| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 02/04/2003 | US6515296 Pattern dimension measuring system and pattern dimension measuring method |
| 02/04/2003 | US6515287 Sectored magnetic lens and method of use |
| 01/30/2003 | WO2003008952A1 Nondestructive analysis method and nondestructive analysis device and specific object by the method/device |
| 01/30/2003 | WO2002040979A3 Device and method for the inspection of a sample by the use of radiation which is reflected from the sample onto a positon-sensitive detector |
| 01/30/2003 | WO2002018921A3 Method and system for real-time fluorescent determination of trace elements |
| 01/30/2003 | WO2001088113A3 Hepatitis c virus helicase crystals, crystallographic structure and methods |
| 01/30/2003 | US20030022401 Semiconductor device inspection method |
| 01/30/2003 | US20030021463 Method and apparatus for circuit pattern inspection |
| 01/30/2003 | US20030021385 Aperture position adjusting mechanism, gantry apparatus and method of controlling it in X-ray CT system |
| 01/30/2003 | US20030021377 Mobile miniature X-ray source |
| 01/30/2003 | US20030021376 High-resolution radiation detector |
| 01/30/2003 | US20030021375 Fiber-optic encoding for dual transmission measurements in positron emission tomography |
| 01/30/2003 | US20030021373 Section reconstruction method and radiographic apparatus |
| 01/30/2003 | US20030020016 Scanning particle mirror microscope |
| 01/30/2003 | US20030020015 Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam |
| 01/29/2003 | EP1279923A2 Method and apparatus for circuit pattern inspection |
| 01/29/2003 | EP1279183A2 A nanotube-based electron emission device and systems using the same |
| 01/29/2003 | EP1279032A2 Method and device using x-rays to measure thickness and composition of thin films |
| 01/29/2003 | EP1147407A4 X-ray fluorescent emission analysis to determine material concentration |
| 01/29/2003 | CN2533463Y Quick sample feeding device for analyzing solid sample in high vacuum |
| 01/29/2003 | CN1393691A Electronic microscope with high time resolution |
| 01/29/2003 | CN1393205A X-ray checker |
| 01/28/2003 | US6512815 Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements |
| 01/28/2003 | US6512814 X-ray reflectometer |
| 01/28/2003 | US6512812 X-ray foreign-body detector |
| 01/28/2003 | US6512811 Evaluation method and evaluation apparatus for semiconductor device |
| 01/28/2003 | US6512810 Method of analyzing a specimen comprising a compound material by x-ray fluorescence analysis |
| 01/28/2003 | US6512240 Method and apparatus for reading a radiation image that has been stored in a photostimulable screen |
| 01/28/2003 | US6512235 Nanotube-based electron emission device and systems using the same |
| 01/28/2003 | US6512227 Method and apparatus for inspecting patterns of a semiconductor device with an electron beam |
| 01/23/2003 | WO2003007330A1 Sample electrification measurement method and charged particle beam apparatus |
| 01/23/2003 | WO2003006972A2 Determination of material parameters using x-ray scattering |
| 01/23/2003 | WO2002057763A3 Apparatus and method for identification of crystals by in-situ x-ray diffraction |
| 01/23/2003 | WO2002008858A3 A method for ab initio determination of macromolecular crystallographic phases using bessel function |
| 01/23/2003 | US20030016790 X-ray inspection using spatially and spectrally tailored beams |
| 01/23/2003 | US20030016783 X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects |
| 01/23/2003 | US20030016778 X-ray computer tomography apparatus |
| 01/23/2003 | US20030015659 Defect inspection method |
| 01/23/2003 | DE10147722C1 Measurement arrangement for pipes has scanning arrangement in form of ring segment spanning more than half pipe's circumference, test heads e.g. opposed in relation to center point |
| 01/22/2003 | EP1277376A2 Method for operating a radiation examination device |
| 01/22/2003 | CN1392956A Quantitative measuring method and apparatus of metal phase using X-ray diffraction method, and method for making plated steel sheet using them |
| 01/22/2003 | CN1392955A Movable container inspectino apparatus |
| 01/22/2003 | CN1392415A Powder included water elutrating instrument and its operation process |
| 01/22/2003 | CN1392405A Metal article identification method and device in luggage |
| 01/22/2003 | CN1392404A Multi-way industrial detection system for large object |
| 01/22/2003 | CN1392403A X-ray detector |
| 01/22/2003 | CN1392402A X-ray CT device |
| 01/22/2003 | CN1099589C Energetic proton heavy ion detector |
| 01/21/2003 | US6510201 Apparatus for measuring the pulse transmission spectrum of elastically scattered x-ray quantities |
| 01/21/2003 | US6510194 Method and apparatus for acquiring transmitted-radiation image data |
| 01/21/2003 | US6509969 System for inspecting and/or processing a sample |
| 01/21/2003 | US6509750 Apparatus for detecting defects in patterned substrates |
| 01/21/2003 | US6509569 Deflection arrangement for separating two particle beams |
| 01/21/2003 | CA2161924C Radon gas measurement apparatus having alpha particle-detecting photovoltaic photodiode surrounded by porous pressed metal daughter filter electrically charged as po-218 ion accelerator |
| 01/16/2003 | WO2003003975A2 Detection and therapy of vulnerable plaque with photodynamic compounds |
| 01/16/2003 | WO2002095381A3 Tandem microchannel plate and solid state electron detector |
| 01/16/2003 | WO2002084268A8 A method for segmenting and recognizing an image in industry radiation imaging |
| 01/16/2003 | WO2002021112A3 Method to measure hydrogen-bearing constituent in a material using neutron spectroscopy |
| 01/16/2003 | US20030012422 Method of recognizing pattern side face and method of detecting and classifying defects |
| 01/16/2003 | US20030012337 Determination of material parameters |
| 01/16/2003 | US20030012335 Pole measuring method |
| 01/16/2003 | US20030012334 Method and apparatus for rapid grain size analysis of polycrystalline materials |
| 01/16/2003 | US20030010912 Methodology for critical dimension metrology using stepper focus monitor information |
| 01/16/2003 | US20030010911 Instrument and method for combined surface topography and spectroscopic analysis |
| 01/16/2003 | CA2449828A1 Detection and therapy of vulnerable plaque with photodynamic compounds |
| 01/15/2003 | EP1275956A2 Security system and method of security service business |
| 01/15/2003 | EP1144989B1 Nanotomography |
| 01/15/2003 | EP1012587B1 Charged particle analysis |
| 01/15/2003 | CN2531386Y Radiation pipeline creeper |
| 01/15/2003 | CN1391099A Self-moving real-time X-ray imaging system |
| 01/15/2003 | CN1099033C X-ray inspection system |
| 01/14/2003 | US6507636 Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates |
| 01/14/2003 | US6507635 Method and apparatus for radiographic inspection of aircraft fuselages |
| 01/14/2003 | US6507634 System and method for X-ray reflectometry measurement of low density films |
| 01/14/2003 | US6507038 Image sensing apparatus |
| 01/14/2003 | US6507025 Density detection using real time discrete photon counting for fast moving targets |
| 01/14/2003 | US6506991 Method and apparatus for sorting waste paper of different grades and conditions |
| 01/14/2003 | US6506519 Nonaqueous secondary battery, method for making negative electrode component therefor, and apparatus for evaluating and making graphite material for negative electrode component |
| 01/09/2003 | WO2003003402A1 Energy filter multiplexing |
| 01/09/2003 | WO2003002997A1 Nonuniform-density sample analyzing method, device, and system |
| 01/09/2003 | WO2003002996A2 Limiting device for electromagnetic radiation, notably in an analysis device |
| 01/09/2003 | WO2003002995A2 Device for and method of material analysis using a shutter comprising a calibration sample |
| 01/09/2003 | WO2003002994A2 Device for the examination of samples by means of x-rays |
| 01/09/2003 | WO2001079823A3 Diffraction enhanced x-ray imaging of articular cartilage |
| 01/09/2003 | US20030009661 Security system and method of security service business |
| 01/09/2003 | US20030009316 Diffraction condition simulation device, diffraction measurement system, and crystal analysis system |
| 01/09/2003 | US20030008404 Method of measuring an impurity profile of a semiconductor wafer and program for measuring an impurity profile of a semiconductor wafer |
| 01/09/2003 | US20030007677 Method and its apparatus for inspecting a pattern |
| 01/09/2003 | US20030007603 Method and device for calibrating a radiological image |
| 01/09/2003 | US20030007600 Proportional gas counters |
| 01/09/2003 | US20030007599 Apparatus for X-ray analysis and apparatus for supplying X-rays |
| 01/09/2003 | US20030007595 Method of reconstructing a tomogram of an x-ray apparatus |
| 01/09/2003 | US20030007592 Computed-tomography system with filtering |
| 01/09/2003 | US20030006373 Observation apparatus and observation method using an electron beam |
| 01/09/2003 | US20030006371 Charged-particle beam apparatus and method for automatically correcting astigmatism of charged-particle beam apparatus |
| 01/08/2003 | EP1274114A2 Observation apparatus and observation method using an electron beam |
| 01/08/2003 | EP1273912A1 Method for determining alloy phase in plating layer and method for evaluating sliding property of alloy galvanized steel plate |
| 01/08/2003 | EP1273907A1 Wafer inspecting method, wafer inspecting instrument, and electron beam apparatus |
| 01/08/2003 | EP1273906A2 X-ray analysis apparatus with an X-ray generator |
| 01/08/2003 | CN2530265Y Radiation ionizing smoke, dust sensor |