| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 09/12/2002 | US20020126802 Automated sample handling for X-ray crystallography |
| 09/12/2002 | US20020126796 Three-dimensional fluoroscopy and x-ray bulb for the same |
| 09/12/2002 | US20020126795 Detector having programmable slice thickness and operational modes and method |
| 09/12/2002 | CA2376395A1 Holographic microscope and method of hologram reconstruction |
| 09/11/2002 | EP1238405A1 Method and system for the examination of specimen using a charged particle bam |
| 09/11/2002 | EP1238266A2 Optical scheme for high flux low-background two-dimensional small angle x-ray scattering |
| 09/11/2002 | EP1238265A2 Apparatus for fast detection of x-rays |
| 09/11/2002 | EP1059877A4 Method and system for creating three-dimensional images using tomosynthetic computed tomography |
| 09/11/2002 | CN2510862Y Inductive-coupling plasma spectrum interface unit |
| 09/11/2002 | CN2510861Y Operation table for industry crack-detector |
| 09/10/2002 | US6449334 Industrial inspection method and apparatus using dual energy x-ray attenuation |
| 09/10/2002 | US6449333 Three-dimensional fluoroscopy and X-ray bulb for the same |
| 09/10/2002 | US6447748 Benzamide compounds for cancer imaging and therapy |
| 09/10/2002 | US6447163 Method for aligning and superimposing X-ray and video images |
| 09/10/2002 | CA2095222C Device for controlling beams of particles, x-ray and gamma quanta and uses thereof |
| 09/06/2002 | WO2002069363A2 Step function determination of auger peak intensity |
| 09/06/2002 | WO2002068944A1 Method and apparatus for measuring physical properties of micro region |
| 09/06/2002 | CA2362784A1 Methods for producing protein domains and analyzing three dimensional structures of proteins by using said domains |
| 09/05/2002 | US20020123187 Polygon-type semiconductor detector for use in high-speed X-ray CT, and manufacturing method therefor |
| 09/05/2002 | DE10107914A1 Anordnung für röntgenanalytische Anwendungen Arrangement for X-ray analytical applications |
| 09/04/2002 | EP1236036A2 X-ray fluorescence apparatus |
| 09/04/2002 | EP1236017A2 X-ray tomography bga ( ball grid array ) inspections |
| 09/04/2002 | CN2509581Y X-ray defects detector for charging of accumulator cell |
| 09/03/2002 | US6445765 X-ray detecting apparatus |
| 09/03/2002 | US6445764 Multi-slice X-ray CT apparatus and method of controlling the same |
| 09/03/2002 | US6445197 Electron beam tester, recording medium therefor and signal data detecting method |
| 09/03/2002 | US6445042 Method and apparatus for making MOSFETs with elevated source/drain extensions |
| 09/03/2002 | US6444993 Apparatus for radiation analysis with a variable collimator |
| 08/29/2002 | WO2002067223A2 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
| 08/29/2002 | WO2002067002A1 Method and device for testing the quality of printed circuits |
| 08/29/2002 | WO2001098788A3 Diagnosting reliability of vias by e-beam probing |
| 08/29/2002 | WO2000011455A9 Digital radiographic weld inspection system |
| 08/29/2002 | US20020118790 Cardiac helical half scan reconstructions for multiple detector row CT |
| 08/29/2002 | US20020117635 Patterned wafer inspection method and apparatus therefor |
| 08/29/2002 | US20020117620 Method and apparatus for determining photoresist pattern linearity |
| 08/29/2002 | US20020117619 Inspecting system using electron beam and inspecting method using same |
| 08/29/2002 | CA2439167A1 Method and device for testing the quality of printed circuits |
| 08/29/2002 | CA2438387A1 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
| 08/28/2002 | EP1235251A1 Electron beam apparatus |
| 08/28/2002 | EP1234310A1 Doubly curved optical device with graded atomic planes |
| 08/28/2002 | EP1234216A1 Method and apparatus for aligning a crystalline substrate |
| 08/28/2002 | CN2508240Y Neutron activating analysis sample pneumatic conveyer buffer unit |
| 08/28/2002 | CN1089901C Device for determination of weight per unit area |
| 08/27/2002 | US6442288 Method for reconstructing a three-dimensional image of an object scanned in the context of a tomosynthesis, and apparatus for tomosynthesis |
| 08/27/2002 | US6442237 Reduced access X-ray imaging device |
| 08/27/2002 | US6442236 X-ray analysis |
| 08/27/2002 | US6442234 X-ray inspection of ball contacts and internal vias |
| 08/27/2002 | US6442233 Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection |
| 08/27/2002 | US6442232 Thin layer nuclear density gauge |
| 08/27/2002 | US6442231 Apparatus and method for improved energy dispersive X-ray spectrometer |
| 08/22/2002 | WO2002065481A1 Device for x-ray analytical applications |
| 08/22/2002 | WO2002065111A1 Method of analyzing sheet product, sheet product manufacturing method using the former method, and sheet article manufactureing apparatus |
| 08/22/2002 | WO2002065110A1 Device for manipulating a product and for processing radioscopy images of the product to obtain tomographic sections and uses |
| 08/22/2002 | WO2002065109A2 Automated control of metal thickness during film deposition |
| 08/22/2002 | WO2002064627A2 Crystallization of igf-1 |
| 08/22/2002 | US20020114506 Circuit pattern inspection method and apparatus |
| 08/22/2002 | US20020114424 Computed tomography apparatus with integrated unbalanced mass detection |
| 08/22/2002 | US20020113234 Method and system for inspecting electronic circuit pattern |
| 08/22/2002 | CA2431033A1 Crystallization of igf-1 |
| 08/21/2002 | EP1233659A1 Nondestructive inspection apparatus |
| 08/21/2002 | EP1233265A1 Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them |
| 08/21/2002 | EP1233264A1 Apparatus for measuring the momentum transfer spectrum of elastically scattered x-ray quanta |
| 08/21/2002 | EP1232388A2 An apparatus for machine fluid analysis |
| 08/21/2002 | EP1080450B1 Method for noise and artefacts reduction through digital image subtraction |
| 08/20/2002 | US6438209 Apparatus for guiding X-rays |
| 08/20/2002 | US6438205 System and method for reducing phase ambiguity of crystal structure factors |
| 08/20/2002 | US6438204 Linear prediction of structure factors in x-ray crystallography |
| 08/20/2002 | US6438200 X-ray fluorescence analyzing apparatus |
| 08/20/2002 | US6438197 X-ray computed tomography apparatus with correction for beam hardening |
| 08/20/2002 | US6438194 Method of and device for forming X-ray images |
| 08/20/2002 | US6438189 Pulsed neutron elemental on-line material analyzer |
| 08/20/2002 | US6435716 Method and system for determining a source-to-image distance in a digital imaging system |
| 08/15/2002 | WO2002063286A2 X-ray fluorescence analyzer |
| 08/15/2002 | WO2002049080A3 Method and apparatus for inspecting a substrate |
| 08/15/2002 | US20020110219 Electric discharge detection circuit |
| 08/15/2002 | US20020110218 Calibration and alignment of X-ray reflectometric systems |
| 08/15/2002 | US20020110216 Radiation detector and X-ray CT apparatus |
| 08/15/2002 | US20020109091 X-ray detector having a large dynamic range |
| 08/15/2002 | US20020109090 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus |
| 08/14/2002 | EP1231485A2 X ray detector with a wide dynamic range |
| 08/14/2002 | EP1231462A2 Method and system for identifying an object by use of decay characteristics of radioactivity of the same object |
| 08/14/2002 | DE10106221A1 Röntgendetektor mit großem Dynamikbereich X-ray detector with wide dynamic range |
| 08/13/2002 | CA2195710C Automated system for use in the determination of subsurface material properties by x-ray diffraction |
| 08/08/2002 | WO2002061513A1 Method for determining and representing an optimal arrangement and installation of a radiometric measuring system |
| 08/08/2002 | WO2002061464A1 On-line measurement of absorbed electron beam dosage in irradiated product |
| 08/08/2002 | WO2002061409A2 Mass spectrometric analysis of complex mixtures of immune system modulators |
| 08/08/2002 | WO2002061407A1 High-energy x-ray imaging device and method therefor |
| 08/08/2002 | WO2002061394A1 Sampling apparatus |
| 08/08/2002 | WO2002037526A9 Electron beam apparatus and method for manufacturing semiconductor device comprising the apparatus |
| 08/08/2002 | WO2001035051A9 X-ray tomography bga (ball grid array) inspections |
| 08/08/2002 | US20020107643 Process for pan-genomic determination of macromolecular atomic structures |
| 08/08/2002 | US20020106051 Image reconstruction using multiple X-ray projections |
| 08/08/2002 | US20020106047 Pulsed neutron elemental on-line material analyzer |
| 08/08/2002 | US20020106045 Identifying an object itself even when it is impossible to indicate on the object an identifier which has been assigned to the object, by the use of decay characteristics of radioactivity of the object. |
| 08/08/2002 | US20020105643 Method for determination of the radiation stability of crystals |
| 08/08/2002 | US20020104969 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and method |
| 08/08/2002 | US20020104965 Collisional gas delivery apparatus and method |
| 08/08/2002 | US20020104964 Apparatus and method for secondary electron emission microscope |
| 08/08/2002 | CA2434197A1 Sampling apparatus |
| 08/07/2002 | EP1229351A1 A semiconductor detector for use in high-speed x-ray ct, and manufacturing method therefor |