Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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07/11/2012 | CN102575975A Wear-less operation of a material surface with a scanning probe microscope |
07/10/2012 | US8220068 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
07/10/2012 | US8220067 Cantilevered probe detector with piezoelectric element |
07/10/2012 | US8220066 Vibration compensation in probe microscopy |
07/05/2012 | US20120174269 Metal tip for scanning probe applications and method of producing the same |
07/05/2012 | US20120174268 Assembly of microcantilever-based sensors with enhanced deflections |
07/03/2012 | CA2462833C Protein and peptide nanoarrays |
06/28/2012 | US20120167262 Silicon pen nanolithography |
06/28/2012 | US20120167261 High Frequency Deflection Measurement of IR Absorption |
06/26/2012 | US8209768 Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip |
06/21/2012 | US20120159678 Nanometer-scale sharpening of conductor tips |
06/19/2012 | CA2397606C Method for synthesising and immobilizing nucleic acids on a silanized solid support |
06/14/2012 | US20120151637 Scanning type probe microscope |
06/14/2012 | US20120147722 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material |
06/13/2012 | EP2463665A1 Cantilever excitation device and scanning probe microscope |
06/12/2012 | US8197701 Diamond film deposition and probes |
05/31/2012 | US20120137394 Atomic Force Microscope Manipulation of Living Cells |
05/30/2012 | CN1963451B Vibration-type cantilever holder and scanning probe microscope |
05/30/2012 | CN102483429A Metal Tip For Scanning Probe Applications And Method Of Producing The Same |
05/29/2012 | US8187673 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
05/24/2012 | US20120131704 Sensor for noncontact profiling of a surface |
05/24/2012 | US20120131703 Quantitative analysis of mrna and protein expression |
05/22/2012 | US8184365 Optical instruments having dynamic focus |
05/22/2012 | US8183648 Nanoscopic electrode molecular probes |
05/17/2012 | US20120121935 Probe, method for manufacturing probe, probe microscope, magnetic head, method for manufacturing magnetic head, and magnetic recording/reproducing device |
05/10/2012 | WO2012060782A1 Hard tip for scanning probe microscopy and method of its production |
05/10/2012 | US20120117696 Integrated metallic microtip coupon structure for atom probe tomographic analysis |
05/02/2012 | EP2447723A1 Scanning probe microscope and probe proximity detection method therefor |
05/01/2012 | US8171568 Positional diamondoid mechanosynthesis |
04/24/2012 | US8166568 Contact probe pin for semiconductor test apparatus |
04/24/2012 | US8163345 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
04/19/2012 | DE102009023796B4 Vorrichtung und Verfahren zur Metallisierung von Rastersondenspitzen Apparatus and method for metallization of scanning probe tips |
04/12/2012 | US20120090058 Video Rate-Enabling Probes for Atomic Force Microscopy |
04/12/2012 | DE102007056992B4 Verfahren zur Erzeugung von Submikrometer-Strukturen an einer ausgeprägten Topographie A process for the production of submicron structures on a pronounced topography |
04/04/2012 | EP2435837A2 Metrology probe and method of configuring a metrology probe |
04/04/2012 | CN1811944B Semiconductor probe with resistive tip and method of fabricating the same |
03/29/2012 | US20120079633 Apparatus and Method for Isolating and Measuring Movement in Metrology Apparatus |
03/28/2012 | EP1063641B1 Information recording apparatus |
03/20/2012 | US8136389 Probe tip assembly for scanning probe microscopes |
03/15/2012 | WO2012033131A1 Surface treatment device using scanning probe microscope |
03/15/2012 | US20120066801 Nanomachining method and apparatus |
03/15/2012 | US20120066800 Fluid delivery for scanning probe microscopy |
03/08/2012 | WO2012028822A1 Storage box for afm probes |
03/08/2012 | WO2012028314A1 Method for producing a measuring tip for a scanning probe microscope and measuring probe having a measuring tip produced according to said method |
03/08/2012 | US20120060244 Scanning probe having integrated silicon tip with cantilever |
03/01/2012 | WO2011055346A3 Wear-less operation of a material surface with a scanning probe microscope |
03/01/2012 | US20120054924 SPM Probe and Inspection Device for Light Emission Unit |
03/01/2012 | DE102010035931A1 Verfahren zur Herstellung einer Messspitze für ein Rastersondenmikroskop sowie Messsonde mit nach diesem Verfahren hergestellter Messspitze A method for manufacturing a probe tip for a scanning probe microscope and measuring probe with generated by this method Probe |
02/09/2012 | US20120036603 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
02/09/2012 | US20120036602 Video rate-enabling probes for atomic force microscopy |
02/07/2012 | US8109135 Cantilever assembly |
02/07/2012 | CA2537023C Processes for fabricating conductive patterns using nanolithography as a patterning tool |
01/31/2012 | US8104332 Probe and cantilever |
01/24/2012 | US8102174 Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
01/12/2012 | WO2011112055A3 Microscope probe and method for manufacturing same |
01/12/2012 | DE102010026703A1 Device for scanning surfaces using atomic force microscopy, utilized in sensor for e.g. biological detection of various mediums, has static and dynamic actuators electrically connected with cantilever |
01/11/2012 | EP2404164A1 A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid |
01/05/2012 | US20120000770 Electrochemical deposition platform for nanostructure fabrication |
12/15/2011 | US20110305996 Beam Pen Lithography |
12/13/2011 | US8079093 Dual tip atomic force microscopy probe and method for producing such a probe |
12/08/2011 | US20110297084 Apparatus for Direct Fabrication of Nanostructures |
12/06/2011 | US8071361 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
12/06/2011 | US8071360 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
12/06/2011 | US8071359 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
12/01/2011 | US20110296565 Multifunctional scanning probe microscope |
11/23/2011 | CN102253245A Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
11/15/2011 | US8060943 Carbon nanotube oscillator surface profiling device and method of use |
11/15/2011 | US8056402 Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques |
11/10/2011 | US20110277193 Sensors and biosensors |
11/10/2011 | US20110275169 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
10/25/2011 | US8046843 Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material |
10/18/2011 | US8040784 Read/write tip, head and device, and use thereof, and method for manufacturing same |
10/11/2011 | US8034395 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof |
10/06/2011 | WO2011121348A1 Probe assembly for a scanning probe microscope |
10/06/2011 | WO2011052902A3 Two-dimensional virtual array probe for three-dimensional ultrasonic imaging |
10/05/2011 | EP2372743A2 Charged particle beam system with an ion generator |
10/04/2011 | US8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope |
09/27/2011 | US8027185 Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
09/21/2011 | CN1871665B 悬臂组件 Cantilever assembly |
09/20/2011 | US8022610 Electronic device containing carbon nanotubes |
09/15/2011 | WO2011112055A2 Microscope probe and method for manufacturing same |
09/15/2011 | US20110223596 Multiplex Detection Compositions, Methods, and Kits |
09/14/2011 | EP1680788B1 Cantilever assembly |
09/13/2011 | US8020216 Tapered probe structures and fabrication |
08/25/2011 | WO2011102474A1 Single crystal diamond movable structure and manufacturing method thereof |
08/23/2011 | US8004278 Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
08/23/2011 | US8002958 Deposition method for nanostructure materials |
08/18/2011 | US20110203021 Spm nanoprobes and the preparation method thereof |
08/16/2011 | US7998528 Method for direct fabrication of nanostructures |
08/16/2011 | US7997125 Miniaturized spring element and method for producing the spring element |
08/16/2011 | CA2411198C Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
08/11/2011 | DE10106854B4 Mikro-Tastkopf und Vorrichtung zum Messen einer Probenoberfläche Micro-probe and apparatus for measuring a sample surface |
08/10/2011 | CN1993609B A method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby |
08/09/2011 | US7994499 Semiconductor probe having wedge shape resistive tip and method of fabricating the same |
07/28/2011 | DE102010006160A1 Device for metalizing scanning probe tips of magnetic force microscopy, has light source directing large-area light to probe tips covered with salt solution, where deposition of metal particles is spatially limited to end region of tip |
07/14/2011 | WO2011012741A3 Microscopy device with tuning fork and rectilinear tip |
07/07/2011 | US20110167526 Microsprings Having Nanowire Tip Structures |
07/07/2011 | US20110162966 Systems and methods for making and using nanoelectrodes |
07/05/2011 | US7975314 Scanning probe microscope and active damping drive control device |
06/23/2011 | WO2011038470A4 Sensors for scanning probe microscopy, method for three-dimensional measurement and method for manufacturing such sensors |