Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
12/2002
12/10/2002US6493646 High order primary decay correction for CT imaging system detectors
12/10/2002US6493422 Phase retrieval in phase contrast imaging
12/10/2002US6493420 Apparatus and method for in-situ measurement of residual surface stresses
12/10/2002US6493418 Method for precisely measuring the weight of mass material and nucleonic weigher employing this method
12/10/2002US6492654 Scanning system with flexible drive assembly
12/10/2002US6492644 Device and method for energy and angle-resolved electron spectroscopy
12/10/2002US6492643 X-ray image sensing device
12/10/2002US6492641 Apparatus and method for gamma-ray determination of bulk density of samples
12/10/2002US6491430 Mobile X-ray apparatus and method for determining projection geometries therein
12/05/2002WO2002097412A2 Method for mass spectrometry, separation of ions with different charges
12/05/2002WO2002097396A2 High throughput screening of ligand binding to macromolecules using high resolution powder diffraction
12/05/2002WO2002052257A3 Device and method for analyzing fat of meat
12/05/2002US20020181656 Apparatus for determining the crystalline and polycrystalline materials of an item
12/05/2002US20020181654 Real time data acquisition system including decoupled host computer
12/05/2002US20020181653 Method and apparatus for radiographic inspection of aircraft fuselages
12/05/2002US20020181652 X-ray foreign material detecting apparatus simultaneously detecting a plurality of X-rays having different amounts of energy
12/05/2002US20020181651 Device and method for determining proportions of body materials
12/05/2002US20020181650 Apparatuses and methods for non-destructive inspection
12/05/2002US20020181649 X-ray device for tomosynthesis
12/05/2002US20020180460 Material segregation, density, and moisture analyzing apparatus and method
12/05/2002US20020178797 Analytical devices based on diffusion boundary layer calibration and quantitative sorption
12/05/2002DE10132816A1 Vorrichtung und Verfahren zur Anpassung der Strahlungsdosis einer Röntgenstrahlungsquelle Apparatus and method for adapting the radiation dose of an X-ray source
12/05/2002DE10125870A1 Optical element for forming object images and/or focusing electromagnetic radiation has at least one region of at least part of zone plate with filter function giving different transmissivity
12/05/2002DE10119072C1 Reflektometeranordnung und Verfahren zur Bestimmung des Reflexionsvermögens ausgewählter Messorte von spektral abhängig reflektierenden Messobjekten Reflektometeranordnung and mechanisms for determining the reflectance of selected measurement locations of spectrally dependent reflective targets
12/05/2002DE10117569C1 Anordnung zur messtechnischen Erfassung einer Projektion des Strahlungsabsorptionsvermögens eines periodisch veränderlichen Messobjekts Arrangement for the metrological detection of a projection of the radiation absorptivity of a periodically varying measurement object
12/04/2002EP1262147A2 Device and method for adjusting the radiation dose from an X-ray source
12/04/2002EP1261859A2 Method of analysis using x-ray fluorescence
12/04/2002EP1000347B1 Method and apparatus for determining molecular crystal structures
12/04/2002EP0855022B1 Methods for the design, quality control, and management of fatigue-limited metal components
12/03/2002US6490471 Electromagnetical imaging and therapeutic (EMIT) systems
12/03/2002US6490368 Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography
12/03/2002US6489619 Pixel circuit with selectable capacitor load for multi-mode X-ray imaging
12/03/2002US6489612 Method of measuring film thickness
11/2002
11/28/2002WO2002095381A2 Tandem microchannel plate and solid state electron detector
11/28/2002WO2002095380A2 Method for determining a physical mass changing event
11/28/2002WO2002095365A2 Method for determining a mass changing event
11/28/2002WO2002027307A3 Method for reconstructing image information from measurement data obtained by a ct scanner
11/28/2002US20020177175 Biosensor for use in the detection of preferential activities in cells
11/28/2002US20020176615 Method of and apparatus for generating phase contrast image
11/28/2002US20020176538 Method for producing a grid structure
11/28/2002US20020176536 Preparation of an oil sample fox X-ray fluorescence analysis
11/28/2002US20020176534 Inspection device
11/28/2002US20020176533 Inspection device
11/28/2002US20020175690 Reflectometer arrangement and method for determining the reflectance of selected measurement locations of measurement objects reflecting in a spectrally dependent manner
11/28/2002US20020175288 Probe for contamination detection in recyclable materials
11/28/2002US20020175283 Tandem microchannel plate and solid state electron detector
11/28/2002US20020175279 Method of mass spectrometry, to enhance separation of ions with different charges
11/28/2002US20020174918 Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them
11/28/2002DE10135660C1 Non-destructive testing device for elongate conductive metal object using eddy current technique has measuring element provided by segmental measuring coils overlapping at their ends
11/27/2002EP1261016A1 Electron beam device and semiconductor device production method using the device
11/27/2002EP1260812A1 Process and apparatus for the x-ray diffraction characterization of a material with amorphous phase
11/27/2002EP1260811A2 X-ray ct apparatus
11/27/2002CN1381718A Recorder of X-ray photoelectronic hologram
11/27/2002CN1381717A Ray testing equipment and ray testing method
11/27/2002CN1381716A Radiation testing device and radiation testing method
11/27/2002CN1095091C X-ray tomography device
11/26/2002US6487270 Apparatus for X-ray analysis with a simplified detector motion
11/26/2002US6487269 Apparatus for analysing a sample
11/26/2002US6487267 X-ray diagnostic device for producing computed tomography and radioscopic exposures
11/26/2002US6486573 Portable X-ray fluorescence analyzer
11/26/2002US6486472 Inspecting system using electron beam and inspecting method using same
11/26/2002US6485935 Structure of the ankyrin binding domain of a α-Na, K-ATPase
11/26/2002US6485176 Inspection system with rho-theta x-ray source transport system
11/21/2002WO2002093490A1 Computed-tomography system with filtering
11/21/2002WO2002093146A1 A tool holder for measurement means
11/21/2002WO2002050519A3 X-ray diffractometer
11/21/2002US20020172325 Film density template and method for comparison of film exposure
11/21/2002US20020172322 X-ray fluorescence spectrometer
11/21/2002US20020171051 Image classification method, obervation method, and apparatus thereof
11/21/2002US20020171050 Gas injector in which one of a plurality of nozzles can be selectively driven for elevation
11/21/2002DE10221200A1 X-ray fluorescence spectrometer has field limiting stop opening shape enabling intensity changes no greater than 1 per cent if specimen surface height variations are no greater then 1 mm
11/21/2002DE10118573C1 Device for fabricating X-ray reflecting images used for investigating single crystals comprises an anode made from a material emitting a characteristic X-ray beam
11/21/2002CA2444952A1 A tool holder for measurement means
11/20/2002EP1258723A1 Non destructive process for continuously measuring the density profile of panels
11/20/2002EP1257848A1 Gamma-ray imaging
11/20/2002EP1257845A2 Sample preparation method
11/20/2002EP1257815A2 Methods for identification and verification
11/20/2002CN1380544A Method for correcting data nonuniformity in radiation imaging system
11/20/2002CN1380543A Image segmentation and identification method in industrial radiation imaging system
11/19/2002US6484051 Coincident multiple compton scatter nuclear medical imager
11/19/2002US6483894 Apparatus and method for adjusting a collimator
11/19/2002US6483893 Digital high resolution X-ray imaging
11/19/2002US6483891 Reduced-angle mammography device and variants
11/19/2002US6483120 Control system for a charged particle exposure apparatus
11/18/2002CA2387004A1 Nondestructive process for continuously measuring the density profile of panels
11/14/2002WO2002091286A2 Analysis and presentation of internal features of logs
11/14/2002WO2002091023A2 Nautical x-ray inspection system
11/14/2002WO2002091022A1 X-ray system comprising an x-ray source, a detector assembly and an aperture
11/14/2002WO2002090955A1 X-ray fluorescence combined with laser induced photon spectroscopy
11/14/2002WO2002090954A1 Apparatus and method for composition measurement
11/14/2002WO2002089671A2 Aerostatic rotor bearing
11/14/2002US20020168083 Analysis and presentation of internal features of logs
11/14/2002US20020168047 Radiation inspection apparatus and radiation inspection method
11/14/2002US20020168046 Method and apparatus for determination of properties of food or feed
11/14/2002US20020168045 X-ray fluorescence combined with laser induced photon spectroscopy
11/14/2002US20020166976 Beam as well as method and equipment for specimen fabrication
11/14/2002US20020166966 Low-vacuum scanning electron microscope
11/14/2002US20020166965 Method of and apparatus for measuring lattice-constant, and computer program
11/14/2002US20020166964 Detection of defects in patterned substrates
11/14/2002US20020166802 Battery inspection system
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