Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
06/2002
06/06/2002CA2436237A1 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
06/05/2002EP1210589A2 Automated sample handling for x-ray crystallography
06/05/2002EP1210588A1 A method for the non-invasive assessment of properties of materials including coal and wool
06/05/2002EP1114435B1 Method for examining and/or modifying surface structures of a sample
06/05/2002CN1352537A Multi-slice x-ray CT apparatus and method for controlling the same
06/04/2002US6400797 Sample changer for capillary geometry X-ray diffractometers
06/04/2002US6400795 X-ray fluorescence analyzer
06/04/2002US6400793 Detector for an X-ray computed tomography apparatus
06/04/2002US6400792 Method for measuring speed and high resolution information of moving object by high-speed X-ray CT, and its device
06/04/2002US6400791 CT device for generating tomograms of slices of a subject which are inclined relative to the longitudinal axis of a patient support
06/04/2002US6400790 Method for image reconstruction for a CT apparatus and CT apparatus for the implementation of such a method
06/04/2002US6400161 Material segregation and density analyzing apparatus and method
06/04/2002US6399953 Scanning electronic microscope and method for automatically observing semiconductor wafer
06/04/2002US6399944 Measurement of film thickness by inelastic electron scattering
05/2002
05/30/2002WO2002041948A1 Device and method for adapting the size of an ion beam spot in the domain of tumor irradiation
05/30/2002WO2001076327A3 Method for operating a radiation examination device
05/30/2002US20020065612 System for assessing metal deterioration on maritime vessels
05/30/2002US20020065463 Electromagnetical imaging and therapeutic (EMIT) systems
05/30/2002US20020064315 Method for operating an X-ray diagnosis device with immediate imaging
05/30/2002US20020063213 Non-contact type atomic microscope and observation method using it
05/29/2002EP1209737A2 Method and apparatus for specimen fabrication
05/29/2002EP1209462A2 Apparatus for analysing a sample
05/29/2002EP1208353A1 X-ray fluorescence sensor for measurement of metal sheet thickness
05/29/2002EP0826220B1 X-ray examination apparatus with x-ray filter
05/29/2002CN2493932Y Electronic type ray chip three-dimension tester
05/28/2002US6396903 Reference grid for security equipment
05/28/2002US6396899 Fluorescent X-ray analyzing apparatus and secondary target device disposed therein
05/28/2002US6396898 Radiation detector and x-ray CT apparatus
05/28/2002US6396074 Image sensing apparatus
05/23/2002WO2002040980A1 Wafer inspecting method, wafer inspecting instrument, and electron beam apparatus
05/23/2002WO2002040979A2 Device and method for the inspection of a sample by the use of radiation which is reflected from the sample onto a positon-sensitive detector
05/23/2002WO2001096902A3 Nuclear detector for multiphase fluid sensing
05/23/2002WO2001061326A3 X-ray system
05/23/2002DE10153978A1 Röntgenanalysegerät mit einem ortsempfindlichen Festkörperröntgendetektor X-ray analysis device with a position-sensitive solid-state X-ray detector
05/23/2002DE10055739A1 Correcting stray radiation for X-ray computer tomography device involves correcting measurement values depending on stray components determined by recursion
05/22/2002EP1206679A1 X-ray fluorescence analysis of multilayered samples
05/22/2002CN1350769A X-ray generator, X-ray imaging apparatus and X-ray inspection system
05/22/2002CN1350700A Process for mapping metal contaminant concentration on a silicon wafer surface
05/21/2002US6393097 Digital detector method for dual energy imaging
05/21/2002US6393095 Automatic defect detection
05/21/2002US6393094 Methods and apparatus using attenuation of radiation to determine concentration of material in object
05/21/2002US6393093 X-ray analysis apparatus with an X-ray detector in the form of a CCD array
05/21/2002US6393090 Computed tomography scout images with depth information
05/21/2002US6393085 Analysis system for non-destructive identification of explosives and chemical warfare agents
05/21/2002US6392249 Method for recording and reproducing images made by penetrating radiation using electroluminescent elements
05/21/2002US6392231 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and method
05/21/2002US6392229 AFM-based lithography metrology tool
05/21/2002US6389908 Method and device for characterizing oil borehole effluents
05/21/2002US6389886 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample
05/16/2002WO2002039790A1 Method for correcting stray radiation for an x-ray computer tomograph scanner
05/16/2002WO2002038045A2 Techniques for deriving tissue structure from multiple projection dual-energy x-ray absorptiometry
05/16/2002WO2001096842A3 Non-destructive inspection apparatus for containers of liquid foodstuffs
05/16/2002WO2001025768A9 Methods for identification and verification
05/16/2002WO2001025767A9 Methods for identification and verification
05/16/2002US20020057759 X-ray fluorescence system and method
05/16/2002US20020056811 Method for producing a detector array for detection of electromagnetic radiation, and a detector array
05/16/2002DE10054680A1 Detector array production, comprises forming stack of layers, radiation sensitive layer, and separation layer
05/15/2002CN2491832Y Portable tube excited X-ray photofluorometer
05/14/2002US6389105 Design and manufacturing approach to the implementation of a microlens-array based scintillation conversion screen
05/14/2002US6389102 X-ray array detector
05/14/2002US6389101 Parallel x-ray nanotomography
05/14/2002US6388252 Self-detecting type of SPM probe and SPM device
05/14/2002US6388249 Surface analyzing apparatus
05/10/2002WO2002037527A1 Electron beam apparatus and device production method using the apparatus
05/10/2002WO2002037526A1 Electron beam apparatus and method for manufacturing semiconductor device comprising the apparatus
05/10/2002WO2001096841A3 X-ray reflectivity apparatus and method
05/09/2002US20020054663 Automated sample handling for x-ray crystallography
05/09/2002US20020054661 Apparatus for analysing a sample
05/09/2002US20020054659 Radiation detector, radiation detecting system and X-ray CT apparatus
05/09/2002US20020053641 Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector
05/08/2002EP1204133A2 Method and apparatus for processing a micro sample
05/08/2002EP1203394A1 METHOD FOR PREPARING A CsX PHOTOSTIMULABLE PHOSPHOR AND PHOSPHORS THEREFROM
05/08/2002EP1203200A1 X-ray reflectometry measurements on patterned wafers
05/08/2002EP0724150B1 Device for obtaining an image of an object using a stream of neutral or charged particles and a lens for converting the said stream of neutral or charged particles
05/08/2002DE10148412A1 Verfahren und Vorrichtung zur Abbildung des Kopfbereiches eines Patienten Method and device for imaging the head region of a patient
05/08/2002DE10141423A1 Verfahren und Gerät zur Prüfung auf Musterfehler Method and apparatus for testing for pattern defects
05/08/2002DE10141422A1 Verfahren zur Prüfung auf Maskenfehler und Gerät zur Elektronenstrahlbelichtung Method to check for errors and mask device for electron beam exposure
05/08/2002DE10052827A1 Detector for X-ray computer tomograph, produces signals which are selectively captured by several channels, based on width of detector components in each detector line
05/08/2002DE10051878A1 Fluorescent X-ray analysis apparatus for specimen analysis, consists of sub-computers connected to main computer through network, by which offline specimen analysis operation is performed
05/08/2002CN2490578Y Portable pachymeter for industrial pressure pipe
05/08/2002CN2490577Y Portable three-D detecting instrument for defect of industrial pressure pipe
05/07/2002US6385289 X-ray diffraction apparatus and method for measuring X-ray rocking curves
05/07/2002US6385284 Radiation monitoring of a physical property of a material
05/07/2002US6385281 Fluorescent x-ray analyzing method and apprartus
05/02/2002WO2002003055A3 Apparatus and method for gamma-ray determination of bulk density of samples
05/02/2002WO2001094984A3 X-ray scatter and transmission system with coded beams
05/02/2002WO2001075934A3 Integrated full wavelength spectrometer for wafer processing
05/02/2002US20020052695 Analyzing apparatus
05/02/2002US20020051965 Modifications of the VEGF receptor-2 protein and methods of use
05/02/2002US20020051514 Apparatus and method for in-situ measurement of residual surface stresses
05/02/2002US20020050568 Radiation image sensing appartus and method
05/02/2002US20020050565 Method and apparatus for processing a micro sample
05/02/2002US20020050160 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films
05/02/2002EP1202112A2 Radiographic apparatus
05/02/2002EP1202045A1 Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof
05/02/2002DE10050349A1 Determining radiation resistance of crystals, used e.g. in production of optical lenses, involves determining two absorption spectra over specified wavelengths using spectrophotometer
05/01/2002CN2489332Y Double-wing type collimator for ray checking system for container
05/01/2002CN2489331Y Shielded body with wing for ray source
05/01/2002CN1346981A Method for determining ore grade and ash content of coal and portable measuring instrument
04/2002
04/30/2002US6381487 Method and apparatus for producing CT images