| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 07/23/1996 | US5539520 For measuring the position of a reflecting object |
| 07/17/1996 | EP0722077A2 Information processing apparatus effecting probe position control with electrostatic force |
| 07/16/1996 | US5537209 An interferometric measuring system having temperature compensation and improved optical configurations |
| 07/16/1996 | US5537162 Method and apparatus for optical coherence tomographic fundus imaging without vignetting |
| 07/11/1996 | DE19600297A1 Laserinterferometer Laser interferometer |
| 07/10/1996 | EP0426866B1 Projection/exposure device and projection/exposure method |
| 07/09/1996 | US5535044 Optical frequency mixing apparatus |
| 07/09/1996 | US5535003 Wavelength stabilizing light source apparatus by maintaining a constant phase difference |
| 07/04/1996 | DE4446887A1 Non-destructive surface inspection by shearing speckle interferometry |
| 07/03/1996 | EP0631660A4 Interferometer requiring no critical component alignment. |
| 07/03/1996 | EP0611438B1 Optical measuring instruments |
| 07/02/1996 | US5532819 For measuring rotational information of a rotating object |
| 06/27/1996 | DE4446134A1 Interferometric measuring system for measurements on living eye |
| 06/25/1996 | US5530543 Detector array for use in interferometric metrology systems |
| 06/25/1996 | US5530542 Circuit and method for controlling glitches in low intensity signals |
| 06/20/1996 | DE4444647A1 Detection and impulse spectrometry of sub-microscopic particles |
| 06/18/1996 | US5528369 Apparatus for producing interferometric fringe patterns having variable parameters |
| 06/11/1996 | US5526114 Time multiplexed fringe counter |
| 06/06/1996 | WO1996017221A1 Phase shifting diffraction interferometer |
| 06/06/1996 | CA2206212A1 Phase shifting diffraction interferometer |
| 06/05/1996 | EP0527739B1 Servo guided stage system |
| 06/04/1996 | US5523842 Method of interference fringe analysis for determining aspect of surface geometry |
| 06/04/1996 | US5523840 Method and apparatus for measuring the thicknesses of layers of a multiple layer semiconductor film utilizing the comparison between a spatialgram and an optical characteristic matrix |
| 06/04/1996 | US5523839 Differential optical interferometric profilomenty for real time manufacturing control |
| 06/04/1996 | US5523838 Optical wavemeter employing a length measuring machine with a white light source for achieving maximum interfering efficiency |
| 05/28/1996 | US5521704 Apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser |
| 05/21/1996 | US5519491 Process for measuring the inclination of boundary areas in an optical system using interferometry to extract reflections from disturbance-generating boundary areas |
| 05/21/1996 | US5519486 Method of creating holographic interferograms for structural examination of composites in sheet metal surfaces |
| 05/15/1996 | EP0711421A1 Operating microscope |
| 05/14/1996 | US5517308 For measuring movements of an object in a fluid medium |
| 05/14/1996 | US5517307 Probe measurement apparatus using a curved grating displacement interferometer |
| 05/14/1996 | US5517303 Coherence selective sensor system |
| 05/07/1996 | US5513828 Vibration immunizing dynamic support structure |
| 05/01/1996 | EP0708913A1 Sensor system |
| 04/30/1996 | US5513005 Method of operating a surgical microscope arrangement for computer-supported stereotactic microsurgery on a patient |
| 04/24/1996 | EP0708307A2 Minute step measuring method |
| 04/23/1996 | US5510891 Object characteristic direct measuring device utilizing a magnetically attracted lover base and an upper frame having a scaled lens therein |
| 04/18/1996 | WO1996011387A1 Interferometer |
| 04/17/1996 | EP0707191A2 Interferometric device for environmetal and frequency-independent length measurement |
| 04/17/1996 | CN1120662A Optical fine interference method for measuring displacement |
| 04/16/1996 | US5508805 Interferometer, optical scanning type tunneling microscope and optical probe |
| 04/16/1996 | US5508804 Laser interferometer strain sensor with adjustable feedback amplification in the form of a saw-tooth pattern |
| 04/16/1996 | US5507740 Corneal topography enhancement device |
| 04/11/1996 | DE19500355A1 Angle measuring unit for measuring microscope with rotatable reticule, for two=dimensional measurement of microscopic object |
| 04/10/1996 | EP0705562A1 Optical coherence tomography corneal mapping apparatus |
| 04/02/1996 | US5504722 Magneto-optic information storage system utilizing a TE/TM mode controlling laser diode |
| 04/02/1996 | US5504720 Fiber optic planar hydrophone |
| 03/27/1996 | EP0645616A4 Dispersion interferometer. |
| 03/26/1996 | US5502564 Substrate thickness measurement using oblique incidence multispectral interferometry |
| 03/26/1996 | US5502562 Method and apparatus for absolute interferometry using a measurement beam and a reference beam having parallel wave fronts and sharing a single beam path |
| 03/21/1996 | WO1995027918A3 Method of determining measurement-point position data and device for measuring the magnification of an optical beam path |
| 03/20/1996 | EP0702206A2 Substrate thickness measurement using oblique incidence multispectral interferometry |
| 03/20/1996 | EP0702205A2 Interferometer |
| 03/19/1996 | US5500734 Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings |
| 03/14/1996 | DE4431412C1 Vorrichtung zur Durchführung spektroskopischer Messungen Device for carrying out spectroscopic measurements |
| 03/13/1996 | EP0701103A2 Optical interference based thickness measuring apparatus |
| 03/13/1996 | EP0700505A1 Interferometric flying height measuring device |
| 03/06/1996 | CN1118074A Multi-stage annular multiple light-wave interferometer |
| 03/06/1996 | CN1118063A Probe position measurement apparatus |
| 02/29/1996 | WO1996006472A1 Stabilised multi-frequency light source and method of generating synthetic light wavelengths |
| 02/29/1996 | WO1996006335A1 Device for carrying out spectroscopic measurements |
| 02/29/1996 | WO1996006324A1 Method and interference microscope for imaging an object, with the aim of achieving a resolution beyond the diffraction limit |
| 02/22/1996 | DE4429416A1 Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung) Method and interference microscope for microscopy of an object to achieve a resolution beyond the diffraction limit (Super Resolution) |
| 02/21/1996 | EP0697611A2 Optical coherence tomography assisted surgical apparatus |
| 02/21/1996 | CN1117131A Combined interferometer and refractometer |
| 02/20/1996 | US5493400 Arrangement for projecting a test pattern onto a surface to be investigated |
| 02/20/1996 | US5493395 Wavelength variation measuring apparatus |
| 02/20/1996 | US5493109 Optical coherence tomography assisted ophthalmologic surgical microscope |
| 02/13/1996 | US5491550 Interference methods and interference microscopes for measuring energy path length differences, path length between two locaitons or for determiing refractive index |
| 02/13/1996 | US5491524 Optical coherence tomography corneal mapping apparatus |
| 02/08/1996 | WO1996003668A1 Multiport optical waveguide interferometer and method of making the same |
| 02/08/1996 | DE4427317A1 Interferometer using laser assembly for testing surfaces of optical elements or entire optical systems |
| 01/31/1996 | EP0694764A2 Detector array for use in interferomic metrology systems |
| 01/24/1996 | CN1030796C Positional measurement |
| 01/23/1996 | US5486924 Method and apparatus for measurement of roughness and hardness of a surface |
| 01/23/1996 | US5486917 Flexture plate motion-transfer mechanism, beam-splitter assembly, and interferometer incorporating the same |
| 01/18/1996 | DE4427352C1 High resolution distance measurement using FMCW laser radar |
| 01/16/1996 | US5485275 Apparatus and method for measuring the error of an apparatus which measure a cylindrical shape using an interferometer |
| 01/16/1996 | US5485272 Radiation-source unit for generating a beam having two directions of polarisation and two frequencies |
| 01/10/1996 | EP0691757A1 Optical frequency mixing apparatus |
| 01/09/1996 | US5483343 Wavelength compensator in a helium ambience |
| 01/09/1996 | US5483342 Polarization rotator with frequency shifting phase conjugate mirror and simplified interferometric output coupler |
| 01/09/1996 | US5483340 Sagnac loop interferometer |
| 01/03/1996 | EP0689665A1 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
| 01/02/1996 | US5481359 Multi-etalon VISAR interferometer having an interferometer frame of high stiffness with a linear elongated slide bar |
| 12/27/1995 | EP0689030A2 Displacement measuring method and apparatus |
| 12/27/1995 | EP0546071B1 Interference microscope |
| 12/26/1995 | US5479546 Optimized non-linear effect tapered optical fiber interferometer/switch device |
| 12/21/1995 | DE4421212A1 Optical system for distance or displacement measurement of machine tool |
| 12/20/1995 | EP0688069A1 Interferometric semiconductor laser with low loss outcoupler and assembly comprising such a laser |
| 12/19/1995 | US5477382 Optical correlator system |
| 12/19/1995 | US5477324 Method and apparatus for detecting surface wave vector dynamics using three beams of coherent light |
| 12/14/1995 | WO1995033971A1 Method and apparatus for acquiring images |
| 12/14/1995 | WO1995033970A1 Rotating cam for optical systems |
| 12/13/1995 | EP0549614B1 Optical apparatus |
| 12/13/1995 | EP0526547B1 Interferometry system and method |
| 12/12/1995 | US5475488 Head flying height measuring apparatus |
| 12/06/1995 | EP0569353B1 Rare-earth-doped lithium niobate waveguide structures |
| 12/05/1995 | US5473722 Rare-earth-doped lithium niobate waveguide structures |
| 12/05/1995 | US5473434 Phase shifting interferometer and method for surface topography measurement |