Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
04/2003
04/03/2003US20030063703 Computed tomography with virtual tilt and angulation
04/03/2003US20030062487 Pattern inspection method and system therefor
04/03/2003US20030062479 Charged particle beam scanning type automatic inspecting apparatus
04/03/2003US20030062477 Methods and apparatus for defect localization
04/03/2003US20030062397 High-precision method and apparatus for evaluating creep damage
04/03/2003US20030062373 Security tray
04/02/2003EP1298431A2 High-precision method and apparatus for evaluating creep damage
04/02/2003EP1196803B1 Near field optical examination device
04/02/2003EP0986766B1 Method and device for measuring the relative proportion of plutonium and uranium in a body
04/02/2003CN1407439A Method for calibrating industrial CT system detector by group series winding
04/02/2003CN1407335A X-ray coating thickness device
04/02/2003CN1406842A Device for monitoring lateral broke of steel wire enhanced conveying belt
04/01/2003US6542580 Relocatable X-ray imaging system and method for inspecting vehicles and containers
04/01/2003US6542578 Apparatus for determining the crystalline and polycrystalline materials of an item
04/01/2003US6542574 System for inspecting the contents of a container
04/01/2003US6542570 Method and system for reconstructing computed tomography images using redundant data
04/01/2003US6542349 Portable X-ray fluorescence analyzer
04/01/2003US6541770 Charged particle system error diagnosis
04/01/2003US6541286 Imaging of integrated circuit interconnects
03/2003
03/27/2003WO2003025980A2 Method of examining a wafer of semiconductor material by means of x-rays
03/27/2003WO2003024331A2 Method for determining density distributions and atomic number distributions during radiographic examination methods
03/27/2003WO2002089671A3 Aerostatic rotor bearing
03/27/2003WO2002088674A3 Adsorptive method for determining a surface property of a solid
03/27/2003WO2002023231A3 Generation of a library of periodic grating diffraction signals
03/27/2003WO2002006792A3 Process of parallel sample preparation
03/27/2003WO2002005213A3 Method and apparatus for digital image defect correction and noise filtering
03/27/2003US20030060983 Proteomic analysis
03/27/2003US20030059843 Detection of preferential binding ligands; obtain slurry of polycrystalline macromolecule and ligands, generate diffraction pattern, compare to control, detect bound ligand
03/27/2003US20030058999 Calibration phantom for projection X-ray systems
03/27/2003US20030058998 X-ray detector monitoring
03/27/2003US20030058993 Positioning mechanism providing precision 2-axis rotation, 1-axis translation adjustment
03/27/2003US20030058991 Digital radioscopic testing system patent
03/27/2003US20030058990 Methods for identification and verification
03/27/2003US20030058984 Retractable collimator apparatus for a CT-PET system
03/27/2003US20030058983 Off-center tomosynthesis
03/27/2003US20030057376 X-ray image sensing device
03/27/2003US20030057366 Method of kick detection and cuttings bed buildup detection using a drilling tool
03/26/2003EP1296352A1 Charged particle beam inspection apparatus and method for fabricating device using that inspection apparatus
03/26/2003EP1296351A1 Charged particle beam inspection apparatus and method for fabricating device using that inspection apparatus
03/26/2003EP1296181A2 X-ray image reader
03/26/2003EP1295110A1 Detection of voids in semiconductor wafer processing
03/26/2003EP1294886A2 THREE-DIMENSIONAL MODEL OF A Fc REGION OF AN IGE ANTIBODY AND USES THEREOF
03/26/2003EP0723762B1 A method and system for detecting grids in a digital image
03/26/2003CN1405555A Aeronautical container/tray article examination system
03/25/2003US6539106 Feature-based defect detection
03/25/2003US6539075 Slight amount sample analyzing apparatus
03/25/2003US6538248 Charged particle beam scanning type automatic inspecting apparatus
03/20/2003US20030055573 Spectroscopy instrument using broadband modulation and statistical estimation techniques to account for component artifacts
03/20/2003US20030055307 Devices for detection and therapy of atheromatous plaque
03/20/2003US20030053600 Apparatus and method for processing of digital images
03/20/2003US20030053596 X-ray image reader
03/20/2003US20030053590 Method of examining a wafer of semiconductor material by means of X-rays
03/20/2003US20030053589 Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same
03/20/2003US20030051412 Cerium based abrasive material and method for evaluating cerium based abrasive material
03/19/2003EP1292838A2 Diagnosting reliability of vias by e-beam probing
03/19/2003EP0910807B1 Side scatter tomography system
03/19/2003CN2540632Y Probe of ash content investigating instrument
03/19/2003CN1404071A Electroacoustic signal detector with complex structure
03/19/2003CN1403808A High-resolution electroacoustic imaging detection system
03/19/2003CN1403801A Box type camera apparatus and radioactive rays photographic apparatus
03/19/2003CN1403058A Image generating method and X-ray computer tomo-imaging apparatus
03/18/2003US6535575 Pulsed X-ray reflectometer
03/18/2003US6535573 X-ray fluorescence analyzer
03/18/2003US6535571 Detector for an X-ray computed tomography apparatus
03/18/2003US6534766 Charged particle beam system and pattern slant observing method
03/18/2003CA2123302C Metering device for a fluid
03/18/2003CA2046314C Contraband detection system using direct imaging pulsed fast neutrons
03/13/2003WO2003021294A1 Method and apparatus for identifying and correcting line artifacts in a solid state x-ray detector
03/13/2003WO2003021244A1 X-ray fluorescence measuring system and methods for trace elements
03/13/2003WO2003021243A1 A container inspection system using cobalt 60 gamma ray source and cesium iodide or cadmium tungstate array detector
03/13/2003WO2003021234A1 Density/level gauge having ultra-low activity gamma-ray source
03/13/2003WO2003021186A1 Method for measuring dimensions of sample and scanning electron microscope
03/13/2003WO2003020114A2 Image positioning method and system for tomosynthesis in a digital x-ray radiography system
03/13/2003WO2002000369A3 Method for imaging inclusions and/or alpha case in articles
03/13/2003US20030049859 Method of analysis using x-ray fluorescence
03/13/2003US20030049678 Detecting preferential ligand in sample; obtain biopolymer crystal, expose biopolymer to test samples, expose to x-rays, obtain x-ray diffraction pattern, evaluate diffraction pattern for receptor ligand complex
03/13/2003US20030049117 Automated barrel panel transfer and processing system
03/13/2003US20030048877 X-ray source and method of using the same
03/13/2003US20030048872 Method of making <200 nm wavelength fluoride crystal lithogrphy/laser optical elements
03/13/2003US20030048871 Grasping system for automated exchange of elongated samples in an X-ray analysis apparatus
03/13/2003US20030048870 X-ray analysis apparatus
03/13/2003US20030048059 Fabrication of chopper for particle beam instrument
03/12/2003EP1291648A2 X-Ray apparatus
03/12/2003EP1291647A2 Engaging system for the automatic change of longitudinal probes in an X-ray analyser
03/12/2003EP1290430A1 Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams
03/12/2003EP1053551A4 Wavelength dispersive x-ray spectrometer with x-ray collimator optic for increased sensitivity over a wide x-ray energy range
03/12/2003CN1401997A Gamma-ray radiation source device for container inspecting system
03/12/2003CN1401996A Gamma-ray radiation source device for vehicle-mounted container inspecting system
03/12/2003CN1401995A Vehicle-mounted Co-60 container inspecting system
03/11/2003US6532276 Method and apparatus for determining a material of a detected item
03/11/2003US6532275 Method and system for safe mail transmission
03/06/2003WO2003019163A1 Method for determining the structure of a polyatomic molecule.
03/06/2003WO2002075772A3 Simultaneous flooding and inspection for charge control in an electron beam inspection machine
03/06/2003WO2002075301A3 Diagnosis of pathogen infections using mass spectral analysis of immune system modulators in post-exposure biological samples.
03/06/2003US20030046011 Method for ab initio determination of macromolecular crystallographic phases at moderate resolution by a symmetry-enforced orthogonal multicenter spherical harmonic-spherical bessel expansion
03/06/2003US20030043967 Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
03/06/2003US20030043965 X-ray diffractometer
03/06/2003US20030043964 Inspection system and method
03/06/2003US20030043963 X-ray fluorescence spectrometric system and a program for use therein
03/06/2003US20030043962 Image positioning method and system for tomosynthesis in a digital X-ray radiography system
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