Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
02/2004
02/18/2004CN1475971A Method of determining stop judging when obtaining two-dimension image of three-dimension object
02/18/2004CN1138977C Equipment and method for directly observing water-contained biologic sample in ambient scanning electronic microscope
02/17/2004US6693988 Arrangement for measuring the pulse transmission spectrum of x-ray quanta elastically scattered in a scanning area for containers
02/17/2004US6693288 Charged particle beam irradiation apparatus and irradiation method using the apparatus
02/17/2004US6693278 Particle-optical inspection device especially for semiconductor wafers
02/17/2004US6693277 Detection of submicron scale cracks and other surface anomalies using positron emission tomography
02/17/2004US6693269 Image reader with DC-coupled integration circuit
02/17/2004US6692698 Combinatorial chemistry; raw material distribution and sample mechanism; flattening means for surfaces of samples on reaction tray
02/12/2004WO2004013867A2 An optical device for directing x-rays having a plurality of optical crystals
02/12/2004WO2004013683A2 Monitoring signal-to-noise ratio in x-ray diffraction data
02/12/2004WO2004013658A2 Method and apparatus for multiple labeling detection and evaluation of a plurality of particles
02/12/2004WO2004013622A1 Method of comparing x-ray diffraction patterns using the fundamental parameter method
02/12/2004WO2004012683A2 Novel druggable regions in set domain proteins and methods of using the same
02/12/2004WO2003087795A3 High-resolution x-ray diffraction apparatus
02/12/2004WO2003048745A3 X-ray fluorescence analyser for analysing fluid streams using a semiconductor-type detector and focusing means
02/12/2004US20040030536 Method and apparatus for improved inspection and classification of attributes of a workpiece
02/12/2004US20040028272 Pattern inspection method and apparatus using electron beam
02/12/2004US20040028265 Three-dimensional spatial filtering apparatus and method
02/12/2004US20040028186 X-ray reflectometer
02/12/2004US20040028181 Method and apparatus for multiple-projection, dual-energy x-ray absorptiometry scanning
02/12/2004US20040028180 X-ray diffraction apparatus
02/12/2004US20040028179 High throughput X-ray diffraction filter sample holder
02/12/2004US20040028177 X-ray inspection device for food products
02/12/2004US20040027567 Method and system for real-time fluorescent determination of trace elements
02/12/2004US20040026619 Method and apparatus for extracting three-dimensional spacial data of object using electron microscope
02/12/2004US20040026268 Gas sensor and detection method and device for gas.concentration
02/12/2004US20040025569 Device for determining and/or monitoring the density and/or the level of a filling material in a container
02/12/2004DE10333821A1 Flexible Bildgebungseinrichtung und digitales Bildgebungsverfahren Flexible imaging device and digital imaging techniques
02/12/2004DE10234465A1 X-ray sectional-imaging method in which the height of a sectional image is set using a camera arrangement for imaging the patient from the side so that a reference marking can be made on a reference image
02/12/2004DE10232172A1 Vorrichtung und Verfahren zur Erzeugung einer definierten Umgebung für partikelförmige Proben Apparatus and method for generating a defined environment for particle-shaped samples
02/12/2004CA2494837A1 Novel druggable regions in set domain proteins and methods of using the same
02/12/2004CA2494511A1 Method of comparing x-ray diffraction patterns using the fundamental parameter method
02/12/2004CA2492543A1 Monitoring signal-to-noise ratio in x-ray diffraction data
02/11/2004EP1388883A2 Coaxial FIB-SEM column
02/11/2004EP1388817A1 Three-dimensional spatial filtering apparatus and method
02/11/2004CN1474358A Three dimension space filter device and method
02/10/2004US6690766 Collimator for a detector array and a nonintrusive inspection apparatus including a collimator
02/10/2004US6690763 Device for micro-manipulation of small samples
02/10/2004US6690762 N-dimensional data encoding of projected or reflected data
02/10/2004US6690010 Chemical analysis of defects using electron appearance spectroscopy
02/10/2004US6690009 Method of determining the charge carrier concentration in materials, notably semiconductors
02/10/2004US6690007 Three-dimensional atom microscope, three-dimensional observation method of atomic arrangement, and stereoscopic measuring method of atomic arrangement
02/05/2004WO2004012209A1 Spatial revolving power evaluation element in x-ray transmission image measuring apparatus
02/05/2004WO2004012208A2 Soller slit using low density materials
02/05/2004WO2004011919A1 Quantitative phase analysis of textured polycrystalline materials
02/05/2004WO2004011898A2 Flow method and apparatus for screening chemicals using micro x-ray fluorescence
02/05/2004WO2003083160A3 Evaluation of chamber components having textured coatings chamber components
02/05/2004WO2003042666A3 Fluid density measurement
02/05/2004US20040022364 Method for determining correction coefficients for detector channels for a computed tomograph
02/05/2004US20040022356 Multi-phenomenology, decision-directed baggage scanning apparatus and method
02/05/2004US20040022354 Multi-layer film spectroscopic element for boron fluorescene x-ray analysis
02/05/2004US20040022348 Computed tomography
02/05/2004US20040021074 Scanning charged particle microscope
02/05/2004DE10232689A1 Mit Strahlen geladener Teilchen arbeitende Anwendungen With charged particle beams working applications
02/05/2004DE10230990A1 Vorrichtung zur Durchführung einer Online-Elementanalyse Apparatus for carrying out an on-line element analysis
02/04/2004EP1386145A1 X-ray fluorescence combined with laser induced photon spectroscopy
02/04/2004CN1473264A Device for determining density and level of filling material in container
02/03/2004US6687328 Method for inspecting objects particularly for detecting defects or irregularities therein by means of X-radiation and apparatus for performing the method
02/03/2004US6687326 Method of and system for correcting scatter in a computed tomography scanner
02/03/2004US6686596 System and method of irradiating products being conveyed past an electron beam delivery device
02/03/2004US6686591 Apparatus for inspecting mask
02/03/2004US6686590 Low-vacuum scanning electron microscope
02/03/2004US6685906 Silicon oxide containing active silicon and its evaluation
02/03/2004US6685847 Method for observing cross-sectional structure of sample
02/03/2004US6684686 Non-contact type atomic microscope and observation method using it
01/2004
01/29/2004WO2004010383A2 Method and apparatus for deriving motion information from projection data
01/29/2004WO2004010162A2 Radiation sources and compact radiation scanning systems
01/29/2004WO2004010147A1 Rotary support and apparatus used for the multiple spectroscopic characterisation of samples of solid materials
01/29/2004WO2004010127A1 Radiation scanning of objects for contraband
01/29/2004WO2004010126A1 Method for nondestructive inspection of state of liquid flow in liquid passage device
01/29/2004WO2004010125A1 X-ray inspection device and x-ray inspection method
01/29/2004WO2004009301A1 End effector
01/29/2004WO2004008969A2 Methods and apparatus for motion compensation in image reconstruction
01/29/2004WO2003050598A3 Integrated crystal mounting and alignment system for high-throughput biological crystallography
01/29/2004US20040017935 Temporal image comparison method
01/29/2004US20040017896 Apparatus and method for characterizing libraries of different materials using x-ray scattering
01/29/2004US20040017891 Radiological imaging apparatus and method
01/29/2004US20040017888 Radiation scanning of objects for contraband
01/29/2004US20040017887 Self-contained, portable inspection system and method
01/29/2004US20040017884 Flow method and apparatus for screening chemicals using micro x-ray fluorescence
01/29/2004US20040017883 CT apparatus, CT imaging method and method of providing service using the same
01/29/2004US20040017882 Oblique view cone beam CT system
01/29/2004US20040016888 Semiconductor device inspecting apparatus
01/29/2004US20040016886 Flexible imager and digital imaging method
01/29/2004US20040016882 Scanning electron microscope
01/29/2004US20040016559 Electrical connector, a cable sleeve, and a method for fabricating an electrical connection
01/29/2004US20040016271 Portable inspection containers
01/29/2004DE10318825A1 Testsystem für ferroelektrische Materialien und Edelmetallelektroden bei Halbleiterkondensatoren Test system for ferroelectric materials and precious metal electrodes in semiconductor capacitors
01/29/2004DE10230929A1 Verfahren zum elektronenmikroskopischen Beobachten einer Halbleiteranordnung und Vorrichtung hierfür A method for electron microscopic observation of a semiconductor device and apparatus therefor
01/28/2004EP1385192A2 Device working with beams of charged particles
01/28/2004EP1384991A1 CT apparatus, CT imaging method and method of providing service using the same
01/28/2004EP1384196A1 Apparatus and method for imaging small objects in a flow stream using optical tomography
01/28/2004EP1384065A2 Sample container with floating cover for x-ray analysis of liquids
01/28/2004CN1470865A Method for making x-ray detector display unit
01/28/2004CN1470864A Method for making x-ray detector display unit
01/28/2004CN1136586C Device for recording off-axis X-ray hologram
01/27/2004US6683935 Computed tomography with virtual tilt and angulation
01/27/2004US6683316 Apparatus for correlating an optical image and a SEM image and method of use thereof
01/27/2004US6683305 Method to obtain transparent image of resist contact hole or feature by SEM without deforming the feature by ion beam
01/22/2004WO2004008480A2 Quantitative analysis via isotopically differentitated derivatization