Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
10/2003
10/01/2003CN1445533A Testing mass spectrum model of blood serum protein in carcinoma of large intestine and its creating method
09/2003
09/30/2003US6628748 Analysis of atomic and molecular elements by way of wavelength dispersive x-ray spectrometric structures including at least one mirror or focussing device having a multi-layer structure onto which fluorescent radiation generated by primary x-ray
09/30/2003US6628746 Image-based inspection system including positioning compensation for non-planar targets
09/30/2003US6628742 Cardiac helical half scan reconstructions for multiple detector row CT
09/30/2003US6627889 Apparatus and method for observing sample using electron beam
09/30/2003US6627888 Scanning electron microscope
09/30/2003US6627887 System and method for constructing a profile of a structure in an integrated circuit
09/30/2003US6627886 Secondary electron spectroscopy method and system
09/30/2003US6627884 Simultaneous flooding and inspection for charge control in an electron beam inspection machine
09/25/2003WO2003079372A1 Detector for x-ray computer tomography scanners
09/25/2003WO2003077723A2 Methods and devices for detection and therapy of atheromatous plaque
09/25/2003WO2003060496A3 Compact x-ray fluorescence spectrometer and method for fluid analysis
09/25/2003US20030179918 Method for determining an object function
09/25/2003US20030179853 Radiological imaging apparatus and radiological imaging method and radiological imaging support method
09/25/2003US20030179851 X-ray diagnostic imaging apparatus
09/25/2003US20030179850 X-ray fluorescence holography apparatus
09/25/2003US20030178582 System and method for electron beam irradiation
09/25/2003US20030178580 Method for defect and conductivity engineering of a conducting nanoscaled structure
09/25/2003US20030178573 Method to measure hydrogen-bearing constituent in a material using neutron spectroscopy
09/25/2003CA2478248A1 Methods and devices for detection and therapy of atheromatous plaque
09/24/2003EP1347309A2 Radiological imaging apparatus and method
09/24/2003EP1347287A1 Simultaneous multi-focus coherent X-ray scattering (CXRS)
09/24/2003EP1346687A1 Method for spacial calibration of X-ray imaging data and calibration device with reduced height
09/24/2003EP1346374A1 A method for producing a grid structure
09/24/2003EP1346222A1 Attachment of second harmonic-active moiety to molecules for detection of molecules at interfaces
09/24/2003CN1444244A Image display device and dissection processing method and element recovery method
09/24/2003CN1444038A Telemetering remote-reading surface type nucleon moisture density meter
09/23/2003US6624425 Waste inspection tomography and non-destructive assay
09/23/2003US6624411 Method of producing a broad-band signal for an ion trap mass spectrometer
09/23/2003US6623978 Observing techniques and its evaluation equipments of rheological properties for resin polymer composite filled with ceramic filler-powder
09/23/2003US6623161 Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
09/18/2003WO2003076699A1 Method for making an oriented optical fluoride crystal blank
09/18/2003US20030176779 Electronic portal imaging for radiotherapy
09/18/2003US20030175982 Using gamma rays
09/18/2003US20030173516 Semiconductor inspection system
09/17/2003EP1344047A2 Method and apparatus for analysing and sorting a flow of material
09/17/2003EP1344018A1 Particle-optical inspection device especially for semiconductor wafers
09/17/2003CN2574050Y Vehicle-mounted mechanical roentgenography detecting system
09/16/2003US6621888 X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
09/16/2003US6621085 Device for the precision rotation of samples
09/16/2003US6620634 Method of accurately measuring compositions of thin film shape memory alloys
09/16/2003US6619368 Method for imaging inclusions in investment castings
09/12/2003WO2003075286A1 X-ray microscope
09/12/2003WO2003074989A2 Methods for identification and verification
09/12/2003WO2003073938A1 Non-invasive stationary system
09/12/2003WO2002038045A8 Techniques for deriving tissue structure from multiple projection dual-energy x-ray absorptiometry
09/12/2003WO2001087140A9 Method and apparatus for anatomical and functional medical imaging
09/11/2003US20030169846 Multi-technique thin film analysis tool
09/11/2003US20030169845 X-ray monochromator and X-ray fluorescence spectrometer using the same
09/11/2003US20030169844 X-ray monochromator and x-ray fluorescence spectrometer using the same
09/11/2003US20030169843 Apparatus and method for detecting items in objects
09/11/2003US20030168596 Microstructured pattern inspection method
09/11/2003US20030168593 Process for identifying single crystals by electron diffraction
09/11/2003US20030168133 Titanium less susceptible to discoloration in the atmosphere and method for producing same
09/10/2003EP1342766A1 Cerium based abrasive material and method for evaluating cerium based abrasive material
09/10/2003EP1342049A1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation
09/10/2003EP0793804B1 Detecting explosives or other contraband by employing transmitted and scattered x-rays
09/10/2003CN2572400Y Vehicle carried moveable container check system
09/10/2003CN1441914A Spectrally shaped X-ray inspection system
09/10/2003CN1441244A Rock fragment depicting instrument and quantitative analysis method of lithologic character and oil-bearing abundance of rock fragment
09/09/2003US6618850 Inspection method and inspection system using charged particle beam
09/09/2003US6618689 Method for the non-destructive inspection of wall strength
09/09/2003US6618465 X-ray shielding system and shielded digital radiographic inspection system and method
09/09/2003US6617599 Apparatus and method for automated indexing of a nuclear gauge
09/09/2003US6617596 On-line measurement of absorbed electron beam dosage in irradiated product
09/09/2003US6617574 Apparatus for in-situ thickness and stoichiometry measurement of thin films
09/09/2003US6617178 Test system for ferroelectric materials and noble metal electrodes in semiconductor capacitors
09/09/2003US6617095 Evaluating method of hydrophobic process, forming method of resist pattern, and forming system of resist pattern
09/05/2003CA2419835A1 Process and device for testing parts by x rays
09/04/2003WO2003073481A2 Feedforward and feedback control of semiconductor fabrication process using secondary electron microscopy and a focused ion beam system
09/04/2003WO2003073448A2 Control of semiconductor fabrication process using scanning electron microscopy and a focused ion beam device
09/04/2003WO2003073232A2 System and method for building and manipulating a centralized measurement value database
09/04/2003WO2003073087A1 Simultaneous multifocal coherent x-ray scanning (cxrs)
09/04/2003WO2003071934A2 Methods and devices for quantitative analysis of x-ray images
09/04/2003WO2003061454A3 Automatically detecting cells having nuclear and cytoplasmic densitometric features associated with disease by optical imaging
09/04/2003WO2002024893A3 CHARACTERIZATION OF THE GSK-3β PROTEIN AND METHODS OF USE THEREOF
09/04/2003US20030165984 Hepatitis C virus helicase crystals, crystallographic structure and methods
09/04/2003US20030165215 Radiation imaging apparatus and radiographing method for radiation imaging apparatus
09/04/2003US20030165213 Method and apparatus for neutron microscopy with stoichiometric imaging
09/04/2003US20030165212 For detecting, locating, and analyzing chemical compounds located within a test subject; for detecting contraband, explosives
09/04/2003US20030164460 Patterned wafer inspection method and apparatus therefor
09/04/2003CA2473621A1 Methods and devices for quantitative analysis of x-ray images
09/04/2003CA2472556A1 System and method for building and manipulating a centralized measurement value database
09/03/2003EP1340241A1 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
09/03/2003CN2570780Y Intelligent scanning beam-defining clipper mating with radioactive ray source
09/03/2003CN2570779Y Vehicle-carrying Co-60 container inspecting system
09/03/2003CN2570778Y Coal power metering apparatus
09/03/2003CN1120503C X-ray examination apparatus comprising collimator unit
09/03/2003CN1120364C Nucleonic water density measuring instrument
09/03/2003CN1119973C Radiation shielding device for high speed data communication in computer tomographic X-ray camera system
09/02/2003US6614924 Adaptive mask technique for defect inspection
09/02/2003US6614875 Method and apparatus for imaging the head area of a patient
09/02/2003US6614873 Interactive ditigal radiographic system
09/02/2003US6614872 Method and apparatus for localized digital radiographic inspection
09/02/2003US6614524 Method of and apparatus for qualitative analysis
09/02/2003US6614244 Semiconductor device inspecting apparatus
09/02/2003US6614022 Pattern inspection method and apparatus using electron beam
09/02/2003US6613593 Method of fabricating a semiconductor device
08/2003
08/28/2003WO2003071557A1 System and method of irradiating products being conveyed past an electron beam delivery device
08/28/2003WO2003071257A1 X-ray condenser
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