Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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09/03/1998 | WO1998038474A1 Circuitry for processing signals occurring in a heterodyne interferometer |
09/03/1998 | DE19708447A1 Twyman-Green interferometer adjustment device |
09/01/1998 | US5801880 Confocal microscope with optical recording and reproducing apparatus |
08/27/1998 | WO1998037379A1 Diffuse surface interference position sensor |
08/26/1998 | EP0860084A1 Flexible disk mode observer |
08/25/1998 | US5798834 Interferometric fiber optic method and apparatus for obtaining absolute static measurement using an optical frequency-time profile |
08/19/1998 | CN1190738A Method for real-time measuring crystal growth solid/liquid boundary and boundary layer structure |
08/18/1998 | US5796472 Optical translucency indicator for measurement of air filter dirtiness, liquid level, thickness, and other parameters |
08/18/1998 | US5795113 Optical unit for image projection and tool incorporating same |
08/13/1998 | WO1998035204A1 Background compensation for confocal interference microscopy |
08/13/1998 | WO1998035203A2 Method and apparatus for performing optical measurements using a rapidly frequency-tuned laser |
08/11/1998 | US5793488 Interferometer with compound optics for measuring cylindrical objects at oblique incidence |
08/11/1998 | US5793487 Optical interference system for performing interference measurement using wavelength |
08/11/1998 | US5793040 Information processing aparatus effecting probe position control with electrostatic force |
08/06/1998 | DE19703735A1 Element with varying length |
08/04/1998 | CA2043020C Device for and method of measurement of an angle of incidence of a luminous beam |
07/29/1998 | EP0366756B1 Broadband optical fiber laser |
07/28/1998 | US5786896 Oblique incidence interferometer with fringe scan drive |
07/28/1998 | US5786533 For determining a depth of a separation in the material |
07/22/1998 | EP0854379A2 All-optical timing recovery |
07/21/1998 | US5784164 Method and apparatus for automatically and simultaneously determining best focus and orientation of objects to be measured by broad-band interferometric means |
07/21/1998 | US5784161 Heterodyne interferometer arrangement with tunable lasers, a heterodyne interferometer, a comparison interferometer and a reference interferometer |
07/21/1998 | US5784160 Non-contact interferometric sizing of stochastic particles |
07/21/1998 | US5783752 Diffuse surface interference position sensor |
07/16/1998 | WO1998031081A1 Low frequency bandwidth laser |
07/16/1998 | WO1998030868A1 Common path, two beam interferometric systems and methods using a birefringent material |
07/15/1998 | EP0852715A1 Integrated optic interferometric sensor |
07/14/1998 | US5781334 Stabilized multi-frequency light source and method of generating synthetic light wavelengths |
07/14/1998 | US5781298 Light mixing technique for isolation and amplification of laser signal from background noise due to scattering in turbid media |
07/14/1998 | US5781297 Mixed frequency and amplitude modulated fiber optic heterodyne interferometer for distance measurement |
07/14/1998 | US5781295 Interferometer for absolute distance measurement |
07/14/1998 | US5781292 Short path scanning interferometer |
07/09/1998 | WO1998029769A1 Stable nonlinear mach-zehnder fiber switch |
07/09/1998 | CA2276489A1 Stable nonlinear mach-zehnder fiber switch |
07/07/1998 | US5777745 Method and apparatus for compensating for noise generated by fluctuation of a medium around an object to be measured |
07/07/1998 | US5777742 System and method for holographic imaging with discernible image of an object |
07/07/1998 | US5777741 Method and apparatus for optical interferometric measurements with reduced sensitivity to vibration |
07/01/1998 | EP0851303A2 Moving interferometer wafer stage |
07/01/1998 | EP0850397A1 Methods for detecting striae |
06/30/1998 | US5774224 Linear-scanning, oblique-viewing optical apparatus |
06/30/1998 | US5772325 Apparatus for providing surface images and method for making the apparatus |
06/25/1998 | WO1998027446A2 Temperature compensated fiber bragg gratings |
06/23/1998 | US5771098 Laser interferometric lithographic system providing automatic change of fringe spacing |
06/23/1998 | US5771097 Mach-zehnder type interferometer |
06/23/1998 | US5771095 Optical test system including interferometer with micromirror and piezoelectric translator for controlling test path mirror |
06/23/1998 | CA2224925A1 Moving interferometer wafer stage |
06/17/1998 | EP0831312A4 Optical fibre interferometer and optical fibre piezo-electric modulator |
06/17/1998 | CN1038781C High precision large aperture phase-shifting digital planaer interferometer |
06/16/1998 | US5767972 Method and apparatus for providing data age compensation in an interferometer |
06/16/1998 | CA2121880C Optical signal detection apparatus and method for preventing polarization signal fading in optical fiber interferometric sensor systems |
06/16/1998 | CA2013406C Optical detection of a surface motion of an object |
06/11/1998 | WO1998025105A1 A system and method for performing selected optical measurements |
06/11/1998 | WO1998025103A1 Interferometric measurement of positions, position changes and physical quantities derivated therefrom |
06/10/1998 | DE19650703A1 Verfahren zum interferometrischen Messen von Positionen, Positionsänderungen und daraus abgeleiteter physikalischer Größen Interferometric method for measuring positions, position changes and derived physical quantities |
06/10/1998 | CN2283830Y Projector for measuring impact test piece |
06/09/1998 | US5764362 Superheterodyne method and apparatus for measuring the refractive index of air using multiple-pass interferometry |
06/09/1998 | US5764361 Interferometer, adjusting method therefor, stage apparatus having the interferometer, and exposure apparatus having the stage apparatus |
06/09/1998 | US5764360 Electro-optical measuring device for absolute distances |
06/09/1998 | US5764345 Methods for detecting inhomogeneities, specifically, striae, infused silica glasses |
06/04/1998 | DE19721884C1 Interferometric measuring arrangement for sensing rough surfaces |
06/03/1998 | EP0845693A1 Confocal microscope and method of generating three-dimensional image using confocal microscope |
06/02/1998 | US5760903 Light measuring apparatus |
06/02/1998 | US5760902 Method and apparatus for producing an intensity contrast image from phase detail in transparent phase objects |
06/02/1998 | US5760901 Method and apparatus for confocal interference microscopy with background amplitude reduction and compensation |
05/28/1998 | WO1998022776A1 Instrument and method for measuring lamellar fine structure by using low interference optical interferometry |
05/28/1998 | WO1998022775A1 Integrated interferometer |
05/28/1998 | CA2269828A1 Integrated interferometer |
05/26/1998 | US5757493 Interferometer with catadioptric imaging system having expanded range of numerical aperture |
05/26/1998 | US5757489 Interferometric apparatus for measuring a physical value |
05/26/1998 | US5757488 Optical frequency stability controller |
05/26/1998 | US5757160 Moving interferometer wafer stage |
05/22/1998 | WO1998021546A1 Sensing method and apparatus |
05/20/1998 | EP0843154A2 Method for measuring shape of object and apparatus for carrying out the same |
05/20/1998 | EP0843152A2 Improving the signal-to-noise ratio of second harmonic interferometers |
05/20/1998 | DE19750698A1 Three=dimensional surveying apparatus especially for organic cavities |
05/20/1998 | DE19647510A1 Optical micromeasuring system for visual examination of small structures |
05/14/1998 | WO1998020300A1 Laser measurement system for rapid calibration of machine tools |
05/14/1998 | CA2270228A1 Laser measurement system for rapid calibration of machine tools |
05/13/1998 | EP0689665A4 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
05/07/1998 | WO1998019293A1 Method for interferometer based spectral imaging of moving objects |
05/05/1998 | US5748315 Optical interference measuring apparatus and method for measuring displacement of an object having an optical path separating system |
05/05/1998 | US5748313 Signal-to-noise ratio of second harmonic interferometers |
04/30/1998 | WO1998017969A1 An optical wavelength scanner employing a reference system |
04/30/1998 | WO1998017968A1 A multi-wavelength reference |
04/30/1998 | CA2272376A1 Variable chirp optical modulator using single modulation source |
04/23/1998 | WO1998016799A1 Interferometer with catadioptric imaging system having expanded range of numerical aperture |
04/23/1998 | WO1998016798A1 Optical profilometry |
04/23/1998 | WO1998016796A1 Interferometric measurement of toric surfaces at grazing incidence |
04/16/1998 | WO1998015797A1 Camera and method for holographic interferometry |
04/16/1998 | WO1998015494A1 Strain sensor and system |
04/16/1998 | CA2267976A1 Strain sensor and system |
04/02/1998 | WO1998013664A1 Laser interferometric lithographic system providing automatic change of fringe spacing |
04/01/1998 | EP0833144A2 Method for measuring a spectral response |
04/01/1998 | EP0832418A1 Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing |
04/01/1998 | EP0832417A1 Method for simultaneous detection of multiple fluorophores for in situ hybridization and chromosome painting |
04/01/1998 | EP0708913B1 Sensor system |
03/31/1998 | US5734471 Method of adjusting sample position in light wave interference apparatus |
03/26/1998 | WO1998012668A1 Test method and test apparatus using pattern matching |
03/26/1998 | WO1998012500A1 Interferometer with air turbulence compensation |
03/26/1998 | WO1998012499A1 Method and device for heterodyne interferometer error correction |