Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
---|
01/01/2004 | US20040000638 Undercut measurement using sem |
12/31/2003 | WO2004001770A1 Optical unit and associated method |
12/31/2003 | WO2004001769A1 Optical device for x-ray applications |
12/31/2003 | WO2004000452A1 High throughput crystallographic screening of materials |
12/31/2003 | WO2003085416A3 Machinery for automatic x-ray inspection of wheels |
12/31/2003 | WO2003085390A3 Computed tomography method |
12/31/2003 | CN1464301A CT-analytic method for realizing image reconstruction by X-ray stereophotography |
12/31/2003 | CN1464300A Apparatus for continuous and automatic measurement of radial flow sediment content |
12/31/2003 | CN1464294A Process of transmission electron microscope specimen preparation for easy damp-affecting denaturization crystal thin film |
12/31/2003 | CN1132772C Rigid folding structure for container detection scanning arm |
12/30/2003 | US6670612 Undercut measurement using SEM |
12/25/2003 | US20030235270 Method of estimating preferred orientation of polycrystalline material |
12/25/2003 | US20030235269 Capturing images of moving objects with a moving illumination point source |
12/25/2003 | US20030234359 Apparatus for scanning a crystalline sample and associated methods |
12/24/2003 | WO2003107398A2 Techniques to characterize iso-dense effects for microdevice manufacture |
12/24/2003 | WO2003107037A2 Scatter spectra method for x-ray fluorescent analysis with optical components |
12/24/2003 | WO2003106984A1 Stereoscopic x-ray imaging apparatus for obtaining three-dimensional coordinates |
12/24/2003 | WO2003106983A1 Methods and apparatus of sample analysis |
12/24/2003 | WO2002095381A8 Tandem microchannel plate and solid state electron detector |
12/24/2003 | CN2594789Y Abnormal radon gamma monitoring alarm in room |
12/24/2003 | CN1131700C Computer chromatographic X-ray camera |
12/24/2003 | CA2490153A1 Stereoscopic x-ray imaging apparatus for obtaining three-dimensional coordinates |
12/23/2003 | US6668039 Compact X-ray fluorescence spectrometer and method for fluid analysis |
12/23/2003 | US6668038 X-ray fluorescence spectrometer |
12/23/2003 | US6668036 Data processing method and data processing apparatus |
12/23/2003 | US6667483 Apparatus using charged particle beam |
12/23/2003 | US6667482 Radiation detector for a computed tomography |
12/18/2003 | WO2003105159A1 Scanner for x-ray inspection comprising a chopper wheel with differently sized apertures |
12/18/2003 | WO2003104848A2 Methods for sem inspection of fluid containing samples |
12/18/2003 | WO2003104847A2 Low-pressure chamber for scanning electron microscopy in a wet environment |
12/18/2003 | WO2003104846A2 A sample enclosure for a scanning electron microscope and methods of use thereof |
12/18/2003 | WO2003103495A1 Method and apparatus for detection of ionizing radiation |
12/18/2003 | WO2003085418A3 Chemical analysis of test objects using neutrons that are generated by concentrically accelerated deuterium ions |
12/18/2003 | US20030232253 Techniques to characterize iso-dense effects for microdevice manufacture |
12/18/2003 | US20030231739 3D X-ray system adapted for high speed scanning of large articles |
12/18/2003 | US20030231737 Method of performing analysis using propagation rays and apparatus for performing the same |
12/18/2003 | CA2484945A1 Method and apparatus for detection of ionizing radiation |
12/17/2003 | EP1371972A2 Method for visualising temperature-dependent processes and apparatus for its implementation |
12/17/2003 | EP1371971A2 Sample analysis using propagating rays and slits for which a slit function is calculated |
12/17/2003 | EP1371970A2 Method and apparatus of 3D X-ray imaging for high speed scanning of large articles |
12/17/2003 | EP1370851A2 X-ray fluorescence analyzer |
12/17/2003 | CN2593189Y 密度测量系统 Density Measurement System |
12/17/2003 | CN1461949A Method for determining correction coefficient for detector channel of computer laminagraphy contrast equipment |
12/16/2003 | US6665373 X-ray imaging system with active detector |
12/16/2003 | US6665372 X-ray diffractometer |
12/16/2003 | US6665370 Computed tomography method and apparatus for acquiring images dependent on a time curve of a periodic motion of the subject |
12/16/2003 | US6664552 Method and apparatus for specimen fabrication |
12/16/2003 | US6664541 Methods and apparatus for defect localization |
12/16/2003 | US6664540 Microprobe and sample surface measuring apparatus |
12/16/2003 | US6663281 X-ray detector monitoring |
12/11/2003 | WO2003102627A1 Differential indication of labeled molecules |
12/11/2003 | WO2003102606A1 Material segregation, density, and moisture analyzing apparatus and method |
12/11/2003 | WO2003102574A1 Method and apparatus for analysis of elements in bulk substance |
12/11/2003 | WO2003102564A2 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate |
12/11/2003 | WO2003102192A1 Methods of purification of cytochrome p450 proteins and of their crystallizing |
12/11/2003 | WO2003101300A2 Rotational angiography based hybrid 3-d reconstruction of coronary arterial structure |
12/11/2003 | WO2003003975A3 Detection and therapy of vulnerable plaque with photodynamic compounds |
12/11/2003 | WO2002013232A3 Measurement of critical dimensions using x-rays |
12/11/2003 | WO1999024553A3 X-ray crystal comprising hiv-1 gp120 |
12/11/2003 | US20030229294 Multilayered polymer tubing with braided layer and methods of making and using same |
12/11/2003 | US20030227996 Method and apparatus for detection of ionizing radiation |
12/10/2003 | EP1369682A2 A method for wafer level detection of integrity of a layer |
12/10/2003 | EP1369161A1 Method for nondestructive inspecting of a depollution device for exhaust gases of an internal combustion engine and installation for restoring depollution devices |
12/10/2003 | EP1369084A1 Edge phantom |
12/10/2003 | CN2591644Y Penetration ionization chamber for monitoring X-ray source dosage rate |
12/10/2003 | CN2591620Y Neutron microscopic imaging device |
12/10/2003 | CN1461409A Method for segmenting and recognizing image in industry radiation imaging |
12/10/2003 | CN1460849A Gamma radiation imaging nondestructive inspection system for bag, box or baggage |
12/10/2003 | CN1460833A Harmonic goniometer instrument |
12/09/2003 | US6662088 Methods and systems for inspecting aircraft fuselage frames |
12/09/2003 | US6661876 Mobile miniature X-ray source |
12/09/2003 | US6661869 Image reconstruction using multiple X-ray projections |
12/09/2003 | US6661868 Radiation inspection apparatus and radiation inspection method |
12/09/2003 | US6661867 Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation |
12/09/2003 | US6661008 Electron-optical system and inspection method using the same |
12/09/2003 | US6661005 Method of examining and/or modifying surface structures of a sample |
12/04/2003 | WO2003100406A1 Analysis of powder diffraction crystallography data |
12/04/2003 | US20030225531 Method and apparatus for analysis of elements in bulk substance |
12/04/2003 | US20030223550 Radioactive image apparatus and focus control method thereof |
12/04/2003 | US20030223549 Positioning stand for a radiography imaging device |
12/04/2003 | US20030223547 X-ray inspection apparatus and method |
12/04/2003 | US20030223536 Element-specific X-ray fluorescence microscope and method of operation |
12/04/2003 | US20030223053 Methods and devices for charge management for three-dimensional and color sensing |
12/04/2003 | US20030222215 Method for objective and accurate thickness measurement of thin films on a microscopic scale |
12/03/2003 | EP1367386A1 X-ray inspection apparatus and method |
12/03/2003 | EP1366469A2 System and method for fast parallel cone-beam reconstruction using one or more microprocessors |
12/03/2003 | CN2589975Y Neutron diffraction tomographic imaging equipment |
12/03/2003 | CN1459275A Diaphragm regulating method of computer lamination contrast and computer lamination contrast apparatus |
12/03/2003 | CN1129789C X-ray inspecting probe for large container and its preparing process |
12/03/2003 | CN1129775C 跨式检查系统 Straddle inspection system |
12/02/2003 | US6658144 Diffraction tomography for monitoring latent image formation |
12/02/2003 | US6658089 System and method for image identification and quality indication for radiographic inspection |
12/02/2003 | US6658087 Nautical X-ray inspection system |
12/02/2003 | US6658082 Radiation detector, radiation detecting system and X-ray CT apparatus |
12/02/2003 | US6657735 Method of evaluating critical locations on a semiconductor apparatus pattern |
12/02/2003 | US6657221 Image classification method, observation method, and apparatus thereof with different stage moving velocities |
12/02/2003 | US6657193 Scanning electron microscope |
12/02/2003 | US6657189 Maintaining measurement accuracy in prompt gamma neutron activation analyzers with variable material flow rates or material bed depth |
11/27/2003 | WO2003098539A1 Optical projection imaging system and method for automatically detecting cells with molecular marker compartmentalization associated with disease |
11/27/2003 | WO2003098149A1 Sample dimension measuring method and scanning electron microscope |