| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
|---|
| 03/18/2004 | WO2003102564A3 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate |
| 03/18/2004 | WO2003095997A3 Method and apparatus for separating primary and secondary charged particle beams |
| 03/18/2004 | WO2003046609A3 System and method for irradiating a sample |
| 03/18/2004 | US20040052330 Calibration and alignment of X-ray reflectometric systems |
| 03/18/2004 | US20040051853 Apparatus for stacking sheet members, apparatus for measuirng dimensions of sheet members, and apparatus for and method of marking sheet members |
| 03/18/2004 | US20040051041 Scanning electron microscope |
| 03/18/2004 | US20040051040 Method for measuring dimensions of sample and scanning electron microscope |
| 03/18/2004 | US20040050184 Sampling apparatus |
| 03/18/2004 | DE10250997A1 Mobile X-ray test unit for thick and complicated structures resolves fluorescence, first and higher order diffraction to give surface and depth chemical composition profiles |
| 03/17/2004 | EP1398623A1 Method and apparatus for polarisation analysis in neutron scattering experiments |
| 03/17/2004 | EP1397821A2 Spectroscopy instrument using broadband modulation and statistical estimation |
| 03/17/2004 | EP1397818A2 Fabrication of chopper for particle beam instrument |
| 03/17/2004 | EP1397784A1 Computed-tomography system with filtering |
| 03/17/2004 | EP1397670A2 Method for determining a physical mass changing event |
| 03/17/2004 | EP1170755A4 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography |
| 03/17/2004 | EP1071535B1 A method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 03/17/2004 | CN1142425C Detector array for ionization chamber and its use |
| 03/16/2004 | US6708121 Analyzing apparatus |
| 03/16/2004 | US6707885 Method for producing a grid structure |
| 03/16/2004 | US6707877 Positioning mechanism providing precision 2-axis rotation, 1-axis translation adjustment |
| 03/16/2004 | US6707875 Nonintrusive inspection apparatus |
| 03/16/2004 | US6707059 Solid state radiation detector |
| 03/16/2004 | US6707056 Stage rotation system to improve edge measurements |
| 03/16/2004 | US6707047 Method to measure hydrogen-bearing constituent in a material using neutron spectroscopy |
| 03/16/2004 | US6705758 Steering arrangement for mobile x-ray apparatus |
| 03/16/2004 | CA2100285C Hydroxyphenylpropionic ester having novel crystal structure |
| 03/11/2004 | WO2004021122A2 Article screening system |
| 03/11/2004 | WO2004020988A1 Digitization reference gauge of radiation transmission test film and process for making the same |
| 03/11/2004 | US20040048391 Automated sample handling for X-ray crystallography |
| 03/11/2004 | US20040047447 Method and apparatus for thin film thickness mapping |
| 03/11/2004 | US20040047446 Method and apparatus for detecting boron in x-ray fluorescence spectroscopy |
| 03/11/2004 | US20040046120 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope |
| 03/11/2004 | US20040046115 Apparatus and a method for characterizing multiphase effluents |
| 03/11/2004 | DE10237546A1 X ray computer tomography unit has copper or aluminum wedge or step filter between anode and detector array |
| 03/10/2004 | EP1396716A2 X-ray optical system for small angle scattering measurements |
| 03/10/2004 | EP1396715A1 Multiple focal spot x-ray inspection system |
| 03/10/2004 | EP1396008A2 Method for mass spectrometry, separation of ions with different charges |
| 03/10/2004 | CN2606333Y Harmonic angulometer |
| 03/10/2004 | CN1480894A Radiation Photographing image reading appts |
| 03/10/2004 | CN1480723A Long range ray board for measuring qigong |
| 03/09/2004 | US6704390 X-ray analysis apparatus provided with a multilayer mirror and an exit collimator |
| 03/09/2004 | US6703959 Signal detecting method and signal detecting device |
| 03/09/2004 | US6703626 Defect observed with the atomic force microscope (afm) and a pattern putting together the shape and position of the defect is extracted from and afm image. the extracted pattern is then converted to a shape format for a for an ion beam defect |
| 03/09/2004 | US6703606 Neutron burst timing method and system for multiple measurement pulsed neutron formation evaluation |
| 03/04/2004 | WO2004019059A1 Device for generating images and/or projections |
| 03/04/2004 | WO2004018959A2 Method and apparatus for thin film thickness mapping |
| 03/04/2004 | WO2003102574B1 Method and apparatus for analysis of elements in bulk substance |
| 03/04/2004 | US20040042586 Golf ball inspection using metal markers |
| 03/04/2004 | US20040042584 Low-cost, high precision goniometric stage for x-ray diffractography |
| 03/04/2004 | US20040041806 Image processing apparatus, image processing method, computer readable medium, and computer program thereof |
| 03/04/2004 | US20040041095 Methods and apparatus for electron beam inspection of samples |
| 03/04/2004 | US20040041094 Method of obtaining a particle-optical image of a sample in a particle-optical device |
| 03/04/2004 | US20040040930 Method for determining etching process conditions and controlling etching process |
| 03/04/2004 | DE19745669B4 Analysensystem zur zerstörungsfreien Identifikation des Inhalts von Objekten, insbesondere von Sprengstoff und chemischen Kampfstoffen Analysis system for non-destructive identification of the contents of objects, especially explosives and chemical warfare agents |
| 03/04/2004 | DE10238894A1 X ray source for computer tomography has two targets with controlled radiation intensity and different beam angle screens to allow beam superposition |
| 03/04/2004 | DE10237347A1 Method of ascertaining discontinuation criterion for two-dimensional X-ray images, requires initially irradiating object by X-ray source, and determining if three-dimensional reconstruction of object is possible |
| 03/03/2004 | EP1394834A2 Method of obtaining an image of a sample in a particle-optical device |
| 03/03/2004 | EP1394533A2 Stress measurement method using x-ray diffraction analysis |
| 03/03/2004 | EP1392168A2 Aerostatic rotor bearing |
| 03/03/2004 | EP1392167A2 Computed tomography apparatus |
| 03/03/2004 | CN1479868A Off-center tomosynthesis |
| 03/03/2004 | CN1479867A X-ray inspection device and controlling and adjusting method of the same |
| 03/03/2004 | CN1140797C Automatic analysis and identification dvice of internal defect in case and its analysis and identification method |
| 03/03/2004 | CN1140796C Taxonomic real-time reconstruction checking method of large-size workpiece defect |
| 03/02/2004 | US6701000 Solution to detector lag problem in a solid state detector |
| 03/02/2004 | US6700951 X-ray fluorescence spectrometer |
| 03/02/2004 | US6700949 Retractable collimator apparatus for a CT-PET system |
| 03/02/2004 | US6700947 Apparatus for optically transmitting data between rotor and stator and X-ray CT apparatus having the apparatus incorporated therein |
| 03/02/2004 | US6700131 Systems for detecting and compensating for image artifacts while scanning an imagine plate |
| 03/02/2004 | US6700126 Radiographic apparatus |
| 03/02/2004 | US6700122 Wafer inspection system and wafer inspection process using charged particle beam |
| 03/02/2004 | US6698296 Use of a cylindrical test body |
| 02/26/2004 | WO2003104848A3 Methods for sem inspection of fluid containing samples |
| 02/26/2004 | WO2003071934A3 Methods and devices for quantitative analysis of x-ray images |
| 02/26/2004 | WO2003065077A3 Combinatorial contraband detection using energy dispersive x-ray diffraction |
| 02/26/2004 | US20040039533 Method and system for analyzing diffraction data from crystalline systems |
| 02/26/2004 | US20040037393 Multiple focal spot X-ray inspection system |
| 02/26/2004 | US20040037389 Process and device for testing parts by X rays |
| 02/26/2004 | US20040036470 Test method for determining imminent failure in metals |
| 02/26/2004 | US20040036021 Scanning electron microscope |
| 02/26/2004 | DE10333563A1 Temporales Bildvergleichsverfahren Temporal comparison method |
| 02/26/2004 | DE10329250A1 Verfahren und Vorrichtung zum Extrahieren dreidimensionaler räumlicher Daten eines Objektes unter Verwendung eines Elektronenmikroskops Method and apparatus for extracting three-dimensional spatial data of an object using an electron microscope |
| 02/26/2004 | DE10317384A1 Computertomographie Computed tomography |
| 02/26/2004 | DE10238398A1 Device for producing images and/or projections used in medical X-ray diagnosis has a unit for acquiring starting radiation having an acquisition element containing a sensor with an activated scintillator, and a photodiode |
| 02/25/2004 | EP1391749A1 Radiographic image reading apparatus |
| 02/25/2004 | EP1391722A1 Portable detection device and method for determining an element in a sample using Rutherford backscattering (RBS) and particle induced X-ray emission (PIXE) |
| 02/25/2004 | EP1390779A1 X-ray system comprising an x-ray source, a detector assembly and an aperture |
| 02/25/2004 | CN1478201A Gas sensor and detection method and device for gas concentration |
| 02/25/2004 | CN1139803C Non-destructive gamma back-scattering imaging detection method and device |
| 02/24/2004 | US6697453 Portable X-ray diffractometer |
| 02/19/2004 | WO2004015633A1 Method and apparatus for extracting three-dimensional spacial data of object using electron microscope |
| 02/19/2004 | WO2004015405A1 Checking for concealed items or materials |
| 02/19/2004 | WO2003081286A3 Swinging objectif retarding immersion lens electron optics focusing, deflection and signal collection system and method |
| 02/19/2004 | US20040034307 Apparatus and method for imaging objects with wavefields |
| 02/19/2004 | US20040032928 Method and system for implementing variable x-ray intensity modulation schemes for imaging systems |
| 02/19/2004 | US20040032280 Integrated visual imaging and electronic sensing inspection systems |
| 02/18/2004 | EP1389797A2 Particle-optical apparatus, electron microscopy system and electron lithography system |
| 02/18/2004 | EP1389444A1 Method and system for implementing variable x-ray intensity modulation schemes for imaging systems |
| 02/18/2004 | CN1476627A Method of measuring performance of scanning electron microscope |
| 02/18/2004 | CN1476533A Method for quantifying texture homogeneity of polycrystalline material |