus and method, and material accordingly obtained |
| 10/04/2012 | US20120252018 Method of detecting an analyte in a sample using semiconductor nanocrystals as a detectable label |
| 10/04/2012 | DE112010004305T5 Verschleissfreie Behandlung einer Materialoberfläche mit einem Rastersondenmikroskop Wear-treatment of a material surface with a scanning probe microscope |
| 10/03/2012 | EP1587113B1 Stylus system for modifying small structures |
| 09/27/2012 | DE102011005998A1 Probe unit for use in scanning probe microscope for measuring e.g. surface roughness of side wall of trench structure of semiconductor structure, has probe tip designed as disk, where height of disk is less than specific percent of radius |
| 09/25/2012 | US8276211 Positional diamondoid mechanosynthesis |
| 09/18/2012 | US8272068 Scanning probe microscope and sample observing method using the same |
| 09/12/2012 | CN102667498A Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package |
| 09/11/2012 | US8262885 Dielectrophoretic tweezers apparatus and methods |
| 09/06/2012 | US20120227139 Friction force microscope |
| 09/05/2012 | EP2495562A2 Two-dimensional virtual array probe for three-dimensional ultrasonic imaging |
| 09/05/2012 | EP2494367A2 Scanning probe microscope having support stage incorporating a kinematic flexure arrangement |
| 08/30/2012 | WO2012116168A2 Integrated microscope and related methods and devices |
| 08/23/2012 | WO2012110602A1 Apparatus and method for analyzing and modifying a specimen surface |
| 08/21/2012 | US8247032 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 08/16/2012 | DE102011004214A1 Vorrichtung und Verfahren zum Analysieren und Verändern einer Probenoberfläche Apparatus and method for analyzing and modifying a sample surface |
| 08/14/2012 | US8245318 Sidewall tracing nanoprobes, method for making the same, and method for use |
| 08/14/2012 | US8245317 Atomic force microscope |
| 08/02/2012 | WO2012101595A1 Method for obtaining hollow nano-structures |
| 07/31/2012 | CA2358215C Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 07/26/2012 | US20120192320 Cantilever excitation device and scanning probe microscope |
| 07/19/2012 | WO2012095376A1 Near-field optical probe manufacturing using organo-mineral material and sol-gel process |
| 07/18/2012 | EP2477038A1 Near-field optical probe manufacturing using organo-mineral material and sol-gel process |