Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
05/2003
05/07/2003CN1416531A Method and device for radiography and radiation detector
05/07/2003CN1107882C Multifunctional industrial X-ray imaging system
05/06/2003US6559456 Charged particle beam exposure method and apparatus
05/06/2003US6559446 System and method for measuring dimensions of a feature having a re-entrant profile
05/02/2003EP1306665A2 Optical apparatus
05/02/2003EP1306652A1 Streak camera apparatus
05/02/2003EP1305815A1 Film thickness measurement using electron-beam induced x-ray microanalysis
05/02/2003EP1305670A1 Phosphor imaging plate and cassette handling system
05/01/2003WO2003012816A3 Mobile miniature x-ray source
05/01/2003WO2003002995A3 Device for and method of material analysis using a shutter comprising a calibration sample
05/01/2003WO2002103710A3 Wavelength dispersive xrf system using focusing optic for excitation and a focusing monochromator for collection
05/01/2003WO2002097396A3 High throughput screening of ligand binding to macromolecules using high resolution powder diffraction
05/01/2003WO2002050518A3 Methods and apparatus for contemporaneous fluoresence and reflectance measurements with multiple measuring devices
05/01/2003US20030082105 Selectively targeted fluorescent, radiolabeled, or fluorescent and radiolabeled compositions
05/01/2003US20030081823 Apparatus and method of obtaining a radiation image of an object
05/01/2003US20030081725 Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements
05/01/2003US20030081723 Method and apparatus for orienting a crystalline body during radiation diffractometry
05/01/2003US20030081720 3D stereoscopic X-ray system
05/01/2003US20030081718 Radiation tomography device
05/01/2003US20030081717 Image-based inspection system including positioning compensation for non-planar targets
05/01/2003US20030081210 Optical apparatus
05/01/2003US20030080302 Method and apparatus for elimination of high energy ion from EUV radiating device
05/01/2003US20030080293 Scanning electron microscope
05/01/2003US20030080292 System and method for depth profiling
05/01/2003US20030080291 System and method for characterization of thin films
04/2003
04/30/2003CN2548153Y Beta-ray continuous monitoring instrument for particle smoke discharge
04/30/2003CN2548152Y Continuous sampling device for measuring radial-flow sediment content
04/30/2003CN1414363A Bioactive target and method for medicine screening and protein structure research
04/30/2003CN1107227C Instrument for analyzing water content in oil
04/30/2003CN1106824C Device containing differentially driven transmission line and computer chromatomograph X-ray camera system containing the device
04/29/2003US6556703 Scanning electron microscope system and method of manufacturing an integrated circuit
04/29/2003US6556655 Method for automatic detection of glandular tissue
04/29/2003US6556653 Non-rotating X-ray system for three-dimensional, three-parameter imaging
04/29/2003US6556652 Measurement of critical dimensions using X-rays
04/29/2003US6556650 Method and a device for radiography and a radiation detector
04/29/2003US6555830 Suppression of emission noise for microcolumn applications in electron beam inspection
04/29/2003US6555816 Scanning electron microscope and sample observation method using the same
04/29/2003US6555380 Method for describing the physical distribution of an agent in a patient
04/24/2003WO2003034052A1 Gamma ray imaging apparatus
04/24/2003WO2002065109A3 Automated control of metal thickness during film deposition
04/24/2003WO2002016615A3 Crystal structure of dimethylarginine dimethylaminohydrolase and arginine deiminase
04/24/2003US20030076924 Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
04/24/2003US20030075691 Charged particle beam apparatus, pattern measuring method and pattern writing method
04/24/2003US20030075684 Halation-prevention filter, image analysis device equipped with said halation-prevention filter, and diffraction pattern intensity analysis method and diffraction pattern intensity correction program that use said halation-prevention filter
04/23/2003EP1304717A1 Sheet beam test apparatus
04/23/2003EP1304562A1 X-ray inspection system for products, in particular food products
04/23/2003EP1303752A2 Apparatus and method for gamma-ray determination of bulk density of samples
04/23/2003EP1005639B1 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films
04/22/2003US6553323 Method and its apparatus for inspecting a specimen
04/22/2003US6553094 Method of determining a content of a nuclear waste container
04/22/2003US6553093 Radiation tomography device
04/22/2003US6553091 X-ray CT apparatus
04/22/2003US6552346 Density detection using discrete photon counting
04/22/2003US6552338 Ion photon emission microscope
04/22/2003US6550964 Covering device for cover elements which are mobile with relation to the other and radiology machine having such a covering device
04/17/2003WO2003031959A2 Method for performing a transmission diffraction analysis
04/17/2003WO2002085079A3 Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube
04/17/2003US20030073278 Oxide film forming method
04/17/2003US20030072419 Computed tomography method and apparatus for acquiring images dependent on a time curve of a periodic motion of the subject
04/17/2003US20030072414 Radiation image recording method and apparatus
04/17/2003US20030072413 X-ray reflectometer
04/17/2003US20030072409 Methods and apparatus for estimating a material composition of an imaged object
04/17/2003US20030071646 Inspection method of semiconductor device and inspection system
04/17/2003US20030071213 Fine pattern inspection apparatus, managing apparatus of CD-SEM device, fine pattern inspection method, managing method of CD-SEM device and program
04/16/2003EP1302899A2 Method and apparatus for image processing
04/16/2003CN1411047A Miniature pattern inspection apparatus and method CD-SEM managing apparatus and method
04/16/2003CN1411025A Charged beam apparatus, pattern testing method and pattern display method
04/16/2003CN1410764A Ion massspectrometry contraband object detecting device, method and use
04/15/2003US6549607 Method and system for creating task-dependent three-dimensional images
04/15/2003US6548822 Method of performing analytical services
04/15/2003US6548814 Arrangement and a method for measuring level, interface level and density profile of a fluid in tanks or containers
04/15/2003US6548811 Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope
04/15/2003US6548810 Scanning confocal electron microscope
04/15/2003US6546788 Nanotomography
04/10/2003WO2003030206A1 Methods and apparatus for defect localization
04/10/2003WO2003029799A1 Methods and apparatus for void characterization
04/10/2003WO2003029798A1 X-ray measuring instrument, thin film measuring and forming system, and thin film measuring and forming method
04/10/2003WO2003029797A2 Method and device for obtaining images from inside dense plasmas
04/10/2003WO2003028430A2 Computed tomography with virtual tilt and angulation
04/10/2003WO2003006972A3 Determination of material parameters using x-ray scattering
04/10/2003WO2002050517A3 Image reconstruction using multiple x-ray projections
04/10/2003US20030068829 High throughput crystallographic screening of materials
04/10/2003US20030068010 Automatic adjusting method for a goniometer and associated device
04/10/2003US20030068007 Measurement of lateral yarn density distribution
04/10/2003CA2461602A1 Computed tomography with virtual tilt and angulation
04/09/2003CN2544279Y Gamma ray detector
04/09/2003CN1409820A X-ray tester
04/09/2003CN1409816A Inspection method utilizing vertical slice image
04/09/2003CN1409099A High precision method and device for evaluating creeping damage
04/08/2003US6546072 Transmission enhanced scatter imaging
04/08/2003US6546071 Analysis of samples
04/08/2003US6546069 Combined wave dispersive and energy dispersive spectrometer
04/08/2003US6545275 Beam evaluation
04/08/2003US6545272 Apparatus and methods for monitoring contamination of an optical component in an optical system
04/03/2003WO2003027653A2 Method and apparatus for discrimination of objects by physical characteristics using a limited-view three-dimensional reconstitution
04/03/2003WO2002061409A3 Mass spectrometric analysis of complex mixtures of immune system modulators
04/03/2003WO2001094987A3 X-ray optical system
04/03/2003US20030063792 Apparatus for inspecting a specimen
04/03/2003US20030063705 Methods and apparatus for void characterization
04/03/2003US20030063704 Methods and devices for quantitative analysis of x-ray images
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