| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 08/07/2002 | EP1228361A1 Digital image orientation marker |
| 08/06/2002 | US6430258 Method for operating a radiation examination device |
| 08/06/2002 | US6430257 Method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 08/06/2002 | US6430256 Direct structure determination of systems with two dimensional periodicity |
| 08/06/2002 | US6430255 Nonintrusive inspection system |
| 08/06/2002 | US6430254 High resolution x-ray imaging of very small objects |
| 08/06/2002 | US6429448 Method for radiographic oncology portal imaging |
| 08/06/2002 | US6429427 Method and apparatus for surface imaging |
| 08/06/2002 | US6429426 Ionization chamber with electron source |
| 08/06/2002 | US6428207 Medical diagnosis; exposure phosphor to radiation |
| 08/01/2002 | WO2002058557A2 Method and apparatus for multiple-projection, dual-energy x-ray absorptiometry scanning |
| 08/01/2002 | WO2000058718A9 X-ray diffraction apparatus and method |
| 08/01/2002 | US20020103439 Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices |
| 08/01/2002 | US20020101957 X-ray measurement of resin distribution in a cellulosic material |
| 08/01/2002 | US20020101527 Radiation image pick-up apparatus and system |
| 08/01/2002 | US20020100885 Radiation image read-out method and apparatus |
| 08/01/2002 | US20020100877 X-ray detector and charged-patricle apparatus |
| 08/01/2002 | US20020100873 Electron microscope and method of photographing TEM images |
| 08/01/2002 | US20020100871 Focused ion beam apparatus |
| 07/31/2002 | EP1227316A2 Method and apparatus for localized digital radiographic inspection |
| 07/31/2002 | EP1227315A2 X-Ray detector and charged-particle trap |
| 07/31/2002 | EP1226587A1 Rotatable cylinder dual beam modulator |
| 07/31/2002 | EP1226431A2 Method and apparatus for determination of properties of food or feed |
| 07/31/2002 | CN1361417A Metal surface coating test system |
| 07/30/2002 | US6426995 Radiation inspection system and method using the same |
| 07/30/2002 | US6426993 Energy dispersion-type X-ray detection system |
| 07/25/2002 | WO2002057763A2 Apparatus and method for identification of crystals by in-situ x-ray diffraction |
| 07/25/2002 | US20020097913 Pattern evaluation method, pattern evaluation system and computer readable recorded medium |
| 07/25/2002 | US20020097837 X-ray reflectance measurement system with adjustable resolution |
| 07/25/2002 | US20020097836 System for inspecting the contents of a container |
| 07/25/2002 | US20020097835 Nonintrusive inspection apparatus |
| 07/25/2002 | US20020097834 X-ray analysis apparatus |
| 07/25/2002 | US20020097833 Methods for identification and verification |
| 07/25/2002 | US20020097832 Methods for identification and verification |
| 07/25/2002 | US20020097830 Method for correcting for beam hardening in a CT image |
| 07/25/2002 | US20020097038 Method of determining angle-of-cut |
| 07/25/2002 | US20020096652 Image sensing apparatus |
| 07/25/2002 | US20020096635 Mask defect repair method |
| 07/25/2002 | DE10102324A1 Röntgeneinrichtung für die Tomosynthese X-ray apparatus for tomosynthesis |
| 07/25/2002 | CA2424893A1 Apparatus and method for identification of crystals by in-situ x-ray diffraction |
| 07/24/2002 | EP1225444A2 Radiographic apparatus for tomosynthesis |
| 07/24/2002 | EP1224459A2 Methods for identification and verification |
| 07/24/2002 | CA2332094A1 Method and apparatus for determining measurements from radiographs |
| 07/23/2002 | US6424695 Separate lateral processing of backscatter signals |
| 07/23/2002 | US6424692 Medical image processing with controlled image-display order |
| 07/18/2002 | WO2002056259A1 Three-dimensional verification supporting apparatus, three-dimensional structure verification method, record medium, and program |
| 07/18/2002 | WO2002055972A1 Mossbauer spectrometer with piezo transducer technology and solid state detectors |
| 07/18/2002 | WO2001084129A3 Method and device using x-rays to measure thickness and composition of thin films |
| 07/18/2002 | WO2001071325A3 Calibration and alignment of x-ray reflectometric systems |
| 07/18/2002 | US20020095267 Method for the non-destructive inspection of wall strength |
| 07/18/2002 | US20020094520 Attachment of second harmonic-active moiety to molecules for detection of molecules at interfaces |
| 07/18/2002 | US20020094062 Method of and system for improving the signal to noise characteristics of images from a digital X-ray detector receiving bi-chromatic X-ray energy |
| 07/18/2002 | US20020094061 Apparatus for measuring the pulse transmission spectrum of elastically scattered x-ray quantities |
| 07/18/2002 | US20020094060 Method and apparatus for X-ray diffraction analyses |
| 07/18/2002 | US20020094059 System and Method for inspecting an object using spatially and spectrally distinguished beams |
| 07/18/2002 | US20020094058 Methods for identification and verification |
| 07/18/2002 | US20020093350 Semiconductor device test method and semiconductor device tester |
| 07/18/2002 | US20020092986 Method and an apparatus of an inspection system using an electron beam |
| 07/18/2002 | US20020092985 Focused ion beam machining method and focused ion beam machining apparatus |
| 07/17/2002 | EP1222439A1 Method and apparatus for molecular analysis of buried layers |
| 07/17/2002 | CN1359089A Method for bean hardening correcting original image recorded by CT Instrument |
| 07/16/2002 | US6421420 Method and apparatus for generating sequential beams of penetrating radiation |
| 07/16/2002 | US6421415 On-line system for quantitative analysis of multi-component additives and coatings in sheet material |
| 07/16/2002 | US6421414 Detector for large wafer surfaces |
| 07/16/2002 | US6421410 Computed tomography apparatus with shadowgram presentation |
| 07/16/2002 | US6420703 Method for forming a critical dimension SEM calibration standard of improved definition and standard formed |
| 07/11/2002 | WO2002054042A1 Improved method for preparing semiconductor wafer for defect analysis |
| 07/11/2002 | WO2002052919A2 Methods of searching for solid forms and screening a sample according to its forms |
| 07/11/2002 | WO2002043565A8 Ct apparatus and method for eliminating cone beam error |
| 07/11/2002 | WO2001069215A3 Apparatus for analyzing samples using combined thermal wave and x-ray reflectance measurements |
| 07/11/2002 | US20020090744 Method and system for measuring in patterned structures |
| 07/11/2002 | US20020090057 X-ray system |
| 07/11/2002 | US20020090051 Radiation tomography device |
| 07/11/2002 | DE10150507A1 Verbindungsverfahren und Verbindungsstruktur von Anschlussflächenelektroden und Prüfverfahren für den Verbindungszustand derselben Connection method and connection structure of pad electrodes and test methods for the connection state of the same |
| 07/11/2002 | CA2433385A1 Methods of searching for solid forms and screening a sample according to its forms |
| 07/10/2002 | EP0900441A4 Sidescatter x-ray detection system |
| 07/10/2002 | EP0896666B1 Method and meter for measuring the composition of a multiphase fluid |
| 07/10/2002 | CN1357755A Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis |
| 07/09/2002 | US6418193 Imaging system including radiation filter for x-ray imaging |
| 07/09/2002 | US6418190 Imaging plate X-ray diffraction apparatus |
| 07/09/2002 | US6418189 Explosive material detection apparatus and method using dual energy information of a scan |
| 07/09/2002 | US6417676 Method and apparatus for applying microwaves to measure the moisture content of material |
| 07/04/2002 | WO2002052579A1 A method for producing a grid structure |
| 07/04/2002 | WO2002052504A2 Method and system for dual energy radiographic imaging employing a digital detector |
| 07/04/2002 | WO2002052257A2 Device and method for analyzing fat of meat |
| 07/04/2002 | WO2002052224A1 Particle-optical inspection device especially for semiconductor wafers |
| 07/04/2002 | WO2000070646A9 Secondary electron spectroscopy method and system |
| 07/04/2002 | US20020085682 X-ray apparatus with non-contacting transmission of data or energy between mechanically connected components |
| 07/04/2002 | US20020085669 Device and method for the inspection of the condition of a sample |
| 07/04/2002 | US20020084412 Electron microscope equipped with electron biprism |
| 07/04/2002 | US20020084411 Substrate inspection system and method for controlling same |
| 07/04/2002 | DE10064707A1 Vorrichtung und Verfahren zur Fettanalyse von Fleisch Apparatus and method for fat analysis of meat |
| 07/04/2002 | DE10063907A1 Detektor zum Detektieren von elektromagnetischer Strahlung Detector for detecting electromagnetic radiation, |
| 07/03/2002 | EP1220582A2 Method and system for determining a source-to-image distance in a digital radiographic imaging system |
| 07/03/2002 | EP1220280A2 Scanning and high resolution x-ray photoelectron spectroscopy and imaging |
| 07/03/2002 | EP1219956A2 Method for providing a substantially uniform surface potential on an insulating specimen |
| 07/03/2002 | EP1218731A1 Methods for identification and verification |
| 07/03/2002 | EP1218730A2 Methods for identification and verification |
| 07/03/2002 | EP1218729A2 Apparatus and method for texture analysis on semiconductor wafers |
| 07/03/2002 | EP1218728A1 Apparatus and method for determining oil well effluent characteristics for inhomogeneous flow conditions |