| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
|---|
| 11/14/2002 | DE10121998A1 Investigation of two phase flows within a pump impeller using a CT scanner with an arrangement whereby both impeller, radiation source and detector can be rotated about a common axis |
| 11/13/2002 | CN1378934A High-safety Co-60 radiating interlock method and system for inspecting radiation of goods train |
| 11/12/2002 | US6480564 Sectional image photography system and method thereof |
| 11/12/2002 | US6480290 Method and apparatus to measure the cross-sectional area of an object |
| 11/12/2002 | US6480002 Battery inspection system |
| 11/12/2002 | US6479835 Radiation image detector |
| 11/12/2002 | US6479819 Object observation apparatus and object observation |
| 11/12/2002 | US6479818 Application of x-ray optics to energy dispersive spectroscopy |
| 11/07/2002 | WO2002088690A1 Optimization on lie manifolds |
| 11/07/2002 | WO2002088689A2 Method and apparatus for x-ray laminography |
| 11/07/2002 | WO2002088674A2 Adsorptive method for determining a surface property of a solid |
| 11/07/2002 | WO2002088078A2 INHIBITORS OF GSK-3 AND CRYSTAL STRUCTURES OF GSK-3β PROTEIN AND PROTEIN COMPLEXES |
| 11/07/2002 | US20020165686 Method for correcting calibration values in a calibration table of a computed tomography apparatus |
| 11/07/2002 | US20020165155 Crystallization of IGF-1 |
| 11/07/2002 | US20020164641 Detecting modulators of tyrosine kinase activity; obtain expresion vector containg tyrosine kinase polypeptide, express vector, incubate with modulator, monitor adjustment activity or tyrosine kinase |
| 11/07/2002 | US20020163992 X-ray detector array and method for manufacturing same |
| 11/07/2002 | US20020163988 Waste inspection tomography and non-destructive assay |
| 11/07/2002 | CA2444882A1 Inhibitors of gsk-3 and crystal structures of gsk-3.beta. protein and protein complexes |
| 11/07/2002 | CA2443417A1 Adsorptive method for determining a surface property of a solid |
| 11/06/2002 | EP1255278A1 Scanning particle mirror microscope |
| 11/06/2002 | EP1254384A1 Spectrally shaped x-ray inspection system |
| 11/06/2002 | EP0917650A4 Two-dimensional imaging backscatter probe |
| 11/06/2002 | EP0897535A4 Operator console for article inspection systems |
| 11/06/2002 | EP0897534A4 Substance detection device using monoenergetic neutrons |
| 11/06/2002 | EP0808468B1 X-ray inspection system |
| 11/06/2002 | CN1378073A Sample substrate removing device |
| 11/06/2002 | CN1378067A Multiple point thickness meter |
| 11/05/2002 | USRE37899 Tomographic method of x-ray imaging |
| 11/05/2002 | US6477237 X-ray shielding mechanism for off-axis X-rays |
| 11/05/2002 | US6477228 Method for operating an X-ray diagnosis device with immediate imaging |
| 11/05/2002 | US6477227 Methods for identification and verification |
| 11/05/2002 | US6477226 X-ray analysis device with X-ray optical semi-conductor construction element |
| 11/05/2002 | US6477221 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
| 11/05/2002 | US6476390 Method and apparatus for inspecting integrated circuit pattern using a plurality of charged particle beams |
| 11/05/2002 | US6476389 X-ray analyzer having an absorption current calculating section |
| 11/05/2002 | US6476388 Scanning electron microscope having magnification switching control |
| 10/31/2002 | WO2002086477A1 Structure determination of materials using electron microscopy |
| 10/31/2002 | WO2002086476A2 High spatial resolution x-ray microanalysis |
| 10/31/2002 | WO2002085213A1 Substance hardness measuring instrument, biological tissue hardness measuring instrument, and recording medium for outputting hardness data on substance when data is inputted to it |
| 10/31/2002 | US20020161534 Method and apparatus for inspecting a substrate |
| 10/31/2002 | US20020159566 Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube |
| 10/31/2002 | US20020159562 X-ray optical system |
| 10/31/2002 | US20020159560 Device for micro-manipulation of small samples |
| 10/31/2002 | US20020158206 Pixel circuit with selectable capacitor load for multi-mode X-ray imaging |
| 10/31/2002 | US20020158200 Electron microscope equipped with x-ray spectrometer |
| 10/31/2002 | US20020158199 Semiconductor inspection system |
| 10/31/2002 | US20020158198 Charged particle beam apparatus |
| 10/31/2002 | US20020158197 AFM-based lithography metrology tool |
| 10/31/2002 | US20020157991 Mild heating asphaltenes in petroleum oils and oil mixture, determining the presence of asphaltene aggregates by irridating petroleum oils and oil mixture with neutrons and determining small angle neutron scattering intensity |
| 10/30/2002 | EP1252634A1 Instrument and method for combined surface topography and spectroscopic analysis |
| 10/30/2002 | EP1252495A2 Analytical devices based on diffusion boundary layer calibration and quantitative sorption |
| 10/30/2002 | CN1376909A Gamma-ray detecting method and device for in-duty pipeline network |
| 10/29/2002 | US6473489 Apparatus for superimposition of X-ray and video images |
| 10/29/2002 | US6473487 Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction |
| 10/29/2002 | US6472664 Photomultiplier tube tightly arranged with substantially no space between adjacent tubes |
| 10/29/2002 | US6472663 Electron microscope |
| 10/29/2002 | US6472662 Automated method for determining several critical dimension properties from scanning electron microscope by using several tilted beam or sample scans |
| 10/29/2002 | US6470738 Rotating probe microscope |
| 10/24/2002 | WO2002085079A2 Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube |
| 10/24/2002 | WO2002084269A1 Measuring the moisture content of plutonium oxide canisters |
| 10/24/2002 | WO2002084268A1 A method for segmenting and recognizing an image in industry radiation imaging |
| 10/24/2002 | WO2002069363A3 Step function determination of auger peak intensity |
| 10/24/2002 | WO2002067223A3 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
| 10/24/2002 | WO2002052504A3 Method and system for dual energy radiographic imaging employing a digital detector |
| 10/24/2002 | WO2001059485A9 Spectrally shaped x-ray inspection system |
| 10/24/2002 | US20020154736 Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements |
| 10/24/2002 | US20020154732 X-Ray fluorescence analyzer |
| 10/24/2002 | US20020154731 Method of X-ray analysis in a particle-optical apparatus |
| 10/24/2002 | US20020154729 X-ray sensor signal processor and x-ray computed tomography system using the same |
| 10/24/2002 | US20020154727 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
| 10/24/2002 | US20020154235 X-ray detecting device and fabricating method thereof |
| 10/23/2002 | EP0993604B1 Method for detecting an element in a sample |
| 10/23/2002 | EP0819247A4 A method and an apparatus for analysing a material |
| 10/22/2002 | US6470071 Real time data acquisition system including decoupled host computer |
| 10/22/2002 | US6470070 Image reconstruction using multiple X-ray projections |
| 10/22/2002 | US6470067 Computed tomography apparatus for determining the pulse momentum transfer spectrum in an examination zone |
| 10/17/2002 | WO2002082533A2 Defect inspection efficiency improvement with in-situ statistical analysis of defect data during inspection |
| 10/17/2002 | WO2002082065A2 Computed tomography apparatus |
| 10/17/2002 | WO2002080772A1 Arrangement for the determination by measurement of a projection of the radiation absorption capacity of a periodically-variable measured object |
| 10/17/2002 | WO2002006800A3 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials |
| 10/17/2002 | US20020150285 Optical projection imaging system and method for automatically detecting cells having nuclear and cytoplasmic densitometric features associated with disease |
| 10/17/2002 | US20020150209 Pulsed X-ray reflectometer |
| 10/17/2002 | US20020150208 X-ray reflectometer |
| 10/17/2002 | US20020150206 Radiation inspection apparatus and radiation inspection method |
| 10/17/2002 | US20020150202 Computed tomography apparatus for determining the pulse momentum transfer spectrum |
| 10/17/2002 | US20020150194 Method and device for non-invasive soil carbon content and distribution measurements |
| 10/17/2002 | US20020149381 Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam |
| 10/17/2002 | US20020149378 Method and apparatus for applying microwaves to measure the moisture content of material |
| 10/17/2002 | US20020148975 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 10/17/2002 | US20020148969 Non-destructive detection systems and methods |
| 10/17/2002 | US20020148968 Radiation detector for a computed tomography |
| 10/17/2002 | US20020148961 Electron beam apparatus and device production method using the electron beam apparatus |
| 10/17/2002 | DE10116222A1 Detektor für Röntgen-Computertomograph Detector for X-ray computed tomography |
| 10/16/2002 | EP1249698A1 Reflectometer arrangement and method of determining the reflectivity of an object |
| 10/16/2002 | EP1248869A2 High-throughput formation, identification, and analysis of diverse solid-forms |
| 10/16/2002 | EP1121584A4 Application of x-ray optics to energy dispersive spectroscopy |
| 10/16/2002 | CN2516969Y On-line checking device for short piece in regular package finished box |
| 10/15/2002 | US6466643 High speed digital radiographic inspection of aircraft fuselages |
| 10/15/2002 | US6466642 Methods and apparatus for the in-situ measurement of CMP process endpoint |
| 10/15/2002 | US6465795 Charge neutralization of electron beam systems |