Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
02/1997
02/25/1997US5606174 Method and device for detecting a shape of object with high resolution measurement of displacement of an object surface from a reference plane
02/13/1997WO1997005448A1 Interferometer with compound optics
02/11/1997US5602643 Method and apparatus for correcting surface profiles determined by phase-shifting interferometry according to optical parameters of test surface
02/04/1997US5600442 Position detecting apparatus based on before and after mode-hop signals
02/04/1997US5600440 Liquid crystal interferometer
01/1997
01/29/1997EP0755530A1 Method of determining measurement-point position data and device for measuring the magnification of an optical beam path
01/28/1997US5598265 Method for profiling an object surface using a large equivalent wavelength and system therefor
01/28/1997US5598264 Noise compensated interferometric measuring device and method using signal and reference interferometers
01/22/1997EP0754309A1 Strip waveguide and uses thereof
01/21/1997US5596410 Interferometer system and method for controlling the activation of a regulating interferometer in response to an output signal
01/21/1997US5596409 Associated dual interferometric measurement method for determining a physical property of an object
01/16/1997DE19624167A1 Coherence biometry and tomography with dynamic coherent focus
01/15/1997EP0753804A1 Laser measuring apparatus
01/15/1997EP0753733A1 Method of controlling a short-etalon Fabry-Perot interferometer used in an NDIR measurement apparatus
01/07/1997US5591174 Microkeratome and method and apparatus for calibrating a microkeratome
01/02/1997EP0751400A1 Method and device for optic treatment of two-dimensional image to extract the velocity field
01/01/1997CN2244180Y Microscopic instrument for tree-walk growth
12/1996
12/31/1996US5589938 Method and apparatus for optical interferometric measurements with reduced sensitivity to vibration
12/31/1996US5588632 Dynamic support structure
12/27/1996EP0750174A2 Reference interferometer with variable wavelength
12/27/1996EP0749566A1 Interferometre and fourier transform spectrometer
12/24/1996US5587792 Apparatus and method for measuring thickness of thin semiconductor multi-layer film
12/19/1996WO1996041122A1 Interferometer
12/19/1996DE19521551A1 Speckle interferometry method for obtaining topographical information of object surface
12/17/1996US5585922 Dual interferometer apparatus compensating for environmental turbulence or fluctuation and for quantization error
12/12/1996WO1996039609A1 Technique for achieving preferred optical alignment in a scanning interferometer
12/11/1996EP0746745A1 Method and apparatus for the rapid acquisition of data in coherence scanning interferometry
12/10/1996US5583638 Angular michelson interferometer and optical wavemeter based on a rotating periscope
12/05/1996WO1996038707A1 Method and apparatus for integrating an automated system to a laboratory
12/05/1996WO1996038706A1 Interferometric broadband imaging
11/1996
11/26/1996US5579112 Optical tomographic imaging equipment having a light source unit for generating a light wave having a predetermined coherence length
11/26/1996US5579109 3 frequency heterodyne laser interferometer that doubles the resolution
11/21/1996WO1996036848A1 Laser beamsplitter for generating a plurality of parallel beams
11/21/1996CA2221170A1 Laser beamsplitter for generating a plurality of parallel beams
11/20/1996EP0586454B1 Positional measurement
11/20/1996EP0546067B1 Interferometer
11/20/1996CN2240711Y Oblique line raster density instrument
11/19/1996US5576832 Optical measuring apparatus and measuring method of the same
11/14/1996DE19541144A1 Control system for controlling drive of body with two parts eg. mirror and lever
11/12/1996US5574560 Dual-beam interferometer with a phase grating
11/07/1996WO1996035100A1 Device for measuring the thickness of transparent objects
11/07/1996DE3645238C2 Variable Fabrv Perot type interferometer
11/06/1996EP0740769A1 An interferometric measuring system
10/1996
10/31/1996DE19617880A1 Abstandsmeßvorrichtung Distance measuring
10/31/1996DE19514852A1 Method for measuring acceleration and vibration
10/23/1996EP0738871A2 Circuit and method for dealing with false zero crossings on low intensity signals
10/22/1996US5568394 Interferometry with multipath nulling
10/22/1996US5568256 Method and apparatus utilizing an optical stage for topographic surface analysis
10/16/1996EP0737843A2 A method and apparatus for coherence observation by interference noise
10/10/1996WO1996031752A1 Apparatus for the measurement of angular displacement
10/10/1996DE19613677A1 Recording surface profile of object, for in-line quality control of machine-mfd. part
10/10/1996DE19513233A1 Determination of phases and phase differences of light reflecting from specular or diffusely reflecting, or transparent surface of object
10/09/1996EP0736759A2 Interferometer having a micromirror
10/09/1996EP0458888B1 Interferometry
10/08/1996US5563706 Interferometric surface profiler with an alignment optical member
10/08/1996US5563704 Camera and method for holographic interferometry using an erasable photosensitive photopolymer film
10/08/1996CA2169141A1 Interferometer having a micromirror
10/03/1996WO1996030082A1 Method of evaluating a laser used in ophthalmological surgery
10/02/1996DE19511926A1 Computer generated diffraction masks for examining surfaces
10/01/1996US5561525 Interferometer for observing the interference pattern of a surface under test utilizing an adjustable aperture stop
10/01/1996US5561524 Interferometric distance measuring apparatus utilizing an asymmetric/elliptic beam
10/01/1996US5561523 Electrically tunable fabry-perot interferometer produced by surface micromechanical techniques for use in optical material analysis
09/1996
09/26/1996WO1996029570A1 Process and device for determining three-dimensional structures in the submicron range
09/26/1996WO1996029569A1 Interferometry system and method for calculating a phase change between successive interference patterns which are recorded in pairs by said interferometry system
09/26/1996DE19610337A1 Electromagnetic inductance with current-dependent inductance value
09/26/1996CA2215600A1 Process and device for determining three-dimensional structures in the submicron range
09/25/1996EP0733877A2 Associated dual interferometric measurement apparatus and method
09/23/1996CA2169506A1 Associated dual interferometric measurement apparatus and method
09/17/1996US5557408 Method of and system for measurement of direction of surface and refractive index variations using interference fringes
09/11/1996EP0731335A2 Apparatus and method for non destructive testing of coherent radiation illuminated material
09/11/1996EP0731334A1 Alignment of interferometers
09/10/1996US5555089 Absolute distance measuring interferometry using multi-pass resonant cavity referenced to a stabilized laser source
09/06/1996WO1996027121A1 Optical fibre interferometer and optical fibre piezo-electric modulator
09/03/1996US5552888 Apparatus for measuring position of an X-Y stage
09/03/1996US5552882 Methods of and apparatus for calibrating precisely spaced multiple transverse holographic gratings in optical fibers
08/1996
08/28/1996EP0729007A2 Positional measurement
08/22/1996DE19505033A1 Interferometer system for laser path measuring system with at least 2 receivers
08/20/1996US5548403 Phase shifting diffraction interferometer
08/20/1996US5548402 Optical sweep signal generator
08/20/1996US5548392 Optical position detector having scale pattern spot-illuminated to increase resolution
08/15/1996WO1996024868A1 Strip waveguide and uses thereof
08/15/1996CA2187216A1 Channel waveguide and applications
08/14/1996DE19504465A1 Testing and calibration system for optical eye range measuring unit
08/14/1996DE19504189A1 Stable and compact two beam interferometer system based on Michelson interferometer
08/14/1996DE19503931A1 New single-mode integrated-optical wide-band waveguide
08/13/1996US5546186 Apparatus for holographic interferometry suitable for inspection of cylindrical optical surfaces
08/13/1996US5546184 Single-frequency bidirectional fringe-counting interferometer
08/07/1996CN1128131A Optical coherence tomography corneal mapping apparatus
08/06/1996US5543914 Apparatus and methods employing harmonic analysis for measuring the difference in phase between two coherent beams
08/06/1996CA2127567C Michelson interferometer
07/1996
07/31/1996EP0724203A1 Holographic method for the recording of interferograms
07/30/1996US5541730 Interferometric measuring apparatus for making absolute measurements of distance or refractive index
07/30/1996US5541729 Measuring apparatus utilizing diffraction of reflected and transmitted light
07/30/1996US5541728 Solid stationary interferometer fourier transform spectrometer
07/25/1996WO1996022506A1 An optical device and a method of utilizing such device for optically examining objects
07/25/1996WO1996022505A1 Interferometric measurement of surfaces with diffractive optics at grazing incidence
07/25/1996DE19524036A1 Determining shape or shape changes by interferometry
07/25/1996DE19501526A1 Object range detection device using frequency-modulated continuous wave laser radar
07/24/1996EP0722558A1 Interferometric method and apparatus to measure surface topography
07/24/1996EP0722557A1 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings