Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
01/2004
01/22/2004WO2004008188A2 System and method for examination of microarrays using scanning electron microscope
01/22/2004WO2004008128A1 X-ray fluorescence analysis using a waveguide connected to the source and to the detector
01/22/2004WO2004008127A2 Device and method for generation of a defined environment for particulate samples
01/22/2004WO2004006745A2 System and method for performing tomosynthesis of an object
01/22/2004WO2003081221A3 Transmission mode x-ray diffraction screening system
01/22/2004WO2003067234A3 Control of film growth using auger electron spectroscopy for measuring film thickness and chemical composition
01/22/2004WO2003050389A3 Apparatus and methods for downhole determination of characteristics of formation fluids
01/22/2004WO2003049510A3 X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
01/22/2004US20040013293 Method for operating a computed tomography (ct) device
01/22/2004US20040013236 Micro beam collimator for high resolution xrd investigations with conventional diffractometers
01/22/2004US20040013235 Computed tomography scanner and method for controlling the computed tomography scanner
01/22/2004US20040013233 High-energy x-ray imaging device and method therefor
01/22/2004US20040013231 Diffraction system for biological crystal screening
01/22/2004US20040013228 X-ray analysis system with humidified sample
01/22/2004US20040013225 Systems and methods for imaging large field-of-view objects
01/22/2004US20040013224 X-ray measuring apparatus
01/22/2004US20040012217 End effector
01/22/2004US20040011976 Radiation sensitive recording plate and method of making and using same
01/22/2004US20040011958 Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction
01/22/2004US20040011957 Method and device for measuring quantity of wear
01/22/2004DE10331419A1 Verfahren und Vorrichtung zur Bestimmung der Ist-Position einer Struktur eines Untersuchungsobjektes Method and device for determining the actual position of a structure of an examination object
01/22/2004CA2492281A1 System and method for examination of microarrays using scanning electron microscope
01/22/2004CA2491140A1 X-ray fluorescence analysis using a waveguide connected to the source and to the detector
01/21/2004EP1381851A2 High spatial resolution x-ray microanalysis
01/21/2004EP1381844A2 Adsorptive method for determining a surface property of a solid
01/20/2004US6680996 Dual-wavelength X-ray reflectometry
01/16/2004CA2393726A1 Quantitative proteomics via isotopically differentiated derivatization
01/15/2004WO2004006189A1 Imaging apparatus and method
01/15/2004WO2004005963A1 A multi-layered radiation converter
01/15/2004WO2004005906A1 A method for detection of micrometric and sub-micrometric images by means of irradiation of a mask or of a biological specimen with ionizing radiation
01/15/2004WO2004005905A1 X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
01/15/2004WO2004005904A1 Conical specimen holder engaging mechanically a heating element comprising a conical bore
01/15/2004WO2003073232A3 System and method for building and manipulating a centralized measurement value database
01/15/2004WO2003062862A3 Phase transition thermometer for use in microcalorimeter for detecting x-rays
01/15/2004WO2003038417A3 System and method for depth profiling and characterization of thin films
01/15/2004US20040009569 Kinase crystal structures and materials and methods for kinase activation
01/15/2004US20040008821 Contrast phantom
01/15/2004US20040008816 Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus
01/15/2004US20040008815 Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus.
01/15/2004US20040008814 Robot compatible crystal worksite suite
01/15/2004US20040008813 Radiological imaging apparatus and radiological imaging method
01/15/2004US20040008809 Method and system for creating task-dependent three-dimensional images
01/15/2004US20040007671 Imaging X-ray detector based on direct conversion
01/15/2004DE10229407A1 Verfahren zur Einstellung der Systemparameter eines Rastermikroskops Method for setting the system parameters of a scanning microscope
01/15/2004DE10227808A1 Röntgenfilter X-ray filter
01/15/2004CA2504195A1 A method for detection of micrometric and sub-micrometric images by means of irradiation of a mask or of a biological specimen with ionizing radiation
01/14/2004EP1381074A2 Method and apparatus for observing a semiconductor device using an electron microscope
01/14/2004EP1380834A1 Method of radiological examination of objects
01/14/2004EP1380263A1 Process and device for measuring the actual position of the structure of an object to be examined
01/14/2004EP1380259A1 Contrast phantom
01/14/2004EP1379858A1 Measuring the moisture content of plutonium oxide canisters
01/14/2004EP1379172A2 Method and apparatus for multiple-projection, dual-energy x-ray absorptiometry scanning
01/14/2004CN2599572Y X-ray fluorescence holograph chromatographic imaging device
01/14/2004CN2599571Y Neutron phase lining chromatographic imaging device
01/14/2004CN1467493A Control method and equipment for electronic control system of intelligent type helium mass spectrometer leak detector
01/13/2004US6678396 Method for the non-invasive measurement of properties of meat
01/13/2004US6678352 Anti-scattering x-ray raster
01/13/2004US6678350 Method of and system for improving the signal to noise characteristics of images from a digital X-ray detector receiving bi-chromatic X-ray energy
01/13/2004US6678349 Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements
01/13/2004US6678348 Integral lens for high energy particle flow, method for producing such lenses use thereof in analysis devices and devices for radiation therapy and lithography
01/13/2004US6678347 Method and apparatus for quantitative phase analysis of textured polycrystalline materials
01/13/2004US6677763 Material segregation, density, and moisture analyzing apparatus and method
01/13/2004US6677606 Dopa and dopamine modification of metal oxide semiconductors, method for attaching biological molecules to semiconductors
01/13/2004US6677587 Electron beam apparatus, and inspection instrument and inspection process thereof
01/13/2004US6677586 Methods and apparatus for electron beam inspection of samples
01/13/2004US6677585 Scanning charged particle microscope, and focal distance adjusting method and astigmatism correction method thereof
01/13/2004US6677162 Process of parallel sample preparation
01/08/2004WO2004003532A1 Method of analyzing probe support by using flying time secondary ion mass spectrometry
01/08/2004WO2004003531A1 Probe support and method of analyzing the probe support
01/08/2004WO2004003530A1 Methods and systems for inspecting aircraft fuselage frames
01/08/2004WO2003040709A3 Spot grid array imaging system
01/08/2004US20040005687 Kinase crystal structures
01/08/2004US20040005026 X-ray microscope apparatus
01/08/2004US20040004190 Multi-layered radiation converter
01/08/2004DE10225899A1 Verfahren zur Visualisierung temperaturabhängiger Prozesse sowie portable Vorrichtung zur Durchführung des Verfahrens A method for visualization of temperature-dependent processes, and portable device for carrying out the method
01/08/2004DE10225188A1 Computertomopraph und Verfahren zur Steuerung des Computertomographen Computertomopraph and method for controlling the computer tomograph
01/07/2004EP1378148A2 Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube
01/07/2004CN1466859A Apparatus for planar beam radiography and method of aligning an ionizing radiation detector with respect to a radiation source
01/06/2004US6674835 Methods and apparatus for estimating a material composition of an imaged object
01/06/2004US6674076 Humidified imaging with an environmental scanning electron microscope
01/06/2004US6674075 Charged particle beam apparatus and method for inspecting samples
01/06/2004US6674073 Scattering target-holding mechanism and an electron spin analyzer
01/06/2004US6672761 X-ray system
01/06/2004US6672585 Apparatus for stacking sheet members, apparatus for measuring dimensions of sheet members, and apparatus for and method of marking sheet members
01/02/2004EP1376652A2 A method and apparatus for acquiring information of a biochip
01/02/2004EP1376649A1 Magnetic field applying sample observing system
01/02/2004EP1376109A2 Material defect evaluation apparatus and method measuring positron lifetimes
01/02/2004EP1376108A2 Crystal Evaluation Device
01/02/2004EP1376107A2 Method of evaluation ion-exchange films and organic samples and x-ray measuring apparatus
01/02/2004EP1376106A2 Method of evaluating organic samples such as ion-exchange films at different humidities using small angle x-ray scattering
01/02/2004EP1376105A2 Method and apparatus for X-ray imaging
01/02/2004EP1376104A1 Capturing images of moving objects with a moving illumination point source
01/02/2004EP1374178A2 Fast computer tomography method
01/02/2004EP1372484A1 Arrangement for the determination by measurement of a projection of the radiation absorption capacity of a periodically-variable measured object
01/01/2004US20040002797 Methods and systems for inspecting aircraft fuselage frames
01/01/2004US20040001618 Optical tomography of small objects using parallel ray illumination and post-specimen optical magnification
01/01/2004US20040000642 Apparatus and methods for secondary electron emission microscope with dual beam
01/01/2004US20040000641 Method and apparatus for observing element distribution
01/01/2004US20040000640 Scanning electron microscope and method of controlling same
01/01/2004US20040000639 Method for setting the system parameters of a scanning microscope