| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 06/17/1999 | WO1999030196A1 Micro benchtop optics by bulk silicon micromachining |
| 06/17/1999 | DE19755820A1 Object illumination method with sinusoidal intensity distributions |
| 06/16/1999 | EP0922198A1 Method and device for measuring the concentration of ions implanted in semiconductor materials |
| 06/16/1999 | EP0620912B1 Structure for the dynamic support of reflective elements |
| 06/15/1999 | CA2146300C Refractive index measurement of spectacle lenses |
| 06/10/1999 | WO1999028790A1 Interferometer system and lithographic apparatus comprising such a system |
| 06/10/1999 | DE19854722A1 Illumination system for image processing measuring unit |
| 06/09/1999 | EP0920696A1 Phase-controlled evanescent field systems and methods |
| 06/08/1999 | US5910839 White light velocity interferometer |
| 06/08/1999 | US5910660 Process and device for determining three-dimensional structure in the submicron range |
| 06/03/1999 | WO1999027342A2 Grazing incidence interferometry for measuring transparent plane-parallel plates |
| 06/02/1999 | DE19749377A1 Interferometer arrangement, e.g. for Sagnac interferometer |
| 06/01/1999 | US5909281 Interferometric measurement of surfaces with diffractive optics and planar wavefront imaging |
| 06/01/1999 | US5908981 Interdigital deflection sensor for microcantilevers |
| 05/27/1999 | DE19853669A1 Ultrashort optical pulse source |
| 05/25/1999 | US5907400 Folded low-power interference microscope objective |
| 05/20/1999 | WO1999024784A1 Monolithic optical assembly and associated retroreflector with beamsplitter assembly |
| 05/18/1999 | US5905574 Method and apparatus for canceling cross polarization interference |
| 05/18/1999 | US5905573 System for measuring the dimensions of structures on an object |
| 05/18/1999 | US5905572 Sample inspection using interference and/or correlation of scattered superbroad radiation |
| 05/14/1999 | WO1999023450A1 Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings |
| 05/14/1999 | WO1999023446A1 Method of improving the contrast of images obtained using the pulsed image-addition espi technique |
| 05/14/1999 | CA2306162A1 Method of improving the contrast of images obtained using the pulsed image-addition espi technique |
| 05/12/1999 | EP0915317A1 Method of improving the contrast of images obtained using the pulsed image-addition ESPI technique |
| 05/11/1999 | US5903350 Demodulator and method useful for multiplexed optical sensors |
| 05/06/1999 | WO1999022198A1 Method and device for measuring the optical properties of transparent and/or diffusive objects |
| 05/06/1999 | EP0913666A2 Interference measurement apparatus and probe used for interference measurement apparatus |
| 05/06/1999 | DE19746535A1 Adjusting system for interferometer for measuring reflecting surfaces |
| 05/04/1999 | US5900938 Laser measurement system for rapid calibration of machine tools |
| 04/28/1999 | EP0910786A1 An interferometer |
| 04/28/1999 | CN1215155A Multiplexing high resolution measuring system for frequency change of multimode optical fibre laser sound transducer |
| 04/27/1999 | US5898500 Device and method for three-dimensional measurements and observation in situ of a surface layer deposited on a thin-film stack |
| 04/27/1999 | US5898498 Point interferometer to measure phase shift in reticles |
| 04/27/1999 | US5898495 Tilt-compensated interferometer |
| 04/22/1999 | WO1999019693A1 Interferometric sensing apparatus |
| 04/22/1999 | WO1999019686A1 Interferometer |
| 04/22/1999 | WO1999002974A9 Wave field microscope, method for a wave field microscope, including for dna sequencing, and calibration method for wave field microscopy |
| 04/22/1999 | WO1999002938A3 Two piece mirror arrangement for interferometrically controlled stage |
| 04/22/1999 | DE19740251C1 Method of comprehensive detection of transient mechanical variations of an object over a surface using an interferometer |
| 04/21/1999 | EP0909963A1 Article comprising a bragg reflective mach-zehnder filter of reduced coupler dependence |
| 04/20/1999 | US5896228 Method and apparatus for controlling the driving of a body |
| 04/20/1999 | US5896198 Optical heterodyne-based method and apparatus for determining the concentration of optically active substances |
| 04/20/1999 | US5896197 Interferometer having glass graphite bearing |
| 04/15/1999 | WO1999018466A1 Spherical-aberration detection system and optical device using the same |
| 04/15/1999 | WO1999018424A1 Interferometric method and apparatus |
| 04/14/1999 | EP0908710A2 Apparatus and method for measuring characteristics of light |
| 04/14/1999 | EP0908709A2 Device for contactless vibration measurement |
| 04/14/1999 | EP0907875A1 Fringe pattern discriminator for interferometer using diffraction gratings |
| 04/07/1999 | EP0700505A4 Interferometric flying height measuring device |
| 04/06/1999 | US5892582 Fabry Perot/fiber Bragg grating multi-wavelength reference |
| 04/06/1999 | US5891747 Interferometric fiber optic displacement sensor |
| 03/30/1999 | US5889899 Article comprising a Bragg reflective Mach-Zehnder filter of reduced coupled dependence |
| 03/30/1999 | US5889611 Operating microscope |
| 03/30/1999 | US5889591 Interferometric measurement of toric surfaces at grazing incidence |
| 03/30/1999 | US5889590 Optical cavity sensor |
| 03/24/1999 | EP0903559A2 Information recording apparatus using an interference device for position detection and positioning |
| 03/24/1999 | EP0902895A1 Interferometric signal processing apparatus |
| 03/23/1999 | US5887092 Optical non-linear branching element with MZ interferometer |
| 03/23/1999 | US5886786 Subject positioning device for optical interferometer |
| 03/18/1999 | WO1999013294A1 Interferometric measuring device for form measurement on rough surfaces |
| 03/18/1999 | DE19741122A1 Interferometric near-field device, e.g. near-field microscope for measuring and structuring material |
| 03/18/1999 | DE19740678A1 Optical position or vibration measuring device using laser interferometer |
| 03/18/1999 | DE19738900A1 Interferometrische Meßvorrichtung zur Formvermessung an rauhen Oberflächen Interferometric measurement device for shape measurement on rough surfaces |
| 03/17/1999 | CN1210975A Adjustable optical test apparatus and system including interferometer with micromirror |
| 03/16/1999 | US5883712 Interferometer of an infrared spectrometer with dynamic moving mirror alignment |
| 03/10/1999 | EP0776536B1 Stabilised multi-frequency light source and method of generating synthetic light wavelengths |
| 03/09/1999 | US5880838 System and method for optically measuring a structure |
| 03/09/1999 | US5880465 Scanning confocal microscope with oscillating objective lens |
| 03/04/1999 | WO1999010710A1 Open loop signal processing circuit and method for a fiber optic interferometric sensor |
| 03/04/1999 | CA2301764A1 Open loop signal processing circuit and method for a fiber optic interferometric sensor |
| 03/03/1999 | EP0899541A2 Apparatus for determining the thickness of an optical sample |
| 03/02/1999 | US5877856 Methods and arrangement for increasing contrast in optical coherence tomography by means of scanning an object with a dual beam |
| 02/28/1999 | CA2244425A1 Apparatus for determining the thickness of an optical sample |
| 02/23/1999 | US5875031 Distance measuring device based on laser interference with a baffle structure member |
| 02/23/1999 | US5875030 Method and apparatus for coherent electromagnetic field imaging through fourier transform heterodyne |
| 02/18/1999 | WO1999008067A1 Digital signal processing (dsp) techniques for ft-ir multiple modulation measurements using a photoelastic modulator (pem) |
| 02/11/1999 | WO1999006794A1 Pulse measurement using frequency shifting techniques |
| 02/09/1999 | US5870511 Fiber optic temperature sensor |
| 02/09/1999 | US5870200 Apparatus for determining the thickness of an optical sample |
| 02/09/1999 | US5870198 Stage position measuring apparatus capable of restricting generation of temperature fluctuations to a measured value |
| 02/09/1999 | US5870196 Optical three-dimensional profilometry method based on processing SPECKLE images in partially coherent light, and interferometer implementing such a method |
| 02/09/1999 | US5870192 Multibeam visar using image coupling from one optical fiber bundle to another through the visar interferometer |
| 02/04/1999 | WO1999005671A1 Universal voice operated command and control engine |
| 02/04/1999 | WO1999005551A1 Method of producing an optical fibre resonant cavity, in particular for an interferometric sensor, and optical fibre resonant cavity produced thereby |
| 02/04/1999 | WO1999005500A1 Image quality mapper for progressive eyeglasses |
| 02/04/1999 | WO1999005490A1 Luminous intensity sensor element and light beam modulating method and device employing such a sensor element |
| 02/04/1999 | WO1999005472A1 Device and method for measuring deformation of a mechanical test specimen |
| 02/04/1999 | WO1999005471A1 Length measuring instrument |
| 02/04/1999 | DE19828546A1 Image taking unit for measuring purposes with at least one optical system |
| 02/04/1999 | DE19822216A1 Interferometer with coherence maintaining fibre |
| 02/04/1999 | CA2298002A1 Image quality mapper for progressive eyeglasses |
| 02/04/1999 | CA2297154A1 Method of producing an optical fibre resonant cavity, in particular for an interferometric sensor, and optical fibre resonant cavity produced thereby |
| 02/04/1999 | CA2297152A1 Device and method for measuring deformation of a mechanical test specimen |
| 02/04/1999 | CA2297151A1 Luminous intensity sensor element and light beam modulating method and device employing such a sensor element |
| 02/03/1999 | EP0895072A2 System for multiplexed high resolution measurement of frequency variations in multimode fiber laser acoustic sensors |
| 02/03/1999 | EP0894350A1 Low frequency bandwidth laser |
| 02/03/1999 | EP0894239A1 Object fixturing in interferometer |
| 02/03/1999 | CN1207169A Sensing method and apparatus |
| 02/02/1999 | US5867693 Extended resolution phase measurement |
| 02/02/1999 | US5867272 Interferometric self aligning fixture with parabolic and flat reflective surfaces |