Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
06/2003
06/04/2003CN1110699C Nondestructive detecting method and device for engineering material
06/03/2003US6574306 Channel-cut monochromator
06/03/2003US6574305 Device and method for the inspection of the condition of a sample
06/03/2003US6574303 Radiation inspection apparatus and radiation inspection method
06/03/2003US6574301 CT data acquisition system trigger jitter filter
06/03/2003US6573735 Reliability of vias and diagnosis by e-beam probing
06/03/2003US6573499 Microstructured pattern inspection method
06/03/2003US6573498 Electric measurement of reference sample in a CD-SEM and method for calibration
05/2003
05/30/2003WO2003044821A1 Sample imaging method and charged particle beam system
05/30/2003WO2003043498A2 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector
05/30/2003WO2002095380A3 Method for determining a physical mass changing event
05/29/2003US20030099330 Method for automatically detecting casting defects in a test piece
05/29/2003US20030098427 Solid sensor
05/29/2003US20030098415 Aberration corrector for instrument utilizing charged-particle beam
05/29/2003US20030097888 Fabrication method for sample to be analyzed
05/28/2003EP1314976A2 Method and apparatus to produce three-dimensional X-ray images
05/28/2003EP1314079A2 A METHOD FOR i AB INITIO /i DETERMINATION OF MACROMOLECULAR CRYSTALLOGRAPHIC PHASES AT MODERATE RESOLUTION BY A SYMMETRY-ENFORCED ORTHOGONAL MULTICENTER SPHERICAL HARMONIC-SPHERICAL BESSEL EXPANSION
05/28/2003EP1314021A2 Method and system for real-time fluorescent determination of trace elements
05/28/2003EP1314006A2 Device for determining and/or monitoring the density and/or the level of a filling material in a container
05/28/2003CN2553377Y High precision X-ray adhesive material director
05/28/2003CN1420353A Intelligent scanning beam-defining clipper matched with ray source
05/27/2003US6570956 Searching system using X-ray and millimeter-wave signal
05/27/2003US6570955 Digital x-ray material testing and bone densitometry apparatus and method
05/27/2003US6570954 X-ray device for tomosynthesis
05/27/2003US6570156 Autoadjusting electron microscope
05/23/2003CA2412707A1 Positioning stand for radiography imaging device
05/22/2003WO2003043051A1 Measurement device for electron microscope
05/22/2003WO2003042674A1 Method for identification of cotton contaminants with x-ray microtomographic image analysis
05/22/2003WO2003042666A2 Fluid density measurement
05/22/2003WO2002101786A3 Spectroscopy instrument using broadband modulation and statistical estimation
05/22/2003WO2002041948A9 Device and method for adapting the size of an ion beam spot in the domain of tumor irradiation
05/22/2003WO2001087140A3 Method and apparatus for anatomical and functional medical imaging
05/22/2003US20030095913 Formed by carbonizing a raw material, slightly oxidizing the surface of the carbonized material, and then graphitizing; may be polished by irradiating with light
05/22/2003US20030095634 Attachment of X-ray apparatus, high temperature attachment and X-ray apparatus
05/22/2003US20030095633 Method and apparatus for improved X-ray device image quality
05/22/2003US20030095631 System for collecting multiple x-ray image exposures of a sample using a sparse configuration
05/22/2003US20030095630 Contrast adjustment of a decomposed X-ray image relative to the contrast of another X-ray image
05/22/2003US20030095629 Arrangement of sensor elements
05/22/2003US20030094572 Inspection system and inspection process for wafer with circuit using charged-particle beam
05/21/2003EP1313126A2 Detector arrangement and detecting process
05/21/2003EP1312938A2 Radiation sensor element
05/21/2003EP1311836A1 Apparatus and method for in-situ measurement of residual surface stresses
05/21/2003EP1311835A2 X-ray reflectivity apparatus and method
05/21/2003EP1311834A1 A method for the non-invasive measurement of properties of meat
05/21/2003EP1311361A2 Method for imaging inclusions and/or alpha case in articles
05/21/2003EP1120086A4 Reduced-angle mammography device and variants
05/21/2003EP0890078B1 Method and apparatus for optical alignment of a measuring head in an x-y plane
05/21/2003EP0792453B1 Method and equipment for determining the content of an element
05/21/2003CN2551179Y Sheet type image receiver for X-ray examination
05/21/2003CN1418599A Fluorescent check computerized tomograph method
05/20/2003US6567498 Low activity nuclear density gauge
05/20/2003US6567496 Cargo inspection apparatus and process
05/20/2003US6567495 Detector having programmable slice thickness and operational modes and method
05/20/2003US6566897 Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam
05/20/2003US6566885 Multiple directional scans of test structures on semiconductor integrated circuits
05/20/2003US6566655 Multi-beam SEM for sidewall imaging
05/20/2003US6566654 Detecting secondary electrons emitted as a result of irradiation of the circuit pattern with the electron beam, forming images of the irradiated first and second regions, extracting a difference between the formed images
05/15/2003WO2003040713A1 Method for detecting an explosive in an object under investigation
05/15/2003WO2003040712A1 Phase-contrast enhanced computed tomography
05/15/2003WO2003040709A2 Spot grid array imaging system
05/15/2003WO2003039972A2 Maintaining measurement accuracy in prompt gamma neutron activation analyzers with variable material flow rates or material bed depth
05/15/2003US20030091147 Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector
05/15/2003US20030091145 X-ray shielding system and shielded digital radiographic inspection system and method
05/15/2003US20030091144 Method for the non-invasive measurement of properties of meat
05/15/2003US20030091143 Fluoroscopic computed tomography method
05/15/2003US20030089853 Electron scatter in a thin membrane to eliminate detector saturation
05/15/2003US20030089852 Apparatus and method for observing sample using electron beam
05/15/2003US20030089851 Analytical method for electron microscopy
05/14/2003EP1310786A2 Method for measuring powder x-ray diffraction data using one- or two-dimensional detector
05/14/2003EP1310785A2 Fluoroscopic computer-tomography method
05/14/2003EP1309855A2 Mass spectrometry
05/14/2003EP1309851A2 Screening crystallisation conditions of organic compounds
05/14/2003EP0746821B1 Method for rebinning and for correcting cone beam error in a fan beam computed tomographic scanner system
05/14/2003CN2550757Y X-ray transmission holographic microscope
05/14/2003CN2549906Y Multiway multi-size image output X-ray device
05/14/2003CN1108531C Millimetre wave radio heliograph using quasioptical transmission mode
05/13/2003US6563906 X-ray compton scattering density measurement at a point within an object
05/13/2003US6563903 Container inspection apparatus
05/13/2003US6563902 Energy dispersive X-ray analyzer
05/13/2003US6563115 High-density recording scanning microscope
05/13/2003US6563112 Method for enhancing the contrast for a transmission electron microscope
05/13/2003US6561010 Apparatus and method for fluid analysis
05/08/2003WO2003039213A2 3D STEREOSCOPIC X-ray SYSTEM WITH TWO DIFFERENT OBJECT TRAJECTORIES
05/08/2003WO2003038419A1 Device for x-ray testing a wheel
05/08/2003WO2003038418A1 Elemental analyser, scanning transmission electron microscope, and element analyzing method
05/08/2003WO2003038417A2 System and method for depth profiling and characterization of thin films
05/08/2003WO2002025271A3 A method for quantifying the texture homogeneity of a polycrystalline material
05/08/2003US20030086531 Multiple energy x-ray imaging techniques
05/08/2003US20030086525 Searching system using x-ray and millimeter-wave signal
05/08/2003US20030085356 Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
05/08/2003US20030085355 Electron beam apparatus, and inspection instrument and inspection process thereof
05/08/2003US20030085354 Method of preventing charging, and apparatus for charged particle beam using the same
05/08/2003US20030085352 Method and apparatus for scanned instrument calibration
05/08/2003US20030085350 Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
05/08/2003US20030085335 Spot grid array imaging system
05/07/2003EP1309234A2 Method and apparatus for elimination of high energy ions from EUV radiating device
05/07/2003EP1308717A1 X-ray measuring and testing system
05/07/2003EP1308716A1 Method for performing a transmission diffraction analysis
05/07/2003CN2549463Y Portable automatic continuous koniogravimeter of Rn concentration and its daughter alpha latent energy value
05/07/2003CN2549462Y Helium mass spectroscopic leakage inspector with wide range
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