| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 07/03/2002 | CN1356640A System for evaluating metal degeneration of sea ship |
| 07/03/2002 | CN1356540A Method and system for in-situ testing grade of big ore block by electron-air shielding radiation effect |
| 07/03/2002 | CN1356539A X-ray tester |
| 07/02/2002 | US6415014 Three-dimensional image constructing method using X-ray apparatus |
| 07/02/2002 | US6414323 Charged particle beam apparatus and method of controlling charged particle beam |
| 07/02/2002 | US6414307 Method and apparatus for enhancing yield of secondary ions |
| 06/27/2002 | WO2002050570A2 Methods for identification and verification |
| 06/27/2002 | WO2002050522A1 Apparatus and a method for characterizing multiphase effluents |
| 06/27/2002 | WO2002050521A2 A method and apparatus for analysing and sorting a flow of material |
| 06/27/2002 | WO2002050519A2 X-ray diffractometer |
| 06/27/2002 | WO2002050518A2 Methods and apparatus for contemporaneous fluoresence and reflectance measurements with multiple measuring devices |
| 06/27/2002 | WO2002050517A2 Image reconstruction using multiple x-ray projections |
| 06/27/2002 | WO2002018883A3 Device for determining the density and the level of a filling material in a container |
| 06/27/2002 | WO2001073415A3 Detection of fissile material |
| 06/27/2002 | US20020082781 Crystal structure analysis method |
| 06/27/2002 | US20020080923 Method and system for determining a source-to-image distance in a digital radiographic imaging system |
| 06/27/2002 | US20020080917 Panel detector pixel replacement method and apparatus |
| 06/27/2002 | US20020080913 Z-axis elimination in an X-ray laminography system using image magnification for Z plane adjustment |
| 06/27/2002 | US20020079463 Method and apparatus for specimen fabrication |
| 06/27/2002 | US20020079459 Detector for the detection of electromagnetic radiation |
| 06/27/2002 | US20020079447 Particle-optical inspection device especially for semiconductor wafers |
| 06/27/2002 | DE10062214A1 Vorrichtung zur Durchleuchtung von Objekten Apparatus for screening of objects |
| 06/27/2002 | DE10062049A1 Verfahren zur Abbildung einer Probenoberfläche mit Hilfe einer Rastersonde sowie Rastersondenmikroskop Method for imaging a sample surface using a scanning probe and scanning probe microscope |
| 06/27/2002 | CA2432447A1 Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices |
| 06/27/2002 | CA2431263A1 A method and apparatus for analysing and sorting a flow of material |
| 06/26/2002 | EP1217387A2 Scintillation detector for electromagnetic radiation |
| 06/26/2002 | CN2497308Y Negative electron affinity photocathode home-position estimating apparatus |
| 06/26/2002 | CN1355558A Device for testing defect in semiconductor device and method for using said device |
| 06/25/2002 | US6411677 Methods and apparatus for calibrating CT x-ray beam tracking loop |
| 06/25/2002 | US6411676 Method for determining parameters of a unit cell of a crystal structure using diffraction |
| 06/25/2002 | US6411674 Radiation tomography device and subject examination apparatus using the same |
| 06/25/2002 | US6411671 Method for reducing line artifacts in a CT image and device for implementing the method |
| 06/25/2002 | US6411406 Holographic microscope and method of hologram reconstruction |
| 06/25/2002 | US6411111 Electron-electro-optical debug system E2ODS |
| 06/25/2002 | US6409382 Mobile X-ray apparatus |
| 06/20/2002 | WO2002049080A2 Method and apparatus for inspecting a substrate |
| 06/20/2002 | WO2002049065A1 Electron beam device and semiconductor device production method using the device |
| 06/20/2002 | WO2002048961A1 Mage processor, image processing method, recording medium and program |
| 06/20/2002 | WO2002048696A1 Pole measuring method |
| 06/20/2002 | WO2002048644A1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 06/20/2002 | WO2002048280A1 Cerium based abrasive material and method for evaluating cerium based abrasive material |
| 06/20/2002 | WO2001067076A3 Method of analysis using x-ray fluorescence |
| 06/20/2002 | US20020075995 X-ray diffractometer |
| 06/20/2002 | US20020074495 Sectored magnetic lens and method of use |
| 06/20/2002 | DE10133676A1 Röntgenfluoreszenz-Dickenprüfer X-ray fluorescence thickness tester |
| 06/19/2002 | EP1215482A2 Object examination device |
| 06/19/2002 | EP1214583A2 Sealed detector for a medical imaging device and a method of manufacturing the same |
| 06/19/2002 | EP1213995A1 Radiology device comprising improved image enlarging means |
| 06/19/2002 | CN2496019Y Coal sample container and coal quatity detecting apparatus therewith |
| 06/19/2002 | CN2496018Y Multi-functional X ray diffractometer |
| 06/19/2002 | CN2496017Y Container detecting apparatus with detector of cobalt 60 gamma ray source cesium iodide or cadmium tungstate |
| 06/19/2002 | CN1354832A Method and apparatus for analysis of material composition |
| 06/19/2002 | CN1354363A Nondestructinve x-ray location apparatus |
| 06/18/2002 | US6408088 Methods and apparatus for single slice helical image reconstruction in a computed tomography system |
| 06/18/2002 | US6408048 Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements |
| 06/18/2002 | US6408047 Method of providing high throughput protein crystallography |
| 06/18/2002 | US6408044 Method for generating a resultant tomogram from a number of tomograms registered with a computer tomography (CT) apparatus |
| 06/18/2002 | US6408043 Volumetric computed tomography system for cardiac imaging including a system for communicating data over a network |
| 06/18/2002 | US6407386 System and method for automatic analysis of defect material on semiconductors |
| 06/18/2002 | US6407373 Apparatus and method for reviewing defects on an object |
| 06/18/2002 | US6406914 Radiation exposure dose-history indicator |
| 06/18/2002 | US6405604 Method and apparatus for measuring oil effluent flow rates |
| 06/13/2002 | WO2002046764A1 Attachment of second harmonic-active moiety to molecules for detection of molecules at interfaces |
| 06/13/2002 | WO2002046735A1 Method for determining alloy phase in plating layer and method for evaluating sliding property of alloy galvanized steel plate |
| 06/13/2002 | WO2002046734A1 Gas sensor and detection method and device for gas.concentration |
| 06/13/2002 | WO2002046729A1 Off-center tomosynthesis |
| 06/13/2002 | WO2002046692A1 A method ad system for measuring in patterned structures |
| 06/13/2002 | WO2002046392A2 X ray crystal structures at 5.5 a resolution of functional complexes of the bacterial ribosome containing transfer rna and model messenger rnas |
| 06/13/2002 | WO2001094923A3 X-ray inspection device for food products |
| 06/13/2002 | WO2001086270A3 Density measurement method and apparatus therefor |
| 06/13/2002 | WO2001084130A3 A nanotube-based electron emission device and systems using the same |
| 06/13/2002 | US20020072133 Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image |
| 06/13/2002 | US20020071525 Nonintrusive inspection system |
| 06/13/2002 | US20020071524 Nonintrusive inspection system |
| 06/13/2002 | US20020071522 Nonintrusive inspection apparatus |
| 06/13/2002 | US20020071520 Apparatus for illuminating objects |
| 06/13/2002 | US20020071519 Energy dispersion-type x-ray detection system |
| 06/13/2002 | US20020071516 Nonintrusive inspection apparatus |
| 06/13/2002 | US20020070738 Semiconductor device inspecting apparatus |
| 06/13/2002 | US20020070340 Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams |
| 06/13/2002 | CA2441881A1 Off-center tomosynthesis |
| 06/13/2002 | CA2436238A1 Gas sensor and detection method and device for gas.concentration |
| 06/13/2002 | CA2431148A1 Attachment of second harmonic-active moiety to molecules for detection of molecules at interfaces |
| 06/13/2002 | CA2429895A1 X ray crystal structures at 5.5 a resolution of functional complexes of the bacterial ribosome containing transfer rna and model messenger rnas |
| 06/12/2002 | EP1213560A1 An apparatus for on-site testing of deterioration of metal structure |
| 06/12/2002 | CN1353306A Equipment and method for directly observing water-contained biologic sample in ambient scanning electronic microscope |
| 06/11/2002 | US6404849 Automated sample handling for X-ray crystallography |
| 06/11/2002 | US6404848 X-ray image radiographing method and X-ray image radiographing apparatus |
| 06/11/2002 | US6404847 Continuously scanning X-ray analyzer having improved readiness and accuracy |
| 06/11/2002 | US6404846 Fluorescent x-ray method for determining x-ray alignment by luminescent changes |
| 06/11/2002 | US6404845 Aerostatic rotor bearing |
| 06/11/2002 | US6404206 Process and circuit for testing a solder joint for faults |
| 06/11/2002 | US6402374 Method and system for determining a source-to-image distance in a digital radiographic imaging system |
| 06/06/2002 | WO2002045153A1 Inspection method and apparatus using electron beam, and device production method using it |
| 06/06/2002 | WO2002045125A1 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope |
| 06/06/2002 | WO2002043565A1 Ct apparatus and method for eliminating cone beam error |
| 06/06/2002 | US20020067800 Apparatus and method for identification of crystals by in-situ X-ray diffraction |
| 06/06/2002 | US20020067482 Particle beam system |
| 06/06/2002 | DE10151127A1 Defect detection method for semiconductor device manufacture, involves estimating similarity between the conductive pad groups based on the secondary electron emission after accumulation of electrons and holes in pads |
| 06/06/2002 | DE10057824A1 Vorrichtung und Verfahren zur Anpassung einer Ionenstrahlfleckgröße in der Tumorbestrahlung Apparatus and method for adapting an ion beam spot size in tumor irradiation |