Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
11/2003
11/27/2003WO2003062805A3 X-ray diffraction method
11/27/2003WO2003043498A3 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector
11/27/2003WO2003039972A3 Maintaining measurement accuracy in prompt gamma neutron activation analyzers with variable material flow rates or material bed depth
11/27/2003US20030219099 Transmission mode X-ray diffraction screening system
11/27/2003US20030219092 Method for diaphragm regulation in a computed tomography apparatus, and computed tomography apparatus with diaphragm regulation
11/27/2003DE29924546U1 X-ray fluorescence elemental analyzer for use in online elemental analysis of coal and mineral ores has an X-ray source and an X-ray fluorescence detector
11/27/2003CA2485675A1 Optical projection imaging system and method for automatically detecting cells with molecular marker compartmentalization associated with disease
11/26/2003EP1365231A2 X-ray diffraction apparatus
11/26/2003EP1365230A2 Method for estimating preferred orientation of polycrystalline material
11/26/2003EP1365229A1 Method and apparatus for measuring physical properties of micro region
11/26/2003EP1364222A1 Method and device for testing the quality of printed circuits
11/26/2003CN2588367Y Digital image receiving processing system for transmission electron microscope
11/26/2003CN1458518A Method and system for radiation detecting cut tobacco filling value
11/26/2003CN1457745A Method for controlling layer image photographic device
11/26/2003CN1129000C Detection method and detector utilizing slow-scanning CCD ray image
11/25/2003US6654445 Device and method for determining proportions of body materials
11/25/2003US6654441 Data processing method and data processing apparatus
11/25/2003US6653637 X-ray detector and charged-particle apparatus
11/25/2003US6653631 Apparatus and method for defect detection using charged particle beam
11/25/2003US6653628 Electron spectroscopic analyzer using X-rays
11/25/2003US6652143 Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube
11/20/2003WO2003096763A1 X-ray generator
11/20/2003WO2003095997A2 Method and apparatus for separating primary and secondary charged particle beams
11/20/2003WO2003039213A3 3D STEREOSCOPIC X-ray SYSTEM WITH TWO DIFFERENT OBJECT TRAJECTORIES
11/20/2003WO2003027653A3 Method and apparatus for discrimination of objects by physical characteristics using a limited-view three-dimensional reconstitution
11/20/2003US20030215061 Method, apparatus and program for radiation imaging
11/20/2003US20030215060 X-ray analysis apparatus and method
11/20/2003US20030215057 Scatter correction method for non-stationary X-ray acquisitions
11/20/2003US20030215056 Conductive adhesive bonded semiconductor substrates for radiation imaging devices
11/20/2003US20030215055 X-ray imaging apparatus for subtraction angiography
11/20/2003US20030215054 Nonintrusive inspection apparatus
11/20/2003US20030213909 Method of inspecting pattern and inspecting instrument
11/20/2003US20030213893 Electron beam apparatus and device manufacturing method using same
11/19/2003EP1363245A1 Three-dimensional verification supporting apparatus, three-dimensional structure verification method, record medium, and program
11/19/2003EP1363121A1 Scatter correction method for non-stationary x-ray acquisitions
11/18/2003US6651018 Method for correcting calibration values in a calibration table of computed tomography apparatus
11/18/2003US6650729 Device and method for adapting the radiation dose of an X-ray source
11/18/2003US6650724 Combined 3D angio-volume reconstruction method
11/18/2003US6650424 Method and system for measuring in patterned structures
11/18/2003US6650129 Method of testing semiconductor device
11/18/2003US6650049 Photomultiplier tube
11/18/2003CA2355560C X-ray compton scatter density measurement at a point within an object
11/13/2003WO2003051201A3 Virtual spherical anode computed tomography
11/13/2003WO2003045221A3 Portable medical digital radiography assembly
11/13/2003US20030210763 Design and manufacturing approach to the implementation of a microlens-array based scintillation conversion screen
11/13/2003US20030210062 Method of testing semiconductor device
11/13/2003US20030209677 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
11/13/2003US20030209673 Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method
11/13/2003US20030209667 Charged particle beam apparatus and method for inspecting samples
11/13/2003US20030209190 Method for making an oriented optical fluoride crystal blank
11/12/2003EP1361427A2 Method and apparatus for imaging specific elements using X-rays
11/12/2003EP1360699A1 Device for x-ray analytical applications
11/12/2003EP1360476A2 Automated control of metal thickness during film deposition
11/12/2003EP1360475A1 Device for manipulating a product and for processing radioscopy images of the product to obtain tomographic sections and uses
11/12/2003EP1360286A2 Characterization of the gsk-3beta protein and methods of use thereof
11/12/2003CN2586172Y Modular structure of radiation imaging solid detector
11/12/2003CN1455248A Method of nondestructive and rapid detecting grain size of metal polycrystal
11/12/2003CN1455247A Method and apparatus of rapid on-line detecting container
11/12/2003CN1455246A Environmental radon measuring method and measuring instrument
11/12/2003CN1454569A X-ray diagnosis apparatus
11/11/2003US6647091 Nonintrusive inspection apparatus
11/11/2003US6647090 X-ray fluorescence spectrometer
11/11/2003US6647085 Data processing method and data processing apparatus
11/11/2003US6646263 Method of X-ray analysis in a particle-optical apparatus
11/11/2003US6646259 Method of sample preparation for transmission electron microscope analysis
11/06/2003WO2003091726A1 Method and system for detecting a property of a pavement by measuring gamma-radiation
11/06/2003WO2003091716A1 Goniometer sample holder with ball and socket joint for aligning a sample to a radiation beam
11/06/2003WO2003020114A3 Image positioning method and system for tomosynthesis in a digital x-ray radiography system
11/06/2003WO2002082533A3 Defect inspection efficiency improvement with in-situ statistical analysis of defect data during inspection
11/06/2003WO2002058557A3 Method and apparatus for multiple-projection, dual-energy x-ray absorptiometry scanning
11/06/2003US20030207475 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
11/06/2003US20030205669 Apparatus and method for secondary electron emission microscope
11/05/2003EP1358623A2 Method and apparatus for inspecting a substrate
11/05/2003EP1358480A2 Diagnosis of pathogen infections using mass spectral analysis of immune system modulators in post-exposure biological samples.
11/05/2003EP1358463A1 Sampling apparatus
11/05/2003EP1358209A2 Crystallization of igf-1
11/05/2003EP1357832A2 Techniques for deriving tissue structure from multiple projection dual-energy x-ray absorptiometry
11/05/2003EP1123502A4 Multiple-head phosphor screen scanner
11/05/2003EP0918484B1 X-ray examination apparatus including a filter
11/05/2003CN1454314A X-ray measuring and testing system
11/05/2003CN1453575A Charge testing method for insulating material
11/05/2003CN1126990C X-ray tomograph system having view selector with prism
11/05/2003CN1126952C Taper limited receiving slit
11/05/2003CN1126703C On-line non-destructive container inspection equipment
11/04/2003US6643592 System and method for fault diagnosis
11/04/2003US6643411 Apparatus and method of obtaining a radiation image of an object
11/04/2003US6643392 Process for reconstructing a tridimensional image of a moving object
11/04/2003US6643354 Calibration and alignment of X-ray reflectometric systems
11/04/2003US6643352 Radiation tomography device
11/04/2003US6642519 Fine pattern inspection apparatus and method and managing apparatus and method of critical dimension scanning electron microscope device
11/04/2003US6642518 Assembly and method for improved scanning electron microscope analysis of semiconductor devices
11/04/2003US6642512 Focused ion beam apparatus
10/2003
10/30/2003US20030204826 Inspection method and inspection system using charged particle beam
10/30/2003US20030201393 Electron microscope
10/30/2003US20030201391 Method of inspecting a circuit pattern and inspecting instrument
10/30/2003US20030200810 Method and apparatus for evaluating damage of metal material
10/29/2003EP1357382A1 Method and system for determining a property of a pavement by measuring natural gamma radiation
10/29/2003EP1357377A2 X-ray difraction screening system with retractable x-ray shield
10/29/2003EP1356354A1 Method for determining and representing an optimal arrangement and installation of a radiometric measuring system
10/29/2003EP1356268A2 Mass spectrometric analysis of complex mixtures of immune system modulators