Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
07/2003
07/31/2003US20030141451 Method of forming a sample image and charged particle beam apparatus
07/31/2003CA2473678A1 Automatically detecting cells having nuclear and cytoplasmic densitometric features associated with disease by optical imaging
07/30/2003CN1433533A Method and apparatus for aligning crystalline substrate
07/30/2003CN1433520A Apparatus and method for radiation detection
07/30/2003CN1432510A On-line detector for regular pieces inside product packing box
07/30/2003CN1116603C Foldable detector scanning arm mechanism for mobile container inspecting system
07/29/2003US6600809 Nondestructive inspection apparatus
07/29/2003US6600808 Part program generating apparatus and program for image measuring apparatus
07/29/2003US6600806 System for radiographic determination of pipe wall thickness
07/29/2003US6600805 Method and apparatus for determination of properties of food or feed
07/29/2003US6600804 Gaseous-based radiation detector and apparatus for radiography
07/29/2003US6600801 Method for correcting for beam hardening in a CT image
07/29/2003US6600156 Scanning electron microscope
07/24/2003WO2003060513A2 Method and apparatus for cancer detection
07/24/2003WO2003060498A1 Diffractometer and method for diffraction analysis
07/24/2003WO2003060497A1 Method for performing powder diffraction analysis
07/24/2003WO2003060496A2 Compact x-ray fluorescence spectrometer and method for fluid analysis
07/24/2003US20030139838 Systems and methods for closed loop defect reduction
07/24/2003US20030138074 Method for correcting stray radiation in an x-ray computed tomograph scanner
07/24/2003US20030137314 Annular illumination method for charged particle projection optics
07/24/2003US20030136920 System and method of detecting, neutralizing, and containing suspected contaminated articles
07/24/2003US20030136906 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods
07/24/2003DE20305448U1 Assembly to measure the presence of suspended solids in a fluid pulped paper or cellulose
07/24/2003CA2473782A1 Diffractometer and method for diffraction analysis
07/23/2003EP1329937A2 Annular illumination method for charged particle projection optics
07/23/2003EP1329138A1 Apparatus for planar beam radiography and method of aligning an ionizing radiation detector with respect to a radiation source
07/23/2003EP1328903A2 Method and apparatus for digital image defect correction and noise filtering
07/23/2003EP1328189A2 Method and apparatus for anatomical and functional medical imaging
07/23/2003CN1431488A Low radioactive nucleon density measurer
07/23/2003CN1115570C Solid dosage instrument capable of measuring total ionizing radiation dosage
07/23/2003CN1115557C Superminiature X-ray defectoscope able to automatically creep in pipeline
07/22/2003US6597762 Method and apparatus of lesion detection and validation based on multiple reviews of a CT image
07/22/2003US6597760 Inspection device
07/22/2003US6597759 Method of inspecting meat for bone content using dual energy x-ray attenuation
07/22/2003US6597758 Elementally specific x-ray imaging apparatus and method
07/22/2003US6597001 Method of electron-beam exposure and mask and electron-beam exposure system used therein
07/17/2003WO2003058223A1 System and method for adapting a software control in an operating environment
07/17/2003WO2003058214A1 Method and means for correcting measuring instruments
07/17/2003WO2003058202A2 System and method of detecting, neutralizing, and containing suspected contaminated articles
07/17/2003US20030134440 Method of accurately measuring compositions of thin film shape memory alloys
07/17/2003US20030133601 Automated method and system for the differentiation of bone disease on radiographic images
07/17/2003US20030133539 System and method for safe mail transmission
07/17/2003US20030133537 Methods for identification and verification using vacuum XRF system
07/17/2003US20030133536 X-ray fluorescence spectrometer
07/17/2003US20030132385 Solid state detector
07/17/2003US20030132382 System and method for inspecting a mask
07/16/2003EP1327878A1 Low activity nuclear density gauge
07/16/2003EP1327877A1 Method for successively performing powder diffraction analysis on a plurality of samples
07/16/2003EP1327012A1 Apparatus and method for identification of crystals by in-situ x-ray diffraction
07/16/2003EP1311834A4 A method for the non-invasive measurement of properties of meat
07/16/2003CN1430516A Crystal structures of P-selectin, P-and E-selectin complexes and use thereof
07/16/2003CN1114828C Combined mobile container detection system
07/16/2003CN1114827C Door frame type scanning car for mobile container detection system
07/16/2003CN1114824C Sampling apparatus
07/15/2003US6594590 Method and apparatus for improved inspection and classification of attributes of a workpiece
07/15/2003US6594337 X-ray diagnostic system
07/15/2003US6594335 X-ray phase-contrast medical micro-imaging methods
07/15/2003US6593583 Ion beam processing position correction method
07/15/2003US6593569 Collisional gas delivery apparatus and method
07/15/2003US6593231 Process of manufacturing electron microscopic sample and process of analyzing semiconductor device
07/15/2003US6593153 Method of and apparatus for measuring lattice-constant, and computer program
07/15/2003US6593152 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
07/10/2003WO2003056317A1 Bulk material analyser and method of assembly
07/10/2003WO2003055338A2 Device and system for measuring the properties of multi-segmented filters and corresponding method
07/10/2003WO2003046533A3 X-ray grading apparatus and process
07/10/2003WO2003028430A3 Computed tomography with virtual tilt and angulation
07/10/2003WO2002095365A3 Method for determining a mass changing event
07/10/2003US20030130803 Method of analysing crystalline texture
07/10/2003US20030128869 Fast computed tomography method
07/10/2003US20030128809 Method for evaluating an SOI substrate, evaluation processor, and method for manufacturing a semiconductor device
07/10/2003US20030128805 Compact X-ray fluorescence spectrometer and method for fluid analysis
07/10/2003US20030128804 System and method for adapting a software control in an operating environment
07/10/2003US20030128278 Streak camera apparatus
07/10/2003US20030127611 Systems for detecting and compensating for image artifacts while scanning an imagine plate
07/10/2003US20030127591 Method and apparatus for local surface analysis
07/10/2003US20030127590 Repeating pulsed magnet
07/09/2003EP1325315A2 A method for quantifying the texture homogeneity of a polycrystalline material
07/09/2003EP1325314A2 A method of body x-ray scanning, an apparatus for its implementation and a radiation detector
07/09/2003EP1324699A1 Cardiac helical half scan reconstructions for multiple detector row ct
07/08/2003US6591003 Optical tomography of small moving objects using time delay and integration imaging
07/08/2003US6590960 Computed tomography apparatus with integrated unbalanced mass detection
07/08/2003US6590956 Nonintrusive inspection system
07/08/2003US6590955 Open chamber-type X-ray analysis apparatus
07/08/2003US6590954 X-ray shearing interferometer
07/08/2003US6590703 Optical system for scanning microscope
07/08/2003US6590224 Image storage medium and method of manufacturing the same
07/08/2003US6590209 Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution
07/08/2003US6588255 Analytical devices based on diffusion boundary layer calibration and quantitative sorption
07/03/2003WO2003054531A1 A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum
07/03/2003WO2002103337A3 Electron beam apparatus and method for using said apparatus
07/03/2003US20030125332 Pyrazolo(3,4-c)pyridazin-3-ylamine derivatives; glycogen synthase kinase-3 (gsk-3); treatment and prevention of diabetes and Alzheimer's disease
07/03/2003US20030123617 Image processing apparatus, image processing method, program, and storage medium
07/03/2003US20030123613 Phosphor imaging plate and cassette handling system
07/03/2003US20030123611 Digital phase contrast X-ray radiographing system
07/03/2003US20030123610 X-ray diffraction apparatus
07/03/2003US20030123608 Method for identification of cotton contaminants with x-ray microtomographic image analysis
07/03/2003US20030123607 Method for making quantitative analysis of nickel
07/03/2003US20030122094 Scanning system with flexible drive assembly
07/02/2003EP1324059A2 System and method for indentifying solder joint defects
07/02/2003EP1324023A2 X-ray diffraction apparatus